TW364950B - Method of testing an analog-to-digital converter - Google Patents

Method of testing an analog-to-digital converter

Info

Publication number
TW364950B
TW364950B TW085111417A TW85111417A TW364950B TW 364950 B TW364950 B TW 364950B TW 085111417 A TW085111417 A TW 085111417A TW 85111417 A TW85111417 A TW 85111417A TW 364950 B TW364950 B TW 364950B
Authority
TW
Taiwan
Prior art keywords
analog
digital converter
testing
significant bit
less
Prior art date
Application number
TW085111417A
Other languages
English (en)
Inventor
Vries Ronald De
Botjo Atzema
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of TW364950B publication Critical patent/TW364950B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/109—Measuring or testing for dc performance, i.e. static testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
TW085111417A 1996-06-17 1996-09-18 Method of testing an analog-to-digital converter TW364950B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP96201683 1996-06-17

Publications (1)

Publication Number Publication Date
TW364950B true TW364950B (en) 1999-07-21

Family

ID=8224087

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085111417A TW364950B (en) 1996-06-17 1996-09-18 Method of testing an analog-to-digital converter

Country Status (6)

Country Link
US (1) US5854598A (zh)
EP (1) EP0852849B1 (zh)
JP (1) JPH11511934A (zh)
DE (1) DE69731365T2 (zh)
TW (1) TW364950B (zh)
WO (1) WO1997049188A1 (zh)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6518900B1 (en) * 1998-12-03 2003-02-11 Continential Teves Ag & Co., Ohg Circuit configuration for testing and A/D converter for applications that are critical in terms of safety
FR2798539B1 (fr) * 1999-09-09 2002-01-25 Centre Nat Rech Scient Procede et dispositif de test integre pour un convertisseur analogique-numerique et convertisseur muni d'un tel dispositif
US6320528B1 (en) 1999-10-15 2001-11-20 Koninklijke Philips Electronics Nv Built-in self test for integrated digital-to-analog converters
US6557131B1 (en) * 1999-12-23 2003-04-29 Cirrus Logic, Inc. Apparatus and method for automated testing of integrated analog to digital converters
JP2002031670A (ja) * 2000-04-19 2002-01-31 Texas Instr Inc <Ti> Ａ／ｄ変換器試験用の効率的データ転送を含む装置及び方法
JP2002236152A (ja) * 2001-02-08 2002-08-23 Mitsubishi Electric Corp 半導体集積回路の試験装置及び試験方法
JP2003338756A (ja) * 2002-05-21 2003-11-28 Mitsubishi Electric Corp 試験方法および試験回路
JP4266350B2 (ja) * 2004-02-12 2009-05-20 株式会社ルネサステクノロジ テスト回路
DE102004007207B4 (de) * 2004-02-13 2008-03-27 Albert-Ludwigs-Universität Freiburg, vertreten durch den Rektor Verfahren zur Charakterisierung von sowie zur automatischen Korrektur linearer Fehler in Analog-Digital-Wandlern
TWI241071B (en) * 2004-06-30 2005-10-01 Univ Nat Cheng Kung Test framework and test method of analog to digital converter
US7081841B1 (en) * 2005-04-28 2006-07-25 Lsi Logic Corporation Analog to digital converter built in self test
JP2008017004A (ja) * 2006-07-04 2008-01-24 Matsushita Electric Ind Co Ltd 半導体装置
US8310385B2 (en) * 2009-05-13 2012-11-13 Qualcomm, Incorporated Systems and methods for vector-based analog-to-digital converter sequential testing
US8327199B1 (en) * 2010-03-05 2012-12-04 Altera Corporation Integrated circuit with configurable test pins
US9851416B2 (en) * 2014-07-22 2017-12-26 Allegro Microsystems, Llc Systems and methods for magnetic field sensors with self-test
US10156461B2 (en) 2014-10-31 2018-12-18 Allegro Microsystems, Llc Methods and apparatus for error detection in a magnetic field sensor
JP6289692B2 (ja) * 2017-02-15 2018-03-07 ルネサスエレクトロニクス株式会社 測定方法
US11848682B2 (en) 2022-01-11 2023-12-19 Allegro Microsystems, Llc Diagnostic circuits and methods for analog-to-digital converters

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4266292A (en) * 1978-11-20 1981-05-05 Wescom Switching, Inc. Method and apparatus for testing analog-to-digital and digital-to-analog code converters
JPS59230323A (ja) * 1983-06-14 1984-12-24 Hiroshi Nakamura 高速ａ−ｄ変換器
EP0447117B1 (en) * 1990-03-15 1997-02-19 AT&T Corp. Built-in self test for analog to digital converters

Also Published As

Publication number Publication date
DE69731365D1 (de) 2004-12-02
WO1997049188A1 (en) 1997-12-24
EP0852849B1 (en) 2004-10-27
DE69731365T2 (de) 2005-11-10
JPH11511934A (ja) 1999-10-12
EP0852849A1 (en) 1998-07-15
US5854598A (en) 1998-12-29

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