TW475175B - Semiconductor device - Google Patents

Semiconductor device Download PDF

Info

Publication number
TW475175B
TW475175B TW089118431A TW89118431A TW475175B TW 475175 B TW475175 B TW 475175B TW 089118431 A TW089118431 A TW 089118431A TW 89118431 A TW89118431 A TW 89118431A TW 475175 B TW475175 B TW 475175B
Authority
TW
Taiwan
Prior art keywords
potential
mentioned
line
source
bit line
Prior art date
Application number
TW089118431A
Other languages
English (en)
Chinese (zh)
Inventor
Kazutami Arimoto
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of TW475175B publication Critical patent/TW475175B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4091Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/065Differential amplifiers of latching type
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/18Bit line organisation; Bit line lay-out

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
TW089118431A 1999-09-10 2000-09-08 Semiconductor device TW475175B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25684299A JP2001084768A (ja) 1999-09-10 1999-09-10 半導体装置

Publications (1)

Publication Number Publication Date
TW475175B true TW475175B (en) 2002-02-01

Family

ID=17298184

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089118431A TW475175B (en) 1999-09-10 2000-09-08 Semiconductor device

Country Status (6)

Country Link
US (1) US6304494B1 (ko)
EP (1) EP1083571B1 (ko)
JP (1) JP2001084768A (ko)
KR (1) KR100351083B1 (ko)
DE (1) DE60000159T2 (ko)
TW (1) TW475175B (ko)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6567332B2 (en) * 2001-03-15 2003-05-20 Micron Technology, Inc. Memory devices with reduced power consumption refresh cycles
JP4388274B2 (ja) * 2002-12-24 2009-12-24 株式会社ルネサステクノロジ 半導体記憶装置
KR100546188B1 (ko) * 2003-05-24 2006-01-24 주식회사 하이닉스반도체 감지증폭수단을 포함하는 반도체 메모리 장치 및 그의감지증폭수단을 오버드라이브 하는 방법
JP2005025805A (ja) * 2003-06-30 2005-01-27 Renesas Technology Corp 半導体記憶装置
KR100541367B1 (ko) * 2003-07-15 2006-01-11 주식회사 하이닉스반도체 오버드라이빙 구조를 가진 반도체 메모리 소자
US7936201B2 (en) * 2006-12-22 2011-05-03 Qimonda Ag Apparatus and method for providing a signal for transmission via a signal line
CN102522107B (zh) * 2011-12-16 2014-12-17 上海科勒电子科技有限公司 传感器或控制器读写系统和方法及相关感应龙头
US9053817B2 (en) * 2013-03-15 2015-06-09 Taiwan Semiconductor Manufacturing Company, Ltd. Amplifier
US9875774B1 (en) * 2016-11-29 2018-01-23 Taiwan Semiconductor Manufacturing Company, Ltd. Memory device and method of operating same
US10431291B1 (en) * 2018-08-08 2019-10-01 Micron Technology, Inc. Systems and methods for dynamic random access memory (DRAM) cell voltage boosting
KR102653529B1 (ko) * 2018-10-22 2024-04-02 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2759689B2 (ja) * 1989-11-24 1998-05-28 松下電器産業株式会社 Ramの読み出し回路
US5264058A (en) 1992-08-24 1993-11-23 Monsanto Forming a shaped prelaminate and bilayer glazing of glass and plastic
US5764580A (en) * 1995-08-18 1998-06-09 Hitachi, Ltd. Semiconductor integrated circuit
JPH09128966A (ja) 1995-10-31 1997-05-16 Nec Corp ダイナミック型半導体記憶装置
TW318932B (ko) 1995-12-28 1997-11-01 Hitachi Ltd
WO1997028532A1 (en) 1996-02-01 1997-08-07 Micron Technology, Inc. Digit line architecture for dynamic memory
JP3386684B2 (ja) 1997-03-19 2003-03-17 シャープ株式会社 半導体記憶装置
JPH1186549A (ja) 1997-09-01 1999-03-30 Hitachi Ltd ダイナミック型ram
JP4326049B2 (ja) * 1998-10-27 2009-09-02 富士通マイクロエレクトロニクス株式会社 書き込みを高速化したメモリデバイス

Also Published As

Publication number Publication date
KR100351083B1 (ko) 2002-09-05
DE60000159D1 (de) 2002-06-13
JP2001084768A (ja) 2001-03-30
US6304494B1 (en) 2001-10-16
KR20010070067A (ko) 2001-07-25
DE60000159T2 (de) 2002-11-07
EP1083571A1 (en) 2001-03-14
EP1083571B1 (en) 2002-05-08

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Legal Events

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GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees