TW502427B - Semiconductor device with malfunction control circuit and controlling method thereof - Google Patents
Semiconductor device with malfunction control circuit and controlling method thereof Download PDFInfo
- Publication number
- TW502427B TW502427B TW089111722A TW89111722A TW502427B TW 502427 B TW502427 B TW 502427B TW 089111722 A TW089111722 A TW 089111722A TW 89111722 A TW89111722 A TW 89111722A TW 502427 B TW502427 B TW 502427B
- Authority
- TW
- Taiwan
- Prior art keywords
- chip
- signal
- fuse
- patent application
- scope
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 28
- 238000000034 method Methods 0.000 title claims abstract description 25
- 230000007257 malfunction Effects 0.000 title claims abstract description 22
- 230000002950 deficient Effects 0.000 claims abstract description 47
- 238000012360 testing method Methods 0.000 claims abstract description 25
- 238000004519 manufacturing process Methods 0.000 claims abstract description 16
- 230000007547 defect Effects 0.000 claims abstract description 10
- 235000012431 wafers Nutrition 0.000 claims description 68
- 239000000872 buffer Substances 0.000 claims description 39
- 238000007493 shaping process Methods 0.000 claims description 6
- 230000006870 function Effects 0.000 description 11
- 230000008569 process Effects 0.000 description 8
- 239000013078 crystal Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 239000000047 product Substances 0.000 description 6
- 230000008439 repair process Effects 0.000 description 6
- 230000004044 response Effects 0.000 description 5
- 230000009471 action Effects 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 239000012467 final product Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 206010029412 Nightmare Diseases 0.000 description 1
- 208000003251 Pruritus Diseases 0.000 description 1
- 241000270666 Testudines Species 0.000 description 1
- 241000270708 Testudinidae Species 0.000 description 1
- 229910052770 Uranium Inorganic materials 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000009194 climbing Effects 0.000 description 1
- 230000009849 deactivation Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011017 operating method Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- E—FIXED CONSTRUCTIONS
- E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
- E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
- E05D7/00—Hinges or pivots of special construction
- E05D7/04—Hinges adjustable relative to the wing or the frame
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47B—TABLES; DESKS; OFFICE FURNITURE; CABINETS; DRAWERS; GENERAL DETAILS OF FURNITURE
- A47B2220/00—General furniture construction, e.g. fittings
- A47B2220/0061—Accessories
- A47B2220/0069—Hinges
- A47B2220/0072—Hinges for furniture
-
- E—FIXED CONSTRUCTIONS
- E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
- E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
- E05D7/00—Hinges or pivots of special construction
- E05D7/04—Hinges adjustable relative to the wing or the frame
- E05D2007/0469—Hinges adjustable relative to the wing or the frame in an axial direction
-
- E—FIXED CONSTRUCTIONS
- E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
- E05Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
- E05Y2900/00—Application of doors, windows, wings or fittings thereof
- E05Y2900/20—Application of doors, windows, wings or fittings thereof for furniture, e.g. cabinets
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Semiconductor Integrated Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
- Read Only Memory (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019990023426A KR100361082B1 (ko) | 1999-06-22 | 1999-06-22 | 칩 동작불능 제어회로를 구비한 반도체 소자 및 칩 동작불능 제어방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW502427B true TW502427B (en) | 2002-09-11 |
Family
ID=19594113
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW089111722A TW502427B (en) | 1999-06-22 | 2000-06-15 | Semiconductor device with malfunction control circuit and controlling method thereof |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP2001014886A (ja) |
| KR (1) | KR100361082B1 (ja) |
| TW (1) | TW502427B (ja) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100475738B1 (ko) * | 2002-09-17 | 2005-03-10 | 삼성전자주식회사 | 칩 동작불능 해제기능을 가지는 반도체 장치 |
| JP4967532B2 (ja) | 2006-08-25 | 2012-07-04 | 富士通セミコンダクター株式会社 | 半導体集積回路および半導体集積回路のテスト方法 |
| CN110763969A (zh) * | 2019-08-08 | 2020-02-07 | 浙江大学 | 发光二极管及太阳能电池老化测试系统 |
-
1999
- 1999-06-22 KR KR1019990023426A patent/KR100361082B1/ko not_active IP Right Cessation
-
2000
- 2000-06-08 JP JP2000172463A patent/JP2001014886A/ja active Pending
- 2000-06-15 TW TW089111722A patent/TW502427B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR20010003220A (ko) | 2001-01-15 |
| JP2001014886A (ja) | 2001-01-19 |
| KR100361082B1 (ko) | 2002-11-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |