TWI507697B - - Google Patents

Info

Publication number
TWI507697B
TWI507697B TW103131350A TW103131350A TWI507697B TW I507697 B TWI507697 B TW I507697B TW 103131350 A TW103131350 A TW 103131350A TW 103131350 A TW103131350 A TW 103131350A TW I507697 B TWI507697 B TW I507697B
Authority
TW
Taiwan
Application number
TW103131350A
Other languages
Chinese (zh)
Other versions
TW201610444A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW103131350A priority Critical patent/TW201610444A/en
Application granted granted Critical
Publication of TWI507697B publication Critical patent/TWI507697B/zh
Publication of TW201610444A publication Critical patent/TW201610444A/en

Links

TW103131350A 2014-09-11 2014-09-11 Open/close device of electronic component test module TW201610444A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW103131350A TW201610444A (en) 2014-09-11 2014-09-11 Open/close device of electronic component test module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW103131350A TW201610444A (en) 2014-09-11 2014-09-11 Open/close device of electronic component test module

Publications (2)

Publication Number Publication Date
TWI507697B true TWI507697B (en) 2015-11-11
TW201610444A TW201610444A (en) 2016-03-16

Family

ID=55220097

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103131350A TW201610444A (en) 2014-09-11 2014-09-11 Open/close device of electronic component test module

Country Status (1)

Country Link
TW (1) TW201610444A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI582430B (en) * 2015-02-05 2017-05-11 李諾工業股份有限公司 A test device
TWI622772B (en) * 2017-01-10 2018-05-01 創意電子股份有限公司 Testing device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6981886B1 (en) * 2004-12-23 2006-01-03 Kingston Technology Corp. Sliding levered handles engaging and pushing memory modules into extender-card socket
CN201111933Y (en) * 2007-08-17 2008-09-10 永采科技资讯股份有限公司 High-performance internal storage test module
TW200837353A (en) * 2007-03-05 2008-09-16 Chroma Ate Inc Rotation-press cover inspection/test apparatus and the tester having the apparatus
TW200944448A (en) * 2008-04-25 2009-11-01 Prov Technology Corp Box closing device for a packing machine of electronic elements
TW200946917A (en) * 2007-11-26 2009-11-16 Advantest Corp Insert, tray and electronic component testing apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6981886B1 (en) * 2004-12-23 2006-01-03 Kingston Technology Corp. Sliding levered handles engaging and pushing memory modules into extender-card socket
TW200837353A (en) * 2007-03-05 2008-09-16 Chroma Ate Inc Rotation-press cover inspection/test apparatus and the tester having the apparatus
CN201111933Y (en) * 2007-08-17 2008-09-10 永采科技资讯股份有限公司 High-performance internal storage test module
TW200946917A (en) * 2007-11-26 2009-11-16 Advantest Corp Insert, tray and electronic component testing apparatus
TW200944448A (en) * 2008-04-25 2009-11-01 Prov Technology Corp Box closing device for a packing machine of electronic elements

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI582430B (en) * 2015-02-05 2017-05-11 李諾工業股份有限公司 A test device
TWI622772B (en) * 2017-01-10 2018-05-01 創意電子股份有限公司 Testing device

Also Published As

Publication number Publication date
TW201610444A (en) 2016-03-16

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