TWI551529B - Electronic components operating machine - Google Patents

Description

Electronic component working machine

The present invention provides an electronic component working machine that can not only perform a preset operation in a cover outside the enclosure, but also reduce the configuration of the shifter and the transfer stroke, thereby improving the work capacity and cost.

Please refer to Figures 1 and 2 for a schematic diagram of a conventional electronic component test sorting machine. The machine 11 is provided with a feeding device 12 for holding the electronic component to be tested, and a measuring electronic component. The receiving device 13 is provided with a testing device 14 having a circuit board 141 and a tester 142 on the machine table 11. The testing device 142 performs a testing operation on the electronic components, and the conveying device 15 is disposed on the machine table 11. The conveying device 15 is provided with a first loading stage 151 and a first discharging stage 152 which are displaced in a first direction (such as an X direction) on one side of the testing device 14 to respectively carry the electronic components to be tested and The electronic component has been tested, and the second loading stage 153 and the second discharging stage 154 for shifting in the X direction are disposed on the other side of the testing device 14 to respectively carry the electronic component to be tested and the electronic component to be tested. The conveying device 15 is further provided with a first shifter 155 for shifting in the first, second and third directions (such as X, Y, Z directions) to take out the electronic components to be tested at the feeding device 12 and transfer them. Up to the first loading stage 151 or the second feeding stage 153, the first feeding stage 151 and the second feeding stage 153 are to be tested The component is carried to the side of the test device 14, wherein the transport device 15 is provided with a second shifter 156 and a third shifter 157 at the test device 14, the second shifter 156 being attached to the frame 158 is provided with a first motor 1561 and a first transmission group 1562. The first transmission group 1562 drives a first L-shaped arm 1563 for Z-direction displacement, and the first L-shaped arm 1563 is provided with a first take-off electronic component. Release 1564. A second motor 1565 is further disposed on the frame 158 to drive the second transmission group 1566 disposed in the Y direction. The second transmission group 1566 drives the first L-shaped arm 1563 and the first take-up via a first moving base 1567. The third member 157 is disposed on the frame 158 with a third motor 1571 and a third transmission group 1572. The third transmission group 1572 drives a second L-shaped arm 1573 for the Z direction. Displacement, the second L-shaped arm 1573 is provided with a second pick-and-place member 1574 for picking and placing electronic components, and the fourth motor 1575 is provided on the frame 158 for driving the fourth transmission group 1576 arranged in the Y direction, the fourth transmission The group 1576 drives the second L-shaped arm 1573 and the second pick-and-place member 1574 to be displaced in the Y direction via a second moving seat 1577, and the conveying device 15 is provided with a fourth shifter 159 for XYZ displacement. The measured electronic components are taken out from the first discharging stage 152 and the second discharging stage 154, and are transferred to the receiving device 13 for sorting and receiving; and the second moving device 156 is used for transferring electronic components as an example. The second motor 1565 drives the first moving seat 1567 to be displaced in the Y direction via the second transmission group 1566, and the first moving seat 1567 drives the first The L-shaped arm 1563 and the first pick-and-place member 1564 are displaced in the Y direction above the first loading stage 151, and then the first motor 1561 drives the first L-shaped arm 1563 to be displaced in the Z direction via the first transmission group 1562. The first pick-and-place member 1563 takes out the electronic component to be tested on the first loading stage 151. After the take-up, the second motor 1565 drives the first L-shaped arm via the second transmission set 1566 and the first moving base 1567. 1563 and the first pick-and-place member 1564 are displaced in the Y direction above the test socket 142 of the testing device 14, and the first L-shaped arm 1563 and the first pick-and-place member 1564 are driven by the first motor 1561 via the first transmission group 1562. The Z-direction displacement causes the first pick-and-place member 1564 to move the electronic component to be tested into the test socket 142 and perform the test operation. After the test is completed, the first L-arm 1563 of the second shifter 156 and the first The pick-and-place member 1564 is displaced in the YZ direction to place the measured electronic component on the first discharge stage 152 for output; however, the test sorter has the following defects in use:

1. Since the first loading stage 151, the first discharging stage 152, the second feeding stage 153 and the second discharging stage 154 are located on both sides of the testing device 14, the conveying device 15 is not only the first take-up The placing member 1564 and the second pick-and-place member 1574 are used for the Z-direction displacement of the electronic component, and the first pick-and-place member 1564 and the second pick-and-place member 1574 must be reciprocally displaced in the Y direction. The 151, the first discharge stage 152, the second loading stage 153 and the second discharge stage 154 and the testing device 14 transfer the electronic component to be tested and the tested electronic component, so that the first pick-and-place member is added. The transfer schedule of the 1564 and the second pick-and-place unit 1574 causes a costly transfer operation time and affects the lack of test throughput.

2. In order to displace the first pick-and-place member 1564 and the second pick-and-place member 1574 in the Y direction, the transport device 15 must dispose the second motor 1565, the second transmission group 1566, the first moving base 1567, the fourth motor 1575, and the fourth. The driving components such as the transmission group 1576 and the second moving base 1577 are not only complicated in the overall conveying device 15, but also increase the device cost.

3. Since the first loading stage 151 and the second loading stage 153 are located in the open space, when the first feeder 155 moves the pre-cooled or preheated electronic components into the first loading stage 151 and the second input After the loading stage 153, the first loading stage 151 and the second loading stage 153 transfer the electronic components to the testing device 14 in the X direction from the front of the feeding device 12 in the transfer path of the open space. On the side, the second shifter 156 or the third shifter 157 moves the electronic component to be tested into the test socket 142, which will cause the electronic component to fail to maintain the pre-warmed test temperature, and must be in the test socket 142. Time-consuming heating or cooling to the test temperature, resulting in the lack of test capacity can not be improved.

An object of the present invention is to provide an electronic component working machine which is provided with a feeding device, a receiving device, a working device, a conveying device and a central control device, and the feeding device is provided with at least one receiving device. a feeding device for the electronic component to be operated, the receiving device is provided with at least one receiving electronic component a material receiving device, wherein the working device is provided with at least one door outer cover, and at least one working room is disposed inside the outer cover for arranging the working device and the presser, the conveying device is attached to the outer cover The interior is provided with at least one loading platform, and the electronic component to be operated at the feeding device is moved into the loading platform by the feeder, and the loading platform is to transport the electronic components to be operated below the pressurer, and the pressing device will carry The electronic component on the stage is taken out and moved into the operator to perform the preset operation. After the operation is completed, the presser moves the operated electronic components on the working device into the stage. After the door panel of the cover is opened, the stage can be The feeder removes the operated electronic components and transfers them to the receiving device for sorting and collecting. The central control device is used to control and integrate the operations of the devices to perform an automated operation; thereby, the loading platform of the conveying device can be utilized Displacement to the bottom of the presser for feeding and discharging, in order to effectively reduce the travel and transfer time of the transfer electronic components, thereby achieving the practical benefit of increasing the operating capacity.

A second object of the present invention is to provide an electronic component working machine, wherein the carrier of the conveying device is directly displaced below the presser for feeding and discharging, and no transfer electrons are disposed between the loading platform and the working device. The component's shifter not only simplifies the device, but also saves costs and benefits the space configuration.

A third object of the present invention is to provide an electronic component working machine, wherein the carrier of the conveying device is located in a working chamber of the working device, and when the feeder moves the pre-cooled or preheated electronic components into the loading platform, The pre-cooled or preheated electronic components can be carried in the closed working room to ensure that the electronic components maintain the pre-warming test temperature, thereby reducing the working time and achieving the practical benefit of increasing the operating capacity.

[study]

11‧‧‧ machine

12‧‧‧Feeding device

13‧‧‧Receiving device

14‧‧‧Testing device

141‧‧‧ boards

142‧‧‧Tester

15‧‧‧Conveyor

151‧‧‧First feeding platform

152‧‧‧First discharge stage

153‧‧‧Second feed stage

154‧‧‧Second discharge platform

155‧‧‧First mover

156‧‧‧Second shifter

1561‧‧‧First motor

1562‧‧‧First Transmission Group

1563‧‧‧First L-arm

1564‧‧‧First pick and place

1565‧‧‧second motor

1566‧‧‧Second gear set

1567‧‧‧First mobile seat

157‧‧‧third shifter

1571‧‧‧third motor

1572‧‧‧ Third transmission set

1573‧‧‧Second L-arm

1574‧‧‧Second pick and place

1575‧‧‧fourth motor

1576‧‧‧Fourth drive set

1577‧‧‧Second mobile seat

158‧‧‧Rack

159‧‧‧fourth shifter

〔this invention〕

20‧‧‧ machine

30‧‧‧Feeding device

31‧‧‧Feeder

40‧‧‧Receiving device

41‧‧‧Receipt receiver

50‧‧‧Working device

51‧‧‧ Cover

511‧‧‧ first port

512‧‧‧first door panel

513‧‧‧First drive source

514‧‧‧Workroom

515‧‧‧ fluid delivery tube

516‧‧‧second port

517‧‧‧ fifth drive source

518‧‧‧Second door panel

521‧‧‧ boards

522‧‧‧ test seat

53‧‧‧Presser

531‧‧‧Warm control

54‧‧‧second drive source

60‧‧‧Conveyor

61‧‧‧First stage

611‧‧‧First accommodating slot

612‧‧‧Second accommodating slot

613‧‧‧ third drive source

62‧‧‧First mover

621‧‧‧First pickup

622‧‧‧Second pickup

623‧‧‧fourth drive source

63‧‧‧Imager

64‧‧‧Second stage

641‧‧‧ third accommodating slot

642‧‧‧ sixth drive source

65‧‧‧ third stage

651‧‧‧4th accommodating slot

652‧‧‧ seventh drive source

66‧‧‧Second shifter

661‧‧‧ Third pickup

662‧‧‧ eighth drive source

67‧‧‧ Third feeder

671‧‧‧Fourth pickup

672‧‧‧ninth drive source

71, 72‧‧‧ Electronic components

Figure 1: Schematic diagram of a conventional electronic component test sorter.

Figure 2: A partial schematic diagram of a conventional electronic component test sorter.

Figure 3 is a schematic view of an electronic component working machine of the present invention.

Fig. 4 is a partial side elevational view of the electronic component working machine of the present invention.

Fig. 5 is a schematic view showing the use of the electronic component working machine of the present invention (1).

Fig. 6 is a schematic view showing the use of the electronic component working machine of the present invention (2).

Figure 7: Schematic diagram of the use of the electronic component working machine of the present invention (3).

Figure 8 is a schematic view showing the use of the electronic component working machine of the present invention (4).

Figure 9 is a schematic view showing the use of the electronic component working machine of the present invention (5).

Fig. 10 is a view showing another embodiment of the electronic component working machine of the present invention.

Figure 11 is a partial side elevational view of another embodiment of the electronic component working machine of the present invention.

Fig. 12 is a schematic view showing the use of another embodiment of the electronic component working machine of the present invention (1).

Figure 13 is a schematic view showing the use of another embodiment of the electronic component working machine of the present invention (2).

Figure 14 is a schematic view showing the use of another embodiment of the electronic component working machine of the present invention (3).

Figure 15 is a schematic view showing the use of another embodiment of the electronic component working machine of the present invention (4).

Figure 16 is a schematic view showing the use of another embodiment of the electronic component working machine of the present invention (5).

