DE69731365D1 - Analog-digital-umsetzerprüfungsverfahren - Google Patents

Analog-digital-umsetzerprüfungsverfahren

Info

Publication number
DE69731365D1
DE69731365D1 DE69731365T DE69731365T DE69731365D1 DE 69731365 D1 DE69731365 D1 DE 69731365D1 DE 69731365 T DE69731365 T DE 69731365T DE 69731365 T DE69731365 T DE 69731365T DE 69731365 D1 DE69731365 D1 DE 69731365D1
Authority
DE
Germany
Prior art keywords
analog
digital converter
testing procedures
converter testing
procedures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69731365T
Other languages
English (en)
Other versions
DE69731365T2 (de
Inventor
Vries Ronald De
Botjo Atzema
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE69731365D1 publication Critical patent/DE69731365D1/de
Publication of DE69731365T2 publication Critical patent/DE69731365T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/109—Measuring or testing for dc performance, i.e. static testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69731365T 1996-06-17 1997-05-28 Analog-digital-umsetzerprüfungsverfahren Expired - Fee Related DE69731365T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP96201683 1996-06-17
EP96201683 1996-06-17
PCT/IB1997/000611 WO1997049188A1 (en) 1996-06-17 1997-05-28 Method of testing an analog-to-digital converter

Publications (2)

Publication Number Publication Date
DE69731365D1 true DE69731365D1 (de) 2004-12-02
DE69731365T2 DE69731365T2 (de) 2005-11-10

Family

ID=8224087

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69731365T Expired - Fee Related DE69731365T2 (de) 1996-06-17 1997-05-28 Analog-digital-umsetzerprüfungsverfahren

Country Status (6)

Country Link
US (1) US5854598A (de)
EP (1) EP0852849B1 (de)
JP (1) JPH11511934A (de)
DE (1) DE69731365T2 (de)
TW (1) TW364950B (de)
WO (1) WO1997049188A1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6518900B1 (en) * 1998-12-03 2003-02-11 Continential Teves Ag & Co., Ohg Circuit configuration for testing and A/D converter for applications that are critical in terms of safety
FR2798539B1 (fr) * 1999-09-09 2002-01-25 Centre Nat Rech Scient Procede et dispositif de test integre pour un convertisseur analogique-numerique et convertisseur muni d'un tel dispositif
US6320528B1 (en) 1999-10-15 2001-11-20 Koninklijke Philips Electronics Nv Built-in self test for integrated digital-to-analog converters
US6557131B1 (en) * 1999-12-23 2003-04-29 Cirrus Logic, Inc. Apparatus and method for automated testing of integrated analog to digital converters
US6531972B2 (en) * 2000-04-19 2003-03-11 Texas Instruments Incorporated Apparatus and method including an efficient data transfer for analog to digital converter testing
JP2002236152A (ja) * 2001-02-08 2002-08-23 Mitsubishi Electric Corp 半導体集積回路の試験装置及び試験方法
JP2003338756A (ja) * 2002-05-21 2003-11-28 Mitsubishi Electric Corp 試験方法および試験回路
JP4266350B2 (ja) * 2004-02-12 2009-05-20 株式会社ルネサステクノロジ テスト回路
DE102004007207B4 (de) * 2004-02-13 2008-03-27 Albert-Ludwigs-Universität Freiburg, vertreten durch den Rektor Verfahren zur Charakterisierung von sowie zur automatischen Korrektur linearer Fehler in Analog-Digital-Wandlern
TWI241071B (en) * 2004-06-30 2005-10-01 Univ Nat Cheng Kung Test framework and test method of analog to digital converter
US7081841B1 (en) * 2005-04-28 2006-07-25 Lsi Logic Corporation Analog to digital converter built in self test
JP2008017004A (ja) * 2006-07-04 2008-01-24 Matsushita Electric Ind Co Ltd 半導体装置
US8310385B2 (en) * 2009-05-13 2012-11-13 Qualcomm, Incorporated Systems and methods for vector-based analog-to-digital converter sequential testing
US8327199B1 (en) * 2010-03-05 2012-12-04 Altera Corporation Integrated circuit with configurable test pins
US9851416B2 (en) 2014-07-22 2017-12-26 Allegro Microsystems, Llc Systems and methods for magnetic field sensors with self-test
US10156461B2 (en) 2014-10-31 2018-12-18 Allegro Microsystems, Llc Methods and apparatus for error detection in a magnetic field sensor
JP6289692B2 (ja) * 2017-02-15 2018-03-07 ルネサスエレクトロニクス株式会社 測定方法
US11848682B2 (en) 2022-01-11 2023-12-19 Allegro Microsystems, Llc Diagnostic circuits and methods for analog-to-digital converters

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4266292A (en) * 1978-11-20 1981-05-05 Wescom Switching, Inc. Method and apparatus for testing analog-to-digital and digital-to-analog code converters
JPS59230323A (ja) * 1983-06-14 1984-12-24 Hiroshi Nakamura 高速ａ−ｄ変換器
DE69124709T2 (de) * 1990-03-15 1997-05-28 At & T Corp Eingebaute Selbstprüfung für Analog-Digitalumsetzer

Also Published As

Publication number Publication date
EP0852849A1 (de) 1998-07-15
US5854598A (en) 1998-12-29
DE69731365T2 (de) 2005-11-10
JPH11511934A (ja) 1999-10-12
WO1997049188A1 (en) 1997-12-24
TW364950B (en) 1999-07-21
EP0852849B1 (de) 2004-10-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN

8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL

8339 Ceased/non-payment of the annual fee