JP1626667S - - Google Patents
Info
- Publication number
- JP1626667S JP1626667S JPD2018-2094F JP2018002094F JP1626667S JP 1626667 S JP1626667 S JP 1626667S JP 2018002094 F JP2018002094 F JP 2018002094F JP 1626667 S JP1626667 S JP 1626667S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2018-2094F JP1626667S (fr) | 2018-02-02 | 2018-02-02 | |
US29/658,647 USD873160S1 (en) | 2018-02-02 | 2018-08-01 | Electric contact |
TW107304472D01F TWD197821S (zh) | 2018-02-02 | 2018-08-02 | 電性接觸子之部分 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2018-2094F JP1626667S (fr) | 2018-02-02 | 2018-02-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP1626667S true JP1626667S (fr) | 2019-03-18 |
Family
ID=65718861
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JPD2018-2094F Active JP1626667S (fr) | 2018-02-02 | 2018-02-02 |
Country Status (3)
Country | Link |
---|---|
US (1) | USD873160S1 (fr) |
JP (1) | JP1626667S (fr) |
TW (1) | TWD197821S (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP1682139S (fr) * | 2020-10-06 | 2021-08-30 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4634968A (en) * | 1982-12-20 | 1987-01-06 | The Narda Microwave Corporation | Wide range radiation monitor |
US4740746A (en) * | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
USD311346S (en) * | 1987-09-25 | 1990-10-16 | Q.A. Technology Company | Electronic test probe |
US5172051A (en) * | 1991-04-24 | 1992-12-15 | Hewlett-Packard Company | Wide bandwidth passive probe |
USD397052S (en) * | 1997-04-08 | 1998-08-18 | Societe Chauvin Arnoux | Test lead |
US7208971B2 (en) * | 2002-10-15 | 2007-04-24 | General Electric Company | Manual probe carriage system and method of using the same |
US9046568B2 (en) * | 2009-03-27 | 2015-06-02 | Essai, Inc. | Universal spring contact pin and IC test socket therefor |
CN102004173B (zh) * | 2009-09-01 | 2014-02-19 | 鸿富锦精密工业(深圳)有限公司 | 探针 |
TWI421504B (zh) * | 2010-07-02 | 2014-01-01 | Isc Co Ltd | 測試用的測試探針以及其製造方法 |
US8912803B2 (en) * | 2011-09-19 | 2014-12-16 | Honeywell International, Inc. | Electrostatic shielding technique on high voltage diodes |
TWD150990S (zh) | 2012-03-27 | 2012-12-21 | 欣興電子股份有限公司 | 針格陣列的針腳 |
EP2836847B1 (fr) * | 2012-04-13 | 2016-05-18 | Delaware Capital Formation, Inc. | Ensemble sonde de test et procédés associés |
JP6011103B2 (ja) * | 2012-07-23 | 2016-10-19 | 山一電機株式会社 | コンタクトプローブ及びそれを備えた半導体素子用ソケット |
USD686098S1 (en) * | 2012-11-14 | 2013-07-16 | Agar Corporation Ltd. | Antenna detection probe for a storage tank |
JP6269337B2 (ja) * | 2014-06-16 | 2018-01-31 | オムロン株式会社 | プローブピン、および、これを用いた電子デバイス |
JP1529608S (fr) * | 2014-12-15 | 2015-07-27 | ||
JP1529605S (fr) * | 2014-12-15 | 2015-07-27 | ||
JP1529607S (fr) * | 2014-12-15 | 2015-07-27 | ||
JP1529612S (fr) * | 2014-12-19 | 2015-07-27 | ||
US10241133B2 (en) * | 2014-12-31 | 2019-03-26 | Tektronix, Inc. | Probe tip and probe assembly |
US9810715B2 (en) * | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
-
2018
- 2018-02-02 JP JPD2018-2094F patent/JP1626667S/ja active Active
- 2018-08-01 US US29/658,647 patent/USD873160S1/en active Active
- 2018-08-02 TW TW107304472D01F patent/TWD197821S/zh unknown
Also Published As
Publication number | Publication date |
---|---|
TWD197821S (zh) | 2019-06-01 |
USD873160S1 (en) | 2020-01-21 |