TW512223B - Method and equipment for evaluating liquid crystal panel - Google Patents
Method and equipment for evaluating liquid crystal panel Download PDFInfo
- Publication number
- TW512223B TW512223B TW090121508A TW90121508A TW512223B TW 512223 B TW512223 B TW 512223B TW 090121508 A TW090121508 A TW 090121508A TW 90121508 A TW90121508 A TW 90121508A TW 512223 B TW512223 B TW 512223B
- Authority
- TW
- Taiwan
- Prior art keywords
- liquid crystal
- light
- crystal panel
- crystal layer
- detection
- Prior art date
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 276
- 238000000034 method Methods 0.000 title claims abstract description 21
- 230000003287 optical effect Effects 0.000 claims abstract description 46
- 230000010287 polarization Effects 0.000 claims abstract description 34
- 238000010521 absorption reaction Methods 0.000 claims abstract description 7
- 238000001514 detection method Methods 0.000 claims description 99
- 238000011156 evaluation Methods 0.000 claims description 82
- 238000001228 spectrum Methods 0.000 claims description 25
- 230000005540 biological transmission Effects 0.000 claims description 17
- 230000003595 spectral effect Effects 0.000 claims description 12
- 230000001678 irradiating effect Effects 0.000 claims description 5
- 230000002079 cooperative effect Effects 0.000 claims description 4
- 238000004806 packaging method and process Methods 0.000 claims 1
- 238000007796 conventional method Methods 0.000 abstract description 2
- 239000000758 substrate Substances 0.000 description 33
- 238000012545 processing Methods 0.000 description 13
- 230000006870 function Effects 0.000 description 12
- 230000008859 change Effects 0.000 description 8
- 238000005259 measurement Methods 0.000 description 8
- 230000001681 protective effect Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 230000000875 corresponding effect Effects 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 6
- 239000006185 dispersion Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000004611 spectroscopical analysis Methods 0.000 description 5
- 238000012937 correction Methods 0.000 description 4
- 238000007689 inspection Methods 0.000 description 4
- 238000004040 coloring Methods 0.000 description 3
- 230000031700 light absorption Effects 0.000 description 3
- 239000013307 optical fiber Substances 0.000 description 3
- 239000003566 sealing material Substances 0.000 description 3
- 238000010276 construction Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000013589 supplement Substances 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 230000009469 supplementation Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000355947A JP2002162360A (ja) | 2000-11-22 | 2000-11-22 | 液晶パネルの評価方法及び評価装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW512223B true TW512223B (en) | 2002-12-01 |
Family
ID=18828275
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW090121508A TW512223B (en) | 2000-11-22 | 2001-08-30 | Method and equipment for evaluating liquid crystal panel |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6724215B2 (OSRAM) |
| JP (1) | JP2002162360A (OSRAM) |
| KR (1) | KR20020040582A (OSRAM) |
| CN (1) | CN100380193C (OSRAM) |
| TW (1) | TW512223B (OSRAM) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102566092A (zh) * | 2010-12-16 | 2012-07-11 | 财团法人工业技术研究院 | 测定液晶参数的方法及装置 |
| TWI422812B (zh) * | 2006-12-19 | 2014-01-11 | Toppan Printing Co Ltd | 彩色濾光片之評價方法、彩色濾光片及液晶顯示裝置 |
| US10854974B2 (en) | 2016-02-19 | 2020-12-01 | Hewlett-Packard Development Company, L.P. | Antenna portions |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7079245B2 (en) * | 2000-12-14 | 2006-07-18 | Mitsubishi Denki Kabushiki Kaisha | Method and apparatus for detecting gap of liquid-crystal panel and apparatus therefor |
| US7006233B2 (en) * | 2003-01-13 | 2006-02-28 | Intel Corporation | Method of detecting a distortion on a surface |
| JP2005339444A (ja) * | 2004-05-31 | 2005-12-08 | Toshiba Matsushita Display Technology Co Ltd | 表示装置 |
| JP3925811B2 (ja) * | 2004-09-13 | 2007-06-06 | セイコーエプソン株式会社 | 液晶パネルの試験方法及び試験装置 |
| WO2006124007A1 (en) * | 2005-05-20 | 2006-11-23 | Conoptix Ab | Method and apparatus for in-line inspection and mapping liquid crystal cell gap |
| CN100395587C (zh) * | 2005-05-23 | 2008-06-18 | 友达光电股份有限公司 | 液晶显示器的检查装置 |
| JP2007212260A (ja) * | 2006-02-09 | 2007-08-23 | Mitsubishi Electric Corp | 反射率測定装置、反射率測定方法及び表示パネルの製造方法 |
| CN101078666B (zh) * | 2006-05-26 | 2010-09-01 | 鸿富锦精密工业（深圳）有限公司 | 反射式显示设备检测装置及方法 |
| WO2008001954A1 (en) * | 2006-06-30 | 2008-01-03 | Nippon Sheet Glass Company, Limited | Glass substrate for reflecting mirror, reflecting mirror having the glass substrate, glass substrate for liquid crystal panel, and liquid crystal panel having the glass substrate |
| JP5585837B2 (ja) * | 2010-11-24 | 2014-09-10 | 横河電機株式会社 | 膜厚測定方法および装置 |
| EP2703773B1 (de) * | 2012-08-28 | 2014-12-24 | Texmag GmbH Vertriebsgesellschaft | Sensor zum Erfassen einer laufenden Warenbahn |
| CN102853905B (zh) * | 2012-09-29 | 2015-11-25 | 京东方科技集团股份有限公司 | 一种光强测试设备 |
| CN103323961B (zh) * | 2013-06-04 | 2015-04-01 | 国家电网公司 | 一种电能表液晶屏检测装置及检测方法 |
| CN103558188B (zh) * | 2013-07-11 | 2016-03-02 | 福建华映显示科技有限公司 | 侦测装置及侦测方法 |
| US9870451B1 (en) * | 2014-11-25 | 2018-01-16 | Emmi Solutions, Llc | Dynamic management, assembly, and presentation of web-based content |
| KR102250032B1 (ko) * | 2014-12-29 | 2021-05-12 | 삼성디스플레이 주식회사 | 표시 장치의 검사 장치 및 표시 장치의 검사 방법 |
| CN105091764A (zh) * | 2015-09-06 | 2015-11-25 | 苏州南光电子科技有限公司 | 基于激光和ccd的玻璃厚度测量系统的测量方法 |
| WO2017078127A1 (ja) * | 2015-11-05 | 2017-05-11 | 有限会社ビジョンサイテック | 偏光された平行光により基板を評価することを含む方法 |
| EP3214462B1 (en) * | 2016-03-04 | 2021-04-28 | ams AG | Optical sensor arrangement |
| TWI689721B (zh) * | 2017-02-17 | 2020-04-01 | 特銓股份有限公司 | 基於利用光學技術掃描透明板材表面污染之方法及其系統 |
| US11133580B2 (en) * | 2017-06-22 | 2021-09-28 | Innolux Corporation | Antenna device |
| CN109282969B (zh) * | 2018-10-08 | 2020-04-03 | 惠州市华星光电技术有限公司 | 偏光度的测量方法 |
| JP7103159B2 (ja) * | 2018-10-29 | 2022-07-20 | コニカミノルタ株式会社 | 光学特性評価方法及び光学特性評価システム |
| CN114112317B (zh) * | 2020-08-31 | 2024-09-17 | 京东方科技集团股份有限公司 | 显示屏幕的检测方法及检测装置 |
| CN112180238A (zh) * | 2020-09-25 | 2021-01-05 | 贵州航天计量测试技术研究所 | 一种基于液晶相变的集成电路内部短路失效定位方法 |
| JP7716704B1 (ja) * | 2025-04-08 | 2025-08-01 | 高知県公立大学法人 | 試料測定装置 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02116703A (ja) * | 1988-10-27 | 1990-05-01 | Matsushita Electric Ind Co Ltd | ガラス基板上の回路パターンの検査装置 |
| JPH0453929A (ja) * | 1990-06-22 | 1992-02-21 | Fujitsu Ltd | 反射型液晶装置 |
| EP0470817A3 (en) * | 1990-08-09 | 1992-11-25 | Seiko Epson Corporation | Liquid crystal electro-optical device |
| JPH05273137A (ja) * | 1992-03-26 | 1993-10-22 | Sigma Tec:Kk | 表面欠陥検査装置 |
| US5517027A (en) * | 1993-06-08 | 1996-05-14 | Mitsubishi Denki Kabushiki Kaisha | Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these |
| US5844249A (en) * | 1993-12-24 | 1998-12-01 | Hoechst Aktiengesellschaft | Apparatus for detecting defects of wires on a wiring board wherein optical sensor includes a film of polymer non-linear optical material |
| JP3258821B2 (ja) * | 1994-06-02 | 2002-02-18 | 三菱電機株式会社 | 微小異物の位置決め方法、分析方法、これに用いる分析装置およびこれを用いた半導体素子もしくは液晶表示素子の製法 |
| JP2685425B2 (ja) * | 1994-09-30 | 1997-12-03 | 株式会社東芝 | 液晶素子評価方法 |
| US5737047A (en) * | 1995-03-27 | 1998-04-07 | Casio Computer Co., Ltd. | Color liquid crystal display device with optical axes of retardation polarization plates set in an opposite direction of twist direction of LC molecules |
| JP2703524B2 (ja) * | 1995-10-12 | 1998-01-26 | 株式会社東芝 | 液晶素子評価方法および評価装置 |
| JPH09179112A (ja) * | 1995-12-21 | 1997-07-11 | Citizen Watch Co Ltd | 液晶表示装置 |
| US6088115A (en) * | 1996-06-05 | 2000-07-11 | Canon Kabushiki Kaisha | Apparatus and method for measuring optical anisotropy |
| JPH10160683A (ja) * | 1996-11-29 | 1998-06-19 | Matsushita Electric Ind Co Ltd | 異物検査方法とその装置 |
| JPH10260403A (ja) * | 1997-01-20 | 1998-09-29 | Seiko Epson Corp | 液晶装置及び電子機器 |
| JP4136067B2 (ja) * | 1997-05-02 | 2008-08-20 | キヤノン株式会社 | 検出装置及びそれを用いた露光装置 |
| JP3507319B2 (ja) * | 1997-12-08 | 2004-03-15 | キヤノン株式会社 | 光学的特性測定装置 |
| KR100612986B1 (ko) * | 1998-06-05 | 2007-02-05 | 삼성전자주식회사 | 액정 표시 장치의 복굴절 위상차 및 셀 간격 측정 장치 |
| JP2000081371A (ja) * | 1998-09-07 | 2000-03-21 | Nec Corp | 薄膜分子配向評価方法、評価装置及び記録媒体 |
| JP2001290118A (ja) * | 2000-01-31 | 2001-10-19 | Sharp Corp | 液晶層の厚み測定方法および厚み測定装置 |
-
2000
- 2000-11-22 JP JP2000355947A patent/JP2002162360A/ja not_active Withdrawn
-
2001
- 2001-08-30 TW TW090121508A patent/TW512223B/zh not_active IP Right Cessation
- 2001-11-21 US US09/990,094 patent/US6724215B2/en not_active Expired - Fee Related
- 2001-11-21 CN CNB011393408A patent/CN100380193C/zh not_active Expired - Fee Related
- 2001-11-21 KR KR1020010072575A patent/KR20020040582A/ko not_active Ceased
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI422812B (zh) * | 2006-12-19 | 2014-01-11 | Toppan Printing Co Ltd | 彩色濾光片之評價方法、彩色濾光片及液晶顯示裝置 |
| CN102566092A (zh) * | 2010-12-16 | 2012-07-11 | 财团法人工业技术研究院 | 测定液晶参数的方法及装置 |
| CN102566092B (zh) * | 2010-12-16 | 2014-09-24 | 财团法人工业技术研究院 | 测定液晶参数的方法及装置 |
| US10854974B2 (en) | 2016-02-19 | 2020-12-01 | Hewlett-Packard Development Company, L.P. | Antenna portions |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100380193C (zh) | 2008-04-09 |
| KR20020040582A (ko) | 2002-05-30 |
| JP2002162360A (ja) | 2002-06-07 |
| CN1354360A (zh) | 2002-06-19 |
| US20020080307A1 (en) | 2002-06-27 |
| US6724215B2 (en) | 2004-04-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |