TW385506B - Composition and process for forming electrically insulating thin films - Google Patents
Composition and process for forming electrically insulating thin films Download PDFInfo
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- TW385506B TW385506B TW087104838A TW87104838A TW385506B TW 385506 B TW385506 B TW 385506B TW 087104838 A TW087104838 A TW 087104838A TW 87104838 A TW87104838 A TW 87104838A TW 385506 B TW385506 B TW 385506B
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- solvent
- solvents
- resin
- item
- composition
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- 239000000203 mixture Substances 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 title claims abstract description 23
- 239000010409 thin film Substances 0.000 title description 16
- 239000002904 solvent Substances 0.000 claims abstract description 85
- 239000011347 resin Substances 0.000 claims abstract description 83
- 229920005989 resin Polymers 0.000 claims abstract description 83
- 238000009835 boiling Methods 0.000 claims abstract description 8
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 claims description 21
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 claims description 21
- -1 methyl isobutyl Chemical group 0.000 claims description 20
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 17
- 239000001301 oxygen Substances 0.000 claims description 17
- 229910052760 oxygen Inorganic materials 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims description 13
- 238000000576 coating method Methods 0.000 claims description 12
- 238000011049 filling Methods 0.000 claims description 12
- 239000011877 solvent mixture Substances 0.000 claims description 12
- 239000011248 coating agent Substances 0.000 claims description 11
- KWKXNDCHNDYVRT-UHFFFAOYSA-N dodecylbenzene Chemical compound CCCCCCCCCCCCC1=CC=CC=C1 KWKXNDCHNDYVRT-UHFFFAOYSA-N 0.000 claims description 10
- 238000010438 heat treatment Methods 0.000 claims description 7
- 239000004215 Carbon black (E152) Substances 0.000 claims description 6
- PWATWSYOIIXYMA-UHFFFAOYSA-N Pentylbenzene Chemical compound CCCCCC1=CC=CC=C1 PWATWSYOIIXYMA-UHFFFAOYSA-N 0.000 claims description 6
- 238000010292 electrical insulation Methods 0.000 claims description 6
- 229930195733 hydrocarbon Natural products 0.000 claims description 6
- 150000002430 hydrocarbons Chemical class 0.000 claims description 6
- 239000005456 alcohol based solvent Substances 0.000 claims description 4
- 230000002079 cooperative effect Effects 0.000 claims description 4
- 239000003759 ester based solvent Substances 0.000 claims description 4
- 238000001704 evaporation Methods 0.000 claims description 4
- 238000009413 insulation Methods 0.000 claims description 4
- 125000001931 aliphatic group Chemical group 0.000 claims description 3
- 239000004615 ingredient Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 229920001296 polysiloxane Polymers 0.000 claims description 3
- DHKHKXVYLBGOIT-UHFFFAOYSA-N acetaldehyde Diethyl Acetal Natural products CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 claims description 2
- 239000003849 aromatic solvent Substances 0.000 claims description 2
- 150000001244 carboxylic acid anhydrides Chemical class 0.000 claims description 2
- 239000003054 catalyst Substances 0.000 claims description 2
- 239000003795 chemical substances by application Substances 0.000 claims description 2
- HHNHBFLGXIUXCM-GFCCVEGCSA-N cyclohexylbenzene Chemical compound [CH]1CCCC[C@@H]1C1=CC=CC=C1 HHNHBFLGXIUXCM-GFCCVEGCSA-N 0.000 claims description 2
- DENRZWYUOJLTMF-UHFFFAOYSA-N diethyl sulfate Chemical compound CCOS(=O)(=O)OCC DENRZWYUOJLTMF-UHFFFAOYSA-N 0.000 claims description 2
- 229940008406 diethyl sulfate Drugs 0.000 claims description 2
- 125000002485 formyl group Chemical class [H]C(*)=O 0.000 claims description 2
- 238000002309 gasification Methods 0.000 claims description 2
- 239000005453 ketone based solvent Substances 0.000 claims description 2
- 150000002576 ketones Chemical class 0.000 claims description 2
- 150000002632 lipids Chemical class 0.000 claims description 2
- 230000008018 melting Effects 0.000 claims description 2
- 238000002844 melting Methods 0.000 claims description 2
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 2
- 150000005846 sugar alcohols Polymers 0.000 claims description 2
- 238000012546 transfer Methods 0.000 claims description 2
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 claims 1
- 150000001241 acetals Chemical class 0.000 claims 1
- 125000004177 diethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical group [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 claims 1
- 239000004210 ether based solvent Substances 0.000 claims 1
- 150000007857 hydrazones Chemical class 0.000 claims 1
- 229910052743 krypton Inorganic materials 0.000 claims 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 claims 1
- 150000003058 platinum compounds Chemical class 0.000 claims 1
- 239000004576 sand Substances 0.000 claims 1
- 150000004756 silanes Chemical class 0.000 claims 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 claims 1
- 150000003623 transition metal compounds Chemical class 0.000 claims 1
- 230000015572 biosynthetic process Effects 0.000 abstract description 3
- 239000010408 film Substances 0.000 description 68
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 47
- 235000012431 wafers Nutrition 0.000 description 36
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 21
- 238000004528 spin coating Methods 0.000 description 21
- 239000010453 quartz Substances 0.000 description 20
- 239000007787 solid Substances 0.000 description 14
- 239000000377 silicon dioxide Substances 0.000 description 13
- 238000006243 chemical reaction Methods 0.000 description 12
- 229910052710 silicon Inorganic materials 0.000 description 12
- 239000010703 silicon Substances 0.000 description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 11
- 229910052757 nitrogen Inorganic materials 0.000 description 10
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
- 230000005856 abnormality Effects 0.000 description 9
- 239000001257 hydrogen Substances 0.000 description 9
- 229910052739 hydrogen Inorganic materials 0.000 description 9
- 239000004575 stone Substances 0.000 description 9
- 239000002253 acid Substances 0.000 description 8
- 150000004687 hexahydrates Chemical class 0.000 description 7
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 6
- 150000002431 hydrogen Chemical class 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 5
- 238000010494 dissociation reaction Methods 0.000 description 5
- 230000005593 dissociations Effects 0.000 description 5
- 239000010410 layer Substances 0.000 description 5
- 229920003209 poly(hydridosilsesquioxane) Polymers 0.000 description 5
- KVNYFPKFSJIPBJ-UHFFFAOYSA-N 1,2-diethylbenzene Chemical compound CCC1=CC=CC=C1CC KVNYFPKFSJIPBJ-UHFFFAOYSA-N 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N benzene Substances C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000000123 paper Substances 0.000 description 3
- 239000013557 residual solvent Substances 0.000 description 3
- 229910052702 rhenium Inorganic materials 0.000 description 3
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 3
- DSNHSQKRULAAEI-UHFFFAOYSA-N 1,4-Diethylbenzene Chemical compound CCC1=CC=C(CC)C=C1 DSNHSQKRULAAEI-UHFFFAOYSA-N 0.000 description 2
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- QUKGYYKBILRGFE-UHFFFAOYSA-N benzyl acetate Chemical compound CC(=O)OCC1=CC=CC=C1 QUKGYYKBILRGFE-UHFFFAOYSA-N 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- RWGFKTVRMDUZSP-UHFFFAOYSA-N cumene Chemical compound CC(C)C1=CC=CC=C1 RWGFKTVRMDUZSP-UHFFFAOYSA-N 0.000 description 2
- FLKPEMZONWLCSK-UHFFFAOYSA-N diethyl phthalate Chemical compound CCOC(=O)C1=CC=CC=C1C(=O)OCC FLKPEMZONWLCSK-UHFFFAOYSA-N 0.000 description 2
- SNRUBQQJIBEYMU-UHFFFAOYSA-N dodecane Chemical compound CCCCCCCCCCCC SNRUBQQJIBEYMU-UHFFFAOYSA-N 0.000 description 2
- MTZQAGJQAFMTAQ-UHFFFAOYSA-N ethyl benzoate Chemical compound CCOC(=O)C1=CC=CC=C1 MTZQAGJQAFMTAQ-UHFFFAOYSA-N 0.000 description 2
- 238000005194 fractionation Methods 0.000 description 2
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 2
- MLFHJEHSLIIPHL-UHFFFAOYSA-N isoamyl acetate Chemical compound CC(C)CCOC(C)=O MLFHJEHSLIIPHL-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000006210 lotion Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 2
- CXQXSVUQTKDNFP-UHFFFAOYSA-N octamethyltrisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)O[Si](C)(C)C CXQXSVUQTKDNFP-UHFFFAOYSA-N 0.000 description 2
- HFPZCAJZSCWRBC-UHFFFAOYSA-N p-cymene Chemical compound CC(C)C1=CC=C(C)C=C1 HFPZCAJZSCWRBC-UHFFFAOYSA-N 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 239000002243 precursor Substances 0.000 description 2
- HQDYNFWTFJFEPR-UHFFFAOYSA-N 1,2,3,3a-tetrahydropyrene Chemical compound C1=C2CCCC(C=C3)C2=C2C3=CC=CC2=C1 HQDYNFWTFJFEPR-UHFFFAOYSA-N 0.000 description 1
- IOKSQICBBBYMRI-UHFFFAOYSA-N 1,2-diethylbenzene phthalic acid Chemical compound C(C)C1=C(C=CC=C1)CC.C(C=1C(C(=O)O)=CC=CC1)(=O)O IOKSQICBBBYMRI-UHFFFAOYSA-N 0.000 description 1
- HGUFODBRKLSHSI-UHFFFAOYSA-N 2,3,7,8-tetrachloro-dibenzo-p-dioxin Chemical compound O1C2=CC(Cl)=C(Cl)C=C2OC2=C1C=C(Cl)C(Cl)=C2 HGUFODBRKLSHSI-UHFFFAOYSA-N 0.000 description 1
- PTTPXKJBFFKCEK-UHFFFAOYSA-N 2-Methyl-4-heptanone Chemical compound CC(C)CC(=O)CC(C)C PTTPXKJBFFKCEK-UHFFFAOYSA-N 0.000 description 1
- VJKHMZIJJRHRTE-UHFFFAOYSA-N 2-butoxy-2-oxoacetic acid Chemical compound CCCCOC(=O)C(O)=O VJKHMZIJJRHRTE-UHFFFAOYSA-N 0.000 description 1
- WOYWLLHHWAMFCB-UHFFFAOYSA-N 2-ethylhexyl acetate Chemical compound CCCCC(CC)COC(C)=O WOYWLLHHWAMFCB-UHFFFAOYSA-N 0.000 description 1
- AJEUTPLLTRJDSH-UHFFFAOYSA-N 2-methyl-2-phenyloxane Chemical compound C=1C=CC=CC=1C1(C)CCCCO1 AJEUTPLLTRJDSH-UHFFFAOYSA-N 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- KVAWUHRMJNFEOD-UHFFFAOYSA-N C[Cu]CC(C)C Chemical compound C[Cu]CC(C)C KVAWUHRMJNFEOD-UHFFFAOYSA-N 0.000 description 1
- PFJFNQUFMTYCHB-UHFFFAOYSA-N C[SiH2]N[SiH3] Chemical compound C[SiH2]N[SiH3] PFJFNQUFMTYCHB-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- PMPVIKIVABFJJI-UHFFFAOYSA-N Cyclobutane Chemical compound C1CCC1 PMPVIKIVABFJJI-UHFFFAOYSA-N 0.000 description 1
- 101100136092 Drosophila melanogaster peng gene Proteins 0.000 description 1
- 101150000419 GPC gene Proteins 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 241001674048 Phthiraptera Species 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- PJANXHGTPQOBST-VAWYXSNFSA-N Stilbene Natural products C=1C=CC=CC=1/C=C/C1=CC=CC=C1 PJANXHGTPQOBST-VAWYXSNFSA-N 0.000 description 1
- 241000779819 Syncarpia glomulifera Species 0.000 description 1
- GJWAPAVRQYYSTK-UHFFFAOYSA-N [(dimethyl-$l^{3}-silanyl)amino]-dimethylsilicon Chemical compound C[Si](C)N[Si](C)C GJWAPAVRQYYSTK-UHFFFAOYSA-N 0.000 description 1
- 125000002777 acetyl group Chemical class [H]C([H])([H])C(*)=O 0.000 description 1
- 150000001335 aliphatic alkanes Chemical class 0.000 description 1
- 125000003545 alkoxy group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000012752 auxiliary agent Substances 0.000 description 1
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical compound C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 1
- 229940007550 benzyl acetate Drugs 0.000 description 1
- 229960000411 camphor oil Drugs 0.000 description 1
- 239000010624 camphor oil Substances 0.000 description 1
- 230000000747 cardiac effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000012700 ceramic precursor Substances 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- DIOQZVSQGTUSAI-NJFSPNSNSA-N decane Chemical compound CCCCCCCCC[14CH3] DIOQZVSQGTUSAI-NJFSPNSNSA-N 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000005243 fluidization Methods 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 238000010571 fourier transform-infrared absorption spectrum Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-M hexanoate Chemical compound CCCCCC([O-])=O FUZZWVXGSFPDMH-UHFFFAOYSA-M 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 238000012966 insertion method Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229940117955 isoamyl acetate Drugs 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 239000003350 kerosene Substances 0.000 description 1
- 210000003127 knee Anatomy 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000035800 maturation Effects 0.000 description 1
- 235000012054 meals Nutrition 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000008267 milk Substances 0.000 description 1
- 210000004080 milk Anatomy 0.000 description 1
- 235000013336 milk Nutrition 0.000 description 1
- 239000012046 mixed solvent Substances 0.000 description 1
- DIOQZVSQGTUSAI-UHFFFAOYSA-N n-butylhexane Natural products CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 1
- YTZKOQUCBOVLHL-UHFFFAOYSA-N p-methylisopropylbenzene Natural products CC(C)(C)C1=CC=CC=C1 YTZKOQUCBOVLHL-UHFFFAOYSA-N 0.000 description 1
- 239000011088 parchment paper Substances 0.000 description 1
- 239000001739 pinus spp. Substances 0.000 description 1
- SSVFCHUBLIJAMI-UHFFFAOYSA-N platinum;hydrochloride Chemical compound Cl.[Pt] SSVFCHUBLIJAMI-UHFFFAOYSA-N 0.000 description 1
- 238000006068 polycondensation reaction Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920000259 polyoxyethylene lauryl ether Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- PJANXHGTPQOBST-UHFFFAOYSA-N stilbene Chemical compound C=1C=CC=CC=1C=CC1=CC=CC=C1 PJANXHGTPQOBST-UHFFFAOYSA-N 0.000 description 1
- 235000021286 stilbenes Nutrition 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 229940036248 turpentine Drugs 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
- 239000010455 vermiculite Substances 0.000 description 1
- 229910052902 vermiculite Inorganic materials 0.000 description 1
- 235000019354 vermiculite Nutrition 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H01L21/02134—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material comprising hydrogen silsesquioxane, e.g. HSQ
-
- H—ELECTRICITY
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Description
經濟部中央標準局員工消費合作社印製 A7 B7- 五、發明説明( 本發明係關於一種形成啻锶换播诚、 , 少风%絕緣溥膜I組合物,及形成電 、邑緣薄膜(方法。更特足Έ•之,本發明係關於一種形成具 有低介電常數之絕緣薄膜之組合物與方法。 已知梦石之絕緣薄膜係在電子裝置中作;爲保護層及作爲 乱、.邑緣層使用。包含樹脂與容劑之组合物濕塗料,係一般 1·生地且廣泛地採用於此領域中。例如,美國專利4,756,977 陳述—種㈣石薄膜塗覆電子裝置之方法,其係將氫輕 丰歧樹脂之溶劑溶液塗敷於基材上,蒸發溶劑,然後在 150^:至ι’οοοτ之溫度下加熱’以達成轉化成似陶资之珍石 田裝置具有縮小之尺寸JL變得更高度地整合時,此等絕 緣層需要較低介電常數。例如,已報告藉由氳石夕倍半氧燒 樹恥之熟化所獲得之薄膜 '具有介電常數爲2.7 (日本應用 物理:曰及相關學會第43'版擴大摘要,第654頁,摘要26a-N·6) 仁疋,低於2.7之介電常數爲在具有設計尺度比〇 i8微米 窄之下-代高度積體電路中之電絕緣薄膜所需要的。雖然 如此,迄今尚未發現安定且高度可再現地在適合高度積體 電路m轉膜中,例如切石薄膜中,產生此種低介 電常數之方法。 另方面,—般已知可將絕緣薄膜本身作成多孔性結構 、降低、.¾緣薄膜之介電常數。例如,美國專利Μ48,⑼ 告經由使用氫矽倚丰氧烷樹脂之烘烤產物作爲高度積 ,電路中之介電層,形成具有多孔性結構之絕緣薄膜。但 是,該美國專利,159並未揭示形成多孔性結構之特定方法 。因此,能夠形成具有低介電常數(介電常數實質上低於 (諳先閲讀背面之注意事孔再填寫本頁)
\ 五、 發明説明(2 經濟部中央榡準局員工消費合作社印製 2.7)之電絕緣薄膜之組合物與方法,仍然未知。 本發明之一項目的,#爲|^ . 制、Λ 保局徒供—種組合物與方法,其可 I造一種具有低介電常數之雷绍铁呀> 、 吊歡夂私絕緣薄膜,特別是具有介電 t數低於2.7者。 ; 1私 本發明係關於一種可形成絕緣薄膜之组合物,立包本 (A) -種樹脂’選自包括電絕緣可熟化有機樹脂與電°絕 緣可熟;(匕無機樹脂;及 (B) —種溶劑混合物,其包含 (i) 一種能夠溶解樹脂(A)之溶劑,與 (11) 一種洛劑,其沸點或蒸氣壓曲線或對樹脂⑷之 親和力與溶劑(i)不同。 此组合物可用於形成具有低介電常數(<2·7)之電絕緣薄膜 〇 本發明係關於一種可形成絕綠薄膜之組合物,其包含 (Α) —種樹脂,選自包括電絕緣可熟化有機樹脂與電絕 緣可熟化無機樹脂;及 (Β) —種溶劑混合物,其包含 (0 —種能夠溶解樹脂(Α)之溶劑,與 · ⑻一種溶劑’其沸點或蒸氣壓曲線或對樹脂(Α)之 親和力與溶劑(i)不同。- 樹脂(A)可爲無機性或有機性且並不重要,只要其爲溶劑 可▲即可’在其塗敷後可藉加熱熟化,並提供絕緣作用。 此樹脂之實例爲烷氧基矽烷之部份i解物,無機樹脂,其 爲梦石先質樹脂,例如氫矽倍半氧烷樹脂,及有機樹脂, 本紙張尺度適用中國國家標準(CNS )八4規格(21〇χ 297公董) ;請先閱讀背面之注意事項再填寫本頁) '衣' 訂--- up “ 1
Α7 B*L 經濟部中央榡準局員工消費合作衽印製 五、發明説明( 譬如聚酿亞胺樹脂、氟碳樹脂、苯并環丁烯樹脂及氣化聚 烯丙基醚。此樹脂可採取單一樹脂或兩種或多種樹脂混合 物之形式。具有熟化成矽石之能力之矽石先質樹脂,係: 供特別良好又電絕緣性質,且因此是較隹岛。 、在$石先質樹脂中,可使用於非逆㈣方法中之氯秒倍 半氧燒樹脂係爲特佳的。於本發明中使用之氫珍倍半氧广 η馬:矽馬烷,其主要骨架係由三官能性矽氧烷單位 1 3/2所组成,且爲—種具有通式之聚合體,其 中下標η爲正整數。從分子結構觀點見之,此氫矽倍丰氧 乾樹脂包括所謂梯型聚碎氧燒與籠㈣♦氧燒。梯型聚夺 氧燒之末端可被封端,例如被羥基,三有機碎烷氧基,譬
如二甲基矽烷氧基,或二有機氫矽烷氧基,學如二 矽烷氧基。 ° L ”虱石夕倍半氧燒樹脂係爲已知,且通常可藉三氣硬燒之水 解作用’及接著進行聚縮合作用合成而得(參閲美國專利 ,,2及曰本專利申請案特許公開(公開或未經審查), 特開昭 59-189126 (189,而1984)與特開昭 60_42426 (42,鑛985^ λ溶劑混合物⑻包含溶劑⑻㈣溶劑⑻⑻。溶劑剛應 能夠溶解樹脂(A)而不會發生化學變化,但其他方面並不重 要。溶劑(B)(i)可舉例如下,芳族溶劑,譬如甲苯、二甲苯 等肊族’奋劑,譬如$烷、庚烷、辛烷等;酮溶劑,譬如 基_甲基異丁基_等;脂族酯溶劑,孽如醋酸丁 醋:醋酸異戊醋等,·及梦氧溶劑,譬如鏈甲基珍氧烷,例 如π甲基二矽氧烷與咖·四甲基二矽氧烷、環狀矽氧烷 本紙( 210Χ2?7公釐) (讀先閲讀背面之注意事項再填寫本頁)
五、發明説明(4 ) ’例如1,1,3,3,5,5,7,7-人甲基四環砍氧燒與-四甲基四環 碎乳燒,及碎燒’譬如四甲基梦貌與二甲基二乙基碎燒。 甲基異丁基酮與矽氧溶劑係爲較佳的。 、溶劑爲其沸點或蒸氣壓曲線或對與脂(六)之親和力 入’合劑(B)(1)不同之洛劑。具有沸點高於溶劑⑻①之溶劑 通常係爲較佳的。溶劑⑼⑻係舉例如下(於括弧中之 數値爲化合咚之沸點):烴溶劑,譬如戊基苯(2〇2,c )、異 丙基苯(152°C )、1,2-二乙基苯(183〇C )、以二乙基苯(18ΐχ:) 、1,4-二乙基苯(184°C )、環己基苯(239°c )、二戊埽(177。〇)、 2,6-二曱基莕(262°C )、對-甲基異丙基苯(irrc )、樟腦油(16〇_ 185 C )、溶劑石腦油(u〇_2〇〇°c )、順式_十氫_ (196»〇)、反 式-十氫茬(187°C )、癸烷(174°C )、四氫莕(2〇7。0 )、松節油 (153-175°C )、煤油(200-245°C )、十二烷(216°C )、十二基苯(分 枝狀)等;酮與醛溶劑,譬如苯乙酮(2〇i.7°C )、異樹根皮酮 (215.3 °C )、樹根皮酮(198-199°C )、曱基環己酮(169.0-170.5 °C ) 經濟部中央標隼局員工消費合作社印製 、曱基正-庚基酮(195.3°C )等;酯溶劑,譬如鄭苯二曱酸二 乙酯(296.1°C )、醋酸芊酯(215.5Ό )、r - 丁内脂(204°C )、草 酸二丁酯(240°C )、醋酸2-乙基己酯(198.6°C )、苯曱酸乙酯 (213.2°C )、曱酸苄酯(203eC )等;硫酸二乙酯(208°C )、環丁 颯(285°C )及自基烴溶劑;經醚化之烴溶劑;醇溶劑;醚/ 縮醛溶劑;多羥醇溶劑;羧酐溶劑;酚溶劑;及矽氧溶劑 。雖然,溶劑混合物(B)之添加量並不重要,但溶劑混合物 通常較佳係以每100重量份數成份(又)不超過5〇重量。/。之量 添加。 , ______. — —___ 本紙張尺度適用中國國家標準( CMS〉A4規格(210X297公釐) A7 B7' 5 經濟部中央榡準局員工消費合作杜印製 五、發明説明( 混合物⑻並非只是採用於本發明中作 溶剩而已。正如下文所討論者,,田( 期間或之㈣氣化並自㈣Μ,於樹脂(A)熟化 間在電絕緣薄膜中,結果產生低介 二隙或自由空 高… %电數電絕緣薄膜。主 要落狀大部份,在塗料基材上之後將立即兹發,卜 :份仍然留在薄膜中,且此殘留溶劑表現得有如上述:但 是,爲有效地a達成上述㈣,溶劑混合物⑻不僅含有主要 溶劑剛,而是混合物,其具有至少!種選自溶糊⑻之 溶劑’其具有比主要溶劑較高之滞點,或具有不同芪氣壓 曲線,意即較難以蒸發,或具有對樹脂㈧之不同親和力。 在已將组合物塗覆於基材上之後,,匕溶劑⑻⑻仍然以較大 量留在生膜中,且在樹脂熟化期間或之後,亦將被蒸發及 2系統逐出。溶劑(B)(ii)之類型並不重要,但應經選擇以獲 得與樹脂熟化溫度之最適宜關係。 成份(C)爲一種在選用基礎上.爲加速樹脂(A)熟化之目的 而添加之成份。當基於觸發與成份田)之氣體產生溫度之良 好平衡之考量時,其變得必須在較低溫度下先行引致成扮 (A)之部份交聯,則使用熟化加速劑(c)。當使用氫矽倍半 氧烷樹脂作爲成份(A)時,熟化加速劑⑹較佳爲鉑觸媒, 譬如氫氯鉑酸或鍺觸媒《對各—1,〇〇〇,〇〇〇重量份數之樹脂(A) 而言’此種熟化加速劑.(C)係以1至500重量份數使用。 此外,在一些情況中,可添加輔助劑,例如安定劑,嬖 如界面活性劑,以幫助溶劑混合物(B)之分散。 當氬矽倍半氧烷樹脂作爲樹脂(A)使用時,加熱此組合物 本紙張尺度適用中國.國家標準(CNS ) A4,規格(210X 297公釐) (讀先閲讀肯面之;这意事碩再填寫本頁)
A7 B7- 經濟部中央標準局員工消费合作社印製 五、發明説明U ) 會造成電絕緣薄膜形成,例切石薄膜。於本文中使用之 碎石係指二氧切(叫),且包括非晶質硬石及未完全不 。夕烷醇及/或氫之非晶質矽石。在添加陶瓷先質之情況 中,此矽石亦含有其相應之化合物。 ; 可使用於根據本發明方法中之基材,其實例爲陶瓷基材 ,各種金屬基材及電子裝置,較佳爲電子裝置。 用以形成電/g緣薄膜之方法,包括 0)以用以形成電絕緣薄膜之组合物塗覆基材表面,該組合 物包含 (A) -種電絕緣可熟化樹脂,選自電絕緣無機樹脂與電 絕緣有機樹脂;與 (B) :種落劑混合物’其包含(i) 一種能夠溶解成份⑷之 溶劑,與⑻—種其沸點或蒸氣壓曲線與溶劑(B)(i)不 #同或其對樹脂(A)之親和力與溶劑田⑹不同之溶劑; (Π)蒸發至少一部份溶劑混合物⑻;及 ㈣接著加錢材,^該樹轉)減_或錢後 致殘留溶劑(B)氣化。 將包含(A)與⑻之可形成絕緣薄膜之組合物,塗覆於其 材表面上,並使-部份溶劑混合物⑻蒸發。可應用之塗^ 万法]其實例爲旋轉塗覆、浸漬、噴霧及流動塗覆。使一 部份溶劑混合物(B)蒸發之方法並不重要,且可舉例如下, 靜置於環境或高溫下,及在空氣中乾燥,在減壓下或於: 流下。在蒸發一郡份之步驟期間,係產生軋 部扮係自系統中逐出’並在絕緣薄膜中相應形成中^孔 本紙張尺度適用中國國家標準(CNS ) A4規格(210Χ297^釐) —-I !I- — if - -Γ -- I— t - -— (諳先閱讀背面之注意事項再填寫本頁)
、1T -參 A7 B7' 經濟部中央標準局員工消費合作社印製 五、發明説明(7 ) 性結構或自由空間。 接著將基材加熱,以在樹脂(A)熟化期間或之後,氣化殘 留溶劑混合物(B)。加熱溫度對此並不重要,只要使用之溫 度會造成溶劑混合物(B)之氣化作用即可。’但是,依特定目 的而定,當期望電絕緣薄膜熔解以使基材平面化時,加熱 必須進行至高於樹脂(A)熔點之溫度。用於此加熱之裝置再 一次並不重夭,且可使用一般使用之加熱器,譬如烘箱、 熱板等。 ' 可形成絕緣薄膜之组合物,具有形成低介電常數絕緣薄 膜之能力,並可用於需要此種性質之應用,例如作爲一種 商用方法,用以在譬如電子裝置等之基材上製造低介電常 數絕緣薄膜。 實例 提出下述實例’以致熟諳此藝者可瞭解及認知本文中所 陳述之發明.,應明瞭的是,此等實例不應用以限制申請專 利範圍中所列示之本發明_範圍。 於實例中對於矽石之轉化率,係使用Fourier變換紅外線 吸收光譜分析,經由度量薄膜中之殘留siH%加以評估。於 薄膜中之殘留SiH%,係使用旋轉塗覆後之100% SiH%計算 而得。介電常數係於25Ό與1百-萬赫茲下,對於在具有電 阻係數爲1CT 2 Ώ · cm之兮晶圓上所形成之試樣進行度量。此 度量法係藉插入方法,使用鋁電極及阻抗分析器進行操作 〇 實例1 , "10- M民張尺度適用中國國家標準(CNS ) ( 210X297公釐) --I I I-—I ----Γ.-- I 一 抑衣-I_ ,\. (諳先閩讀背面之注意事項再填寫本頁} 訂-- ΙΦ---- 經濟部中央標準局員工消費合作社印製 A 7 B7' , 五、發明説明(8 ) 氫矽倍半氧烷樹脂係藉曰本專利公告(Kokoku)特公昭47-31838 (美國專利3,615,272)之實例1中所述之方法合成。藉凝 膠滲透層析(GPC)分析氫矽倍半氧烷樹脂產物,獲得數目平 均分·,量爲1,540,及重量平均分子量爲7,允5。根據日本專 利申請案特許公開(公開專利案或未經審查)Hei 6- ) 157760 (157,760/1994)(美國專利5,416,190)之實例1中所述之方 法,使氫矽倚半氧烷樹脂接受分子量分級分離。藉GPC分 析所回收溶離份(’Ή-樹脂溶離份")中之氫矽倍半氧烷樹脂, 獲得數目平均分子量爲5,830,及重量平均分子量爲11,200 。在GP C度量法中之條件爲:
儀器:802A,得自Tosoh公司 管柱:G3000/G4000/G5000/G6000 載體溶劑:甲苯 柱溫:30°C 分子量標準物:聚苯乙烯 檢測.:差示折射計 試樣:2重量%固體(甲苯溶液) 將H-樹脂溶離份溶解於甲基異丁基酮中,以製備22重量 % (固體)溶液。於其中添加1重量%十二基苯,以甲基異 丁基酮溶液爲基準,以及100 ppm重量之氫氯#酸六水合物 ,以H-樹脂溶離份爲基準。製造具有6,060埃厚度之薄膜, 其方式是將溶液旋轉塗覆於矽晶圓上,在500 rpm之初步旋 轉下歷經3秒,然後在3,000 ipm之主要旋轉下歷經10秒,接 著在室溫下靜置10分鐘。將晶圓於空氣流下,,在250°C石英 ;_-11- _ 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) (讀先閱讀背面之注意事項再填寫本頁) '袈' •1T丨 經濟部中央標準扃員工消费合作社印製 、發明説明(9 時,!供烤1小時’移除並使其在室溫下靜置10分鐘。此 使,π,在甲基異丁基網中之溶解度係低於旋轉塗覆後。 在㈣石英供箱中,於含π)鹏氧之氮氣流下回火 中時^取出並使其在室溫下靜置时鐘;。在所形成薄膜 中未L 4 &Η% A 78%,確認轉化至#石確已發生。於薄膜 中未發現異常,意即裂餐 a缝寺。此薄膜之介電常數爲2·4。
--— A 將Λ例1中製成之H_樹脂溶離份溶解於甲基異丁基酮中 ^製備22重量%(固體)溶液。於其中添加1〇重量%十二 ’苯;< 甲基異丁基_落液爲基準,以及動ppm重量之氯 m合物,以h•樹脂落離份爲基準。製造具有_〇 厚度心溥膜,其方式是將溶液旋轉塗覆於砍晶圓上,在 500 rpm之初步旋轉下歷智 缺你士 下歷經1〇秒,接著在二然後在3,00—之主要旋轉 ‘至恤下靜置10分鐘。將晶圓於空氣流 下,在250 0石英伴篇由l4^ 1 t , 匕成 央烘相中烘烤1小時,移除並使其在室溫下 於』=後此時,薄膜在甲基異丁基酮中之溶解度係低 於㈣塗覆後。使晶圓在鑛石英烘箱巾,於含10ppm氧 之氮氣流下回火1小時,勒山斗7土# 吁,取出輩使其在室溫下靜置10分鐘 。在薄膜中之殘留siH%爲79%,確認轉化至硬石確已發生 ,於薄膜中未發現異$,意即裂缝等。此薄膜之介電常數 爲 2.4 _。 I .. 實例3 將實例1中製成之H-樹脂溶離份溶解於甲基異丁基銅中 ’以製備35重量%(固體)溶液β於其中添加1Ό重量。/。十二 ------------------ - 1夕灣 本紙張纽適财酬$網t ί CNsTA4^r^7^97i^—
A7 B7' 五 經濟部中央標準局員工消費合作社印製 A7 B7 一 五、發明説明(1〇 ) 基苯,以所製成之甲基異丁基酮溶液爲基準,以及100 ppm 重量之氫氯鉑酸六水合物,以Η-樹脂溶離份爲基準。製造 具有13,700埃厚度之薄膜,其方式是將溶液旋轉塗.覆於矽 晶圓上,在500 rpm之初步旋轉下歷經3秒;然後在2,000 rpm 之主要旋轉下歷經10秒,接著在室溫下靜置10分鐘。將晶 圓於空氣流下,在250°C石英烘箱中烘烤1小時,移除並使 其在室溫下雙置10分鐘。此時,薄膜在甲基異丁基酮中之 溶解度係低於旋轉塗覆後。使晶圓在400°C石英烘箱中,於 含10 ppm氧之氮氣流下回火1小時,取出並使其在室溫下靜 置10分鐘。在所形成薄膜中之殘留SiH%爲79%,確認轉化 至矽石確已發生。於薄膜中未發現異常,意即裂缝等。此 薄膜之介電常數爲2.4.。 實例4 將實例1中製成之H-樹脂溶離份溶解於曱基異丁基酮中 ,以製備22重量。/。(固體)溶液。於其中添加10重量。/〇鄰苯 二甲酸二乙酯,以曱基異丁基酮溶液爲基準,以及100 ppm 重量之氫氯鉑酸六水合物,以Η-樹脂溶離份爲基準。製造 具有6,300埃厚度之薄膜,其方式是將溶液旋轉塗覆於矽晶 圓上,在500 rpm之初步旋轉下歷經3秒,然後在3,000 rpm之 主要旋轉下歷經10秒,接著在t溫下靜置10分鐘。將晶圓 於空氣流下,在250°C石英烘箱中烘烤1小時,移除並使其 在室溫下靜置10分鐘。此時,薄膜在甲基異丁基酮中之溶 解度係低於旋轉塗覆後。使晶圓在400°C石英烘箱中,於含 10 ppm氧之氮氣流下回火1小時,取出並使其在室溫下靜置 _-13-_' _ 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (讀先閔讀背面之注意事項再填寫本頁)
、1T .— A7 B7 一 經濟部中央標準局員工消費合作社印掣 五、發明説明(11 ) '—~ 10分鐘。在所形成薄膜中之殘留SiH%爲78〇/。,確認轉化至 矽石確已發生。於薄膜中未發現異常,意即裂缝等。此薄 膜之介電常數爲2.4。 實例5 _ ) 7 氫矽倍半氧fe樹脂係藉曰本專利公告讲〇k〇ku)特公昭 31838 (美國專利3,615,272)之實例j中所述之方法合成。藉 GPC分析氫矽#半氧烷樹脂產物,獲得數目平均分子量爲 1,540 ’重量平均分子量爲7,7()5,及具有分子量不大於⑽ t成份含量之値爲41重量%。根據日本專利申請案特許公 開(公開專利案或未經審查)Hd 6_15776〇 (157,76〇/1994)(美國專 利5,416,190)之實例i 1所述之方法,使氫矽倍半氧烷樹脂接 藉GPC分析所回收溶離份(,Ή-樹脂溶離 燒樹脂,獲得數目平均分.子量爲.743, 重量平均分子量爲l,kl3,及具有分子量不大於15〇〇之成份 含量之値爲72重量%。在GPC度量法中之條件,係與實例 1中所報告者相同。 將此溶離份溶解於六甲基二矽氧烷/八甲基三矽氧烷混 合溶劑(30/70)中,以製備30 % (固體)溶液。於其中添加1〇 重量0/。十二基苯,以六甲基二矽氧烷/八曱基三矽氧烷溶 液爲基準,以及l〇〇ppm重量之氳氯鉑酸六水合物,以沁樹 脂溶離份爲基準。製造.具有6,320埃厚度之薄膜,其方式是 將;4液旋轉塗覆於石夕晶圓上,在5〇〇 之初步旋轉下歷經 3秒,然後在3,000ipm之主要旋轉下歷經1〇秒,接著在室溫 下靜置10分鐘。將晶圓於空氣流下,在2〇(rc石英烘箱中烘 受分子量分級分離。 份")中之氫矽倍半氧 14- 本紙張尺度適用中國國家標率(CMS ) A4規格(210χ297公楚) •I —^1· ml 1--1 k -訂
Lm. A7 B7~ 經濟部中央標準局員工消費合作社印製 五、發明説明(12 ) 烤1小時’移除並使其在室溫下靜置10分鐘。此時,薄膜 在甲基異丁基酮中之溶解度係低於旋轉塗覆後。使晶圓在 400C石荚烘箱中,於含1〇ppm氧之氮氣流下回火】小時, 取出並使其在室溫下靜置10分鐘。在所形;成薄膜中之殘留
SiH%爲7〇%,確認轉化至矽石確.已發生。於薄膜中未發現 異常’意即裂缝等。所形成薄膜之介電常數爲2.2。 實例6 ts 知1〇重量%十二基苯添加至有機旋轉塗覆玻璃(OCD-7型 得自 Tokyo Oka Kogyo Kabushiki Kaisha)。形成具有 6,300 埃厚度 <薄膜,其方式是將溶液旋轉塗覆於矽晶圓上,在5〇〇rpm 之初步旋轉下歷經3秒,然後在3,〇〇〇rpm之主要旋轉下歷經 10秒,接著在室溫下靜置10分鐘。將晶圓於空氣流下,在 250。。石英烘箱中烘烤1小時,移除並使其在室溫下靜置10 分鐘。此時,薄膜在甲基異丁基酮中之溶解度係低於旋轉 ,覆後。使晶圓在400X:石英烘箱巾,於含1〇ppm氧之氮氣 二下回火1小時,取出並使其在宣溫下靜置1〇分鐘。於薄 膜中未發現異常,意即裂缝等。此薄膜之介電常數爲27。 實例7 將根據日本專利公告阳如㈣特公昭47_31838 (美國專利 3,615,272)之實们中所述之方法_合成之氫碎倍半氧賴脂( 平均刀-1,540且重量平均分子量=7,7〇5)溶解於甲基異 網中,〃製備26重量% (固體)溶液。於其中添加重 十苯,以甲基異丁基_溶液爲基準,以及1〇〇Ppm K虱氯鉑酸六水合物,以樹脂爲基準。製備具有6,2〇〇 (CNS ) A4規格(2丨0X297公釐) (諳先閲讀背面之注意事項再填1¾本頁}
經濟部中央標準局員工消費合作社印製 A7 B7 - ' 五、發明説明(13 ) 埃厚度之薄膜,其方式是將溶液旋轉塗覆於矽晶圓上,在 500 rpm之初步旋轉下歷經3秒,然後在3,000 rpm之主要旋轉 下歷經10秒,接著在室溫下靜置10分鐘。將晶圓於空氣流 下,在250°C石英烘箱中烘烤1小時,取出'並使其在室溫下 靜置10分鐘。此時,薄膜在曱基異丁基酮中之溶解度係低 於旋轉塗覆後。使晶圓在400°C石英烘箱中,於含10 ppm氧 之氮氣流下吗火1小時,取出並使其在室溫下靜置10分鐘 。在薄膜中之殘留SiH%爲75%,確認轉化至矽石確已發生 。於薄膜中未發現異常,意即裂缝等。此薄膜之介電常數 爲 2.4。 實例8 將實例1中製成之H-樹脂溶離份溶解於曱基異丁基酮中 ,以製備22重量。/。(固體)溶液。於其中添加10重量。/。十二 基苯,及1童量。/。聚氧化乙烯月桂基醚,以曱基異丁基酮 溶涑爲基準。製造具有6,450埃厚度之薄膜,其方式是將溶 液旋轉塗覆於珍晶圓上,在500 rpm之初步旋轉下歷經3秒 ,然後在3,000 ipm之主要旋轉下歷經10秒,接著在室溫下 靜置10分鐘。 實例9 將實例1中製成之H-樹脂溶軼份溶解於甲基異丁基酮中 ,以製備22重量。/。(固體)溶液。於其中添加10重量。/〇十二 基苯,以甲基異丁基酮溶液爲基準。製造具有6,300埃厚度 之薄膜,其方式是將溶液旋轉塗覆於珍晶圓上,在500 rpm 之初步旋轉下歷經3秒,然後在3,000 rpm之主要旋轉下歷經 __ -16-__ 表紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) --------^---厂衣------訂-------S||jP (讀先閣讀背面之注意事項再填寫本頁) A7 B7 — 經濟部中央標準局員工消費合作社印^ 五、發明説明(14 ) ~~ : ' --- 10秒,接著在室溫下靜 , 置10刀鐘。使晶圓在400°C石英烨铲 中,於含10PPm氧之氮氣、、* 々央烘相 紙巩机下回火1小時,取出並在玄加 保持10分鐘。在薄膜中士 至恤下 ^ p ^ ^ u中〈殘留SiH%爲77%,確認轉化至 石:已發生。於溥膜中未發現異常,意即,裂缝等 之介電常數爲2.4。 存膝 實例10 將實例1中|i成樹脂溶離份溶解於甲基異丁基嗣中 以製備22重! /。(固體)溶液。於其中添加忉重量。,。戊基 苯:以甲基異丁基_溶液爲基準,以及IGOppm重量之氫^ 鉑酸六水合物,以H~街脂溶離份爲基準。製造具有6,500埃 厚度t薄膜,其方式是將溶液旋轉塗覆於矽晶圓上,在 50〇Ipm之初步旋轉下歷經3秒,然後在3,〇〇〇jpm之主要旋轉 下歷經1G秒,接著在室溫下靜置1()分鐘。將晶圓於空氣流 下在250 C石英烘箱中烘烤J小時,取出並在室溫下保持 10分鐘。在薄膜中之殘留SiH%爲91%,確認轉化至矽石確 已發生。於薄膜中未發現異常,意即裂缝等。此薄膜之介 電常數爲2.7。 實例11 . 將實例1中製成之H-樹脂溶離份溶解於甲基異丁基_中 ’以製備18重量% (固體)溶液。-於其中添加1〇重量0/〇十二 基苯’以甲基異丁基溶液爲基準,以及100 ppm重量之氫 氯銘酸六水合物,以H-樹脂溶離份爲基準。將此溶液旋轉 塗覆於具有圖樣之多晶矽晶圓上(特徵高度=〇.5微米,特 徵寬度及特徵間距=0· 18微米),於500 rpm之相·步旋轉下歷 -17- 本紙張尺度適用中國國家標準(CNS ) A4規格(2iOX297公釐) (讀先聞讀背面之注意事項再填寫本頁) k 訂 10. A7 B7" 五、發明説明(15 ) 經3秒,然後於5,000 rpm之主要旋轉下歷經10秒。溶劑之完 全蒸發,獲得在其最深區段處具有厚度爲8,235埃之薄膜。 將此晶圓於氮氣流下,在加熱板上,使用150°C /1分鐘、200 °C /1分鐘及200°C /1分鐘之順序,依所予之;順序加熱。這會 造成流體化作用,與特徵間之完全間隙充填,及樹脂表面 之完全平面化。將晶圓於空氣流下,在250°C石英烘箱中烘 烤1小時,移货並使其在室溫下靜置10分鐘。此時,薄膜 在甲基異丁基酮中之溶解度係低於旋轉塗覆後。使晶圓在 400°C石英烘箱中,於含10 ppm氧之氮氣流下回火1小時,’ 取出並在室溫下保持10分鐘。於薄膜中未發現異常,意即 裂缝等。. 實例12 經濟部中央標準局員工消費合作社印製 (諳先閩讀背面之注意事項再填寫本頁) 氟化聚缔丙基醚樹脂,係根據第十二屆國際VLSI多階互 連會議之1995會刊第116頁上所述之方法合成。藉GPC分析 樹脂產物,獲得數目平均分子量爲2,540,及重量平均分子 量爲9,390。使此樹脂溶解於甲基異丁基酮中,以製備26重 量% (固體)溶液。於其中添加10重量%十二基苯,以甲基 異丁基酮溶液爲基準。製備具有6,080埃厚度之薄膜,其方 式是將溶液旋轉塗覆於梦晶圓上,在500 rpm之初步旋轉下 歷經3秒,然後在3,000 rpm之主要旋轉下歷經10秒,接著在 室溫下靜置10分鐘。將晶圓於空氣流下,在250°C石英烘箱 中烘烤1小時,移除並使其在室溫下靜£ 10分鐘。此時, 薄膜在甲基異丁基酮中之溶解度係低於旋轉塗覆後。使晶 圓在400°C石英烘箱中,於含10 ppm氧之氮氣流下回火1小 _-18-_.._ 本纸張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 經濟部中央標率局員工消費合作社印製 33S_. a? ----- BT- 五、發明説明(16 ) ~~~ 時,取出並在室.溫下保持1〇分鐘。發現薄膜在甲基異丁基 酮中之溶解度,已遭受進一步減退。此薄膜具有介電常數 爲 2.4 〇 比較實例1 : 將實例1中所製成之H_樹脂溶離份溶解於甲基異丁基酮 中,以製備22重量% (固體)溶液。製造具有6,〇78埃厚度之 薄膜,其方式是將溶液旋轉塗覆於矽晶圓上,在5〇〇屯^之 初步旋轉下歷經3秒,然後在3,000 φτη之主要旋轉下歷經1〇 秒’接著在室溫下靜置10分鐘。使晶圓在4〇〇。〇石英烘箱中 ,於含lOppm氧之氮氣流下回火1小時,取出並在室溫下保 持10分鐘。在薄膜中之殘留siH%爲75%,確認轉化至矽石 確已發生。於薄膜中發現裂缝產生。此矽石薄膜之介電常 數爲2.8 〇 比較實例2 將實例1中所製成之樹脂溶離份溶解於甲基異丁基酮 •中’以製備35重量% (固體)溶液。製造具有13,2〇〇埃厚度 之薄膜’其方式是將溶液旋轉塗覆於矽晶圓上,在5〇〇ipm 义初步旋轉下歷經3秒’然後在2〇〇〇rpm之主要旋轉下歷經 1〇秒’接著在室溫下靜置1〇分鐘。使晶圓在40(rc石英烘箱 中’於含10 ppm氧之氮氣流下回-火1小時,取出並在室溫下 保持ίο分鐘。在薄膜中之殘留siH〇/。爲乃%,確認轉化至矽 石確已發生。於薄膜中發現裂缝產生。此矽石薄膜之介電 常數爲2.8。 ' 1" · ·" " — | y — 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂 •φ~·
Claims (1)
- 385s〇e —--——♦明專利範圍 A8 Βδ C8 D8 經濟部中央標準局員工消費合作社印製 L種形成電絕緣薄膜之纽合物 (A)-種電絕緣可熟化樹脂,選自;:: 機樹脂與電絕緣可熟化無機樹:;:絕緣可熟化有 .種么劑混合物.,其包含 ) ①一種能夠溶解樹脂(Α)之溶劑,蛊 ⑼選自包括其滞點與溶劑①不同之溶劑 其扃氣壓曲線與溶劑①不同之溶劑,及其 脂(Α)之親和力與溶劑①不同之溶劑。 '' 2. =申請專利範圍第β之组合物’其中樹脂(α)爲氨抑 半氧烷樹脂。 " 3. 如申請專利範園第】項之组合物,其中组合物另外含有 (C),一種供成份⑷用之熟化-加速觸媒。 4. 如申請專利範圍第3項之組合物,其中(c)係選自鉑化合 物或過渡金屬化合物。· 5_如申請專利範圍第1項之組合物,其中溶劑出)(丨)係選自 包括芳族溶劑、脂族溶劑、酮溶劑、脂族酯溶劑、碎氧 溶劑及矽烷。 6_如申請專利範圍第5項之組合物 7.如申.請專利範圍第6項之組合物 基酮 讀 先 閱 之 意 事 裝 其中溶劑爲酮溶劑。 其中溶劑爲甲基異丁 8. 如申請專利範圍'第5,項之组合物’其中溶劑爲砂氧溶劑 〇 9. 如申請專利範園第1項之組合物.,其中溶劑(B)(ii)爲具有 比溶劑(B)(i)較高沸點之溶劑。 - 20 本紙張尺度適用中國國家標準(cns )α4規格(2ΐ〇χ297公釐) π 訂 經濟部中央標準局員工消費合作社印製 A8 B8 C8 D8 申請專利範圍 1〇_如申請專利範園第9項之组合物,其中溶劑⑼⑻係選自 包括烴溶劑;嗣溶劑;醛溶劑;酯溶劑;硫酸二乙酯; 環丁砜;自基烴溶劑;經醚化之烴溶劑;醇溶劑;醚溶 劑;.縮醛溶劑;多羥醇溶劑;羧酐溶劑、酚性溶劑;及 矽氧溶劑。 11.如申請專利範圍第i項之組合物,其中溶劑①爲曱基 異丁基酮,κ且溶劑(B)(ii)爲十二基苯。 12_如申請專利範圍第i項之組合物,其中溶劑田⑹爲甲基 異丁基酮,JL溶劑⑼⑻爲鄰萆二甲酸二乙酯。 13. 如申請專利範圍第i項之组合物,其中溶劑㊉⑹爲甲基 異丁基酮,且溶劑(Β)(ϋ)爲環己基苯。 14. 如申請專利範圍第i項之组合物,其中溶劑卬⑹爲甲基 異丁基酮,且溶劑(B)⑻爲戊基苯。 15. 如申請專利範園第!項之組合物,其中溶劑爲矽氧 溶劑,且溶劑⑼⑻爲十二基苯。 16. 如中請專利範圍第}項之組合物,其巾溶劑混合物⑻係 以每100重量份數樹脂(A)有50重量%存在。 L7. —種形成電絕緣薄膜之方法,其包括 0)以申請專利範圍第i項之组合物塗覆基材表面; ⑻蒸發至少一部份溶劑混合―物田);及 (1Π)加熱基材,以在該樹脂熟化期間或熟化後,引致 殘留成份(B)之氣化作用。 18•如申請專利範園第17項之方法,其中基材爲電子裝置。 仪如申請專利範園第㈣之方法,其中表面之塗覆係藉旋 21 - 本纸張尺度適用中國國家標準( ,(請先鬩讀背面之注意事項再填寫本頁}8 ο. 5 ABCD 、申請專利範圍 轉塗覆進行。 20.如申請專利範園第17項之方法,其中基材係在(ΙΠ)中被 加熱至高於樹脂(A)熔點之溫度。 (請先鬩讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印製 -22- 本纸張尺度適用中國國家標準(CNS ) A4規格(210 X 297公釐)
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US7675067B2 (en) | 2005-07-25 | 2010-03-09 | Samsung Electronics Co., Ltd. | Thin film transistor substrate and manufacturing method thereof |
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US6231989B1 (en) | 1998-11-20 | 2001-05-15 | Dow Corning Corporation | Method of forming coatings |
EP1094506A3 (en) | 1999-10-18 | 2004-03-03 | Applied Materials, Inc. | Capping layer for extreme low dielectric constant films |
US6875687B1 (en) | 1999-10-18 | 2005-04-05 | Applied Materials, Inc. | Capping layer for extreme low dielectric constant films |
KR100430464B1 (ko) * | 1999-12-28 | 2004-05-10 | 쇼꾸바이 카세이 고교 가부시키가이샤 | 낮은 유전상수를 갖는 실리카-함유 코팅 필름의 형성 방법및 이 필름으로 코팅된 반도체 기판 |
JP2001214127A (ja) | 2000-01-31 | 2001-08-07 | Dow Corning Toray Silicone Co Ltd | 電気絶縁性薄膜形成性樹脂組成物、および電気絶縁性薄膜の形成方法 |
JP2001247819A (ja) * | 2000-03-03 | 2001-09-14 | Dow Corning Toray Silicone Co Ltd | 電気絶縁性架橋薄膜形成性有機樹脂組成物、および電気絶縁性架橋薄膜の形成方法 |
US6576568B2 (en) | 2000-04-04 | 2003-06-10 | Applied Materials, Inc. | Ionic additives for extreme low dielectric constant chemical formulations |
US7265062B2 (en) | 2000-04-04 | 2007-09-04 | Applied Materials, Inc. | Ionic additives for extreme low dielectric constant chemical formulations |
JP2001291427A (ja) * | 2000-04-06 | 2001-10-19 | Dow Corning Toray Silicone Co Ltd | 電気絶縁性薄膜形成性樹脂組成物、および電気絶縁性薄膜の形成方法 |
US6764809B2 (en) | 2000-10-12 | 2004-07-20 | North Carolina State University | CO2-processes photoresists, polymers, and photoactive compounds for microlithography |
JP4828451B2 (ja) | 2006-03-27 | 2011-11-30 | 東京エレクトロン株式会社 | 基板処理方法、半導体装置の製造方法および基板処理装置 |
KR100910542B1 (ko) * | 2007-05-04 | 2009-08-05 | 제일모직주식회사 | 반도체 미세 갭 필용 화합물 및 이를 이용한 반도체 미세갭 필용 조성물 |
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US5618878A (en) * | 1995-04-07 | 1997-04-08 | Dow Corning Corporation | Hydrogen silsesquioxane resin coating composition |
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US7675067B2 (en) | 2005-07-25 | 2010-03-09 | Samsung Electronics Co., Ltd. | Thin film transistor substrate and manufacturing method thereof |
US7947986B2 (en) | 2005-07-25 | 2011-05-24 | Samsung Electronics Co., Ltd. | Thin film transistor substrate and manufacturing method thereof |
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