KR100361082B1 - 칩 동작불능 제어회로를 구비한 반도체 소자 및 칩 동작불능 제어방법 - Google Patents

칩 동작불능 제어회로를 구비한 반도체 소자 및 칩 동작불능 제어방법 Download PDF

Info

Publication number
KR100361082B1
KR100361082B1 KR1019990023426A KR19990023426A KR100361082B1 KR 100361082 B1 KR100361082 B1 KR 100361082B1 KR 1019990023426 A KR1019990023426 A KR 1019990023426A KR 19990023426 A KR19990023426 A KR 19990023426A KR 100361082 B1 KR100361082 B1 KR 100361082B1
Authority
KR
South Korea
Prior art keywords
chip
fuse
signal
integrated circuit
semiconductor integrated
Prior art date
Application number
KR1019990023426A
Other languages
English (en)
Korean (ko)
Other versions
KR20010003220A (ko
Inventor
강상석
신경선
강기상
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR1019990023426A priority Critical patent/KR100361082B1/ko
Priority to JP2000172463A priority patent/JP2001014886A/ja
Priority to TW089111722A priority patent/TW502427B/zh
Publication of KR20010003220A publication Critical patent/KR20010003220A/ko
Priority to US10/277,573 priority patent/US6972612B2/en
Application granted granted Critical
Publication of KR100361082B1 publication Critical patent/KR100361082B1/ko

Links

Classifications

    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00—Hinges or pivots of special construction
    • E05D7/04—Hinges adjustable relative to the wing or the frame
    • A—HUMAN NECESSITIES
    • A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
    • A47B—TABLES; DESKS; OFFICE FURNITURE; CABINETS; DRAWERS; GENERAL DETAILS OF FURNITURE
    • A47B2220/00—General furniture construction, e.g. fittings
    • A47B2220/0061—Accessories
    • A47B2220/0069—Hinges
    • A47B2220/0072—Hinges for furniture
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00—Hinges or pivots of special construction
    • E05D7/04—Hinges adjustable relative to the wing or the frame
    • E05D2007/0469—Hinges adjustable relative to the wing or the frame in an axial direction
    • E—FIXED CONSTRUCTIONS
    • E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2900/00—Application of doors, windows, wings or fittings thereof
    • E05Y2900/20—Application of doors, windows, wings or fittings thereof for furniture, e.g. cabinets

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
KR1019990023426A 1999-06-22 1999-06-22 칩 동작불능 제어회로를 구비한 반도체 소자 및 칩 동작불능 제어방법 KR100361082B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1019990023426A KR100361082B1 (ko) 1999-06-22 1999-06-22 칩 동작불능 제어회로를 구비한 반도체 소자 및 칩 동작불능 제어방법
JP2000172463A JP2001014886A (ja) 1999-06-22 2000-06-08 半導体集積回路装置及びその制御方法
TW089111722A TW502427B (en) 1999-06-22 2000-06-15 Semiconductor device with malfunction control circuit and controlling method thereof
US10/277,573 US6972612B2 (en) 1999-06-22 2002-10-21 Semiconductor device with malfunction control circuit and controlling method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019990023426A KR100361082B1 (ko) 1999-06-22 1999-06-22 칩 동작불능 제어회로를 구비한 반도체 소자 및 칩 동작불능 제어방법

Publications (2)

Publication Number Publication Date
KR20010003220A KR20010003220A (ko) 2001-01-15
KR100361082B1 true KR100361082B1 (ko) 2002-11-18

Family

ID=19594113

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019990023426A KR100361082B1 (ko) 1999-06-22 1999-06-22 칩 동작불능 제어회로를 구비한 반도체 소자 및 칩 동작불능 제어방법

Country Status (3)

Country Link
JP (1) JP2001014886A (ja)
KR (1) KR100361082B1 (ja)
TW (1) TW502427B (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100475738B1 (ko) * 2002-09-17 2005-03-10 삼성전자주식회사 칩 동작불능 해제기능을 가지는 반도체 장치
JP4967532B2 (ja) * 2006-08-25 2012-07-04 富士通セミコンダクター株式会社 半導体集積回路および半導体集積回路のテスト方法
CN110763969A (zh) * 2019-08-08 2020-02-07 浙江大学 发光二极管及太阳能电池老化测试系统

Also Published As

Publication number Publication date
KR20010003220A (ko) 2001-01-15
JP2001014886A (ja) 2001-01-19
TW502427B (en) 2002-09-11

Similar Documents

Publication Publication Date Title
KR0135108B1 (ko) 스트레스 테스트 회로를 포함하는 반도체 메모리 장치
KR101382563B1 (ko) 레디/비지 제어회로를 구비하는 플래쉬 메모리장치 및 이를테스트하는 방법
US20090196113A1 (en) Fuse circuit and semiconductor memory device including the same
US5909142A (en) Semiconductor integrated circuit device having burn-in test capability and method for using the same
KR101110794B1 (ko) 퓨즈 회로 및 리던던시 회로
US7924646B2 (en) Fuse monitoring circuit for semiconductor memory device
US7697361B2 (en) Apparatus for electrical fuse option in semiconductor integrated circuit
US6859067B2 (en) Semiconductor apparatus
KR100361082B1 (ko) 칩 동작불능 제어회로를 구비한 반도체 소자 및 칩 동작불능 제어방법
KR100378198B1 (ko) 반도체 장치의 모드 제어 회로 및 이를 구비하는 반도체메모리 장치
KR20030088863A (ko) 두개의 내부 전원 기준 전압 발생 회로를 구비한 내부전원 전압 제어 장치
KR100757411B1 (ko) 옵션 퓨즈 회로를 이용한 반도체 메모리 장치의 전압재설정 회로 및 그 방법
US6972612B2 (en) Semiconductor device with malfunction control circuit and controlling method thereof
JP3642555B2 (ja) 半導体装置及びそのテスト方法
US7760566B2 (en) Semiconductor memory device for preventing supply of excess specific stress item and test method thereof
US8395406B2 (en) Integrated circuit architecture for testing variable delay circuit
US5034687A (en) Signature indicating circuit
US6262621B1 (en) Voltage boosting circuit for semiconductor device
KR100475738B1 (ko) 칩 동작불능 해제기능을 가지는 반도체 장치
US6985390B2 (en) Integrated memory circuit having a redundancy circuit and a method for replacing a memory area
US6788087B2 (en) Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit
US6657904B2 (en) Semiconductor device
KR100439104B1 (ko) 안티퓨즈 제어 회로
US7382671B2 (en) Method for detecting column fail by controlling sense amplifier of memory device
KR100480906B1 (ko) 반도체 메모리 소자의 리페어 회로

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20121031

Year of fee payment: 11

FPAY Annual fee payment

Payment date: 20131031

Year of fee payment: 12

LAPS Lapse due to unpaid annual fee