TW476780B - Silicon dioxide containing coating - Google Patents
Silicon dioxide containing coating Download PDFInfo
- Publication number
- TW476780B TW476780B TW088113391A TW88113391A TW476780B TW 476780 B TW476780 B TW 476780B TW 088113391 A TW088113391 A TW 088113391A TW 88113391 A TW88113391 A TW 88113391A TW 476780 B TW476780 B TW 476780B
- Authority
- TW
- Taiwan
- Prior art keywords
- coating
- substrate
- coatings
- silicon
- heated
- Prior art date
Links
- 238000000576 coating method Methods 0.000 title claims abstract description 118
- 239000011248 coating agent Substances 0.000 title claims abstract description 76
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 56
- 239000000377 silicon dioxide Substances 0.000 title claims abstract description 23
- 235000012239 silicon dioxide Nutrition 0.000 title claims abstract description 14
- 239000000758 substrate Substances 0.000 claims abstract description 41
- 239000008199 coating composition Substances 0.000 claims abstract description 23
- 239000012298 atmosphere Substances 0.000 claims abstract description 14
- 230000001590 oxidative effect Effects 0.000 claims abstract description 7
- 238000000034 method Methods 0.000 claims description 45
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 claims description 28
- 239000004793 Polystyrene Substances 0.000 claims description 12
- 229920002223 polystyrene Polymers 0.000 claims description 12
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 11
- 229920005591 polysilicon Polymers 0.000 claims description 11
- 230000008018 melting Effects 0.000 claims description 5
- 238000002844 melting Methods 0.000 claims description 5
- 239000010410 layer Substances 0.000 abstract description 15
- 238000010438 heat treatment Methods 0.000 abstract description 10
- 239000011229 interlayer Substances 0.000 abstract description 3
- 229920003203 poly(dimethylsilylene-co-phenylmethyl- silylene) polymer Polymers 0.000 abstract 2
- 239000000945 filler Substances 0.000 description 39
- 239000000463 material Substances 0.000 description 19
- -1 polysiloxanes Polymers 0.000 description 19
- 239000002243 precursor Substances 0.000 description 16
- 239000002904 solvent Substances 0.000 description 16
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 13
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 12
- 239000011347 resin Substances 0.000 description 12
- 229920005989 resin Polymers 0.000 description 12
- 229910052710 silicon Inorganic materials 0.000 description 12
- 239000010703 silicon Substances 0.000 description 12
- 239000000919 ceramic Substances 0.000 description 11
- 229910052751 metal Inorganic materials 0.000 description 10
- 239000002184 metal Substances 0.000 description 10
- 150000002739 metals Chemical class 0.000 description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 7
- 239000002253 acid Substances 0.000 description 7
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 7
- 229910052802 copper Inorganic materials 0.000 description 7
- 239000010949 copper Substances 0.000 description 7
- 239000007789 gas Substances 0.000 description 7
- 229910052760 oxygen Inorganic materials 0.000 description 7
- 239000001301 oxygen Substances 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 7
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 6
- 239000003054 catalyst Substances 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- 230000003647 oxidation Effects 0.000 description 6
- 238000007254 oxidation reaction Methods 0.000 description 6
- 239000003973 paint Substances 0.000 description 6
- 239000002245 particle Substances 0.000 description 6
- 239000004575 stone Substances 0.000 description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 5
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 5
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 5
- 239000010432 diamond Substances 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
- 229910052719 titanium Inorganic materials 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 4
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 4
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- 125000003545 alkoxy group Chemical group 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 238000005524 ceramic coating Methods 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 230000004907 flux Effects 0.000 description 4
- 239000004615 ingredient Substances 0.000 description 4
- 229910052755 nonmetal Chemical class 0.000 description 4
- 229910052698 phosphorus Inorganic materials 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 229920001721 polyimide Polymers 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 150000003839 salts Chemical class 0.000 description 4
- SCPYDCQAZCOKTP-UHFFFAOYSA-N silanol Chemical compound [SiH3]O SCPYDCQAZCOKTP-UHFFFAOYSA-N 0.000 description 4
- 229910052814 silicon oxide Inorganic materials 0.000 description 4
- 229910052709 silver Inorganic materials 0.000 description 4
- 239000004332 silver Substances 0.000 description 4
- 229910052718 tin Inorganic materials 0.000 description 4
- HGUFODBRKLSHSI-UHFFFAOYSA-N 2,3,7,8-tetrachloro-dibenzo-p-dioxin Chemical compound O1C2=CC(Cl)=C(Cl)C=C2OC2=C1C=C(Cl)C(Cl)=C2 HGUFODBRKLSHSI-UHFFFAOYSA-N 0.000 description 3
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 3
- 239000006087 Silane Coupling Agent Substances 0.000 description 3
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N ammonia Natural products N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 3
- 235000011114 ammonium hydroxide Nutrition 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 3
- 229910001385 heavy metal Inorganic materials 0.000 description 3
- 239000012762 magnetic filler Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000004005 microsphere Substances 0.000 description 3
- 229920001296 polysiloxane Polymers 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- 239000011701 zinc Substances 0.000 description 3
- 229910052725 zinc Inorganic materials 0.000 description 3
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- PMPVIKIVABFJJI-UHFFFAOYSA-N Cyclobutane Chemical compound C1CCC1 PMPVIKIVABFJJI-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 239000005083 Zinc sulfide Substances 0.000 description 2
- HMDDXIMCDZRSNE-UHFFFAOYSA-N [C].[Si] Chemical compound [C].[Si] HMDDXIMCDZRSNE-UHFFFAOYSA-N 0.000 description 2
- UMVBXBACMIOFDO-UHFFFAOYSA-N [N].[Si] Chemical compound [N].[Si] UMVBXBACMIOFDO-UHFFFAOYSA-N 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 2
- 239000012190 activator Substances 0.000 description 2
- 125000000217 alkyl group Chemical group 0.000 description 2
- 230000003064 anti-oxidating effect Effects 0.000 description 2
- 229910052788 barium Inorganic materials 0.000 description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 239000012700 ceramic precursor Substances 0.000 description 2
- 239000004927 clay Substances 0.000 description 2
- 229910017052 cobalt Inorganic materials 0.000 description 2
- 239000010941 cobalt Substances 0.000 description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 2
- 239000000084 colloidal system Substances 0.000 description 2
- 239000012141 concentrate Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- ZSWFCLXCOIISFI-UHFFFAOYSA-N cyclopentadiene Chemical compound C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 description 2
- 238000006298 dechlorination reaction Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- GNEPOXWQWFSSOU-UHFFFAOYSA-N dichloro-methyl-phenylsilane Chemical compound C[Si](Cl)(Cl)C1=CC=CC=C1 GNEPOXWQWFSSOU-UHFFFAOYSA-N 0.000 description 2
- 238000003618 dip coating Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- FWDBOZPQNFPOLF-UHFFFAOYSA-N ethenyl(triethoxy)silane Chemical compound CCO[Si](OCC)(OCC)C=C FWDBOZPQNFPOLF-UHFFFAOYSA-N 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 150000001247 metal acetylides Chemical class 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 239000008267 milk Substances 0.000 description 2
- 210000004080 milk Anatomy 0.000 description 2
- 235000013336 milk Nutrition 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 150000002843 nonmetals Chemical group 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 125000000962 organic group Chemical group 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 229920000052 poly(p-xylylene) Polymers 0.000 description 2
- 239000004576 sand Substances 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 150000004756 silanes Chemical class 0.000 description 2
- 239000002689 soil Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 150000004763 sulfides Chemical class 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 239000011593 sulfur Substances 0.000 description 2
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 2
- 239000011135 tin Substances 0.000 description 2
- 239000004408 titanium dioxide Substances 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910052720 vanadium Inorganic materials 0.000 description 2
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910052984 zinc sulfide Inorganic materials 0.000 description 2
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 2
- 229910000859 α-Fe Inorganic materials 0.000 description 2
- YPFNIPKMNMDDDB-UHFFFAOYSA-K 2-[2-[bis(carboxylatomethyl)amino]ethyl-(2-hydroxyethyl)amino]acetate;iron(3+) Chemical compound [Fe+3].OCCN(CC([O-])=O)CCN(CC([O-])=O)CC([O-])=O YPFNIPKMNMDDDB-UHFFFAOYSA-K 0.000 description 1
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 1
- IHZXTIBMKNSJCJ-UHFFFAOYSA-N 3-{[(4-{[4-(dimethylamino)phenyl](4-{ethyl[(3-sulfophenyl)methyl]amino}phenyl)methylidene}cyclohexa-2,5-dien-1-ylidene)(ethyl)azaniumyl]methyl}benzene-1-sulfonate Chemical compound C=1C=C(C(=C2C=CC(C=C2)=[N+](C)C)C=2C=CC(=CC=2)N(CC)CC=2C=C(C=CC=2)S([O-])(=O)=O)C=CC=1N(CC)CC1=CC=CC(S(O)(=O)=O)=C1 IHZXTIBMKNSJCJ-UHFFFAOYSA-N 0.000 description 1
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 1
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910001339 C alloy Inorganic materials 0.000 description 1
- 239000005046 Chlorosilane Substances 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- HZZVJAQRINQKSD-UHFFFAOYSA-N Clavulanic acid Natural products OC(=O)C1C(=CCO)OC2CC(=O)N21 HZZVJAQRINQKSD-UHFFFAOYSA-N 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 229920000271 Kevlar® Polymers 0.000 description 1
- 239000005909 Kieselgur Substances 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910003962 NiZn Inorganic materials 0.000 description 1
- 241001674048 Phthiraptera Species 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 229910021604 Rhodium(III) chloride Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 208000010513 Stupor Diseases 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 235000009754 Vitis X bourquina Nutrition 0.000 description 1
- 235000012333 Vitis X labruscana Nutrition 0.000 description 1
- 240000006365 Vitis vinifera Species 0.000 description 1
- 235000014787 Vitis vinifera Nutrition 0.000 description 1
- DZPJVKXUWVWEAD-UHFFFAOYSA-N [C].[N].[Si] Chemical compound [C].[N].[Si] DZPJVKXUWVWEAD-UHFFFAOYSA-N 0.000 description 1
- UBMXAAKAFOKSPA-UHFFFAOYSA-N [N].[O].[Si] Chemical compound [N].[O].[Si] UBMXAAKAFOKSPA-UHFFFAOYSA-N 0.000 description 1
- YKTSYUJCYHOUJP-UHFFFAOYSA-N [O--].[Al+3].[Al+3].[O-][Si]([O-])([O-])[O-] Chemical compound [O--].[Al+3].[Al+3].[O-][Si]([O-])([O-])[O-] YKTSYUJCYHOUJP-UHFFFAOYSA-N 0.000 description 1
- VSTCOQVDTHKMFV-UHFFFAOYSA-N [Ti].[Hf] Chemical class [Ti].[Hf] VSTCOQVDTHKMFV-UHFFFAOYSA-N 0.000 description 1
- WIGAYVXYNSVZAV-UHFFFAOYSA-N ac1lavbc Chemical compound [W].[W] WIGAYVXYNSVZAV-UHFFFAOYSA-N 0.000 description 1
- YRKCREAYFQTBPV-UHFFFAOYSA-N acetylacetone Chemical compound CC(=O)CC(C)=O YRKCREAYFQTBPV-UHFFFAOYSA-N 0.000 description 1
- 229910001508 alkali metal halide Inorganic materials 0.000 description 1
- 150000008045 alkali metal halides Chemical class 0.000 description 1
- 150000001336 alkenes Chemical class 0.000 description 1
- 125000003342 alkenyl group Chemical group 0.000 description 1
- 150000001343 alkyl silanes Chemical class 0.000 description 1
- 125000000304 alkynyl group Chemical group 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 239000000908 ammonium hydroxide Substances 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 230000003078 antioxidant effect Effects 0.000 description 1
- 235000006708 antioxidants Nutrition 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 125000003236 benzoyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C(*)=O 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 229910052810 boron oxide Inorganic materials 0.000 description 1
- 230000001680 brushing effect Effects 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 239000001913 cellulose Substances 0.000 description 1
- 229920002678 cellulose Polymers 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- KOPOQZFJUQMUML-UHFFFAOYSA-N chlorosilane Chemical compound Cl[SiH3] KOPOQZFJUQMUML-UHFFFAOYSA-N 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 229940090805 clavulanate Drugs 0.000 description 1
- HZZVJAQRINQKSD-PBFISZAISA-N clavulanic acid Chemical compound OC(=O)[C@H]1C(=C/CO)/O[C@@H]2CC(=O)N21 HZZVJAQRINQKSD-PBFISZAISA-N 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 239000011231 conductive filler Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 150000001879 copper Chemical class 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- CEPJDVVOYPTUTO-UHFFFAOYSA-N cyclobutylsilane Chemical compound [SiH3]C1CCC1 CEPJDVVOYPTUTO-UHFFFAOYSA-N 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 1
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 1
- COVFEVWNJUOYRL-UHFFFAOYSA-M digallate Chemical compound OC1=C(O)C(O)=CC(C(=O)OC=2C(=C(O)C=C(C=2)C([O-])=O)O)=C1 COVFEVWNJUOYRL-UHFFFAOYSA-M 0.000 description 1
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 1
- NJLLQSBAHIKGKF-UHFFFAOYSA-N dipotassium dioxido(oxo)titanium Chemical compound [K+].[K+].[O-][Ti]([O-])=O NJLLQSBAHIKGKF-UHFFFAOYSA-N 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000004945 emulsification Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- WOXXJEVNDJOOLV-UHFFFAOYSA-N ethenyl-tris(2-methoxyethoxy)silane Chemical compound COCCO[Si](OCCOC)(OCCOC)C=C WOXXJEVNDJOOLV-UHFFFAOYSA-N 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 125000003983 fluorenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3CC12)* 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 239000002529 flux (metallurgy) Substances 0.000 description 1
- LNTHITQWFMADLM-UHFFFAOYSA-N gallic acid Chemical compound OC(=O)C1=CC(O)=C(O)C(O)=C1 LNTHITQWFMADLM-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 239000001023 inorganic pigment Substances 0.000 description 1
- 229940087654 iron carbonyl Drugs 0.000 description 1
- 239000004761 kevlar Substances 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 239000011133 lead Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 230000005499 meniscus Effects 0.000 description 1
- 150000002736 metal compounds Chemical class 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- VVRQVWSVLMGPRN-UHFFFAOYSA-N oxotungsten Chemical class [W]=O VVRQVWSVLMGPRN-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- ISWSIDIOOBJBQZ-UHFFFAOYSA-M phenolate Chemical compound [O-]C1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-M 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 229920003209 poly(hydridosilsesquioxane) Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- SONJTKJMTWTJCT-UHFFFAOYSA-K rhodium(iii) chloride Chemical compound [Cl-].[Cl-].[Cl-].[Rh+3] SONJTKJMTWTJCT-UHFFFAOYSA-K 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 150000003346 selenoethers Chemical class 0.000 description 1
- 150000004760 silicates Chemical class 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
- 239000004447 silicone coating Substances 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 238000005475 siliconizing Methods 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 238000005987 sulfurization reaction Methods 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- ANRHNWWPFJCPAZ-UHFFFAOYSA-M thionine Chemical compound [Cl-].C1=CC(N)=CC2=[S+]C3=CC(N)=CC=C3N=C21 ANRHNWWPFJCPAZ-UHFFFAOYSA-M 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- ZDHXKXAHOVTTAH-UHFFFAOYSA-N trichlorosilane Chemical compound Cl[SiH](Cl)Cl ZDHXKXAHOVTTAH-UHFFFAOYSA-N 0.000 description 1
- 239000005052 trichlorosilane Substances 0.000 description 1
- 229910001930 tungsten oxide Inorganic materials 0.000 description 1
- 210000002268 wool Anatomy 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02211—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound being a silane, e.g. disilane, methylsilane or chlorosilane
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/02255—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Paints Or Removers (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Liquid Crystal (AREA)
Description
4 476780 五、發明說明(1)
本發明係關於一種由聚矽苯乙烯形成之含二氧化、 及其製備之方法。產生之塗料在基板(如電子裝置)上有 用。 種種含矽材料用作二氧化矽之前驅物,如石夕^立丰&士 。干樹 脂、矽酸酯、聚矽烷、聚碳矽氧烷及其組合或水解產物在 技藝界均已知道。 形成完成之二氧化石夕陶曼塗料之方法在技藝界中已知道 且通常由美國專利第5, 336, 532及5, 318,857號表示。這^ 方法包括在電子裝置上形成陶變*而驅物之塗層,之彳灸在台 氧存在下加熱前驅物至40至400 °C之溫度。在美國專利第$ 5, 336, 532號中陶瓷前驅物包含氫矽倍半氧烧^樹脂。在^ # 國專利第5, 3 1 8, 85 7號中陶瓷前驅物為水解或部份# _ < 矽醇鹽。 相似地,美國專利第5, 26 2, 20 1號揭示製造陶竟塗料之 方法’其中在包括含水氨或氫氧化錢之氣氛中加熱陶曼肯 驅物至2 0至5 0 0 °C。 形成含二氧化矽之似陶瓷塗料之方法在技藝界中亦已知 道’例如:美國專利第5, 29 0, 35 4號描述在基^板上(如電 裝置)以及藉以覆盍基板之方法。此法包括以含溶劑、氣 石夕倍半氧烷樹脂及金屬氧化前驅物之溶液塗佈基板V。之^後 蒸發溶劑,藉以在基板上沉積準陶瓷塗料。之後經由加^ 至40。及1,〇〇〇 °c之溫度將準陶瓷塗料陶瓷化。可由額外、、、 之鈍化或障礙塗料覆蓋此塗料。 美國專利第5, 1 4 5, 723號透露一種亦為在基板上形成氧
476780 五、發明說明(2) 化矽塗料之方法。此法包括以熔點在5〇至45〇 石夕前驅物塗佈基板。在其中,在惰性氣氛下4之乳化丄 於其·溶點之溫度,讓塗料炫化並流動。其次二,t至南 熱熔化之塗料足夠之時Ρβ,,促進其轉化為氧 壌土兄中加 美國專利第5,39 9,441號主張一種在積體電。 導電塗料之方法。此法包括塗佈氧化石夕前 广成不 之塗料至積體電路上,之後加熱塗覆 月=料 虱矽倍半氧烷樹脂及水解或部份水解烷氧基矽烷,1 在氧化或非氧化氣氛下加熱。 兀 ^ 美國專利第5, 7 1 0, 203號顯示一種在電子裝置上形 :=料狀此法包括塗佈氧化矽前驅物樹脂及填料:塗料 氧;二子裝置上。之後在足以轉化氧化矽先驅物樹脂至含 兮埴2陶竞基質之溫度下加熱塗覆之電子裝*。在其中 Ϊ裝Ϊ 化氣氛中反應釋放足夠之熱將損壞受干擾之電 =、=專利第5,5 〇 8,〇 6 2號為一種在基板上形成不溶塗料 物# 1、;!此法包括混合包含烷氧基矽烷及鈦催化劑之組合 泰^ Ϊ ί抖混合物。之後塗佈此塗料混合物至基板上並暴 η η。氣水軋中足以形成不溶塗料之時間。最後,在1 0 0 、,。^間之溫度加熱有不溶塗料之基板長至6小時。 & ΐ f專利第5, 71丨,987號亦提供一種在電子裝置上形成 咨人塗料之方法,其藉由(1)在該裝置上塗佈包括預陶 一 材料及填料之組合物;(2 )其後陶瓷化該預陶瓷含 476780 五、發明說明(3) 矽材料;及(3)塗佈整個產生之陶瓷層由膠狀益機基矽氧 烷樹脂、苯駢環丁烯基樹脂、聚醯亞胺樹脂、矽氧烷聚醯 亞胺及聚對二曱苯製造之密封層;及(4)最後硬化該覆於 上面之樹脂。最終之塗料可進一步包括可選擇之第三(多 晶質SiC:H、鑽石、氮化矽或聚對二甲苯)及第四層(一與第 —層相同)。 =而’冑面之方法沒有揭示聚破苯乙烯作二氧化石夕之前 驅物。 •: ί二發:Λ目標為提供使用聚石夕苯乙稀在基板(如 兒子衣置)上形成含二氧化矽塗料之方法。 &在,進一步之目標為提供在基板上形成多層塗料之 去’共中至少一層係由包括爷石々贫7" 之含二氧切塗料。 4本乙邮之塗料組合物製造 本發明係關於形成含二氧化矽塗料之 氧化氣氛中加熱包括聚矽苯乙烯之塗料組1:此法包括在 化石夕塗料。含:氧切塗料可用’^ $成含二氧 間塗料或平面化塗料。含二氧化 統,作為層 本發明係關於在基板上形成含二;=電子裝置上。 「含二氧化矽塗料」意指非晶質二土料之方法α 之碳、矽醇、氫或其組合。形成含矽,其可含有殘留 括塗佈包含聚矽苯乙烯之塗料組合:::匕矽塗料之方法包 氛t加熱聚矽苯乙烯形成含二氧化基板上並在氧化氣 -聚矽苯乙烯包括分子式為((c 广料。 元。聚矽苯乙烯中矽鍵結甲基及(Ce H5 s i c H3)之單 鍵結苯基之比例典型上 476780 五、發明說明(4) ' ' -- 為 1 : 1 至 4 : 1。 制I石夕苯乙稀在技藝界中已知道且可由技藝界已知之方法 例如 物料學及工程百科全書(Encyclopedia ~一—ScTe_nce and Engineering)、第二版,卷 13、第324-327頁、1988描述包括鈉脫氯處理二曱基二氯 石夕烧及甲基苯基二氯矽烷之方法。脫氯處理可在射及甲苯 存在下加熱二甲基二氯矽烷及甲基苯基二氯矽烷至高於 1 〇 之溫度而實行。聚矽苯乙烯聚合物可由紐約之尼索 伊華美國公司(Nissho Iwai American Corp,, New York, NY)商業上取得。 ^料、组合物進一步包括視需要之原料。視需要之原料包 括修改之陶瓷氧化物前驅物、填料、矽烷偶合劑、催化 劑、助焊劑及其組合。 塗料組合物可包括一或多種修改之陶瓷氧化物前驅物。 「修改之陶瓷氧化物前驅物」意指有一或多個可水解基鍵 結至金屬或非金屬之金屬及非金屬化合物。適當金屬之實 例包括叙、鈦、鍅、钽、鈮及釩。適當非金屬之實例包括 爛及碟。可水解基之實例包括烷氧基如曱氧基、乙氧基及 丙氧基,醯氧基如乙醯氧基,及其他有機基透過氧原子鍵 、、口至金屬或非金屬。 修改之陶瓷氧化物必須能溶解於溶劑中、水解及隨後之 衣解。修改之陶瓷氧化物前驅物用於塗料組合之量典型上 選擇使含二氧化矽之塗料含〇.;[至3〇重量%由修正之陶瓷氧 化物前驅物形成之修正陶瓷氧化物。
第7頁 476780 五、發明說明(5) 塗料組合物可進一步包括至少〜種填料。「 為微 細分離固體分佈在含二氧化石夕塗料中。填料在塗料组合物 具種種形態,包括薄:、粒3 :有機或無機的。1使】 粒子大小視填料之形式及微球。填袢形” 有在次微米範圍(即5至15〇^微^求厚度而定° 如】〇〇至500微米。適當之直毛料微Λ)内之小粒子大至大粒: 4M . r 週田之填枓包括光學不透明的、轎射不 J月的、杂光的、抗氧化、抗磨耗、磁性的及導體之填 光學不透明填料為表現含二氧化石夕塗料對可I光不玎貫 :,填料。光學不透明填料包括矽、|g =化物、氣化物及碳化物。較佳之光學不透明=包括 t句粒子大小為6微米之電漿氧化鋁微球、平均粒子大小 穿5/ΓΛ米之氧切微球、氮切(Si3N4)粉末或晶鬚、 :矽粉末或晶鬚、氮化鋁粉末及黑無機色素如平均粒子 大小為0.4微米之黑色費羅(FERR〇®) ρ 633 1。 ^射^透明填料為表現含二氧化石夕塗料對聲波及輕射如 為、备、外線、紅外線及可見光不可貫穿之填料。輻射不 、,明填料包括重金屬如鉛及鎢與重金屬如鋇、鉛、銀、 酸鴎鎘访錫2鈀、鳃及鉍之不溶解鹽。此鹽可包括碳 里、g文鹽及氧化物。以僞較佳。 ^光填料為表現含二氧化矽塗料能吸收能量並以過量之 “、、輻射放射電磁輻射之填料。發光填料可為磷;亦即,硫 化物包括硫化鋅及硫化鎘;硒化物;硫硒化物、硫氧化 頁 第 476780 五、發明說明(6) 物:乳支配磷如爛酸鹽、銘酸_ '^ 化磷如鹼金屬函化物、鹼土二鎵酸鹽、矽酸鹽;及南 物較佳而以硫化鋅最佳。可力化物及齒氧化物。以硫化 包括鐘、銀及銅…化舌化;至鱗化合物。活化劑 化劑存在之量以磷重量為礎2之稀土金屬離子。通常 抗氧化填料為表現含二紐莫耳%。 一步氧化之填料。更特別的,抗=^ =熱輻射產生之進 反應以釋放過量之熱至覆# ^ 為在氧化環境中 : 則基板。•當之抗氧化填;:::屬::抑:進:步之檢 鋁及鋅。 燭鳑鐵、矽、錫、 抗磨耗填料為表現含二氧化矽塗料不易 壞基板而移除之填料。广成釭 3磨擦方法不破 鈦n : 耗材料之例證為鑽石、氮化 鈦、奴化鎢、^化鈕及石墨纖維、科夫拉 L I化 斯特爾(NEXTEL®)及氧化鋁。 )、能 抗能填料為表現含二氧化矽塗料對能量源(如臭氧、紫 2光及臭乳、氣體自由基及離子與氣態或液態硼反應物種 及可造成破壞基板之電漿)不穿透或反應,或二者皆是者 之填料。抗能填料包括重金屬如鉛、鎢、鈕、銻及其^他。 磁性填料為表現含二氧化矽塗料以具有淨磁矩之磁場磁 化之填料。磁化填料包括碳合金肥粒鐵、鐵羰基及如鐵、 ,、鈷、鎳、銅、鈦、釩、鉬、鎂、鋁、鉻、錯、鉛及鋅 等金屬之合金。實例包括Fe2〇3、MnZn、NiZn及CuZri。 導體填料為使含二氧化矽塗料為熱或電導體之填料。導 體填料包括金、銀、銅、鋁、鎳、ZnCr及鈷。
第9頁 476780 五、發明說明(7) 其他適當之填料 之氧化物、氮化物 如玻璃、氧化铭、 氧化錯及氧化; 酸鋰及鈮酸鉛;硫 如矽酸鋁;色素及 i呂、銅;碎酸4弓如 有機材料如纖維素 并環丁烷;氟碳聚 丙烯;高介電常數 等金屬之鈇酸鹽、 填料之選擇將視 化。填料之選擇視 填料之量將以含 並籍聚石夕苯乙稀附 鍵結填料。典型上 烯重量為基礎)。身 基礎為1至5重量%) 至9 6重量%之塗料矣 塗料組合物可進 之化學式為A(4_n)Si, 或芳香基,或另一 可水解基如1至6個 燒氧基或乙醯氧基 合物如聚四氟乙豨 材料如錄、結、鎖 銳酸鹽或鏑Τ酸鹽。 鉛、鑭 包括次要填料即合成或天然材料如金屬 、硼化物、碳化物及硫化物,及非金屬 氧化矽、二氧化鈦、氧化辞、氧化鎢、 鈦醆鹽如鈦酸鉀及鈦酸鋇、鈮酸鹽如鈮 酸鋇、碳酸鈣;析出之矽藻土;矽酸鹽 染料如晶體紫及花青;填;金屬如銀 夕礦石;雲母;高領土;黏土;滑石 、聚醯亞胺、酚樹脂、環氡樹脂、聚 is β _ 氟及六 鐵鋅及 —π、付性而變 塗料欲作之用途而定。 2:矽塗料要求之品質及特徵而變化 者;存在足夠…笨乙稀以 户而 Λ至96重量%(以聚石夕苯乙 七而,小罝填料(即以聚石夕笨乙 適合一些應用。拿 董里約 £合物。 軏佳地,填料之量為80 -步包括石夕烷以修改填料。㉟常,適當
^处其有機基團烷基;烷烯基 g月&基如曱基而、说S 内歸虱基或環氧基。Y為 碳原子之烷氧美,'約 ^ 2至8個碳原子之烷氧 。下標,η,為1、?式q 〇 丁 <況札 或3,以3較佳。適當
476780 五、發明說明(8) 之矽烷偶合劑包括3-曱基丙烯氧丙烯三曱氧基矽烷,3 -去 水甘油氧丙基三甲氧基石夕烧,3 -魏基丙基三甲氧基石夕烧, 乙烯基三乙醯氧基矽烷,乙烯基三乙氧基矽烷,乙烯基三 (2-甲氧基乙氧基)矽烷及2-(3,4 -環氧基環己基)乙基三曱 氧基矽烷。塗料組合物可包括0. 1至1 0重量%之矽烷偶合 劑。 塗料組合物可進一步包括催化劑以增加速率及轉化成二 氧化矽之程度。可溶解之鉑、铑及銅之錯合物為適當催化 劑之實例。適當催化劑之實例包括乙醯丙酮鉑、 RhCl3(S(CH2CH2CH2CH3)2)3及著銅。可加催化劑之量以聚矽 苯乙稀重量為基礎為5至1,000 ppm之始、姥或銅。 塗料組合物可進一步包括助焊劑。「助焊劑」為在塗料 組合物熔化並與其他成份反應產生具改良之黏著力及拿刃性 之含二氧化矽塗料。助焊劑之實例包括氧化硼及五氧化 石粦。 塗料組合物可用任何方法塗佈至基板上,然而,較佳之 方法包括製造包括塗料組合物及溶劑,以此溶劑塗佈基板 並移除溶劑。「溶液」意指含塗料組合物之溶劑,其中溶 解聚矽苯乙烯並溶解或分散(或二者皆有)視需要之塗料組 合物成份在溶劑中。 以種種方法結合溶劑、聚矽苯乙烯及視需要之成份來製 備此溶液。可用攪拌及加熱以溶解聚矽苯乙烯於溶劑中。 當欲使用填料時,可藉勻漿器、超音波探針或膠體磨粉機 混合聚矽苯乙烯及視需要成份以製備溶液。
第11頁 I ____ 五、發明說明(9) :谷釗可為溶解聚砂 矽塗料之任何材料。、=不更改藉以製造之含二氧化 二曱苯,嗣;酯;及二之=劑包括芳香烴如苯、甲苯及 選擇溶劑之量使溶液含四氫呋喃及乙二醇醚。典型上, 重量%溶劑。 至9· 1重量%溶劑,以含50至99 了用任何已知方法、 佈、噴霧、流動、浸料組合物至基板,如旋轉塗 刷、彎月形塗佈,波;锡::、網板::刷、網印、孔板印 其他。當塗料組合物不含$眭刮=茱片比色墨膜技術及 佳。網印對含填料之塗料組1舦=土轉塗佈或浸塗佈較 後,移除溶劑,留下包.取口較佳。在溶液塗佈至基板 料於該基板上。溶劑藉 ^乙烯及現需要之原料之塗 5〇°C)、真空或二者皆曰有二兄^条。件^蒸發或藉加熱(高至 佈溶液時,在塗佈時已部份节田用疑轉旋轉塗佈塗 々之後加熱聚石夕苯乙稀以在基板S成含二. J料。加熱在5。至uoo,以5。至4 砂塗料之 執行。 1土之虱化氣氛中 在一種在低溫加熱聚矽苯乙烯之方法中,节— 括在50至40 0 °c之溫度之臭氧。在臭氧之存在w匕氣氣包 形成之二氧化矽可能含有殘留之矽醇。殘留 σ熱後, 氨水或氫氧化銨或其組合之存在下加熱移除。醇可藉在 、更佳地,加熱在50至4〇〇它之溫度含空氣之 進行。然而,含低水平氧(即在丨〇〇至5〇〇 ρ㈣之,氛下 氧之氣氛亦可使用。當在氣氛中氧水平增加,、’级)至純 貝1需要之加
第12頁 476780 五、發明說明(10) 熱時間減少。典 分析顯示聚矽笨 成。「FTIR」指 通常,含二氧 一氧*化砍塗料之 料不含任何填料 朱。當塗料含填 以0 · 1至1 ο 〇微米 e含二氧化矽塗 里來源、輻射、 含 一hr 〜氧化矽塗料 置」包括矽基装 置 焦平面陣、 面顯示器及積體 、I發明之含二 塗料或多層塗料 面^塗佈平面化 當本發明之含 &砂塗料藉類似 此法包括以包括 β物至高於其熔 t氡化氣氛中5 0 言本發明之含 上塗料組合物不 型上需要之加熱時間為1至3小時。當FTIR ^歸已轉化成含二氧化矽塗料時加熱完 萄立葉轉換紅外線儀。 =矽塗料將少於1至50 0微米厚。然而,含 f度隨視需要原料之形式及量而定。當塗 ^ ’塗料厚度典型上為5 0至1,〇 〇 〇毫微 料時’塗料厚度典型上為〇· 1至5〇〇微米, 較佳。 料用於保護電子裝置免受氧化、激發態能 光、磨耗、振動及酸材料之破壞。上面有 之基板可用於電子裝置較佳。r電子裝 置如矽晶圓、氧化鋁基板、Μ化鎵基裝 光電裝置、光生優打電池、光學裝置、平 電路。 氧化矽塗料可用作平面化塗料、層間介電 系統中之一層。「平面化塗料」指具有表 塗料較少不規則之一層材料。 二氧化石夕塗料用作平面化塗料時,含二氧 美國專利5,1 4 5,7 2 3中揭示之方法製備。 聚矽笨乙烯之塗料塗佈基板。加熱塗料組 點之溫度讓塗料組合物熔化並流動。之後 至1,0 0 0 °c之溫度下加熱塗料組合物。 二氧化矽塗料用作層間介電塗料時,典型 含填料。
第13頁 476780
