TW436946B - Integrated circuit device and process for its manufacture - Google Patents
Integrated circuit device and process for its manufacture Download PDFInfo
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- TW436946B TW436946B TW086115875A TW86115875A TW436946B TW 436946 B TW436946 B TW 436946B TW 086115875 A TW086115875 A TW 086115875A TW 86115875 A TW86115875 A TW 86115875A TW 436946 B TW436946 B TW 436946B
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- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 238000007606 doctor blade method Methods 0.000 description 1
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 125000004185 ester group Chemical group 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- WSFSSNUMVMOOMR-UHFFFAOYSA-N formaldehyde Substances O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 125000001188 haloalkyl group Chemical group 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 150000003949 imides Chemical class 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229940039781 leptin Drugs 0.000 description 1
- 150000007517 lewis acids Chemical class 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- CRVGTESFCCXCTH-UHFFFAOYSA-N methyl diethanolamine Chemical group OCCN(C)CCO CRVGTESFCCXCTH-UHFFFAOYSA-N 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000001393 microlithography Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 125000001421 myristyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 229910052605 nesosilicate Inorganic materials 0.000 description 1
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- KBXJHRABGYYAFC-UHFFFAOYSA-N octaphenylsilsesquioxane Chemical compound O1[Si](O2)(C=3C=CC=CC=3)O[Si](O3)(C=4C=CC=CC=4)O[Si](O4)(C=5C=CC=CC=5)O[Si]1(C=1C=CC=CC=1)O[Si](O1)(C=5C=CC=CC=5)O[Si]2(C=2C=CC=CC=2)O[Si]3(C=2C=CC=CC=2)O[Si]41C1=CC=CC=C1 KBXJHRABGYYAFC-UHFFFAOYSA-N 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 150000004762 orthosilicates Chemical class 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- CKOOABJZYWLHMN-UHFFFAOYSA-N phenyl benzoate Chemical compound C=1C=CC=CC=1C(=O)OC1=CC=CC=C1.C=1C=CC=CC=1C(=O)OC1=CC=CC=C1 CKOOABJZYWLHMN-UHFFFAOYSA-N 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 229920002098 polyfluorene Polymers 