TW201610444A - Open/close device of electronic component test module - Google Patents

Abstract

An open/close device of an electronic component test module is disclosed. The test module is provided with a test base, a cover body and a linkage frame. The cover body is covered on the test base. The linkage frame is pivoted to the cover body, and is locked to be positioned to the test base. The open/close device includes a conveying mechanism and an open/close unit. The conveying mechanism is provided with a conveying tool moving along at least one direction, so as to link to assemble with the open/close unit. The open/close unit is provided with a press member moving along at least one direction, and a hook. The press member is pressed against a fastener for opening the linkage frame. The hook is hooked with the linkage frame to move apart from the test base, and utilizes the linkage frame to drive the cover body to swing outwardly to open. The open/close unit is further provided with a push member moving along at least one direction, so as to push against the linkage frame to drive the cover body to swing inwardly, and can associate with the hook to hook the linkage frame to be locked and positioned to the test base for closing the cover body. Accordingly, the present invention can automatically open and close the test module, it not only saves labor cost but also reduces open/close operating time, thereby achieving practical efficiency of saving cost as well as increasing test capability.

Description

Opening and closing device for electronic component test module (3)

The invention provides an opening and closing device capable of automatically opening and closing a test module, which not only reduces manpower, but also shortens the opening and closing operation time, thereby saving cost and improving test productivity.

Nowadays, after the electronic component is packaged in the back stage, in order to ensure the quality of the product, the electronic component is placed in the test socket of the test module to perform a test operation to detect whether the electronic component is damaged during the manufacturing process, so as to eliminate the Good product, because the electronic components in the process of performing the test operation, it will generate self-heating due to the execution of the program operation. In order to avoid the self-heating temperature of the electronic components exceeding the preset test temperature and affecting the test quality, the manufacturer is in the test mode. The test seat of the group is equipped with a cover body with a heat dissipation structure, and the heat dissipation structure and the electronic components are used for cold heat exchange, so that the temperature of the electronic components is maintained within a preset test temperature range, thereby ensuring the detection yield of the electronic components.

Referring to FIGS. 1 and 2, a plurality of test modules 10 are mounted on the test circuit board 20. Each test module 10 includes a test stand 11, a cover 12, and a linkage frame 13. The test stand 11 is provided with a housing. The electronic component is provided with a slot 111, and a plurality of probes 112 electrically connected to the test circuit board 20 are disposed in the receiving slot 111, and the protrusions 113 are disposed on both sides of the test socket 11 and are recessed at one end. One end of the cover body 12 is pivoted to the end of the test seat 11 having the buckle groove 114 by the first pivot shaft 121, and the cover is placed on the test seat 11, and the cover body 12 is provided with a heat dissipation structure. The heat dissipation structure is provided with a conductive member 122 protruding from the bottom surface of the cover body 12 to contact the self-heating of the conductive electronic component, and is connected to the heat dissipation fin 123 on the top surface of the cover body 12. One end of the linkage frame 13 is The second pivot 131 is pivotally disposed at the other end of the cover body 12, and is provided with a fastening portion 132 on both sides to hook the protrusions 113 on both sides of the test seat 11, and is linked. The other end of the frame 13 has a buckle 133 for hooking the buckle groove 114 of the test seat 11, so that the cover body 12 is positioned on the test seat 11, and the top of the linkage frame 13 is equipped with a fan 134 for assisting heat dissipation. Referring to Figures 3, 4, and 5, in use, the worker presses the buckle 133 on the interlocking frame 13 with the hand to disengage from the buckle groove 114 of the test seat 11, and then pulls the interlocking frame 13, the interlocking frame 13 That is, the second pivot 131 is rotated toward the outer circumference, and the fastening portion 132 is disengaged from the protrusion 113 of the test seat 11, and the worker pulls the linkage frame 13 again, and the linkage frame 13 is the second pivot. The shaft 131 drives the lid body 12 upwardly, and the lid body 12 swings open toward the other outer side with the first pivot shaft 121 as a center of rotation, and then releases the interlocking frame 13, and the interlocking frame 13 utilizes its own weight and The two pivots 131 are the center of rotation, and are placed downwardly behind the cover body 12. After the cover body 12 is opened, the worker manually places the electronic component 30 to be tested into the test stand 11 . Inside the slot 111; please refer to Figures 6, 7, and 8, after completing the loading operation of the electronic component 30, The person manually pulls the interlocking frame 13 and the cover body 12, and the cover body 12 rotates with the first pivot shaft 121 as a center of rotation, and drives the linkage frame 13 to swing downward synchronously, so as to avoid the engagement of the interlocking frame 13 The portion 132 is latched on the stud 113 of the test seat 11, and the worker must lift the interlocking frame 13 outward. The interlocking frame 13 swings outwardly with the second pivot 131 as a center of rotation, and the engaging portion 132 is buckled. Swinging and retracting inwardly to cover the cover 12 on the test seat 11, the worker then pulls the interlocking frame 13 inwardly, and the interlocking frame 13 swings inwardly with the second pivot 131 as a center of rotation, so that one end The fastening portion 132 is fastened to the protrusion 113 of the test seat 11, and the buckle 133 at the other end of the linkage frame 13 is hooked to the buckle groove 114 of the test seat 11, so that the cover 12 is positioned on the test seat 11, and The conductive member 122 on the cover 12 contacts the conduction electrons 30 to generate self-heating during the test, and then the heat dissipation fins 123 on the top surface of the cover 12 and the fan 134 on the linkage frame 13 dissipate heat to make the electronic component 30 The temperature is maintained within a preset test temperature range, thereby ensuring the electronic component 30 Test yield; However, this use manually open and close the test module 10 has the following deletions:

1. The operator opens and closes the cover 12 and the linkage frame of the test module 10 by manual operation. When the number of the test modules 10 is large, it is necessary to arrange more people to open and close the cover body 12 and the interlocking frame 13 one by one, resulting in an increase in operating cost.

2. Since the cover member 12 is provided with the conductive member 122, the heat dissipation fins 123, and the components of the heat dissipation fan 134 and the like on the interlocking frame 13, the weight of the cover body 12 and the interlocking frame 13 is relatively heavy, and the staff must perform the test work. It is laborious to pull the interlocking frame 13 and the cover 12 of the plurality of test modules 10 outward to open the cover 12 for the electronic component 30 to be placed in the test seat 11, and then the cover 12 is laboriously and one by one. And the interlocking frame 13 is repositioned and positioned on the test seat 11, so that the manual opening and closing operation is not only time-consuming and laborious, but also reduces the test productivity.

3. After the staff member manually opens the cover 12 of the test module 10, the electronic component 30 needs to be manually and manually placed on the test stand 11 to increase the loading and unloading operation time, thereby reducing the test throughput.

An object of the present invention is to provide an opening and closing device (3) for an electronic component test module, wherein the test module is provided with a test seat, a cover body and a linkage frame, and the cover system cover is placed on the test seat, and the linkage is The frame is pivotally connected to the cover and is fastened and positioned to the test seat. The opening and closing device comprises a transfer mechanism and an opening and closing unit, and the transfer mechanism is provided with a transfer device for at least one direction displacement to connect and assemble the opening and closing a unit, the opening and closing unit is provided with a pressing member and a hook for at least one direction displacement, and the pressing member is pressed against the buckle of the interlocking frame, and the hook is adapted to disengage the frame from the test seat. And the linkage frame is used to drive the cover body to swing outwardly, and the opening and closing unit is further provided with a pushing member for at least one direction displacement, so as to push the linkage frame to drive the cover body to swing inward, and hook the hook frame with the hook hook The camera is positioned in the test seat, and the cover body is closed; thereby, the test module can be automatically opened and closed, and the manual configuration is greatly reduced, thereby achieving the practical benefit of cost saving.

The object of the present invention is to provide an opening and closing device (3) for an electronic component test module, wherein the transfer device of the transfer mechanism drives the opening and closing of a plurality of pressing members, hooks and pushing members. The unit is displaced above the test module to open the unit Automated opening and closing of the cover of a batch of test modules, thereby greatly reducing the working time of the opening and closing cover, and achieving the practical benefit of improving the test capacity.

The third object of the present invention is to provide an opening and closing device (3) for an electronic component test module, wherein the opening and closing unit is a frame plate pressing pressing member, a hooking device and a pushing member, and is mounted on the frame plate and the moving plate. The connecting structure of the carrier is provided with a connecting structure between the frame plate and the transfer carrier, and a first connecting seat with a locking portion and a second connecting seat with a fastening member. When the whole opening and closing unit is replaced, the pneumatic fastening device can be driven to automatically disengage or engage the clamping portion, so that the entire opening and closing unit can be conveniently assembled and disassembled, thereby achieving the practical benefit of improving the use efficiency.

A fourth object of the present invention is to provide an opening and closing device (3) for an electronic component test module, wherein the opening and closing device is provided with a pick-up mechanism having at least one pick-up device, and the test module is automatically opened in the opening and closing unit. After the cover body, the pick-up mechanism can automatically pick up and place the electronic components in the test stand, and it is not necessary to manually pick and place, thereby greatly reducing the loading and unloading operation time, thereby achieving the practical benefit of improving the test capacity.

[study]

10‧‧‧Test module

11‧‧‧ test seat

111‧‧‧ accommodating slots

112‧‧‧Probe

113‧‧‧Bump

114‧‧‧ buckle groove

12‧‧‧ Cover

121‧‧‧First pivot

122‧‧‧Transmission parts

123‧‧‧Hot film

13‧‧‧ linkage framework

131‧‧‧Second pivot

132‧‧‧Deduction Department

133‧‧‧ buckle

134‧‧‧fan

20‧‧‧Test circuit board

30‧‧‧Electronic components

〔this invention〕

40‧‧‧Opening and closing device

41‧‧‧Transportation mechanism

411‧‧‧First Transferr

412‧‧‧Second transfer

4121‧‧‧Motor

4122‧‧‧Transmission group

413‧‧‧Rack

414‧‧‧Transfer Vehicle

415‧‧‧Second joint

4151‧‧‧Inlay fasteners

42‧‧‧Opening unit

421‧‧‧ ‧ boards

4211‧‧‧Holdings

422‧‧‧ first joint

4221‧‧‧Card Department

423‧‧‧First drive source

424‧‧‧Mobile seat

425‧‧‧Parts

426‧‧‧second drive source

4261‧‧‧Parts

427‧‧‧Swing seat

4271‧‧‧ Third pivot

4272‧‧ ‧ chute

4273‧‧‧ pivot slot

4274‧‧‧Magnetic parts

428‧‧‧Hook

4281‧‧‧fourth pivot

429‧‧‧ Third drive source

430‧‧‧Parts

44‧‧‧ picking institutions

441‧‧‧ Third Transfer

442‧‧‧ Picker

50‧‧‧Test module

51‧‧‧ test seat

511‧‧‧ accommodating slots

512‧‧‧ probe

513‧‧‧Bump

514‧‧‧ buckle groove

52‧‧‧ Cover

521‧‧‧ fifth pivot

522‧‧‧Transmission parts

523‧‧‧ Thermal film

53‧‧‧ linkage framework

531‧‧‧ sixth pivot

532‧‧‧Deduction Department

533‧‧‧ buckle

534‧‧‧Hooking Department

535‧‧‧fan

60‧‧‧Electronic components

Figure 1: Schematic diagram of a conventional test module and test circuit board.

Figure 2: Schematic diagram of a conventional test module.

Figure 3: Schematic diagram of the use of the manual manual test module (1).

Figure 4: Schematic diagram of the use of the manual open test module (2).

Figure 5: Schematic diagram of the use of the manual manual test module (3).

Figure 6: Schematic diagram of the use of the manual manual test module (1).

Figure 7: Schematic diagram of the use of the manual manual test module (2).

Figure 8: Schematic diagram of the use of the manual manual test module (3).

Figure 9 is a schematic view of the opening and closing device of the present invention.

Figure 10 is a schematic view of the opening and closing unit of the opening and closing device of the present invention.

Figure 11 is a schematic view of the opening and closing device and the test module of the present invention.

Figure 12: Schematic diagram of the use of the opening and closing device opening test module of the present invention (1).

Figure 13: Schematic diagram of the use of the opening and closing device opening test module of the present invention (2).

Figure 14: Schematic diagram of the use of the opening and closing device opening test module of the present invention (3).

Figure 15: Schematic diagram of the use of the opening and closing device opening test module of the present invention (4).

Figure 16: Schematic diagram of the use of the opening and closing device opening test module of the present invention (5).

Figure 17: Schematic diagram of the use of the opening and closing device closing test module of the present invention (1).

Figure 18: Schematic diagram of the use of the closing test module of the opening and closing device of the present invention (2).

Figure 19: Schematic diagram of the use of the closing test module of the opening and closing device of the present invention (3).

Figure 20 is a schematic view showing the separation of the transfer mechanism and the opening and closing unit of the opening and closing device of the present invention.

In order to make the present invention more fully understood by the reviewing committee, a preferred embodiment and a drawing will be described in detail as follows: Referring to Figures 9 and 10, the opening and closing device 40 of the present invention includes a transfer mechanism 41 and The opening and closing unit 42 is provided with at least one transfer device for transferring at least one transfer carrier for at least one direction displacement. In the embodiment, the transfer mechanism 41 is provided with a first transfer device 411. And the second transfer device 412, the first transfer device 411 drives a frame 413 equipped with the second transfer device 412 to shift in the first and second directions (such as the ZX direction) of the larger stroke, and the second transfer device 412 A motor 4121 is provided to drive the transmission group 4122. The transmission group 4122 includes a pulley set and a screw base set, and a transfer seat 414 is coupled to the transfer carrier by a screw seat of the screw screw set to drive the transfer carrier. 414 is a Z-direction displacement; the opening and closing unit 42 includes a pressing member, a hook and a pushing member, and the pressing member, the hooking device and the pushing member can be directly mounted on the transfer carrier 414 or assembled on a board. In the embodiment, the transfer unit 414 is connected by a shelf. In the embodiment, the opening and closing unit 42 is provided with a frame. 421, and a connection structure is disposed between the top surface of the shelf 421 and the transfer carrier 414 of the transfer mechanism 41. The connection structure is disposed between the shelf 421 and the transfer carrier 414. a first connecting seat and a second connecting seat having a fastening member for attaching and detaching the opening and closing unit 42. In the embodiment, the connecting structure is provided with a locking portion 4221 on the top surface of the mounting plate 421. The connecting portion 422 is a ring groove. The moving member 414 is provided with a second connecting seat 415 at a position corresponding to the first connecting seat 422. The second connecting base 415 is provided with a plurality of connecting seats 415. The insulative fastener 4151 can be a bead body, and pneumatically drives a plurality of inlay members 4151 to be snapped or disengaged from the first joint 4 The latching portion 4221 of the 22, the opening and closing unit 42 is provided with at least one pressing member for pressing against the fastener of the linkage frame of the test module. In the embodiment, the mounting member of the bracket 421 is attached. A first driving source 423, which can be a pressure cylinder, is mounted on the side of the 4211. The first driving source 423 drives a moving seat 424 for displacement in the Z direction. One side of the moving base 424 is provided with a pressing member 425. The opening and closing unit 42 is provided with at least one hook, and the hook is displaced in at least one direction to pull off the joint of the test module and is separated from the test seat. In this embodiment, the hook is attached to the movable seat 424. A second driving source 426, which can be a pressure cylinder, is disposed on one side of the pivoting seat 427. The pivoting seat 427 is pivoted on the moving base 424 by a third pivot 4271, and is provided with a matching abutting member with the second driving source 426. And the sliding slot, the second driving source 426 is driven to swing the swinging seat 427. In the embodiment, the piston rod of the second driving source 426 is provided with a topping member 4261 which can be a roller, and is mounted on the swinging seat 427. An elongated slot 4272 is opened for the insertion of the abutting member 4261, so that the second driving source 426 is carried by the abutting member 4261 and the chute 4272. The swinging seat 427 is oscillated, and the swinging seat 427 is provided with a hook 428. Further, a protective structure is disposed between the hook 428 and the swinging seat 427. The protective structure is provided with a pivoting groove 4273 on the swinging seat 427. The hook 428 is provided with a fourth pivot 4281, and is pivoted to the pivoting groove 4273 of the swinging seat 427 by a fourth pivot 4281, and a magnetic member 4274 is disposed at a position corresponding to the hook 428 of the swinging seat 427. In the normal use state, the magnetic member 4274 is positioned by the magnetic hook 428, so that the hook 428 is hooked on the linkage frame of the test module, and when the hook 428 is pulled too much or the linkage frame is stuck, the hook 428 is subjected to the hook 428. When the pull-down force is greater than the abnormal state of the suction force of the magnetic member 4274, the hook 428 can be automatically detached from the magnetic member 4274, and the fourth pivot 4281 is rotated as a center of rotation to release the linkage frame of the test module, thereby preventing the test. The module or the hook 428 is damaged, and the opening and closing unit 42 is provided with at least a pushing member, and the pushing member is displaced in at least one direction to push the connecting frame of the test module to drive the cover to swing. In the embodiment, the bearing member 4211 of the shelf 421 is another. It may be equipped with a pressure cylinder of the third driving source 429, the third driving source train 429 drives a pushing member 430 for Z-direction displacement.

Referring to Figures 9, 11, and 12, the test module 50 is applied to the opening and closing device 40 of the present invention. The plurality of test modules 50 are disposed on the test circuit board. The test module 50 includes a test stand 51 and a cover. The body 52 and the interlocking frame 53 are provided with a receiving groove 511 for accommodating electronic components, and a plurality of probes 512 electrically connected to the test circuit board are disposed in the receiving groove 511, and the test stand is further provided. A protrusion 513 is disposed on one end of the 51, and a buckle groove 514 is recessed at the other end. One end of the cover 52 is pivoted to the other end of the test seat 51 by the fifth pivot 521, and the cover is placed in the test. The cover 51 is further provided with a heat dissipation structure. The heat dissipation structure is provided with a conductive member 522 protruding from the bottom surface of the cover 52 to contact the self-heating of the conductive electronic component and is connected to the top surface of the cover 52. One end of the interlocking frame 523 is pivotally disposed at one end of the cover body 52 with a sixth pivot 531, and is provided with a fastening portion 532 on both sides to be hooked on the sides of the test seat 51. At the other end of the column 513, the interlocking frame 53 has a buckle 533 and a hook portion 534, and the buckle 533 is hooked to the buckle groove 514 of the test seat 51. The hook portion 534 is in an inverted L shape for hooking the hook 428, and the upper portion of the interlocking frame 53 is equipped with a fan 535 for assisting heat dissipation; when the test module 50 is opened by using the opening and closing device 40, the opening and closing is performed. The first transfer device 411 of the transfer mechanism 41 of the device 40 carries the second transfer device 412 and the opening and closing unit 42 for X-direction displacement to the upper side of the test module 50, and the motor 4121 of the second transfer device 412 drives the transmission group 4122. And moving the transfer carrier 414 and the opening and closing unit 42 to the Z-direction downward displacement via the transmission group 4122. The first driving source 423 of the opening and closing unit 42 drives the moving seat 424 and the pressing member 425 to be displaced in the Z direction, so that the pressure is applied. The fastener 425 corresponds to the fastener 533 of the linkage frame 53 of the test module 50. The first conveyor 411 of the transfer mechanism 41 drives the opening and closing unit 42 to shift in the X direction, so that the pressing member 425 is pressed against the linkage frame 53. The buckle 533 is separated from the buckle groove 514 of the test seat 51, and the hook 428 is located below the hook portion 534 of the interlocking frame 53.

Referring to FIGS. 9 and 13 , the first transfer device 411 and the second transfer device 412 of the transfer mechanism 41 drive the opening and closing unit 42 to perform displacement in the XZ direction, and the hook 428 of the opening and closing unit 42 is hooked to the interlocking frame 53 . Hook 534, and the interlocking frame 53 is oscillated outwardly. The interlocking frame 53 is rotated about the sixth pivot 531, and the engaging portion 532 is swung inwardly away from the protruding post 513 of the test seat 51.

Referring to Figures 9, 14, and 15, the first transfer unit 411 and the second transfer unit 412 of the transfer mechanism 41 continue to drive the opening and closing unit 42 to perform reverse displacement in the X direction and upward displacement in the Z direction, so that the opening and closing unit 42 is opened. The hook 428 hooks the interlocking frame 53 to actuate the interlocking frame 53 to move the cover 52 by using the sixth pivot 531. The cover 52 is pivoted outwardly with the fifth pivot 521 as a center of rotation; The second driving source 426 of the closing unit 42 drives the top abutting member 4261 to be displaced upward in the Z direction, so that the top abutting member 4261 abuts against the sliding groove 4272 of the swinging seat 427, thereby driving the swinging seat 427 to move, and the swinging seat 427 is third. The pivot 4271 swings upwards as a center of rotation, and causes the hook 428 to swing downward, so that the hook 428 releases the hook portion 534 of the interlocking frame 53, and the interlocking frame 53 swings downward and is placed on the cover by its own weight. After the body 52, the cover 52 of the test module 50 is opened.

Referring to Figures 9 and 16, the electronic component loading operation can be manually loaded or automatically loaded. Since the present invention can automatically open the cover 52 of the test module 50, in order to automate the operation of the opening and closing device 40, The opening and closing device 40 of the present invention further comprises a picking mechanism 44, wherein the picking mechanism 44 is provided with at least one pick-and-place electronic component pick-up device, and at least one transfer device is provided to drive the pick-up device to at least In the present embodiment, the pick-up mechanism 44 is provided with a third transfer unit 441 for driving the pick-up 442 having the electronic component 60 to be tested for X-direction displacement to the test block 51 of the test module 50, and third. The transfer device 441 further drives the pick-up 442 to perform the Z-direction displacement, and the electronic component 60 to be tested is placed in the receiving slot 511 of the test socket 51, so that the electronic component 60 to be tested is electrically contacted with the probe 512 of the test socket 51, and the completion is performed. After the material operation, the third transfer unit 441 of the pick-up mechanism 44 drives the pick-up 442 to move away from the test module 50 in the XZ direction.

Referring to FIGS. 9 and 17, after the electronic component loading operation is completed, the third driving source 429 of the opening and closing unit 42 drives the pushing member 430 to perform the Z-party. The first transfer device 411 and the second transfer device 412 of the transfer mechanism 41 drive the opening and closing unit 42 to be displaced in the XZ direction, so that the pushing member 430 of the opening and closing unit 42 is pushed against the interlocking frame 53. The fan 535 swings inwardly, so that the interlocking frame 53 drives the cover 52 to swing inwardly. In this case, the first driving source 423 of the opening and closing unit 42 drives the movable seat 424 and the hook 428 to shift downward in the Z direction. The hook 428 corresponds to the hook portion 534 of the interlocking frame 53 of the test module 50.

Referring to FIGS. 9, 18, and 19, when the interlocking frame 53 and the cover 52 are swung inward, the third driving source 429 of the opening and closing unit 42 drives the pushing member 430 to perform an upward displacement reset in the Z direction, and the transfer is performed. The first transfer unit 411 and the second transfer unit 412 of the mechanism 41 drive the opening and closing unit 42 to be displaced in the XZ direction, and the hook 428 of the opening and closing unit 42 is hooked to the hook portion 534 of the interlocking frame 53 to drive the interlocking frame. The swinging frame 53 swings outwardly with the sixth pivot 531 as a center of rotation, and swings the engaging portion 532 inward to avoid the latching protrusion 513 of the test seat 51; then the opening and closing unit 42 The second driving source 426 drives the top abutting member 4261 to be displaced upward in the Z direction, so that the abutting member 4261 abuts against the sliding groove 4272 of the swinging seat 427, thereby driving the swinging seat 427 to move, and the swinging seat 427 is coupled to the third pivot 4271. Swinging upwards for the center of rotation, and causing the hook 428 to swing downward, the hook 428 releases the hook portion 534 of the linkage frame 53, and the linkage frame 53 swings inwardly by its own weight, and the buckle 533 is buckled. Closing the buckle 514 of the test seat 51, thereby closing the cover 52 of the test module 50; the transfer machine The first transfer unit 411 and the second transfer unit 412 of the mechanism 41 drive the opening and closing unit 42 to move away from the test module 50 in the XZ direction. When the cover 52 is placed on the test seat 51, the conductive member 522 is contacted to be tested. The electronic component 60, when the electronic component 60 to be tested performs a test operation in the test socket 51 and generates self-heating, the self-heating of the electronic component 60 to be tested can be conducted to the heat dissipation fin 523 through the conductive member 522 to dissipate heat, and is cooled by the fan 535. The electronic component 60 to be tested is kept within the preset test temperature range, thereby ensuring the detection yield. When the test is completed, the opening and closing device 40 can open the cover 52 of the test module 50 by using the opening and closing unit 42 to For testing The test stand 51 performs a loading and unloading operation.

Referring to FIGS. 9 and 20, the opening and closing device 40 of the present invention can replace the opening and closing unit 42 to accommodate different test modules, and the transfer device 414 of the transfer mechanism 41 and the frame 421 of the opening and closing unit 42 are connected. The first connecting seat 422 and the second connecting base 415 are connected and assembled. When the opening and closing unit 42 is replaced, the fastening member 4151 of the second connecting seat 415 can be pneumatically driven to retract from the first connecting seat 422. The latching portion 4221 separates the transfer carrier 414 from the shelf plate 421, so that the opening and closing unit 42 can be conveniently replaced, thereby achieving the practical benefit of improving the usability.

414‧‧‧Transfer Vehicle

415‧‧‧Second joint

4151‧‧‧Inlay fasteners

42‧‧‧Opening unit

421‧‧‧ ‧ boards

4211‧‧‧Holdings

422‧‧‧ first joint

4221‧‧‧Card Department

423‧‧‧First drive source

424‧‧‧Mobile seat

425‧‧‧Parts

426‧‧‧second drive source

4261‧‧‧Parts

427‧‧‧Swing seat

4271‧‧‧ Third pivot

4272‧‧ ‧ chute

4273‧‧‧ pivot slot

4274‧‧‧Magnetic parts

428‧‧‧Hook

4281‧‧‧fourth pivot

429‧‧‧ Third drive source

430‧‧‧Parts

Claims (10)

An opening and closing device (3) for an electronic component test module, comprising: a transfer mechanism: at least one transfer device is provided to drive at least one transfer carrier for at least one direction displacement; and the opening and closing unit is mounted on the shift The carrier of the carrier is provided with at least one pressing member and a hook, and the pressing member is displaced in at least one direction to press against the fastener that opens the linkage frame of the test module, and the hook is configured Displacement in at least one direction, the hooking frame is used to drive the cover of the test module to swing open, and the opening and closing unit is further provided with at least one pushing member, and the pushing member is displaced in at least one direction to push the The interlocking frame drives the cover to swing and close. The opening and closing device (3) of the electronic component test module according to claim 1, wherein the transfer mechanism of the opening and closing device is provided with a first transfer device and a second transfer device, and the first transfer device The device drives at least one frame equipped with the second transfer device for first and second direction displacement, and the second transfer device drives the transfer carrier and the opening and closing unit to perform displacement in a first direction. The opening and closing device (3) of the electronic component test module according to claim 2, wherein the second transfer device of the transfer mechanism is provided with a motor to drive at least one transmission group to operate, the transmission group The link drives the shifting of the transfer carrier. The opening and closing device (3) of the electronic component test module according to the first aspect of the invention, wherein the opening and closing unit is provided with a first driving source, and the first driving source drives at least one moving seat Displacement in one direction, the movable seat is equipped with the pressing member. The opening and closing device (3) of the electronic component test module according to the fourth aspect of the invention, wherein the moving base of the opening and closing unit is provided with a second driving source, at least one of which is pivotally mounted on the movable seat The swinging seat is equipped with the at least one hook and is driven to swing by the second driving source. The opening and closing device (3) of the electronic component test module according to claim 5, wherein the swinging seat of the opening and closing unit is coupled to the second driving source There are matching toppings and chutes. The opening and closing device (3) of the electronic component test module according to the fifth aspect of the invention, wherein the hooking device of the opening and closing unit and the swinging seat are provided with a protective structure, the protective structure is attached to the swinging The at least one hook is pivoted on the seat, and at least one magnetic member that magnetically attracts the hook is disposed on the swing seat. The opening and closing device (3) of the electronic component test module according to the first aspect of the invention, wherein the opening and closing unit is provided with at least one plate, and the pressing member is assembled on the frame plate, The hook and the pusher. The opening and closing device (3) of the electronic component test module according to the eighth aspect of the patent application, wherein the shelf of the opening and closing unit and the transfer carrier of the transfer mechanism are provided with a connection structure, the connection The structure is characterized in that a first connecting seat with a locking portion and a second connecting seat with an engaging member are disposed between the shelf and the transfer carrier. The opening and closing device (3) of the electronic component test module according to claim 1, further comprising the pick-up device, wherein the pick-up mechanism is provided with at least one pick-and-place device for picking and placing electronic components. And providing at least one transfer device to drive the picker to be displaced in at least one direction.