TWI299403B - - Google Patents

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Publication number
TWI299403B
TWI299403B TW095129872A TW95129872A TWI299403B TW I299403 B TWI299403 B TW I299403B TW 095129872 A TW095129872 A TW 095129872A TW 95129872 A TW95129872 A TW 95129872A TW I299403 B TWI299403 B TW I299403B
Authority
TW
Taiwan
Prior art keywords
display substrate
substrate
transport
display
sensor
Prior art date
Application number
TW095129872A
Other languages
English (en)
Chinese (zh)
Other versions
TW200714901A (en
Inventor
Masato Ikeda
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200714901A publication Critical patent/TW200714901A/zh
Application granted granted Critical
Publication of TWI299403B publication Critical patent/TWI299403B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
TW095129872A 2005-10-13 2006-08-15 Testing apparatus for the display substrate TW200714901A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005298424A JP2007107985A (ja) 2005-10-13 2005-10-13 パネル基板の検査装置

Publications (2)

Publication Number Publication Date
TW200714901A TW200714901A (en) 2007-04-16
TWI299403B true TWI299403B (ko) 2008-08-01

Family

ID=38033961

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095129872A TW200714901A (en) 2005-10-13 2006-08-15 Testing apparatus for the display substrate

Country Status (3)

Country Link
JP (1) JP2007107985A (ko)
KR (1) KR100795387B1 (ko)
TW (1) TW200714901A (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112748314B (zh) * 2020-12-25 2024-02-06 Tcl王牌电器(惠州)有限公司 耐压测试装置
CN117012123B (zh) * 2023-06-30 2023-12-22 广州鸿宇数字科技有限公司 一种液晶显示器坏点检测设备及检测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3860293B2 (ja) * 1997-06-23 2006-12-20 株式会社日本マイクロニクス 液晶パネルの検査装置
TW533319B (en) 1999-11-19 2003-05-21 De & T Co Ltd LCD testing system
KR100489522B1 (ko) * 2002-06-04 2005-05-16 참이앤티 주식회사 평면디스플레이 검사장치
KR100490952B1 (ko) * 2002-11-29 2005-05-19 (주)넥스트인스트루먼트 스테이지 방식을 갖는 다목적 광학 검사용 디스플레이패널 이송장치

Also Published As

Publication number Publication date
KR20070041321A (ko) 2007-04-18
KR100795387B1 (ko) 2008-01-17
TW200714901A (en) 2007-04-16
JP2007107985A (ja) 2007-04-26

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees