TW344895B - Delay element tester and integrated circuit with test function - Google Patents

Delay element tester and integrated circuit with test function

Info

Publication number
TW344895B
TW344895B TW086108712A TW86108712A TW344895B TW 344895 B TW344895 B TW 344895B TW 086108712 A TW086108712 A TW 086108712A TW 86108712 A TW86108712 A TW 86108712A TW 344895 B TW344895 B TW 344895B
Authority
TW
Taiwan
Prior art keywords
delay element
signals
integrated circuit
test function
under test
Prior art date
Application number
TW086108712A
Other languages
English (en)
Inventor
Norifumi Kobayashi
Original Assignee
Toshiba Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Co Ltd filed Critical Toshiba Co Ltd
Application granted granted Critical
Publication of TW344895B publication Critical patent/TW344895B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
TW086108712A 1996-06-27 1997-06-21 Delay element tester and integrated circuit with test function TW344895B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8167361A JPH1010179A (ja) 1996-06-27 1996-06-27 遅延素子試験装置および試験機能を有する集積回路

Publications (1)

Publication Number Publication Date
TW344895B true TW344895B (en) 1998-11-11

Family

ID=15848300

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086108712A TW344895B (en) 1996-06-27 1997-06-21 Delay element tester and integrated circuit with test function

Country Status (4)

Country Link
US (1) US6057691A (zh)
JP (1) JPH1010179A (zh)
KR (1) KR100269704B1 (zh)
TW (1) TW344895B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI477795B (zh) * 2008-05-16 2015-03-21 Dainippon Printing Co Ltd 數位訊號延遲測定電路、以及數位訊號延遲測定方法

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6219305B1 (en) * 1996-09-17 2001-04-17 Xilinx, Inc. Method and system for measuring signal propagation delays using ring oscillators
US6233205B1 (en) 1996-09-17 2001-05-15 Xilinx, Inc. Built-in self test method for measuring clock to out delays
US6466520B1 (en) 1996-09-17 2002-10-15 Xilinx, Inc. Built-in AC self test using pulse generators
US6452459B1 (en) 1999-07-22 2002-09-17 Xilinx, Inc. Circuit for measuring signal delays of synchronous memory elements
JP2002162441A (ja) * 2000-11-22 2002-06-07 Nec Corp 半導体装置
US6630838B1 (en) 2001-01-23 2003-10-07 Xilinx, Inc. Method for implementing dynamic burn-in testing using static test signals
JP3798713B2 (ja) * 2002-03-11 2006-07-19 株式会社東芝 半導体集積回路装置及びそのテスト方法
US7065684B1 (en) 2002-04-18 2006-06-20 Xilinx, Inc. Circuits and methods for measuring signal propagation delays on integrated circuits
JP4746975B2 (ja) * 2005-12-15 2011-08-10 富士通セミコンダクター株式会社 半導体回路の試験方法
JP4792340B2 (ja) * 2006-07-11 2011-10-12 株式会社アドバンテスト 試験装置および試験方法
JP2008157881A (ja) * 2006-12-26 2008-07-10 Yokogawa Electric Corp タイミング検査装置
WO2008117468A1 (ja) * 2007-03-27 2008-10-02 Advantest Corporation 試験装置
KR101013442B1 (ko) * 2007-04-13 2011-02-14 주식회사 하이닉스반도체 반도체 집적 회로의 전압 측정 장치 및 이를 포함하는 전압측정 시스템
JP4910859B2 (ja) * 2007-04-20 2012-04-04 横河電機株式会社 半導体検査装置
US8274272B2 (en) * 2009-02-06 2012-09-25 Advanced Micro Devices, Inc. Programmable delay module testing device and methods thereof
JP5292243B2 (ja) * 2009-09-28 2013-09-18 株式会社日立製作所 半導体集積回路
US20120081141A1 (en) * 2010-09-30 2012-04-05 International Business Machines Corporation On-Chip Delay Measurement Through a Transistor Array
US8829922B2 (en) 2011-02-17 2014-09-09 International Business Machines Corporation On-chip measurement of AC variability in individual transistor devices
JP6309358B2 (ja) * 2014-06-11 2018-04-11 公立大学法人首都大学東京 遅延時間の計測方法および遅延時間計測装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2889515A (en) * 1955-08-15 1959-06-02 Brubaker Electronics Inc Delay line test means and techniques
US4118665A (en) * 1977-12-08 1978-10-03 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Time domain phase measuring apparatus
US5291141A (en) * 1991-09-30 1994-03-01 Hughes Aircraft Company Method for continuously measuring delay margins in digital systems
JPH0792235A (ja) * 1993-09-25 1995-04-07 Nec Corp 半導体装置及びその遅延時間測定方法
US5471145A (en) * 1994-04-07 1995-11-28 Texas Instruments Incorporated Calibrating transition dependent timing errors in automatic test equipment using a precise pulse width generator
JP3406439B2 (ja) * 1995-10-24 2003-05-12 株式会社アドバンテスト 可変遅延回路の遅延時間測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI477795B (zh) * 2008-05-16 2015-03-21 Dainippon Printing Co Ltd 數位訊號延遲測定電路、以及數位訊號延遲測定方法

Also Published As

Publication number Publication date
KR100269704B1 (ko) 2000-11-01
KR980006247A (ko) 1998-03-30
US6057691A (en) 2000-05-02
JPH1010179A (ja) 1998-01-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees