TWD177828S - 積體電路插座用探針引腳 - Google Patents

積體電路插座用探針引腳

Info

Publication number
TWD177828S
TWD177828S TW104303168F TW104303168F TWD177828S TW D177828 S TWD177828 S TW D177828S TW 104303168 F TW104303168 F TW 104303168F TW 104303168 F TW104303168 F TW 104303168F TW D177828 S TWD177828 S TW D177828S
Authority
TW
Taiwan
Prior art keywords
integrated circuit
socket
probe pin
case
article
Prior art date
Application number
TW104303168F
Other languages
English (en)
Chinese (zh)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司, Omron Tateisi Electronics Co filed Critical 歐姆龍股份有限公司
Publication of TWD177828S publication Critical patent/TWD177828S/zh

Links

TW104303168F 2014-12-15 2015-06-11 積體電路插座用探針引腳 TWD177828S (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27894F JP1529608S (fr) 2014-12-15 2014-12-15

Publications (1)

Publication Number Publication Date
TWD177828S true TWD177828S (zh) 2016-08-21

Family

ID=53764635

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104303168F TWD177828S (zh) 2014-12-15 2015-06-11 積體電路插座用探針引腳

Country Status (3)

Country Link
US (1) USD776552S1 (fr)
JP (1) JP1529608S (fr)
TW (1) TWD177828S (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6269337B2 (ja) * 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP1592871S (fr) * 2017-02-10 2017-12-11
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
USD847757S1 (en) * 2017-08-30 2019-05-07 Kabushiki Kaisha Nihon Micronics Probe pin
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
JP1626668S (fr) * 2018-02-02 2019-03-18
JP1622968S (fr) * 2018-02-02 2019-01-28
JP1626667S (fr) * 2018-02-02 2019-03-18
JP1623280S (fr) * 2018-02-02 2019-01-28
JP1623279S (fr) * 2018-02-02 2019-01-28
JP1622970S (fr) * 2018-02-02 2019-01-28
JP1622969S (fr) * 2018-02-02 2019-01-28
JP1624757S (fr) * 2018-05-16 2019-02-18
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (fr) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contacteur et dispositif de connexion électrique
KR101058146B1 (ko) * 2009-11-11 2011-08-24 하이콘 주식회사 스프링 콘택트 및 스프링 콘택트 내장 소켓
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
JP5352525B2 (ja) 2010-04-28 2013-11-27 日本航空電子工業株式会社 プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5699899B2 (ja) * 2011-10-14 2015-04-15 オムロン株式会社 接触子
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Also Published As

Publication number Publication date
USD776552S1 (en) 2017-01-17
JP1529608S (fr) 2015-07-27

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