|
US4634968A
(en)
*
|
1982-12-20 |
1987-01-06 |
The Narda Microwave Corporation |
Wide range radiation monitor
|
|
US4740746A
(en)
*
|
1984-11-13 |
1988-04-26 |
Tektronix, Inc. |
Controlled impedance microcircuit probe
|
|
US4716365A
(en)
*
|
1985-10-11 |
1987-12-29 |
Lisle Corporation |
Circuit tester
|
|
USD311346S
(en)
*
|
1987-09-25 |
1990-10-16 |
Q.A. Technology Company |
Electronic test probe
|
|
US5172051A
(en)
*
|
1991-04-24 |
1992-12-15 |
Hewlett-Packard Company |
Wide bandwidth passive probe
|
|
USD397052S
(en)
*
|
1997-04-08 |
1998-08-18 |
Societe Chauvin Arnoux |
Test lead
|
|
US7208971B2
(en)
*
|
2002-10-15 |
2007-04-24 |
General Electric Company |
Manual probe carriage system and method of using the same
|
|
US9046568B2
(en)
*
|
2009-03-27 |
2015-06-02 |
Essai, Inc. |
Universal spring contact pin and IC test socket therefor
|
|
CN102004173B
(zh)
*
|
2009-09-01 |
2014-02-19 |
鸿富锦精密工业（深圳）有限公司 |
探针
|
|
TWI421504B
(zh)
*
|
2010-07-02 |
2014-01-01 |
Isc Co Ltd |
測試用的測試探針以及其製造方法
|
|
US8912803B2
(en)
*
|
2011-09-19 |
2014-12-16 |
Honeywell International, Inc. |
Electrostatic shielding technique on high voltage diodes
|
|
WO2013154738A1
(fr)
*
|
2012-04-13 |
2013-10-17 |
Delaware Capital Formation, Inc. |
Ensemble sonde de test et procédés associés
|
|
JP6011103B2
(ja)
*
|
2012-07-23 |
2016-10-19 |
山一電機株式会社 |
コンタクトプローブ及びそれを備えた半導体素子用ソケット
|
|
USD686098S1
(en)
*
|
2012-11-14 |
2013-07-16 |
Agar Corporation Ltd. |
Antenna detection probe for a storage tank
|
|
JP6269337B2
(ja)
*
|
2014-06-16 |
2018-01-31 |
オムロン株式会社 |
プローブピン、および、これを用いた電子デバイス
|
|
JP1529605S
(fr)
*
|
2014-12-15 |
2015-07-27 |
|
|
|
JP1529608S
(fr)
*
|
2014-12-15 |
2015-07-27 |
|
|
|
JP1529607S
(fr)
*
|
2014-12-15 |
2015-07-27 |
|
|
|
JP1529612S
(fr)
*
|
2014-12-19 |
2015-07-27 |
|
|
|
US10241133B2
(en)
*
|
2014-12-31 |
2019-03-26 |
Tektronix, Inc. |
Probe tip and probe assembly
|
|
US9810715B2
(en)
*
|
2014-12-31 |
2017-11-07 |
Tektronix, Inc. |
High impedance compliant probe tip
|