JP1622969S - - Google Patents
Info
- Publication number
- JP1622969S JP1622969S JPD2018-2098F JP2018002098F JP1622969S JP 1622969 S JP1622969 S JP 1622969S JP 2018002098 F JP2018002098 F JP 2018002098F JP 1622969 S JP1622969 S JP 1622969S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2018-2098F JP1622969S (fr) | 2018-02-02 | 2018-02-02 | |
| US29/658,651 USD873684S1 (en) | 2018-02-02 | 2018-08-01 | Electric contact |
| TW107304474F TWD195360S (zh) | 2018-02-02 | 2018-08-01 | 電性接觸子之部分 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2018-2098F JP1622969S (fr) | 2018-02-02 | 2018-02-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1622969S true JP1622969S (fr) | 2019-01-28 |
Family
ID=65237648
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JPD2018-2098F Active JP1622969S (fr) | 2018-02-02 | 2018-02-02 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD873684S1 (fr) |
| JP (1) | JP1622969S (fr) |
| TW (1) | TWD195360S (fr) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP1682139S (fr) * | 2020-10-06 | 2021-08-30 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4634968A (en) * | 1982-12-20 | 1987-01-06 | The Narda Microwave Corporation | Wide range radiation monitor |
| US4740746A (en) * | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
| US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
| USD311346S (en) * | 1987-09-25 | 1990-10-16 | Q.A. Technology Company | Electronic test probe |
| US5172051A (en) * | 1991-04-24 | 1992-12-15 | Hewlett-Packard Company | Wide bandwidth passive probe |
| USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
| US7208971B2 (en) * | 2002-10-15 | 2007-04-24 | General Electric Company | Manual probe carriage system and method of using the same |
| US9046568B2 (en) * | 2009-03-27 | 2015-06-02 | Essai, Inc. | Universal spring contact pin and IC test socket therefor |
| CN102004173B (zh) * | 2009-09-01 | 2014-02-19 | 鸿富锦精密工业（深圳）有限公司 | 探针 |
| TWI421504B (zh) * | 2010-07-02 | 2014-01-01 | Isc Co Ltd | 測試用的測試探針以及其製造方法 |
| US8912803B2 (en) * | 2011-09-19 | 2014-12-16 | Honeywell International, Inc. | Electrostatic shielding technique on high voltage diodes |
| EP2836847B1 (fr) * | 2012-04-13 | 2016-05-18 | Delaware Capital Formation, Inc. | Ensemble sonde de test et procédés associés |
| JP6011103B2 (ja) * | 2012-07-23 | 2016-10-19 | 山一電機株式会社 | コンタクトプローブ及びそれを備えた半導体素子用ソケット |
| USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
| JP6269337B2 (ja) * | 2014-06-16 | 2018-01-31 | オムロン株式会社 | プローブピン、および、これを用いた電子デバイス |
| JP1529608S (fr) * | 2014-12-15 | 2015-07-27 | ||
| JP1529605S (fr) * | 2014-12-15 | 2015-07-27 | ||
| JP1529607S (fr) * | 2014-12-15 | 2015-07-27 | ||
| JP1529612S (fr) * | 2014-12-19 | 2015-07-27 | ||
| US10241133B2 (en) * | 2014-12-31 | 2019-03-26 | Tektronix, Inc. | Probe tip and probe assembly |
| US9810715B2 (en) * | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
-
2018
- 2018-02-02 JP JPD2018-2098F patent/JP1622969S/ja active Active
- 2018-08-01 US US29/658,651 patent/USD873684S1/en active Active
- 2018-08-01 TW TW107304474F patent/TWD195360S/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| TWD195360S (zh) | 2019-01-11 |
| USD873684S1 (en) | 2020-01-28 |