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920000734 polysilsesquioxane polymer Polymers 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 125000004076 pyridyl group Chemical group 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- 150000004760 silicates Chemical class 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000003980 solgel method Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000004646 sulfenyl group Chemical group S(*)* 0.000 description 1
- 229940124530 sulfonamide Drugs 0.000 description 1
- 150000003456 sulfonamides Chemical class 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 230000035922 thirst Effects 0.000 description 1
- 125000005369 trialkoxysilyl group Chemical group 0.000 description 1
- 125000000876 trifluoromethoxy group Chemical group FC(F)(F)O* 0.000 description 1
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical group CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49894—Materials of the insulating layers or coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S428/00—Stock material or miscellaneous articles
- Y10S428/901—Printed circuit
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24917—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including metal layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31678—Of metal
- Y10T428/31681—Next to polyester, polyamide or polyimide [e.g., alkyd, glue, or nylon, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31721—Of polyimide
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Formation Of Insulating Films (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Silicon Polymers (AREA)
- Paints Or Removers (AREA)
Description
Α7 Β7 436946 五、發明説明(1〉 本發明係關於一種包含經改l鍵材I之積體電路,及 製锋此積體電路之方法。 _發明背景 於微電子工業上, 古Ii 果上—直希望在多階積體電路裝置*中,例 如-己隐與邏輯晶片上,增加電路密度,藉以增加其性能及 降低其成本。爲達成此項目帛,-般希望降低晶片上之最 小特徵尺寸’例如電路線寬’以及亦降低所插人介電材料 (介電常數至能夠有較接近間距之電路線,而不會增加_ 訊及性偶合。再者,一般希望降低介電材料之介電常 數,譬如被使用在含有輸入/輸出電路系統之積體電路裝 置之線後端(BEOL)部份中者,以降低裝置所必要之驅動電 流與㈣消耗。目前之電介質爲二氧化矽,其具有介電常 魅4.0。此材料具有必要之機械與熱性質,以抵遍隨著 ΐ導體製造之加工處理操作與熱循環。但是,_般期望供 未來積體電路裝置用之介電材料,能夠顯示比藉由二氧: 矽所顯示者爲低之介電常數(例如< 3 〇)。 因此,本發明之一項目的,保爲提供—種包含I改良介 電杖料之經改良積體電路裝置。 其他目的與優點將自下文揭示内容而明瞭。 發明摘述 本發明係關於-種積蛊電路裝置,其包含(1)基材;间倖 衿該某材上之互連金屬電路線’及闽)位於鄰接該電潞線 之t電材料(於電路線上方及/或介於其間)。此介電材料 4- 本紙浪尺度朝中國國家標準(CNS ) M祕(2! 〇 χ所公幻 -1_^ ^;!裝-ί (請先閎讀背面之注意事項再填寫本頁} 訂-------球__ 經濟部t央榇準局員工消費合作社印$ -ί I m * A7 B7 436946 五'發明説明(2) 包含有巍惠龙醯胺盧酯之反應產物,麓聚瘦胺 酸奋較佳係0 士疼氧棊矽烷基烷基封端。兔二項具體實施 例中,有機黑—二'氧化矽係爲矽倍半氧烷,且該介電材料具 有七於、Ρ · 5微米之相倍域。 本發明亦關於積體電路封裝結構,用以形成本發·明積體 電路裝置之材料組合物及方法。 ' 於下文詳述中及從附圖,提出更多關於本發明之揭示内 容。 _附圖簡述 圖1爲一部份本發明積體電路裝置之橫截面圖。 圖2-5説明一種製造本發明積體電路裝置之方法。 圖6-8説明一種製造本發明積體電路裝置之替代方法。 發明詳述 本發明積體電路裝置之一項具體實施例,係示於圖1中 3此裝置大致上.包含、基材2、路線丄及介電^料6。 基材2具有於其中形成之砉直金履屬釘8。電路線之功能是 在裝置中全電信號,並提供電源輸入至裝置,及來自裝 置I信號輸出。適當積體電路裝置通常包含多層電路線, 其係藉蚩直金屬錦、針互連。 供本發明裝置用之適當基材,包括矽、二氧化矽、破璃 :氮化矽 '陶瓷材料、鋁、銅及砷化鎵。其他適當基材係 爲熟請此藝者所已知。在多層積體電路裝置中,輕絕緣、 平面化之|路線之下層亦可充、作基材。 適當電路線通常包括金屬性、導電性材料,譬如銅、鋁 木纸張尺度賴巾_家料(CNS ) A4規格(2似297公 I . 装------ΪΤ------.^ * . : , (請先閱讀背面之注意事項-¾填寫本頁) M濟部中央橾準局員工消費合作'社印製 5- 4369 4 6 4369 4 6 經濟部中央標準局員工消費合作杜印裝 A7 B7 五、發明説明(3 ) 、鎢、金'銀或其合金。電路線可視情況塗戈金屬襯料, 譬如錬、_或鉻層’或其他層,譬如障壁或黏著層(例如 SiN、TiN)。 本發明之較佳具體實施例’係關於一種提供信號與—動力 .電流至一或多個積體電片之積體電路封―裝裝置(泰^ 片模-組),其包含(i)泰」^·,具有電導體用以連接至電夸板 ,⑻多個交替之電絕緣與導零>#,位於基材上,其中至少 該導電層包含本發明之經改良龙電^膜,及邱)多個通孔 ’用以使H、體、導電層及積體電路晶片電互連。 此·積體電—雖-处裝裝置爲在積體t路晶片與電路典之間封 裝之仝間、層。積體電路晶片鼠被笔農友積體電路封裝裝 ㉟上’乱後者係傢1被裝載在复路_板上。 #羞__裝置之’良掛通常爲氣性基材,譬如次肩〜、〜穸或陶瓷 。此基材可視情況具有經配置於_甚中之積體電路^ 具有電導體,譬如複入/輸出'針銷〇/〇針銷),用以將封裝 裝置電連接至 '電路板。多個電絕緣與導·常層(具有導電性 電路經.配粟於介電樊緣材料中之層)係交替地雄疊在基材 + °諸層通常係以一層接著一層之程庠在基材上形成,其 中各層係在個另1處理步驟中形成。 此裝置亦包含_裝置,用以容納積體電硌晶片。 適當接收裝置包括用以接收晶片!/0針銷之插接板,或供焊 料連接至晶片之金屬墊片。通义此〜故裝装置亦包含多個電 通孔,大致上垂直對準以電互連Ϊ/0針銷,導電層及經配置 在接收裝置中之積體電路晶片β積體電路封裝裝置之功能 ________ - 6 - 本紙張尺度適用中國國家標準(CNS ) -—------- • :^訂 旅丨 (請先聞讀背面之注意事項再填寫本頁) 436946 經濟部中央標隼局買工消費合作社印製 A7 B7 五、發明説明(4 ) 結構與製造方法,係爲熟諳此藝者所習知,如在美國專利 4,489,364、4,508,981、4,628,411 及 4,811,082 中所揭示者,其揭 示内容係併於本文供參考〇 本發明之主要特徵係爲介電材料,其係定位在電路線上 方及/或在電路線之間及在基材上β在多階積體電*路裝置 中’介電材料經常被平面化,以充作供下一層電路線之石 印形成用之基材。此介電材料包含有機聚二氧化矽與一種 以(RO)m(R”)nSiR'_封端(末端基)之聚醯胺酸酯之反應產物, 其中m爲1、2或3 ; ιη·Ηι=3 ; R與R,爲烴基,及R__爲氫化基 團或烴基。此末端基較佳爲單、二或三Ci6烷氧基矽烷基 q_6烷基或芳基(例如次苯基 '次苄基、次荅基或次蔥基) 0 於本文中使用之烴基,係意謂以烴爲基礎之基困(單或 雙官能性),具有一個碳原子連接至分子之其餘部份,且 主要具有烴特性.。烴基包括下述: (1) 烴基;意即,脂族(例如’ CKC10烷基或烯基與(:5,1〇環 坑基或環烯基)' 芳族、脂族取代之芳族、芳族取代之脂 族及其類似基團。此種基團係爲熟諳此藝者所已知;其實 例包括甲基(對雙官能性烴基而言爲亞甲基)、乙基、丁基 、己基 '辛基、癸基、十二基' 十四基、十八基、環己基 、苯基 '各基、宇基及萬基(所有異構物均包含在内)。 (2) 經取代之烴基;意即,含有非烴取代基之基團,就本 發明而論,該取代基不會改變該基團之主要爲烴之特性。 熟諳此藝者將明瞭適當取代基(例如,由基、烷氧基、& 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) :---抽衣------、玎------線 _ - - * * (請先閲讀背面之注^一^^項^填寫本頁} 4369 4 6 A7 B7 經濟部肀央樣準扃負工消费合作社印裳 克、發明説明(5 氧藏基、硝基 '垸基亞項醯基)。 (3)雜基團;意即,一種基團,雖然就本發明而論,其在 特性上主要爲烴’但含有不爲碳之原子,存在於其他情況 下係由碳原子所组成之鏈或環上。適當雜原子對熟諳此藝 者.而言係爲顯而易見的’且係包括例如氮、氧及硫* 一般而言,對於在以烴爲基礎之基團中之每1〇個碳原子 ,將存在不超過約三個取代基或雜原子,且較佳爲不超過 一個。 具有末端基之聚醯胺酸酯’較佳係製自①二胺;⑹二酯 鹵化一酷(例如氣化物)及(iii)胺基故氧基秒院之反應 適當二胺具有式H2NRNH2,其中R爲
其中X係選自包括具有1-3個碳或鹵碳原子之次烷基鏈 '羰 基、-0-、-S-、-S0.2 -及-N-娱*基。此次燒基鍵可進一步被鹵 烷基(例如三氟曱基)及苯基取代。芳族環可視情況被例如 三氟甲氧基或其類似基團取代。關於二胺之適當R係包括 -8- 表紙张A度適用中國國家標準(CNS〉A4規格(210 X297公釐) ---------^------,玎------線 . . : (請先閱讀背面之注意事項再填寫本頁) 經濟部中央標牟局貝工消費合作社印製 1 ' 4369 46 A7 __________B7 五、發明説明(β ) ·
其中y係選自三氟甲基、笨基或經取代之苯基。適當芳族 二胺爲: 對-苯二胺: 4,4’-二胺基-二苯基胺:聯苯胺; 4,4'·二胺基-二苯基越: 1,5-二胺基-莕; 3,3'-二甲基·4,4·-二胺基-聯苯; 3,-> - 一甲乳基聯笨胺; 1,4-雙(對-胺基苯氧基)苯: 1,3-雙(對-胺基苯氧基)苯: 2,2-雙[4-胺基苯基]六氟基丙烷。 於二胺中之R亦可爲脂族或環脂族基困,譬如次環烷基 ,例如次環己基。適當脂族二腔包括1,4-二胺基環己燒與 雙(4-胺基環己基)甲烷。 較佳二胺爲一種其中在上式中之乂爲>〇(苯基)(三氟甲基) 之二胺。較佳二胺爲9,-雙(4-胺基苯基)苐(FDA) : 4,4’-氧二 苯胺及U-雙(4-胺基苯基)小苯基-2,2,2-三氟乙烷(3FDA)。 -9- 本纸伕尺度適用中國國家標準(CNS ) Λ4規格< 21〇Χ29?公釐) ---------¾-------.1:叫------g • - - > (請先聞讀背面之:这意事^再填寫本頁} 4369 4 6 A7 B7 五、發明説明(
二酯氣化二醯係適當地製自其相應之二酐’此二酐適當 地具有下式 CO CO / \ / \n Ο ^Αγ ο \ / \ CO CO 其中Ar可選自
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(請先閏讀背面之注意事項再填寫本頁) 裝· 訂 經濟部中央標準局—工消費合作杜印裝
CHj 焦蜜石酸二酐 二苯甲酮二酐 2,2-雙(3,4-二羧基苯基)丙烷二酐 -10- 本紙張尺度適用中國國家標準(CNS ) A4規格(210 X 297公釐) 4369 4 6 Α7 Β7 經濟部中央標準局貝工消費合作社印裝 五、發明説明(8 ) 3,3丨,4,4'-聯笨基四羧酸二酐 雙(3,4-二羧基苯基)瞇二酐 雙(3,4-二羧基苯基)硫醚二奸 雙酚Α雙醚二酐
2,2-雙(3,4-二幾基苯基)六氟基丙規(二奸 J 2,3,6,7-莕四羧酸二酐 雙(3,4-二羧基苯基)砜二酐 1,2,5,6-蓁四幾酸二酐 2,2.,3,3.-聯苯基四羧酸二酐 3,4,3,4,-二苯甲酮四羧酸二酐;及 三聯苯二酐。 較佳二醋氣化二醯爲焦蜜石酸二乙酯氣化二醯。 此一 Ss氣化一酿係藉由連續地使相應奸與適當醇及氣化 草醯反應而形成。適當醇爲乙醇。醯亞胺化之速率可藉由 酯基(例如來自G醇之乙基酯取代基)之電子取代基作用而 改變’而供使用於本發明中之其他適當醇類,係爲熟諳此 藝者所已知,譬如在由Hergenrother所著之,,高性能聚合體 ”(1994)第139頁上所揭示者’其揭示内容係併於本文供參考 1適當二酯氯化二醯係爲二氣焦蜜石酸二乙酯 '二氣聯苯 基四羧酸二乙酯及二氣氧基二鄱苯二曱酸酯二乙酯。^他 適當二胺類及二酯氣化二醯類,係爲熟諳此藝者所已知, 譬如在美國專利4,720,539,及在1992年5月1〇日提出申請之 共待審共同歸屬之美國專利申請案序號〇8/〇58 3〇3中所^示 者’其揭示内容係併於本文供所有目的作參 本紙張尺度家標準(CNS) M規格(& χ所公着 ----------& ! ' -. (請先閲讀背面之注意事項再填寫本頁) 丁 -6 旅 436946 A7 B7 五、發明説明(9 適當胺基烷氧基矽烷具有式,其中 m+n=3(n較佳爲3),R較佳爲Ci_6烷基,且R,爲間n隔基較 佳爲C^6次烷基(例如亞甲基)或無雜原子之芳基(未具有雜 原子之經芳族基團)’譬如次苯基、次苄基或次萘基,其 係位在胺基與矽原子之間。由於R係在反應期間自·此组成 中分裂與移除,故R可爲不會無法令人接受地干擾反應之 任何有機基團’且此等基團係意欲涵蓋在本發明内,作爲 本文中所請求者之等效物》若η小於3,則R"較佳爲氫化基 或低碳C! _ ό烷基。較佳矽烷爲胺基苯基三甲氧基矽烷3其 他適當矽烷反應物係爲熟諳此藝者所已知, 爲形成聚醯胺酸酯反應物,將此三種先質以適當化學計 量(例如,二胺與二酯氣化二醯爲1 : 1,而矽烷之量係計 算自Carothers方程式,以提供所要分子量之聚合體產物)溶 解於適當溶劑(譬如NMP)中,而造成烷氧基矽烷基烷基封 端之聚醯胺酸酯。此烷氧基矽烷基烷基封端之聚醯胺酸酯 反應物,具有分子量(Μη)約5,000至20,000克/莫耳=適當烷 氧基矽烷基烷基封端之聚醯胺酸酯,具有以下結構: 和衣-- , -. {請先閲讀背面之注意事項再填寫本頁) 0 起濟部中央標辛局貝工消費合作社印製
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⑴2Et Ph CF3)Et〇2C0 Jn 0
0 'NH-R-Si(OEt). CO.Et 其中R爲苯基或烷基,且聚醯胺酸酯取代基爲乙基3 有機聚二氧化矽爲一種包含矽、碳、氧及氫原子之聚合 化合物。適當有機聚二氧化矽包含(i)經部份縮合之烷氧基 12 本紙張尺度適用中國國家標牟(CNS ) A4規格(2〖〇X297公釐) 經濟'邱中央標準局員工消费合作社印製 ' 436946 A7 -------------- B7 五、發明説明(ΊΟ) 矽烷(例如,藉控制水解而經部份縮合之烷氧基矽烷, 具有Μη約500至20,000,例如四乙氧基矽烷);⑼以有機方 式改質之矽酸酯,具有組成爲與化沒%,其中R爲有 機取代基,(iii)經部份縮合之原矽酸酯,具有組成爲si〇R4 ,(iv)矽氧烷,及(v)矽倍半氧烷。矽倍半氧烷爲5型 之聚合矽酸酯材料,其中R爲有機取代基。 供本發明使用之適當有機聚二氧化矽,係爲熟諳此藝者 所已知。有機聚二氧化矽較佳爲四乙氧基矽烷 '矽倍半氧 境或其混合物。供本發明用之適當矽倍半氧烷爲烷基(甲 基)苯基矽倍半氧烷,其係市購可得(例如,得自 Techniglass Penysburg^ Ohio之GR950)。其他適當矽倍半氧烷係爲 熟諳此藝者所已知,譬如在美國專利5,384 376及 Chem,Rev. 95, 1409-1430 (1995)中所揭示者,其揭示内容係併於 本文供參考。 此介電組合物係適當地包含約5至95重量%篆睹舜胺成 份’且係在释―友法中形成。第一個步驟涉及在室溫下 使吹倍I农農燒、氧基.梦坑基淀基封端之聚醯胺酸酯溶解 在適^當溶劑(南,滞點溶劑’例如N-甲基-2-四氫p比洛酮NMP) 中。將此组合物享接加熱_,至:向溫’或以-逐步方式加熱(例 如2〇0°C X 2小時,然後熬升車4〇(TC,並保持2小時),以造 成聚酷胺酸酯之鏈增長^及.酿亞胺化,以及官能基化聚醯亞 胺與聚二氧化矽之交叉縮合。 本發明之、介J;粗合_物、,在8〇°C下具右介電常數低於3 2 , 較隹係低於3,0,、且1氛氣攸遊2.9。此组免物具有相位域 -13 - 本紙乐尺度適用中國g家揉準(CMS ) A4規格(2I0X297公釐) , I I ^ ,灯------.# (請先聞讀背面之注項再填寫本頁) ί"' 4369 4 6 經濟部中央標準局員工消費合作社印製 Α7 Β7 五、發明説明(μ ) 小於0.5微米,_佳係小於0.3微米,其會造成増強之機械 與抛光特性,及增強之各向同性、光學及介電性質。再者 ’此介電組合物具有抵抗裂化及使甚輯夠以化學方式/以 裨械方式〜被.乎面乂匕之麟械性質,以幫助在爰路裝 置中之另一個雷路'階層 印形成。此介電组合@有増 加之擊穿電壓、,強之韌性及增和之抗龜裂性,即使在高 環境濕度下使用厚膜亦然。此介電組合物爲光轰#透明的 ’ JL良好地黏>著__^基材》此介電组合物熱期間遭受最 ,J、之收^绩。 藉由有機1:^氧妙與末端基封端之聚醯胺酸酯反應所 形成之組合物,亦具有其他利用性,譬如在隱形眼鏡與鏡 子及在外太空中使用之每』^幕護塗層。 本發明亦關於製造積體電路裝置之方法。參考圖2,— 種具體實施方法之第一個步驟,係涉及在基材2上配置本 發明包含三烷氧基矽烷基烷基封端之聚酿胺酸酯與矽倍半 氧烷之介電组合物之層10。基材2係顯示具有垂直金屬销 釘8。將此组合物溶解於適當溶劑中,譬如N,Ni_二甲基丙 二脲(DMPU)、NMP或其類似物,並藉技藝上已知之方法, 將其塗敷至基材’ f如旋轉或噴塗或刮刀塗覆。此方法之 第二個步驟,係涉及將组合物加熱至高溫,以使聚酿胺酸 醋酷亞胺化’及藉溶膠-凝膠方法使矽烷基反應性基團交 叉縮合。較佳复迸立盖..全盖.於_验譬如..胺__或布胡司—巷.驗-春在 下加熱。此驗會催化醯亞胺化作用及交叉縮合,使得能夠 有較低之最初熟化溫度’例如低於200。匚。此鹼可適當地爲 14 泰紙張尺度適用中國國家標準(CNS ) A4規格(2!0χ29ϋ ^ — I--装------.玎------^ f請先閲讀背面之注意事^再填寫本頁} 4369 46 A7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明(12 ) 有機胺。此胺較佳係具有高沸點,並可於反應完成時,藉 加熱移除。適當驗爲N甲基二乙醇胺。其他適當驗係爲熟 叫此藝者所已知,譬如在美國專利5,206,117中所揭示者, 其揭示内容係併於本文供所有目的作參考。同樣地,此反 應可藉布朗司特或路易士酸催化a * 參考圖3,此方法之第三個步驟係涉及使介電組合物層 1〇以石印方式構圖,以在組合物層中形成壕溝12 (凹陷)。 於圖3中所示之壕溝12係延伸至基材2及至金屬銷釘8。石 印構圖通常係涉及①以正型或負型光阻,譬如由Shipley或 Hoechst Celanese所銷售者(AZ光阻),塗覆介電組合物層1〇, (11)使光阻以影像複製方式曝露(經過光罩)至輻射下,譬如 電磁波’例如UV或遠UV,(iii)使光阻中之影像顯像,例如 使用適當驗性顯像劑,及(iv)經過介電組合物層1〇轉移影 像至基材2 ’使用適當轉移技術,譬如反應性離子束蝕刻 (RIE)。適當石印構圖技術係爲熟諳此藝者所習知,譬如在 Thompson等人之"微石印術導論"(1994)中所揭示者,其揭示 内容係併於本文供參考。 參考圖4,在用以形成本發明積體電路方法之第四個步 驟中’係將金屬薄膜W沈積至具有圖樣之介電層10上。較 佳金屬材科包括銅、鎢及鋁。此金屬係藉技藝上已知之技 術,譬如化學蒸氣沈積(CVD)、電漿加強CVD '電與無電沈 積、漱射或其類似方法,適當地沈積至具有圖樣之介電層 參考圖5 ’此方法之最後步驟係涉及移除過量金屬材料( 15- ; I 装ΐτ------m (請先閲讀背面之注意事項再4寫本頁) A7 B7 經濟部中央橾準局負工消費合作社印掣 五、發明説明(13 例如,使金屬薄膜14平面化),因此薄膜14通常係與具有 圖樣之介電層10同一水平。平面化可使用化學/機械抛光 或選擇性濕或乾蝕刻達成。適當化學/機械抛光係爲熟諳 此藝者所已知。 參考圖6-8 ’其係顯示本發明用以製造積體電路裝S方法 之一種替代具體實施例。在此具體實施例中,此方法之第 一個步騍係涉及沈積金屬薄膜16至基材18上。基材18亦具 有垂直金屬銷釘20。參考圖7,在此方法之第二個步驟中 ’係將金屬薄膜經過光罩以石印方式構圖,以形成壕溝22 。參考圖8 ’在此方法之第三個步驟中,係將本發明之介 電组合物層24沈積至具有圖樣之金屬薄膜16上。在此方法 之最後步驟中,係將组合物加熱,以使三烷氧基矽烷基烷 基封端之聚醯胺酸酯醯亞胺化’並使矽燒基反應物縮合a 然後’可視情況將介電層平面化,以供多層積體電路中之 隨後程序使用s . . 下述實例爲本發明方法之詳細説明。此等詳細製備法, 係落在上文所提出較一般性地描述之方法之範園内,且係 用以舉例説明之。此等實例僅爲説明目的而提出,並非意 欲作爲對本發明範圍之限制。 tJLL三11氧基矽烷基封端之聚(醢胺酸乙d之合成 間·二氣焦蜜石酸二乙酯(PMDA) 1,1-雙(4_胺基苯基)-1_苯基-2,2,2-三氟乙燒(3jrpA) 在装有架高攪拌器、氮氣入口管及添液渴斗之三頸燒瓶 中,添加9.48毫莫耳卩.2456克)3fda、1.04毫莫耳(〇 221S克) -16- 冬紙铁尺度適用中國國家標準(CNS ) 規格(210X29·?公釐) — -^ -f Μ Μ------ΐτ------^ (请先閱讀背面之注意事項声填寫本頁) 436946 A7 B7 經濟部中夬標準局員工消费合作社印製 五、發明説明(14 ) 胺基苯基三甲氧基矽烷、25毫莫耳(2克)吡啶及50毫升經 蒸餾NMP。此系統一直保持在i氮壓力下。使反應混合物 冷卻至0°C。將PMDA二乙酯氣化二醯(10毫莫耳,14716克) 溶解於〜100毫升二氯甲烷中,且定量地轉移至添液漏斗中 。將二氣甲烷溶液逐滴添加至反應混合物中D於添‘加完成 後’使聚合反應在室溫下進行過夜。將聚(酿胺酸乙酯)寡 聚物在甲醇中藉較高剪切沉殿單離,過;慮並在眞空烘箱中 於 60°C 下乾燥(Μη=ι〇,〇〇〇)。 實例2 组合物之形成 將得自實例1之聚(醯胺酸乙酯)寡聚物溶解於DMPU中。 於此溶液中,添加聚矽倍半氧烷(GR950F,得自Techniglass) 。形成具有固含量爲37重量%且聚(醯胺酸烷基酯)含量爲 23重量%之透明琥珀色溶液。接著將此溶液藉旋轉塗覆堯 鑄於玻璃板上’以形成1至10微米厚之薄膜。藉由將聚合 體薄膜各別在250°C與400°C下,於N2大氣中加熱2小時,達 成酿亞胺化。接著,使已熟化之聚醯亞胺薄膜慢慢地冷卻 至室溫。經熟化之聚醯亞胺薄膜無裂紋,顯示相位域爲 1000 A,於80ec下之介電常數爲約2.9 :熱應力約3〇mPa及折 射率約1.56。 雖然本發明已針對特定具體實施例加以描述,但不得將 其細節解釋爲限制,因爲顯而易見的是,在未偏離其精神 與範圍下可訴諸不同具體實施例、改變及修正,且應明瞭 此種等效具體實施例係意欲包含在本發明之範圍内。 17- 本紙張尺度適用t國國家標準(CNS ) A4規格(2丨〇 χ四7公釐) ^----- ---------^------1Τ------^ (請先閱讀背面之注意事項WV填寫本頁)
Claims (1)
- 枣年『彳月$曰修正/更正/補充 A8 B8 C8 第86115875號專利申‘案 ^書專利範圍修正本(89年11 六'申請專利範圍 1. 種積體電路裝置,其包含: (a) 基材; ------1--Ί---,衣------訂 (請先閲讀背面之注意事項再填寫本頁) (b) 位於該基材上之金屬電路線;及 ⑹位於鄰接該電路線之介電组合物,此組合物包含有 機聚二氧切及以(R0)m(R,,)nSiR,.封端之聚酿胺酸醋 <反應產物’其中R與R-係獨立為烴基;R"為氫化 基或垣基;m為1、2或3,且n+m=3。 2.根據申請專利範圍第!項之裝置,其中有機聚二氧化珍 為Ct ·6燒氧基矽烷、矽倍半氧烷或其混合物。 3_根據申請專利範圍第2項之裝置,其中妙倍半氧烷為苯 基/ 4_6燒基矽倍半氧燒。 4. 根據申請專利範圍第2項之裝置,其中聚酷胺酸酷係以 二_c^丨0烷氧基矽烷基c卜丨0烷基或三Ci _丨〇烷氧基矽烷 基芳基封端。 5. 根據申請專利範圍第3項之裝置,其中聚醯胺酸醋包含 一種二胺,選自9,9,-雙(4-胺基苯基)第、4,4,_氧基二苯胺 及U-雙(4-胺基苯基)-ΐ·苯基_2,2,2_三氟乙烷,及一種二 酯二酸齒化物,選自二氣焦蜜石酸二〇1-6烷基酯、二氣 經濟部中央樣準局員工消費合作社印東 氧基二鄰苯二甲酸二Ci_6烷基酯及二氣聯苯基_四羧酸 一 C] 娱*基醋。 6. 根據申請專利範圍第2項之裝置,其中介電組合物具有 介電常數低於3,2。 7. 根據申請專利範圍第2項之裝置’其中介電組合物具有 相位域小於0.5微米。 本紙張尺度適用令國國家梯準(CNS ) A4况格(2tOX297公釐) A8 B8 C8 D8 436946 辫年”月3日修正/更正/補充 申請專利範圍 8. —種形成積體電路之方法,其包括: ⑷將介電组合物層置於基材上,該組合物包含之反應 物為有機聚二氧化碎及以(R〇UR,,)n弧,_封端之聚臨 胺觳酗,其中R與R’係獨立為烴基;R”為氫化基或 煙基;1、2或3,且n+m=3 ; (b) 加熱此組合物,以使反應物進行反應; (c) 將該介電層以石印方式構圖; (d) 沈積金屬薄膜於具有圖樣之介電層上;及 (e) 使薄膜平面化’以形成積體電路。 9. 根據中專利範圍第8項之方法’纟中有機聚二氧化石夕 為h _6烷氧基矽烷 '矽倍半氧烷或其混合物。 瓜根據申請專利範圍第9項之方法,其^臨胺酸醋係以 三-ClM〇烷氧基矽烷基Ci i〇烷基或烷氧基矽烷 基芳基封端a 11,根據申請專利範圍第9項之方法1中聚醯胺酸醋包含 種一胺,選自9,9_-雙(4-胺基苯基)苇、4,4,_氧基二苯胺 及U-雙(4-胺基苯基)小苯基_2,2,2_三敦乙烷,及一種二 酯二酸齒化物,選自二氣焦蜜石酸二〇1_6烷基酯 '二^ 氧基二鄰苯二甲酸二Cl_6烷基酯及二氣聯苯基_四羧酽 ~ C! -6淀基酯。 J A根據申請專利範圍第8項之方法,其中係將組合物於 機鹼存在下加熱。 ' 13· ~種形成積體電路之方法,其包括: 0)沈積金屬薄膜於基材上; -2- 本紙張尺度適用中國國家榡準(CNS ) A4说格(210 X 297公釐) --,-----Ί.--’衣-- (請先閲讀背面之注意ί項再填寫本頁) 訂 經濟部中央標準局員工消費合作社印製 ^369 4 6 A8 B8 C8 D8 % 、'申請專利範固 化)將該金屬薄膜以石印方式構圖: I ^^^1 - - - -- - - I *R»11 _— I - · - · 3-9 {請先閲讀背面之注^^項再填寫本頁) (c) 使介電组合物層沈積在具有圖樣之金屬薄膜上,該 組合物包含之反應物為有機聚二氧化矽及以 (R〇)m (R'\ SiR’-封端之聚酿胺酸酷,其中r與r係獨立 為烴基;R"為氫化基或烴基;m為1、2或3,且 n+m=3 ;及 (d) 加熱此組合物,以使反應物進行反應。 ’根據申請專利範圍第8項之方法,其中有機聚二氧化矽 為C1 - 6烷氧基矽烷、矽倍半氧烷或其混合物β .根據申請專利範圍第14項之方法,其中聚醯胺酸酯係 乂 — 'C卜ίο垸氧基秒燒基C卜丨0虎基或三c丨_1〇燒氧基石夕 境基芳基封端^ Κ根據申請專利範圍第14項之方法,其中聚醯胺酸酯包 含一種二胺,選自9,9,-雙(4-胺基苯基)苇、4,4,·氧基二苯 胺及U-雙(4-胺基苯基)_卜苯基_2,2,2-三氟乙烷,及一種 二酯二酸i化物,選自二氯焦蜜石酸:Ci6烷基酯、二 氯氧基二鄰苯二甲酸二(^_6烷基酯及二氯聯笨基-四羧 酸二烷基酯。 經濟部中央標隼局貝工消費合作社印製 R根據申請專利範圍第13項之方法,其中係將組合物於 有機驗存在下加熱。 18.—種介電组合物’係由溶解有機聚二氧化碎及以 (R0)m(R")nSiR_-封端之聚醯胺酸酯而製備,其中R與R,係 獨立為Μ基’ R"為氫化基或烴基,m為1、2或^,且 ;且加熱該結果混合物至—高溫以使得該聚 -3- 本纸張尺度逋用申國國家標芈(CNS ) A4C#· ( 2丨〇父加公釐) ' 436946 AS Β8 C8 D8 Η ; I) Λ 六、申請專利範圍 醯胺酸酯發生鏈延件及醯亞胺化,以及該機能化聚 亞醯胺之交聯縮合該聚二氧化矽。 -----------Τ--哀------訂 (請先閲讀背面之注意事項再填寫本頁) 19.根據申請專利範圍第18項之組合物,其中有機聚二氧 化石夕為C1 .6燒氧基碎燒、碎倍半氧燒或其混合物。 20·根據申請專利範圍第19項之组合物,其中該酯係以三_ C] - 1 〇境乳基石夕姨;基Ci _丨〇燒基或三-Ci _丨〇燒氧基矽境基 芳基封端。 21. 根據申請專利範圍第2〇項之組合物,其中聚醯胺酸酯 包含一種二胺’選自9,9,-雙(4-胺基苯基)苐、4,4,-氧基二 苯胺及U-雙(4-胺基苯基)-1-苯基·2,2,2-三氟乙烷,及一 種二酯二酸齒化物,選自二氯焦蜜石酸二心^烷基酯、 二氣氧基二鄰苯二甲酸二烷基酯及二氣聯苯基-四 幾酸二Cl_6烷基酯。 22. 種用以提供信號及動力電流至積體電路晶片之積體 電路封裝裝置,其包含: (1)基材,具有電導體用以連接至電路板, (⑴多個交替之電絕緣與導電層,位於基材上,其中至 ^ 一層包含有機聚二氧化碎及以(R〇)m (RH)n SiR__封端 經濟部中央標準局員工消费合作社印製 之聚醯胺酸酯之反應產物,其中R與R,係獨立為垣 基’ R”為氫.化基或fe基,m為1、2或3,且n+m=3 · 及 , (ui)多個通孔,用以使電導體、導電層及積體電路晶片 電互連。 23. 