TWI559004B - Electronic components operating equipment and its application of the test classification equipment - Google Patents

Electronic components operating equipment and its application of the test classification equipment Download PDF

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Publication number
TWI559004B
TWI559004B TW104127363A TW104127363A TWI559004B TW I559004 B TWI559004 B TW I559004B TW 104127363 A TW104127363 A TW 104127363A TW 104127363 A TW104127363 A TW 104127363A TW I559004 B TWI559004 B TW I559004B
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Taiwan
Prior art keywords
electronic component
control box
disposed
temperature control
opening
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TW104127363A
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Chinese (zh)
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TW201708826A (en
Inventor
zi-wei Li
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Hon Tech Inc
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Publication of TW201708826A publication Critical patent/TW201708826A/en

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電子元件作業裝置及其應用之測試分類設備 Electronic component operating device and its application test classification equipment

本發明係提供一種利用水平位移之移動件帶動控溫箱之門板啟閉,以避免於作業室上方配置高聳之啟閉用元件,進而便利其他裝置之移料器於承置器之上方順暢位移,並可利於作業室空間配置之電子元件作業裝置。 The invention provides a moving piece driven by a horizontal displacement to drive the door panel of the temperature control box to open and close, so as to avoid the high-rise opening and closing components disposed above the working room, thereby facilitating the smooth displacement of the shifter of other devices above the bearing device. And can be used to facilitate the operation of electronic components in the work space.

在現今,電子元件於實際使用時,可能處於低溫環境或高溫環境,業者為確保電子元件之使用品質,於電子元件製作完成後,必須以測試設備對電子元件進行冷測作業或熱測作業,以淘汰出不良品;請參閱第1、2圖,該電子元件測試設備之機台11上係設有具電路板121及測試座122之測試裝置12,用以測試電子元件,一輸送裝置之移料機構13係設有作第一、二、三方向(如X、Y、Z方向)位移之移料器131,以將待測之電子元件移入測試座122,另於測試座122之上方設有下壓裝置14,該下壓裝置14係以作動桿141帶動一壓抵電子元件之下壓治具142作Z方向位移,該下壓治具142上係設有一為致冷晶片之溫控件1421,以使電子元件處於預設溫度模擬測試環境,另於下壓治具142之外部設有一溫度保持機構,該溫度保持機構係設有具第一箱體1431及第二箱體1432之控溫箱,第一箱體1431係套置於下壓治具142之外部,第二箱體1432則套置於第一箱體1431之外部,並與第一箱體1431間設有連結桿144,使得第一箱體1431及第二箱體1432作Z方向相對位移,又該第二箱體1432底部之開口處設有可樞轉擺動啟閉之二門板145,另於測試座122之頂面直立配置有二高度較高且可開啟門板145之控制件146;於使用時,該移料機構13之移料器131作Y-Z方向位移將待測之電子元件移入測試座122,該下壓裝置14之作動桿141係帶動下壓治具142及控溫箱作Z方向向下位移,並令控溫箱之第二箱體1432的門板145 接觸到測試座122兩側之控制件146,控制件146即頂推門板145作樞轉擺動開啟,並頂抵於第二箱體1432之周側而限制位移,接著作動桿141繼續帶動下壓治具142及第一箱體1431作Z方向向下位移,該第一箱體1431即可沿連結桿144位移,以令下壓治具142下壓測試座122上之電子元件,使電子元件之接點確實接觸測試座122之探針而進行測試作業;惟,該溫度保持機構必須於測試座122之兩側方配置有高聳直立之控制件146,方可利用二控制件146頂推第二箱體1432上之二門板145樞轉開啟,並頂抵第二箱體1432限位,但二高聳直立之控制件146凸出於測試座122之周側,易影響其他裝置(圖未示出)於測試座122上方作X-Y方向位移,導致其他裝置之作動路徑必須閃避二高聳直立之控制件146,以致不利其他裝置之作動時序規劃及測試設備之整體空間配置。 Nowadays, when electronic components are actually used, they may be in a low-temperature environment or a high-temperature environment. In order to ensure the quality of use of electronic components, after the electronic components are manufactured, the electronic components must be cold-tested or thermally tested with test equipment. In order to eliminate defective products; please refer to Figures 1 and 2, the test device 12 with the circuit board 121 and the test socket 122 is mounted on the machine 11 of the electronic component testing device for testing electronic components, a conveying device The material transfer mechanism 13 is provided with a shifter 131 for shifting in the first, second and third directions (such as X, Y, Z directions) to move the electronic component to be tested into the test socket 122, and above the test socket 122. A pressing device 14 is provided. The pressing device 14 is driven by the actuating rod 141 to press the pressing member 142 under the electronic component for displacement in the Z direction. The lower pressing device 142 is provided with a temperature for the cooling chip. The control unit 1421 is configured to allow the electronic component to be in a preset temperature simulation test environment, and a temperature maintaining mechanism is disposed outside the lower pressing fixture 142. The temperature maintaining mechanism is provided with a first housing 1431 and a second housing 1432. Temperature control box, first box 1 The 431 sleeve is placed outside the lower pressing fixture 142, and the second housing 1432 is sleeved outside the first housing 1431, and a connecting rod 144 is disposed between the first housing 1431 so that the first housing 1431 And the second box body 1432 is relatively displaced in the Z direction, and the second door panel 145 is pivotally opened and closed at the opening of the bottom portion of the second box body 1432, and the top surface of the test socket 122 is erected with two heights. The control member 146 of the door panel 145 can be opened. In use, the shifter 131 of the material transfer mechanism 13 is displaced in the YZ direction to move the electronic component to be tested into the test socket 122, and the actuating rod 141 of the lower pressing device 14 The lower pressing fixture 142 and the temperature control box are downwardly displaced in the Z direction, and the door panel 145 of the second housing 1432 of the temperature control box is driven. The control member 146 is in contact with the control member 146 on both sides of the test seat 122. The control member 146 pushes the door panel 145 to pivotally open and closes against the circumferential side of the second housing 1432 to restrict displacement, and the movable lever 141 continues to drive. The pressing fixture 142 and the first housing 1431 are displaced downward in the Z direction, and the first housing 1431 can be displaced along the connecting rod 144, so that the pressing fixture 142 presses down the electronic components on the test socket 122 to make the electronic The contact of the component does contact the probe of the test socket 122 for testing; however, the temperature maintaining mechanism must be provided with a towering upright control member 146 on both sides of the test socket 122, so as to be pushed by the second control member 146. The two door panels 145 on the second box body 1432 are pivotally opened and are in abutment against the second box body 1432, but the two towering upright control members 146 protrude from the circumferential side of the test seat 122, which easily affect other devices (not shown) It is shown that the XY direction is displaced above the test socket 122, so that the actuation path of other devices must be evaded by the two towering upright control members 146, so as to adversely affect the timing planning of the other devices and the overall spatial configuration of the test equipment.

本發明之目的一,係提供一種電子元件作業裝置,包含作業室、至少一承置器、壓取機構、溫度保持機構及啟閉機構,該作業室係於頂板上設有至少一通口,該承置器係位於通口之下方,以承置電子元件,該壓取機構係設有作至少一方向位移之壓取器,以壓取電子元件,該溫度保持機構係於壓取器之外部設有具至少一門板之控溫箱,以使壓取器保持預設作業溫度,該啟閉機構係於作業室之通口處配置有至少一由驅動源驅動位移之移動件,該移動件與門板間係設有相互配合之卡接部件及接合部件,於門板之接合部件卡合移動件之卡接部件時,該移動件即帶動門板作水平位移而同步開啟,以供控溫箱內之壓取器下壓承置器上之電子元件;藉此,該啟閉機構利用水平位移之移動件帶動控溫箱之門板同步平移作動啟閉,以避免於作業室上方配置高聳之啟閉用元件,進而便利其他裝置之移料器於作業室上方順暢位移,並利於作業室之空間配置,達到提升作業效能之實用效益。 An object of the present invention is to provide an electronic component working device comprising a working chamber, at least one mounting device, a pressing mechanism, a temperature maintaining mechanism and an opening and closing mechanism, wherein the working chamber is provided with at least one opening on the top plate, The mounting device is located below the opening to receive the electronic component, and the pressing mechanism is provided with a presser for displacement in at least one direction to press the electronic component, and the temperature maintaining mechanism is external to the crimper a temperature control box having at least one door panel for maintaining a preset operating temperature, wherein the opening and closing mechanism is disposed at the opening of the working chamber with at least one moving member driven to be displaced by the driving source, the moving member The locking member and the engaging member are matched with the door panel. When the engaging member of the door panel engages the engaging member of the moving member, the moving member drives the door panel to be horizontally displaced and simultaneously opened for the temperature control box. The pressure device presses down the electronic component on the socket; thereby, the opening and closing mechanism uses the horizontal displacement moving member to drive the door panel of the temperature control box to synchronously move and close, thereby avoiding the high opening and closing of the upper part of the working room. Element, and further facilitate the shifting of the feeder to other devices smooth upward displacement of the working chamber, the working chamber and facilitates the configuration space, to enhance the utility efficiency job performance.

本發明之目的二,係提供一種應用電子元件作業裝置之測試分類設備,其包含機台、供料裝置、收料裝置、作業裝置、輸送裝置及中央控制裝置,該供料裝置係配置於機台上,並設有至少一容納待測電子元件之供料承置器,該收料裝置係配置於機台上,並設有至少一容納已測電 子元件之收料承置器,該作業裝置係配置於機台上,以承置待測之電子元件,並對待測之電子元件執行預設作業,該輸送裝置係配置於機台上,並設有至少一移載電子元件之移料器,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 A second object of the present invention is to provide a test and classification device for applying an electronic component working device, which comprises a machine table, a feeding device, a receiving device, a working device, a conveying device and a central control device, wherein the feeding device is configured on the machine And on the stage, and provided with at least one feeding device for accommodating the electronic component to be tested, the receiving device is disposed on the machine table, and is provided with at least one for receiving the measured electricity a receiving device for the sub-component, the working device is disposed on the machine to receive the electronic component to be tested, and performs a preset operation on the electronic component to be tested, the conveying device is disposed on the machine, and The at least one shifting device for transferring electronic components is provided, and the central control device is used for controlling and integrating the operations of the devices to perform an automatic operation, thereby achieving the practical benefit of improving the working efficiency.

〔習知〕 [study]

11‧‧‧機台 11‧‧‧ machine

12‧‧‧測試裝置 12‧‧‧Testing device

121‧‧‧電路板 121‧‧‧Circuit board

122‧‧‧測試座 122‧‧‧ test seat

13‧‧‧移料機構 13‧‧‧Transfer mechanism

131‧‧‧移料器 131‧‧‧Transfer

14‧‧‧下壓裝置 14‧‧‧Under pressure device

141‧‧‧作動桿 141‧‧‧acting rod

142‧‧‧下壓治具 142‧‧‧Under pressure fixture

1421‧‧‧溫控件 1421‧‧‧Warm control

1431‧‧‧第一箱體 1431‧‧‧First box

1432‧‧‧第二箱體 1432‧‧‧Second cabinet

144‧‧‧連結桿 144‧‧‧ Connecting rod

145‧‧‧門板 145‧‧‧ door panel

146‧‧‧控制件 146‧‧‧Controls

〔本發明〕 〔this invention〕

20‧‧‧作業裝置 20‧‧‧Working device

21‧‧‧作業室 21‧‧‧Workroom

211‧‧‧頂板 211‧‧‧ top board

212‧‧‧通口 212‧‧‧ mouth

22‧‧‧承置器 22‧‧‧ 承器

221‧‧‧承置部件 221‧‧‧Holding parts

23‧‧‧壓取機構 23‧‧‧Picking mechanism

231‧‧‧壓取器 231‧‧‧Presser

232‧‧‧驅動結構 232‧‧‧Drive structure

233‧‧‧作動件 233‧‧‧actuation

2331‧‧‧固定板 2331‧‧‧Fixed plate

2332‧‧‧穿孔 2332‧‧‧Perforation

234‧‧‧溫控器 234‧‧‧ thermostat

24‧‧‧溫度保持機構 24‧‧‧ Temperature retention mechanism

241‧‧‧控溫箱 241‧‧‧temperature control box

2411‧‧‧側板 2411‧‧‧ side panel

242‧‧‧第一滑軌 242‧‧‧First slide rail

243‧‧‧第一滑座 243‧‧‧First slide

244‧‧‧門板 244‧‧‧ door panel

2441‧‧‧接合部件 2441‧‧‧Connected parts

245‧‧‧第二滑軌 245‧‧‧Second rail

246‧‧‧第二滑座 246‧‧‧Second slide

247‧‧‧連結件 247‧‧‧Links

2471‧‧‧限位件 2471‧‧‧Limited parts

248‧‧‧第一彈性件 248‧‧‧First elastic parts

249‧‧‧第二彈性件 249‧‧‧Second elastic parts

25‧‧‧啟閉機構 25‧‧‧Opening and closing agency

251‧‧‧壓缸 251‧‧‧pressure cylinder

252‧‧‧傳動件 252‧‧‧ Transmission parts

253‧‧‧移動件 253‧‧‧Mobile parts

2531‧‧‧卡接部件 2531‧‧‧Snap parts

254‧‧‧第三滑軌 254‧‧‧ third slide

255‧‧‧第三滑座 255‧‧‧ third slide

2561‧‧‧發射元件 2561‧‧‧Transmission components

2562‧‧‧接收元件 2562‧‧‧ Receiving components

261‧‧‧第一輸送管 261‧‧‧First duct

262‧‧‧第二輸送管 262‧‧‧Second delivery tube

31‧‧‧移料機構 31‧‧‧Transfer mechanism

311‧‧‧移料器 311‧‧‧Transfer

41‧‧‧電子元件 41‧‧‧Electronic components

50‧‧‧機台 50‧‧‧ machine

60‧‧‧供料裝置 60‧‧‧Feeding device

61‧‧‧供料承置器 61‧‧‧Feeder

70‧‧‧收料裝置 70‧‧‧Receiving device

71‧‧‧收料承置器 71‧‧‧Receipt receiver

80‧‧‧輸送裝置 80‧‧‧Conveyor

81‧‧‧第一移料器 81‧‧‧First mover

82‧‧‧第一供料載台 82‧‧‧First feeding stage

83‧‧‧第二供料載台 83‧‧‧Second feed stage

84‧‧‧第二移料器 84‧‧‧Second shifter

85‧‧‧第三移料器 85‧‧‧ third shifter

86‧‧‧第一收料載台 86‧‧‧First receiving platform

87‧‧‧第二收料載台 87‧‧‧Second receiving platform

88‧‧‧第四移料器 88‧‧‧fourth shifter

第1圖:習知電子元件測試設備之測試裝置及下壓裝置的配置示意圖。 Figure 1: Schematic diagram of the configuration of the test device and the pressing device of the conventional electronic component test equipment.

第2圖:習知電子元件測試設備之測試裝置及下壓裝置的使用示意圖。 Figure 2: Schematic diagram of the use of the test device and the pressing device of the conventional electronic component test equipment.

第3圖:本發明電子元件作業裝置之前視圖。 Fig. 3 is a front view of the electronic component working device of the present invention.

第4圖:本發明電子元件作業裝置之側視圖。 Fig. 4 is a side view of the electronic component working device of the present invention.

第5圖:本發明電子元件作業裝置之使用示意圖(一)。 Fig. 5 is a schematic view showing the use of the electronic component working device of the present invention (1).

第6圖:本發明電子元件作業裝置之使用示意圖(二)。 Figure 6 is a schematic view showing the use of the electronic component working device of the present invention (2).

第7圖:本發明電子元件作業裝置之使用示意圖(三)。 Figure 7 is a schematic view showing the use of the electronic component working device of the present invention (3).

第8圖:本發明電子元件作業裝置之使用示意圖(四)。 Figure 8 is a schematic view showing the use of the electronic component working device of the present invention (4).

第9圖:本發明電子元件作業裝置之使用示意圖(五)。 Figure 9 is a schematic view showing the use of the electronic component working device of the present invention (5).

第10圖:本發明電子元件作業裝置之使用示意圖(六)。 Fig. 10 is a schematic view showing the use of the electronic component working device of the present invention (6).

第11圖:本發明電子元件作業裝置之使用示意圖(七)。 Figure 11 is a schematic view showing the use of the electronic component working device of the present invention (7).

第12圖:本發明電子元件作業裝置之使用示意圖(八)。 Fig. 12 is a schematic view showing the use of the electronic component working device of the present invention (8).

第13圖:本發明電子元件作業裝置之使用示意圖(九)。 Figure 13 is a schematic view showing the use of the electronic component working device of the present invention (9).

第14圖:本發明作業裝置應用於測試分類設備之示意圖。 Figure 14: Schematic diagram of the application device of the present invention applied to a test classification device.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱第3、4圖,本發明電子元件作業裝置20包含作業室21、至少一承置器22、壓取機構23、溫度保持機構24及啟閉機構25;該作業室21係設有至少一作業空間,更進一步,該作業室21可為一獨立室體,亦或裝配於機台之下方,並以機台作為頂板,於本實施例中,該作業室21係以機台作為頂板211,並於頂板211上開設有通口212;該至少一承置器22係設有至少一承置電子元件之承置部件221,更進一步,該承置器22可為載台、料盤或測試座等,該承置部 件可為承槽或承置治具等,於本實施例中,該承置器22係配置於作業室21內,並位於通口212下方,該承置器22係為一測試座,且設有具複數個探針之承置部件221,用以承置待作業之電子元件執行測試作業;該壓取機構23係設有作至少一方向位移之壓取器231,用以壓抵電子元件,亦或壓抵及取放電子元件或移載取放電子元件,更進一步,壓取器231可配置於承置器22之上方,並作第三方向(如Z方向)位移,壓取器231亦可作第一、二、三方向(如X、Y、Z方向)位移,而於承置器22與相關裝置之間移載電子元件,該壓取器231可為一下壓器,用以壓抵電子元件,壓取器231亦可為具吸嘴之下壓器,用以壓抵及取放電子元件,於本實施例中,該壓取機構23係配置於作業室21之上方,並對應於承置器22,該壓取機構23係設有驅動結構232,以驅動至少一作動件233作Z方向位移,該作動件233裝配有下壓電子元件之壓取器231,該壓取器231之上方則設有至少一溫控器234,以使壓取器231保持預設測試作業溫度,該溫控器234可為致冷晶片、加熱件或具流體之本體,於本實施例中,該溫控器234係為致冷晶片,以使壓取器231保持低溫預設測試作業溫度;該溫度保持機構24係裝配於壓取機構23上,並於壓取器231之外部設有具至少一門板之控溫箱241,更進一步,該控溫箱241內面與作動件233之間係設有相互配合且呈Z方向配置之第一滑軌242及第一滑座243,於本實施例中,係於控溫箱241內部之兩側面設有呈Z方向配置之第一滑軌242,於作動件233之兩側面設有呈Z方向配置之第一滑座243,以滑置於第一滑軌242,使控溫箱241與作動件233可作Z方向相對位移,另於控溫箱241之底面水平配置有至少一門板244,於本實施例中,係於控溫箱241之底面水平配置設有二門板244,並於控溫箱241之二側板2411與二門板244間設有相互配合且呈X方向配置之第二滑軌245及第二滑座246,於本實施例中,係於控溫箱241之側板2411設有呈X方向配置之第二滑座246,於門板244上設有呈X方向配置之第二滑軌245,使門板244利用第二滑軌245沿控溫箱241之第二滑座246滑移,又該控溫箱241與壓取機構23之作動件233間係設有至少一連結件247及至少一第一彈性件24 8,於本實施例中,係於壓取機構23之作動件233側面設有具穿孔2332之固定板2331,於控溫箱241之底板上固設有連結件247,該連結件247上套置有為彈簧之第一彈性件248,並以一端穿置於作動件233之穿孔2332,且於端部固設有可頂抵固定板2331之限位件2471,使控溫箱241裝配於壓取器231之外部,並利用第一彈性件248之彈性頂推而可迅速作Z方向向下位移復位,另於該溫度保持機構24之控溫箱241底板與門板244間設有至少一為彈簧之第二彈性件249,以輔助門板244向內位移閉合;該啟閉機構25係於作業室21上配置有至少一驅動源,以驅動至少一移動件位移,該移動件係帶動門板244同步位移啟閉,於本實施例中,係於作業室21之頂板211上設有二驅動源,二驅動源分別設有呈第一方向配置之壓缸251,二壓缸251各別連結驅動一傳動件252作第一方向位移,二傳動件252分別連結二呈水平配置之移動件253,二移動件253與二門板244之間係設有相互配合之卡接部件及接合部件,於本實施例中,係於門板244開設有為槽孔之接合部件2441,於移動件253上相對應接合部件2441之位置設有為插銷之卡接部件2531,使得壓缸251經由傳動件252而帶動移動件253作第一方向之平移作動,移動件253利用卡接部件2531及接合部件2441之相互配合而帶動門板244作第一方向位移啟閉,另於啟閉機構25之傳動件252與頂板211間設有相互配合之第三滑座與第三滑軌,以輔助移動件253平穩位移,於本實施例中,係於頂板211上設有呈第一方向配置之第三滑軌254,於傳動件252上設有呈第一方向配置之第三滑座255,以滑置於第三滑軌254,又該啟閉機構25係設有至少一感知器,以感知控溫箱241位於預設作業位置,於本實施例中,係於作業室21之頂板211上設有一發射光線之發射元件2561及一接收光線之接收元件2562,用以感知控溫箱241之門板244置放於移動件253上的預設作業位置,並將感知資料傳輸至中央控制裝置(圖未示出),使中央控制裝置控制啟閉機構25之驅動源作動,以便利啟閉門板244;該作業裝置20更包含於控溫箱241上設有至少一輸送乾燥空氣之第一輸送管261,以輸送預設溫度之乾燥空氣,於本實施例中,第一輸送管261可輸 送低溫之乾燥空氣至控溫箱241的內部,以減少控溫箱241內之空氣含水量,進而防止壓取器231及電子元件結露,另該作業裝置20係設有至少一輸送乾燥空氣至作業室21內部之第二輸送管262,以防止作業室21內部之承置器22及電子元件結露。 In order to make the present invention further understand the present invention, a preferred embodiment will be described in conjunction with the drawings, as described in detail below. Referring to Figures 3 and 4, the electronic component working device 20 of the present invention includes a working room 21, At least one of the sockets 22, the pressing mechanism 23, the temperature maintaining mechanism 24, and the opening and closing mechanism 25; the working chamber 21 is provided with at least one working space, and further, the working chamber 21 can be a separate chamber body, or In the embodiment, the working chamber 21 is a top plate 211, and a top opening 211 is defined in the top plate 211. The at least one receptacle 22 is mounted on the top plate 211. The mounting member 22 is provided with at least one mounting member for holding the electronic component. Further, the mounting device 22 can be a carrier, a tray or a test seat, etc., and the receiving portion In this embodiment, the receptacle 22 is disposed in the working chamber 21 and is located below the opening 212. The receptacle 22 is a test seat, and A mounting member 221 having a plurality of probes for carrying the test operation for the electronic component to be operated is provided; the pressing mechanism 23 is provided with a presser 231 for at least one direction displacement for pressing the electrons The component is also pressed or placed to pick up or drop the electronic component or to move the pick-and-place electronic component. Further, the presser 231 can be disposed above the receptacle 22 and displaced in the third direction (eg, the Z direction). The device 231 can also be displaced in the first, second, and third directions (such as X, Y, and Z directions), and the electronic component is transferred between the socket 22 and the related device, and the presser 231 can be a pressure reducer. For pressing the electronic component, the presser 231 can also be equipped with a nozzle under pressure device for pressing and receiving the electronic component. In the embodiment, the pressing mechanism 23 is disposed in the working room 21 Above, corresponding to the socket 22, the pressing mechanism 23 is provided with a driving structure 232 for driving at least one of the actuators 233 for Z-direction displacement, The movable member 233 is equipped with a presser 231 for pressing down the electronic component, and at least one thermostat 234 is disposed above the presser 231 to keep the presser 231 at a preset test operating temperature. The thermostat 234 The temperature controller 234 is a refrigerant chip to maintain the low temperature preset test operating temperature; the temperature maintaining mechanism 24 is a cooling wafer, a heating element or a fluid body. In this embodiment, the temperature controller 234 is a refrigerant chip. The temperature control box 241 having at least one door panel is disposed outside the presser 231, and further, the inner surface of the temperature control box 241 and the actuating member 233 are matched with each other. The first slide rail 242 and the first slide rail 243 are disposed in the Z direction. In the embodiment, the first slide rail 242 disposed in the Z direction is disposed on the two sides of the temperature control box 241. The two sides of the 233 are provided with a first sliding seat 243 arranged in the Z direction to slide on the first sliding rail 242, so that the temperature control box 241 and the actuating member 233 can be relatively displaced in the Z direction, and the temperature control box 241 is The bottom surface is horizontally disposed with at least one door panel 244. In this embodiment, the bottom surface of the temperature control box 241 is horizontally disposed with two doors. 244, and between the two side plates 2411 of the temperature control box 241 and the two door panels 244, a second slide rail 245 and a second slide rail 246 which are arranged in the X direction, which are arranged in the X direction, are used in the temperature control box. The second plate 2411 of the 241 is provided with a second sliding seat 246 disposed in the X direction, and the second sliding rail 245 disposed in the X direction is disposed on the door plate 244, so that the door plate 244 is separated from the temperature control box 241 by the second sliding rail 245. The two sliding blocks 246 are slid, and at least one connecting member 247 and at least one first elastic member 24 are disposed between the temperature control box 241 and the actuating member 233 of the pressing mechanism 23 . 8. In this embodiment, a fixing plate 2331 having a through hole 2332 is disposed on a side surface of the actuating member 233 of the pressing mechanism 23. A connecting member 247 is fixed on the bottom plate of the temperature control box 241, and the connecting member 247 is sleeved. The first elastic member 248 is disposed as a spring, and is inserted into the through hole 2332 of the actuating member 233 at one end, and a limiting member 2471 capable of abutting against the fixing plate 2331 is fixed at the end portion, so that the temperature control box 241 is assembled The outside of the presser 231 can be quickly displaced in the Z direction by the elastic pushing of the first elastic member 248, and at least one between the bottom plate of the temperature control box 241 and the door panel 244 of the temperature maintaining mechanism 24 is provided. The second elastic member 249 is a spring, and the auxiliary door panel 244 is displaced inwardly; the opening and closing mechanism 25 is disposed on the working chamber 21 with at least one driving source for driving displacement of at least one moving member, and the moving member drives the door panel 244 synchronous displacement opening and closing, in this embodiment, is provided on the top plate 211 of the working room 21 is provided with two driving sources, the two driving sources are respectively provided with a pressure cylinder 251 arranged in a first direction, and the two pressure cylinders 251 are respectively connected Driving a transmission member 252 for the first direction displacement, and the second transmission member 252 respectively connecting the two The horizontally disposed moving member 253, the two moving members 253 and the two door panels 244 are provided with engaging engaging members and engaging members. In the embodiment, the door panel 244 is provided with a joint member 2441 which is a slot. The engaging member 2531 is a latching member 2531 at a position corresponding to the engaging member 2441 of the moving member 253, so that the pressing cylinder 251 drives the moving member 253 to move in the first direction via the transmission member 252, and the moving member 253 utilizes the engaging member. 2531 and the engaging member 2441 cooperate with each other to drive the door panel 244 to be opened and closed in the first direction, and the third sliding seat and the third sliding rail are matched between the driving member 252 of the opening and closing mechanism 25 and the top plate 211. The auxiliary moving member 253 is smoothly displaced. In the embodiment, the third sliding rail 254 disposed in the first direction is disposed on the top plate 211, and the third sliding seat 255 disposed in the first direction is disposed on the transmission member 252. The sliding mechanism is disposed on the third sliding rail 254, and the opening and closing mechanism 25 is provided with at least one sensor to sense that the temperature control box 241 is located at a preset working position. In this embodiment, it is attached to the top surface of the working room 21. 211 is provided with a light-emitting element 2561 And a receiving component 2562 for receiving the light, for sensing the preset working position of the door panel 244 of the temperature control box 241 placed on the moving member 253, and transmitting the sensing data to the central control device (not shown) to make the center The control device controls the driving source of the opening and closing mechanism 25 to facilitate opening and closing of the door panel 244. The working device 20 further includes at least one first conveying pipe 261 for conveying dry air on the temperature control box 241 for conveying the preset temperature. Dry air, in this embodiment, the first conveying pipe 261 can be lost The low-temperature dry air is sent to the inside of the temperature control box 241 to reduce the moisture content of the air in the temperature control box 241, thereby preventing the dew 231 and the electronic components from dew condensation, and the working device 20 is provided with at least one conveying dry air to The second transfer pipe 262 inside the work chamber 21 prevents dew condensation of the mount 22 and the electronic components inside the work chamber 21.

請參閱第5、6圖,欲執行電子元件41之冷測作業時,該壓取機構23係以一為致冷晶片之控溫器234使壓取器231降溫至預設測試溫度,以便壓取器231下壓電子元件時,可使電子元件41處於模擬低溫測試環境,為防止低溫之壓取器231在尚未執行下壓動作之前發生結露,作業裝置20係利用第一輸送管261對控溫箱241內輸送低溫之乾燥空氣,以減少控溫箱241內之空氣含水量,進而防止壓取器231於未下壓電子元件之前結露,又該控溫箱241係罩置於壓取器231之外部,並以二門板244關閉控溫箱241,亦可避免低溫之壓取器231與控溫箱241外部含水量高之空氣接觸,以防止壓取器231在尚未執行下壓動作之前發生結露,進而提升測試品質,一輸送裝置(圖未示出)之移料機構31係以移料器311作Y方向位移將待測之電子元件41移載至作業裝置20之啟閉機構25的移動件253上方,由於移動件253水平配置於作業室21上,並不會高聳直立凸伸於作業室21之上方而影響移料器311之位移作動,使得移料器311可順暢位移至承置器22之上方,並可便於作業室21之空間配置,又由於啟閉機構25之二移動件253關閉作業室21之通口212,中央控制裝置可依移料器311之作動時序而自動控制該啟閉機構25之壓缸251作動,以帶動二移動件253開啟作業室21之通口212,亦或於啟閉機構25之感知器感測到移料器311或電子元件41時,將感測資料傳輸至中央控制裝置,而由中央控制裝置控制該啟閉機構25之壓缸251作動,以帶動二移動件253開啟作業室21之通口212,於本實施例中,中央控制裝置依移料器311之作動時序而控制啟閉機構25之壓缸251作動,該壓缸251之活塞桿係驅動傳動件252作X方向位移,利用傳動件252帶動移動件253作X方向向外位移,二移動件253即開啟作業室21之通口212,進而該移料機構31之移料器311即可作Z方向向下位移通過該通口212,而將待測之電子元件41移入承置器22 之承置部件221,並使待測電子元件41之接點電性接觸承置器22之探針;於承置器22承置待測之電子元件41後,中央控制裝置係控制啟閉機構25之壓缸251作動,該壓缸251之活塞桿係驅動該傳動件252作X方向反向位移,利用傳動件252帶動移動件253作X方向向內位移,使二移動件253暫時關閉作業室21之通口212。 Referring to FIGS. 5 and 6, when performing the cold test operation of the electronic component 41, the pressing mechanism 23 cools the presser 231 to a preset test temperature by a temperature controller 234 for the cooling chip, so as to be pressed. When the electronic component is pressed by the extractor 231, the electronic component 41 can be placed in a simulated low temperature test environment. To prevent condensation of the low temperature presser 231 before the pressing operation is performed, the working device 20 is controlled by the first transfer pipe 261. The low temperature dry air is transported in the thermostat 241 to reduce the moisture content of the air in the temperature control box 241, thereby preventing the depressor 231 from dew condensation before the electronic component is depressed, and the temperature control box 241 is placed on the presser. Outside the 231, the temperature control box 241 is closed by the two-door plate 244, and the low-temperature presser 231 can be prevented from contacting the air having a high water content outside the temperature control box 241 to prevent the presser 231 from being subjected to the pressing operation. Condensation occurs, thereby improving the quality of the test. The transfer mechanism 31 of a transport device (not shown) shifts the electronic component 41 to be tested to the opening and closing mechanism 25 of the working device 20 by the shifter 311 in the Y direction. Above the moving part 253, due to the moving part 253 The flat portion is disposed on the working chamber 21, and does not rise upright and protrudes above the working chamber 21 to affect the displacement of the shifter 311, so that the shifter 311 can be smoothly displaced above the receptacle 22, and can be easily The space configuration of the working room 21, and because the moving member 253 of the opening and closing mechanism 25 closes the opening 212 of the working chamber 21, the central control device can automatically control the pressure cylinder of the opening and closing mechanism 25 according to the actuation timing of the feeder 311. The 251 is actuated to drive the two moving members 253 to open the opening 212 of the working room 21, or to transmit the sensing data to the central control device when the sensor of the opening and closing mechanism 25 senses the shifter 311 or the electronic component 41. The central control device controls the pressure cylinder 251 of the opening and closing mechanism 25 to actuate to drive the two moving members 253 to open the opening 212 of the working chamber 21. In this embodiment, the central control device operates according to the shifting of the feeder 311. The pressure cylinder 251 of the control opening and closing mechanism 25 is actuated. The piston rod of the pressure cylinder 251 drives the transmission member 252 to be displaced in the X direction, and the transmission member 252 drives the moving member 253 to be displaced outward in the X direction, and the second moving member 253 is opened. a port 212 of the working room 21, and further The feeding mechanism 31 to move the feeder 311 for Z-direction displacement downward through the port 212, and the electronic components 41 to be tested into the bearing set 22 The component 221 is mounted, and the contact of the electronic component 41 to be tested is electrically contacted with the probe of the mounting device 22; after the mounting device 22 carries the electronic component 41 to be tested, the central control device controls the opening and closing mechanism. The cylinder 251 of the cylinder 251 is actuated, and the piston rod of the cylinder 251 drives the transmission member 252 to reversely shift in the X direction, and the moving member 253 is used to drive the moving member 253 to be displaced in the X direction, so that the two moving members 253 are temporarily closed. The opening 212 of the chamber 21.

請參閱第7、8圖,由於壓取機構23係位於承置器22及作業室21之通口212的上方,壓取機構23係以驅動結構232驅動該作動件233作Z方向向下位移,令作動件233帶動壓取器231及溫度保持機構24同步作Z方向向下位移,使溫度保持機構24之二門板244置放於啟閉機構25之二移動件253上,並令二門板244的接合部件2441分別套合於二移動件253之卡接部件2531;於啟閉機構25之發射元件2561與接收元件2562間的光線被遮斷時,該接收元件2562即將感測資料傳輸至中央控制裝置,該中央控制裝置控制啟閉機構25之壓缸251作動,該壓缸251之活塞桿驅動該傳動件252作X方向向外位移,利用傳動件252帶動移動件253作X方向向外位移,以開啟作業室21之通口212,由於二移動件253之卡接部件2531係卡掣二門板244的接合部件2441,而可利用二移動件253作X方向向外位移之同時,即帶動二門板244同步作X方向向外位移平移作動,二門板244係以第二滑軌245沿控溫箱241之第二滑座246滑移,並拉伸第二彈性件249,進而開啟控溫箱241。 Referring to FIGS. 7 and 8, since the pressing mechanism 23 is located above the opening 212 of the socket 22 and the working chamber 21, the pressing mechanism 23 drives the actuator 233 to be displaced downward in the Z direction by the driving structure 232. The actuating member 233 drives the presser 231 and the temperature maintaining mechanism 24 to be displaced downward in the Z direction, so that the two door plates 244 of the temperature maintaining mechanism 24 are placed on the moving member 253 of the opening and closing mechanism 25, and the two door plates are made. The engaging member 2441 of the 244 is respectively engaged with the engaging member 2531 of the two moving members 253; when the light between the transmitting member 2561 and the receiving member 2562 of the opening and closing mechanism 25 is blocked, the receiving member 2562 transmits the sensing data to The central control device controls the pressure cylinder 251 of the opening and closing mechanism 25 to actuate. The piston rod of the pressure cylinder 251 drives the transmission member 252 to be displaced outward in the X direction, and the moving member 253 is driven by the transmission member 252 to perform the X direction. The outer displacement is to open the opening 212 of the working chamber 21, and since the engaging member 2531 of the two moving members 253 is engaged with the engaging member 2441 of the two-door plate 244, the two moving members 253 can be used to perform the X-direction outward displacement. That is, the two door panels 244 are synchronized to be the X side. Translational displacement outwardly actuated, two lines at a second door 244 of the second slide rail 245 of the slide 246 sliding along the temperature control box 241, and a second stretched elastic member 249, and thus open the temperature control box 241.

請參閱第3、9圖,於開啟控溫箱241之二門板244後,該壓取機構23之驅動結構232經由作動件233繼續帶動壓取器231作Z方向向下位移,由於溫度保持機構24之控溫箱241的二門板244係置放於二移動件253上,使得控溫箱241限位不作Z方向向下位移,該壓取機構23之作動件233並利用第一滑座243沿控溫箱241之第一滑軌242作Z方向向下位移,並以固定板2331的穿孔2332沿控溫箱241之連結件247滑移,且壓縮第一彈性件248,又由於控溫箱241之二門板244及啟閉機構25之二移動件253均已開啟,使得作動件233可帶動壓取器231通過作業室21之通口212,而下壓於承置器22上之待測電子元件41,令待測電子元件 41之接點與承置器22之探針確實接觸而執行冷測作業,當控溫箱241罩置於作業室21上時,不僅可防止作業室21內之乾燥空氣外洩,並利用第一輸送管261及第二輸送管262分別於控溫箱241及作業室21之內部輸送乾燥空氣,使得待測電子元件41於承置器22上進行冷測作業時,進而有效防止壓取器231、電子元件41及承置器22結露。 Referring to Figures 3 and 9, after the two door panels 244 of the temperature control box 241 are opened, the driving structure 232 of the pressing mechanism 23 continues to drive the presser 231 downward in the Z direction via the actuating member 233, due to the temperature maintaining mechanism. The two door plates 244 of the temperature control box 241 of the 24 are placed on the two moving parts 253, so that the temperature control box 241 is not displaced downward in the Z direction, and the actuating member 233 of the pressing mechanism 23 utilizes the first sliding seat 243. The first slide rail 242 of the temperature control box 241 is displaced downward in the Z direction, and is slid along the joint 247 of the temperature control box 241 by the through hole 2332 of the fixed plate 2331, and compresses the first elastic member 248, and is controlled by temperature. The two door panels 244 of the box 241 and the two moving members 253 of the opening and closing mechanism 25 are all opened, so that the actuating member 233 can drive the presser 231 through the opening 212 of the working chamber 21 and press down on the socket 22. Electronic component 41 for electronic components to be tested When the contact point of the 41 is in contact with the probe of the receiver 22 to perform the cold test operation, when the temperature control box 241 is placed on the work chamber 21, not only the dry air in the work chamber 21 is prevented from being leaked, but also the first use A conveying pipe 261 and a second conveying pipe 262 respectively convey dry air inside the temperature control box 241 and the working chamber 21, so that the electronic component 41 to be tested is subjected to cold-measurement work on the socket 22, thereby effectively preventing the pressure-receiving device. 231. The electronic component 41 and the receiver 22 are dew condensation.

請參閱第3、10、11圖,於完成冷測作業後,該壓取機構23之驅動結構232經由作動件233先帶動壓取器231作Z方向向上位移,該作動件233即利用第一滑座243沿控溫箱241之第一滑軌242作Z方向向上位移,並以固定板2331的穿孔2332沿控溫箱241之連結件247向上滑移,使壓取器231脫離承置器22上之已測電子元件41,而位於控溫箱241內;接著該啟閉機構25之壓缸251的活塞桿係驅動該傳動件252作X方向向內位移,利用傳動件252帶動移動件253作X方向向內位移,以關閉作業室21之通口212,由於二移動件253之卡接部件2531係卡掣二門板244的接合部件2441,而可利用二移動件253作X方向向內位移之同時,即帶動二門板244同步作X方向向內位移平移作動,二門板244係以第二滑軌245沿控溫箱241之第二滑座246滑移,並使第二彈性件249收縮,進而關閉控溫箱241。 Referring to Figures 3, 10, and 11, after the cold-test operation is completed, the driving structure 232 of the pressing mechanism 23 first drives the presser 231 to move upward in the Z direction via the actuating member 233, and the actuating member 233 utilizes the first The sliding seat 243 is displaced upward in the Z direction along the first sliding rail 242 of the temperature control box 241, and is slid upward along the connecting piece 247 of the temperature control box 241 by the through hole 2332 of the fixing plate 2331, so that the presser 231 is disengaged from the socket. The tested electronic component 41 on the 22 is located in the temperature control box 241; then the piston rod of the pressure cylinder 251 of the opening and closing mechanism 25 drives the transmission member 252 to be displaced in the X direction, and the moving member is driven by the transmission member 252. 253 is displaced inward in the X direction to close the opening 212 of the working chamber 21. Since the engaging member 2531 of the two moving members 253 is engaged with the engaging member 2441 of the two door panels 244, the two moving members 253 can be used as the X direction. At the same time of the internal displacement, the two-door plate 244 is synchronously moved in the X-direction inward displacement, and the two-door plate 244 is slid along the second sliding seat 246 of the temperature control box 241 by the second sliding rail 245, and the second elastic member is slid. The 249 is contracted, and the temperature control box 241 is closed.

請參閱第12、13圖,當控溫箱241之二門板244關閉後,該壓取機構23之驅動結構232經由作動件233帶動壓取器231作Z方向向上位移,由於作動件233之固定板2331係頂抵於控溫箱241之限位件2471,而可帶動控溫箱241同步作Z方向向上位移,控溫箱241則利用第一彈性件248之復位彈力頂推而向下位移,以保持罩置於壓取器231之外部,進而壓取機構23之驅動結構232帶動壓取器231及溫度保持機構24同步作Z方向向上位移復位;該中央控制裝置依移料器311之作動時序而控制啟閉機構25之壓缸251作動,該壓缸251之活塞桿係驅動傳動件252作X方向位移,利用傳動件252帶動移動件253作X方向向外位移,二移動件253即開啟作業室21之通口212,進而該移料機構31之移料器311即可作Z方向向下位移通過該通口212,以於承置器22上取出已測之電子 元件41。 Referring to Figures 12 and 13, when the two door panels 244 of the temperature control box 241 are closed, the driving structure 232 of the pressing mechanism 23 drives the presser 231 to move upward in the Z direction via the actuating member 233, and is fixed by the actuating member 233. The plate 2331 is abutted against the limiting member 2471 of the temperature control box 241, and the temperature control box 241 can be driven to shift upward in the Z direction, and the temperature control box 241 is displaced downward by the reset elastic force of the first elastic member 248. The holding mechanism is placed outside the presser 231, and the driving structure 232 of the pressing mechanism 23 drives the presser 231 and the temperature maintaining mechanism 24 to synchronously shift and reset in the Z direction; the central control device is operated by the shifter 311. Actuating the timing and controlling the pressure cylinder 251 of the opening and closing mechanism 25, the piston rod of the pressure cylinder 251 drives the transmission member 252 to be displaced in the X direction, and the transmission member 252 drives the moving member 253 to be displaced outward in the X direction, and the moving member 253 That is, the opening 212 of the working chamber 21 is opened, and the shifter 311 of the moving mechanism 31 can be displaced downward through the opening 212 in the Z direction to take out the measured electrons on the socket 22. Element 41.

請參閱第3、4、14圖,係本發明作業裝置20應用於測試分類設備,該測試分類設備包含作業裝置20、機台50、供料裝置60、收料裝置70、輸送裝置80及中央控制裝置,該供料裝置60係裝配於機台50,並設有至少一供料承置器61,用以容納至少一待測之電子元件;該收料裝置70係裝配於機台50,並設有至少一收料承置器71,用以容納至少一已測之電子元件,該作業裝置20係裝配於機台50上,並設有作業室21、至少一承置器22、壓取機構23、溫度保持機構24及啟閉機構25,於本實施例中,該承置器22係為具探針之測試座,用以測試電子元件,該壓取機構23係以壓取器231下壓電子元件,該溫度保持機構24係以控溫箱241使壓取器231保持預設測試溫度,該啟閉機構25係以水平位移之移動件253帶動控溫箱241之門板244啟閉;該輸送裝置80之第一移料器81係於供料裝置60取出待測之電子元件,並分別輸送至第一供料載台82及第二供料載台83,第一供料載台82及第二供料載台83將待測之電子元件載送至作業裝置20處,該輸送裝置80之第二移料器84及第三移料器85分別將第一供料載台82及第二供料載台83上待測之電子元件移載至作業裝置20而執行測試作業,以及將作業裝置20處之已測電子元件移載至第一收料載台86及第二收料載台87,第一收料載台86及第二收料載台87則載出已測之電子元件,該輸送裝置80之第四移料器88係於第一收料載台86及第二收料載台87上取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置70分類收置,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Referring to Figures 3, 4 and 14, the working device 20 of the present invention is applied to a test sorting device including a working device 20, a machine table 50, a feeding device 60, a receiving device 70, a conveying device 80, and a center. The feeding device 60 is mounted on the machine table 50 and is provided with at least one feeding device 61 for accommodating at least one electronic component to be tested; the receiving device 70 is mounted on the machine table 50, And at least one receiving device 71 for accommodating at least one tested electronic component, the working device 20 is mounted on the machine 50, and is provided with a working chamber 21, at least one socket 22, and pressure The taking mechanism 23, the temperature maintaining mechanism 24 and the opening and closing mechanism 25 are in the embodiment, the mounting device 22 is a test stand with a probe for testing electronic components, and the pressing mechanism 23 is a crimper. 231 is pressed down to the electronic component, the temperature maintaining mechanism 24 is configured to maintain the preset temperature of the presser 231 by the temperature control box 241, and the opening and closing mechanism 25 drives the door panel 244 of the temperature control box 241 with the horizontally displaced moving member 253. Closed; the first feeder 81 of the conveying device 80 is connected to the feeding device 60 to take out the electricity to be tested. The components are respectively sent to the first feeding stage 82 and the second feeding stage 83. The first feeding stage 82 and the second feeding stage 83 carry the electronic components to be tested to the working device 20 The second feeder 84 and the third feeder 85 of the conveying device 80 respectively transfer the electronic components to be tested on the first feeding stage 82 and the second feeding stage 83 to the working device 20 to execute The test operation, and transferring the measured electronic components at the working device 20 to the first receiving stage 86 and the second receiving stage 87, the first receiving stage 86 and the second receiving stage 87 are carried The measured electronic component, the fourth feeder 88 of the transport device 80 is attached to the first receiving platform 86 and the second receiving carrier 87 to take out the measured electronic components, and according to the test result, The measured electronic components are transported to the receiving device 70 for sorting and storage. The central control device is used to control and integrate the operations of the devices to perform automated operations, thereby achieving practical benefits of improving operational efficiency.

20‧‧‧作業裝置 20‧‧‧Working device

21‧‧‧作業室 21‧‧‧Workroom

211‧‧‧頂板 211‧‧‧ top board

212‧‧‧通口 212‧‧‧ mouth

22‧‧‧承置器 22‧‧‧ 承器

221‧‧‧承置部件 221‧‧‧Holding parts

23‧‧‧壓取機構 23‧‧‧Picking mechanism

231‧‧‧壓取器 231‧‧‧Presser

232‧‧‧驅動結構 232‧‧‧Drive structure

233‧‧‧作動件 233‧‧‧actuation

2331‧‧‧固定板 2331‧‧‧Fixed plate

2332‧‧‧穿孔 2332‧‧‧Perforation

234‧‧‧溫控器 234‧‧‧ thermostat

24‧‧‧溫度保持機構 24‧‧‧ Temperature retention mechanism

241‧‧‧控溫箱 241‧‧‧temperature control box

2411‧‧‧側板 2411‧‧‧ side panel

242‧‧‧第一滑軌 242‧‧‧First slide rail

243‧‧‧第一滑座 243‧‧‧First slide

244‧‧‧門板 244‧‧‧ door panel

2441‧‧‧接合部件 2441‧‧‧Connected parts

245‧‧‧第二滑軌 245‧‧‧Second rail

246‧‧‧第二滑座 246‧‧‧Second slide

247‧‧‧連結件 247‧‧‧Links

2471‧‧‧限位件 2471‧‧‧Limited parts

248‧‧‧第一彈性件 248‧‧‧First elastic parts

249‧‧‧第二彈性件 249‧‧‧Second elastic parts

25‧‧‧啟閉機構 25‧‧‧Opening and closing agency

251‧‧‧壓缸 251‧‧‧pressure cylinder

252‧‧‧傳動件 252‧‧‧ Transmission parts

253‧‧‧移動件 253‧‧‧Mobile parts

2531‧‧‧卡接部件 2531‧‧‧Snap parts

254‧‧‧第三滑軌 254‧‧‧ third slide

255‧‧‧第三滑座 255‧‧‧ third slide

2561‧‧‧發射元件 2561‧‧‧Transmission components

2562‧‧‧接收元件 2562‧‧‧ Receiving components

261‧‧‧第一輸送管 261‧‧‧First duct

262‧‧‧第二輸送管 262‧‧‧Second delivery tube

Claims (9)

一種電子元件作業裝置,包含:作業室;至少一承置器:係設有至少一承置電子元件之承置部件;壓取機構:係設有作至少一方向位移之壓取器,用以壓取該電子元件;溫度保持機構:係於該壓取機構之壓取器外部裝設有控溫箱,該控溫箱係由該壓取機構帶動作至少一方向位移,並於底部設有至少一平移作動之門板;啟閉機構:係於該作業室上設有至少一驅動源,該驅動源係驅動至少一移動件平移作動,該移動件與該溫度保持機構之門板間係設有相互配合之卡接部件與接合部件,以帶動該溫度保持機構之門板啟閉。 An electronic component working device comprising: a working room; at least one socket: at least one bearing member for mounting electronic components; and a pressing mechanism: a crimping device for displacing at least one direction for Pressing the electronic component; the temperature maintaining mechanism: a temperature control box is disposed outside the pressure extractor of the pressing mechanism, and the temperature control box is displaced by the pressing mechanism in at least one direction, and is disposed at the bottom At least one translationally actuating door panel; an opening and closing mechanism: at least one driving source is disposed on the working chamber, the driving source is configured to drive at least one moving member to move, and the moving member is disposed between the door panel of the temperature maintaining mechanism The engaging member and the engaging member cooperate with each other to drive the door panel of the temperature maintaining mechanism to open and close. 依申請專利範圍第1項所述之電子元件作業裝置,其中,該作業室係於頂板上設有至少一通口,該至少一承置器係位於該通口之下方。 The electronic component working device according to claim 1, wherein the working room is provided with at least one opening on the top plate, and the at least one receiving device is located below the opening. 依申請專利範圍第1項所述之電子元件作業裝置,其中,該壓取機構係設有驅動結構,該驅動結構係驅動至少一作動件作至少一方向位移,該控溫箱與該作動件之間係設有至少一呈第三方向配置之連結件,又該溫度保持機構之控溫箱與該壓取機構之作動件間係設有相互配合且呈第三方向配置之第一滑軌及第一滑座。 The electronic component working device according to claim 1, wherein the pressing mechanism is provided with a driving structure for driving at least one actuating member for at least one direction displacement, the temperature control box and the actuating member At least one connecting member disposed in a third direction is disposed between the temperature control box of the temperature maintaining mechanism and the actuating member of the pressing mechanism, and the first sliding rail disposed in a third direction And the first slide. 依申請專利範圍第1項所述之電子元件作業裝置,其中,該溫度保持機構之控溫箱係設有二門板,並於該控溫箱之二側板與該二門板間設有相互配合且呈第一方向配置之第二滑軌及第二滑座。 The electronic component working device according to claim 1, wherein the temperature control box of the temperature maintaining mechanism is provided with a two-door plate, and the two side plates of the temperature control box are matched with the two door plates. a second slide rail and a second slide rail disposed in the first direction. 依申請專利範圍第1項所述之電子元件作業裝置,其中,該啟閉機構之驅動源係設有呈第一方向配置之壓缸,該壓缸係驅動該至少一傳動件作第一方向位移,該傳動件係連結帶動該移動件位移,該移動件帶動該溫度保持機構之門板位移啟閉。 The electronic component working device according to claim 1, wherein the driving source of the opening and closing mechanism is provided with a pressure cylinder disposed in a first direction, the cylinder driving the at least one transmission member as a first direction Displacement, the transmission member is coupled to drive the displacement of the moving member, and the moving member drives the door panel of the temperature maintaining mechanism to be opened and closed. 依申請專利範圍第5項所述之電子元件作業裝置,其中,該啟閉機構之傳動件與該作業室間設有相互配合之第三滑座與第三滑軌。 The electronic component working device according to claim 5, wherein the third sliding seat and the third sliding rail are matched with each other between the driving member of the opening and closing mechanism and the working chamber. 依申請專利範圍第1項所述之電子元件作業裝置,其中,該啟閉機構係設有至少一感知器,以感知該控溫箱位於預設作業位置。 The electronic component working device according to claim 1, wherein the opening and closing mechanism is provided with at least one sensor to sense that the temperature control box is located at a preset working position. 依申請專利範圍第1項所述之電子元件作業裝置,更包含於該控溫箱上設有至少一輸送乾燥空氣之第一輸送管,以輸送乾燥空氣至該控溫箱之內部。 The electronic component working device according to claim 1, further comprising at least one first conveying pipe for conveying dry air to convey dry air to the inside of the temperature control box. 一種應用電子元件作業裝置之測試分類設備,包含:機台;供料裝置:係配置於該機台上,並設有至少一供料承置器,用以容納至少一待測之電子元件;收料裝置:係配置於該機台上,並設有至少一收料承置器,用以容納至少一已測之電子元件;至少一依申請專利範圍第1項所述之電子元件作業裝置:係裝配於該機台上;輸送裝置:係裝配於該機台上,並設有至少一移料器,用以移載該電子元件;中央控制裝置:係用以控制及整合各裝置作動,以執行自動化作業。 A test classification device for applying an electronic component working device, comprising: a machine table; a feeding device: disposed on the machine table, and provided with at least one feeding device for accommodating at least one electronic component to be tested; Receiving device: disposed on the machine, and provided with at least one receiving device for accommodating at least one tested electronic component; at least one electronic component working device according to claim 1 : is mounted on the machine; the conveying device is mounted on the machine, and is provided with at least one feeder for transferring the electronic component; the central control device is for controlling and integrating the devices To perform automated work.
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