五、發明說明(ίο 當本發明之含二氧化矽塗料用作多層塗料之一層時,多 層塗料藉在基板上塗佈覆於一層含二氧化碎塗料上或在其 下之額外塗層。這些額外塗層可為二氧化吩/陶瓷氧化物 塗料、含碎塗料、含碳-矽塗料、含矽-氮塗料、含矽-破 氮塗料、含矽-氧-氮塗料及似鑽石碳塗料。較佳地、額外 塗層選自含碎塗料、含矽碳塗料、含矽氮塗料及含矽碳氮 塗料。
可使用各種方法塗佈額外塗層。這類方法包括化學氣相 沉積(CVD)技術如熱CVD、光化學氣相沉積、電漿增強 CVD、電子迴旋共振及喷射氣相沉積。物理氣相沉積(pVD) 技術如濺鍍或電子束蒸發亦可使用。這些方法需要不是對 氣化物種以熱或電漿形式之額外能量以引起要求之反應, 就是其集中能量於材料之固態樣品上以引起其沉積。 熱CVD,包括藉使要求前驅氣流通過加熱之基板上沉積重 料,當前驅物氣體接觸熱表面時,其反應並1冗積畫料。在 25至1,〇〇〇 t之範圍内之基板溫度足以在幾分鐘至幾小時 内形成塗層,視前驅氣體及塗層厚度而定。在此方法中玎 使用反應性金屬促進沉積。
在電聚增強CVD中,藉使前驅氣體通過電漿場使其反 應。反應性物種形成並集中在基板上迅速地黏著。透過熱 C V D方法之此方法之優點為在電漿增強c v D中可使用較低之 基板及加工溫度。 在C \ D方法中梓闲> ^ 用之別驅氣體包括矽烷或鹵化矽烷之混 合物如在四乙基鄰矽酴 am 存在下之三氯矽烷、烷基矽烷如
第14頁 476780
五、發明說明(12) 二曱基矽烷及矽環丁烷。 、可塗佈提供對侵蝕、分層及分離額外保護之視需要覆苗 塗,覆f,二氧化石夕塗料。適當覆蓋塗層包括膠狀無機= 矽氧烷樹脂、笨駢環丁烷基樹脂、聚醯亞胺、矽二 亞胺、聚對二甲笨、光阻聚合物、石夕氧烧之室溫可硫:: 合物及矽氧烷膠體。以膠狀無機基矽氧烷樹脂作覆蓋塗層 ,佳。可用任何習知方法塗佈覆蓋塗層。可由溶劑$ $ i 盍,層三適當之方法包括流動、旋轉、噴霧及浸塗佈。 這些實例預定描述本發明並對熟諳此藝者證實之。
在下面實例中,PSS-4〇〇tM表示矽鍵結甲基對苯基比為 1 : 1至4 : 1之聚石夕苯乙烯。rFTIR」指富立葉轉換紅外線 儀。 實例1 將在庚烧中之5重量% pss-40 0溶液以3,0 0 0 rpm 20秒旋 ,,佈至2· 54平方公分之矽晶圓上。之後在含4· 1至4. 4% 臭氧之大氣中加熱塗覆之晶圓至175艽維持3小時。FTIr分 析確定產生之塗料含二氧化矽及小量矽醇。 之後在含氨水蒸氣之大氣中加熱塗覆之晶圓至1 7 5 °C維 持3小日守。f T I R分析顯示矽醇實質上自塗料移除。塗料厚 度為50毫微米且折射率為1442。 實例2
將在甲苯中之30重量% pSS-4〇〇以3,〇〇〇 rpn] 2〇秒旋轉 塗佈至2· 54平方公分矽晶圓及2· 54平方公分氧化鋁基板 上。在林德柏格箱型爐(Lindberg B〇x FurnaceTM)中80 0 °C
O:\59\59328.ptd 第15頁 476780 五、發明說明(13) 下空氣中加熱塗覆之晶圓及氧化鋁基板1小時。之後以 FTIR分析晶圓及基板上之塗層。其分別顯示PSS-40 0完全 轉化成二氧化矽。塗料之厚度為0. 8 2微米且折射率為 1.439。 實例3 以超音波探針混合下列原料2 5秒之週期製備塗料組合 物: 1. 55 克PSS-400 , 1 1 · 1 1克錫(6 · 9 7微米), 6 · 5 3克鉛(5 · 0微米), 3.0克鑽石(0-1微米), 3.0克鑽石(4-6微米), 3.0克鑽石(8-12微米), 0. 5克二氧化鈦,及 3. 0克二曱苯。 使用0. 0 0 5 1釐米塗佈棒塗佈塗料組合物至2 9平方公分氧 化鋁平板上。讓塗覆之平板以空氣乾燥2小時1 5分鐘。之 後在環繞壓縮空氣中在4 0 0 °C下加熱塗覆之平板1小時。形 成之塗層在4 0 0倍之顯微鏡下沒有可視之裂痕。塗層具有 鉛筆硬度6H及30. 3微米之厚度。鉛筆硬度係根據AS TM D3363將塗覆之平板置於堅硬之水平表面並將已知硬度之 鉛筆在45 °角於表面上推離操作者6. 5毫米之筆晝。此試 驗以最硬之鉛筆開始並以減少硬度之鉛筆重覆直到鉛筆不 切入或挖出塗層。第一個不切入或挖出塗層之鉛筆硬度記
第16頁 476780
第17頁
Claims (1)
- 47678^-η 公告本_ 六、申請專利範圍 1. 一種形成含二氧化石夕塗料之方法,其包括:1)塗佈包 括聚矽苯乙烯之塗料組合物至基板上,及2)在氧化氣氛中 5 0至1 0 0 0 °C之溫度下加熱該塗料以形成該含二氧化矽塗 料。 2. —種在基板上形成平面化塗層之方法,其包括:i )塗 佈包括聚矽苯乙烯之塗料組合物至該基板上,此處該聚矽 苯乙烯有熔點;i i )在惰性氣氛中加熱該塗層至大於該聚 矽苯乙烯熔點之溫度加熱該塗層,讓該聚矽苯乙烯熔化並 流動;其後i i i )在氧化氣氛中5 0至1 0 0 0 °C之溫度下加熱該 塗層形成該平面化塗層。 3. 如申請專利範圍第1項之方法,此處基板為平板顯示 器。O:\59\59328.ptd 第18頁
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US5686172A (en) * | 1994-11-30 | 1997-11-11 | Mitsubishi Gas Chemical Company, Inc. | Metal-foil-clad composite ceramic board and process for the production thereof |
US5508062A (en) * | 1994-12-02 | 1996-04-16 | Dow Corning Corporation | Method for forming an insoluble coating on a substrate |
US5711987A (en) * | 1996-10-04 | 1998-01-27 | Dow Corning Corporation | Electronic coatings |
-
1998
- 1998-08-06 US US09/129,765 patent/US5935638A/en not_active Expired - Fee Related
-
1999
- 1999-07-19 EP EP99305693A patent/EP0978326A3/en not_active Withdrawn
- 1999-08-03 SG SG1999003750A patent/SG73665A1/en unknown
- 1999-08-04 KR KR1019990031993A patent/KR20000017084A/ko not_active Application Discontinuation
- 1999-08-05 JP JP11221940A patent/JP2000104017A/ja not_active Withdrawn
- 1999-08-05 TW TW088113391A patent/TW476780B/zh active
Also Published As
Publication number | Publication date |
---|---|
SG73665A1 (en) | 2000-06-20 |
KR20000017084A (ko) | 2000-03-25 |
EP0978326A3 (en) | 2002-01-16 |
US5935638A (en) | 1999-08-10 |
JP2000104017A (ja) | 2000-04-11 |
EP0978326A2 (en) | 2000-02-09 |
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