根據申請專利範圍第22項之裝置,其中有機聚二氧化 4 本紙張蝴(2丨0Χ297公釐) ABCD436946 穷 > If (> 穴、申請專利範圍 硬為Ch絲基找、料半氧Μ其混合物。 — ,卞』祀固矛d貝疋裝置,其中矽倍半氧烷為 丰基/ (2丨_ 6坑基碎倍半氧境。 _根在申凊專利範圍第23項之裝置,其中聚醯胺酸酯係 以二-ci-io烷氧基矽烷基(:卜1〇烷基或三(^-⑺烷氧基矽 故基芳基封端。 26.根據申請專利範圍第25項之裝置,其中聚醯胺酸酯包 含一種二胺’選自9,9,·雙(4-胺基苯基)苐、4,4,-氧基二苯 胺及U-雙(4,胺基苯基)_卜苯基_2,2,2_三氟乙烷,及一種 二醋二酸卣化物,選自二氣焦蜜石酸二Ci_6烷基酯、二 氣氧基二鄰苯二甲酸:Ci6烷基酯及二氣聯苯基-四羧 ^ — Α·6龍基@旨。 (請先閱讀背面之注^^項再填寫本頁) -•5 經濟部t央梯準局男工消費合作社印東 -5 本紙法尺度適用中國國家標準(CNS ) Α4規格(210Χ297公釐)
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JP (1) | JPH10135202A (zh) |
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US6323549B1 (en) * | 1996-08-29 | 2001-11-27 | L. Pierre deRochemont | Ceramic composite wiring structures for semiconductor devices and method of manufacture |
CN1171290C (zh) * | 1998-06-05 | 2004-10-13 | 佐治亚技术研究公司 | 多孔性绝缘材料及其制备方法 |
US6143643A (en) * | 1998-07-08 | 2000-11-07 | International Business Machines Corporation | Process for manufacture of integrated circuit device using organosilicate insulative matrices |
US6299721B1 (en) * | 1998-12-14 | 2001-10-09 | Gould Electronics Incl | Coatings for improved resin dust resistance |
JP3865115B2 (ja) * | 1999-09-13 | 2007-01-10 | Hoya株式会社 | 多層配線基板及びその製造方法、並びに該多層配線基板を有するウエハ一括コンタクトボード |
US6420441B1 (en) | 1999-10-01 | 2002-07-16 | Shipley Company, L.L.C. | Porous materials |
US6903006B2 (en) * | 2000-03-17 | 2005-06-07 | Matsushita Electric Industrial Co., Ltd. | Interlayer dielectric film, and method for forming the same and interconnection |
TWI226103B (en) | 2000-08-31 | 2005-01-01 | Georgia Tech Res Inst | Fabrication of semiconductor devices with air gaps for ultra low capacitance interconnections and methods of making same |
JP2004509468A (ja) | 2000-09-13 | 2004-03-25 | シップレーカンパニー エル エル シー | 電子デバイスの製造 |
US6998148B1 (en) | 2001-03-28 | 2006-02-14 | Shipley Company, L.L.C. | Porous materials |
JP3505520B2 (ja) * | 2001-05-11 | 2004-03-08 | 松下電器産業株式会社 | 層間絶縁膜 |
TW562822B (en) * | 2002-09-03 | 2003-11-21 | Chang Chun Plastics Co Ltd | Organic-inorganic hybrid film material and its preparation |
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EP0838853A3 (en) | 2000-01-05 |
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JPH10135202A (ja) | 1998-05-22 |
SG63750A1 (en) | 1999-03-30 |
CN1151558C (zh) | 2004-05-26 |
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