TW568350U - Planarized final passivation for semiconductor devices - Google Patents

Planarized final passivation for semiconductor devices

Info

Publication number
TW568350U
TW568350U TW090200219U TW90200219U TW568350U TW 568350 U TW568350 U TW 568350U TW 090200219 U TW090200219 U TW 090200219U TW 90200219 U TW90200219 U TW 90200219U TW 568350 U TW568350 U TW 568350U
Authority
TW
Taiwan
Prior art keywords
semiconductor devices
final passivation
planarized
planarized final
passivation
Prior art date
Application number
TW090200219U
Other languages
English (en)
Inventor
James Gardner Ryan
Alexander Mitwalsky
Katsuya Okumura
Original Assignee
Ibm
Siemens Ag
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm, Siemens Ag, Toshiba Corp filed Critical Ibm
Publication of TW568350U publication Critical patent/TW568350U/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3157—Partial encapsulation or coating
    • H01L23/3171—Partial encapsulation or coating the coating being directly applied to the semiconductor body, e.g. passivation layer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/5329—Insulating materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Formation Of Insulating Films (AREA)
  • Local Oxidation Of Silicon (AREA)
TW090200219U 1995-08-23 1996-08-07 Planarized final passivation for semiconductor devices TW568350U (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/518,209 US6376911B1 (en) 1995-08-23 1995-08-23 Planarized final passivation for semiconductor devices

Publications (1)

Publication Number Publication Date
TW568350U true TW568350U (en) 2003-12-21

Family

ID=24063021

Family Applications (1)

Application Number Title Priority Date Filing Date
TW090200219U TW568350U (en) 1995-08-23 1996-08-07 Planarized final passivation for semiconductor devices

Country Status (5)

Country Link
US (1) US6376911B1 (zh)
EP (1) EP0759635A3 (zh)
JP (1) JPH09120963A (zh)
KR (1) KR100327721B1 (zh)
TW (1) TW568350U (zh)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0182006B1 (ko) * 1995-11-10 1999-04-15 김광호 반도체 패키지 장치 및 몰딩물질에 의해 발생하는 기생용량의 산출방법
JP3305211B2 (ja) 1996-09-10 2002-07-22 松下電器産業株式会社 半導体装置及びその製造方法
EP1387394A3 (en) * 1997-04-15 2004-04-07 STMicroelectronics S.r.l. Process of final passivation of integrated circuit devices
US6271141B2 (en) * 1999-03-23 2001-08-07 Micron Technology, Inc. Methods of forming materials over uneven surface topologies, and methods of forming insulative materials over and between conductive lines
US6358862B1 (en) * 1999-09-02 2002-03-19 Micron Technology, Inc Passivation integrity improvements
DE10059935A1 (de) * 2000-11-28 2002-06-06 Infineon Technologies Ag Dicht gepackte Halbleiterstruktur und Verfahren zum Herstellen einer solchen
KR100503527B1 (ko) * 2003-02-12 2005-07-26 삼성전자주식회사 퍼하이드로 폴리실라잔을 포함하는 반도체 소자 제조용조성물 및 이를 이용한 반도체 소자의 제조방법
US7279353B2 (en) * 2003-04-02 2007-10-09 Micron Technology, Inc. Passivation planarization
CN101765913B (zh) * 2007-07-30 2012-10-03 Nxp股份有限公司 底部粗糙度减小的半导体部件的应力缓冲元件
JP2011216771A (ja) * 2010-04-01 2011-10-27 Rohm Co Ltd 半導体装置およびその製造方法
CN102592989B (zh) * 2011-01-07 2015-04-08 中国科学院微电子研究所 层间电介质的近界面平坦化回刻方法
US20150206794A1 (en) * 2014-01-17 2015-07-23 Taiwan Semiconductor Manufacturing Company, Ltd. Method for Removing Micro Scratches In Chemical Mechanical Polishing Processes
EA029641B1 (ru) * 2015-02-04 2018-04-30 Открытое акционерное общество "ИНТЕГРАЛ"-управляющая компания холдинга "ИНТЕГРАЛ" Металлизация интегральной схемы
GB2575888B (en) * 2018-10-03 2020-09-23 X Fab Sarawak Sdn Bhd Improvements relating to passivation layers

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3838442A (en) * 1970-04-15 1974-09-24 Ibm Semiconductor structure having metallization inlaid in insulating layers and method for making same
US3760242A (en) * 1972-03-06 1973-09-18 Ibm Coated semiconductor structures and methods of forming protective coverings on such structures
US4091407A (en) 1976-11-01 1978-05-23 Rca Corporation Combination glass/low temperature deposited Siw Nx Hy O.sub.z
US4091406A (en) 1976-11-01 1978-05-23 Rca Corporation Combination glass/low temperature deposited Siw Nx Hy O.sub.z
JPS62177927A (ja) 1986-01-31 1987-08-04 Nec Corp 半導体集積回路装置の製造方法
US5065222A (en) * 1987-11-11 1991-11-12 Seiko Instruments Inc. Semiconductor device having two-layered passivation film
US5166101A (en) 1989-09-28 1992-11-24 Applied Materials, Inc. Method for forming a boron phosphorus silicate glass composite layer on a semiconductor wafer
JPH03209823A (ja) 1990-01-12 1991-09-12 Nec Corp 樹脂封止型半導体装置
CA2056456C (en) 1991-08-14 2001-05-08 Luc Ouellet High performance passivation for semiconductor devices
US5849632A (en) 1991-08-30 1998-12-15 Micron Technology, Inc. Method of passivating semiconductor wafers
JPH0661498A (ja) * 1992-08-05 1994-03-04 Nec Corp 不揮発性半導体記憶装置
US5393708A (en) 1992-10-08 1995-02-28 Industrial Technology Research Institute Inter-metal-dielectric planarization process
US5312512A (en) 1992-10-23 1994-05-17 Ncr Corporation Global planarization using SOG and CMP
US5268330A (en) 1992-12-11 1993-12-07 International Business Machines Corporation Process for improving sheet resistance of an integrated circuit device gate
JP2776457B2 (ja) * 1992-12-29 1998-07-16 インターナショナル・ビジネス・マシーンズ・コーポレイション 半導体デバイスのクラックストップ形成方法及び半導体デバイス
JP3209823B2 (ja) 1993-04-12 2001-09-17 株式会社ザナヴィ・インフォマティクス 車載用ナビゲーション装置
US5366850A (en) 1993-04-14 1994-11-22 Industrial Technology Research Institute Submicron planarization process with passivation on metal line
US5356513A (en) * 1993-04-22 1994-10-18 International Business Machines Corporation Polishstop planarization method and structure
US5561319A (en) * 1993-05-14 1996-10-01 Lsi Logic Corporation Integrated circuit structure including CMOS devices protected by patterned nitride passivation and method for the fabrication thereof
JPH0738068A (ja) * 1993-06-28 1995-02-07 Mitsubishi Electric Corp 半導体装置およびその製造方法
US5366911A (en) * 1994-05-11 1994-11-22 United Microelectronics Corporation VLSI process with global planarization

Also Published As

Publication number Publication date
EP0759635A3 (en) 1999-03-24
US6376911B1 (en) 2002-04-23
EP0759635A2 (en) 1997-02-26
KR100327721B1 (ko) 2002-07-27
KR970013071A (ko) 1997-03-29
JPH09120963A (ja) 1997-05-06

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MK4K Expiration of patent term of a granted utility model