In order to make the present invention more fully understood by the reviewing committee, a preferred embodiment and a drawing will be described in detail as follows: Referring to Figures 3 and 4, the electronic component working machine of the present invention comprises a machine table 20, a feeding device 30, a receiving device 40, a working device 50, a conveying device 60 and a central control device (not shown), the feeding device 30 is mounted on the machine table 20, and is provided with at least one electronic device to be operated In the embodiment, the feeding device 31 is a feeding tray and can be displaced in a third direction (such as a Z direction); the receiving device 40 is assembled on the machine. The receiving unit 41 is disposed on the table 20 and is provided with at least one receiving device 41. In the embodiment, the receiving device 41 is a receiving tray and can be in a third direction (such as Z). Displacement; the working device 50 is mounted on the machine table 20, and is provided with at least one door outer cover 51, and at least one working room is disposed inside the outer cover 51, and at least one pair of electronic devices are disposed inside the working room An operator that performs a preset operation, and a crimper that configures at least one electronic component to be pressed, In the example, the first door 511 is provided with a cover 51, and the first port 511 is provided with a first door 512 that can be opened and closed. In this embodiment, the cover 51 is attached to the cover 51. The first driving source 513 is configured as a pressure cylinder, and the first door plate 512 is coupled to drive the first door plate 512 to open and close the first opening 511, and the inside of the outer cover 51 is a work space 514 in a confined space, the work room 514 can be used for performing a cold test operation or a thermal test operation of an electronic component or a wireless communication electronic component test operation for preventing noise, etc., and further, the work room 514 The system is connected to at least one fluid delivery pipe 515, which can transport dry cold air or dry hot air to the working chamber 514 to reduce the air moisture content of the working chamber 514, and prevent dew condensation of the presser or electronic components, and the like. The operator can be a tester or a detector or a printer. In this embodiment, the operator is a tester, and is provided with an electrically connected circuit board 521 and a test socket 522 for performing on the electronic components. For the test operation, the presser 53 is located above the test stand 522 and is provided with at least one temperature control to place the electronic component in an analog pre-war test environment, which may be a cryogenic wafer or a heating element or The temperature control container of the fluid, etc., in the embodiment, the temperature control 531 is a cooling chip, so that the electronic component can be subjected to a cold test operation under a simulated low temperature test environment, and the presser 53 is Two drive source 54 drive Displacement in the Z direction to pick up and press against the electronic component; the transport device 60 is mounted on the machine table 20, and at least one stage is provided in the working chamber 514 of the working device 50, the stage has at least one The accommodating groove of the electronic component is placed and displaced in at least one direction below the presser 53 for picking and placing electronic components. Further, the carrier can carry the electronic component to be operated or the electronic component to be operated, or In the present embodiment, the stage is a first stage 61, and the first stage 61 has a plurality of first receiving slots 611 and a plurality of second housings. The slot 612 is configured to respectively receive the electronic component to be operated and the electronic component to be operated, and the first stage 61 is driven by the third driving source 613 to be displaced in the Y direction to be below the presser 53 and the first port 511. The transfer device 60 is provided with at least one shifter for moving the electronic component, and the picker is provided with at least one pick-up member for picking and placing electronic components. In the embodiment, the transfer device The first shifter 62 is a first shifter 62, and the first shifter 62 is provided with a first pick. The member 621 and the second pick-up member 622 are driven by the fourth driving source 623 to be displaced in the XYZ direction to pick up the electronic component to be operated and the electronic device to be operated between the feeding device 30, the receiving device 40 and the first loading table 61. The component, the other conveying device 60 is provided with at least one image capturing The image pickup unit 63 of the electronic component transmits the image pickup data to the central control device to perform an appearance inspection operation on the electronic component. In the embodiment, the image pickup device 63 is a CCD and is driven by the fourth driving source 623. The drive is displaced in the XY direction to take the electronic components to be operated at the feeding device 30; the central control device (not shown) is used to control and integrate the operations of the devices to perform an automated operation.

Referring to FIG. 5, the electronic component working machine of the present invention is applied to test electronic components. The conveying device 60 drives the first shifter 62 and the image picker 63 to shift in the XY direction to the feeding device by the fourth driving source 623. At 30, the singapore imager 63 takes an image of the electronic component 71 to be tested on the supply container 31, and transmits the image data to the central control device to perform an appearance inspection operation on the electronic component. After that, the fourth driving source 623 drives the first shifter 62 and the image picker 63 to shift in the Y direction, so that the first picking member 621 of the first shifter 62 aligns the electronic components on the feeding and receiving device 31. 71. The first pick-up member 621 is displaced in the Z direction to take out a plurality of electronic components 71 to be tested on the feeding receiver 31.

Referring to FIGS. 6 and 7, the fourth driving source 623 of the conveying device 60 drives the first shifter 62 and the image picker 63 to be displaced in the XY direction to the working device 50. The working device 50 is driven by the first driving. The source 513 drives the first door panel 512 on the outer cover 51 to be displaced in the Y direction to open the first port 511. The first pick-up member 621 of the first shifter 62 corresponds to the first receiving slot 611 of the first stage 61. The first pick-up member 621 is moved in the Z direction to move the electronic component 71 to be tested into the first receiving slot 611; after the first loading 61 carries the electronic component 71 to be tested, the first driving source 513 is driven. The first door panel 512 is reversely displaced in the Y direction to close the first port 511, so that the working chamber 514 of the outer cover 51 forms a closed space. Since the working chamber 514 is connected to the fluid conveying pipe 515, the fluid conveying pipe 515 can be transported to dry and cool. The air is supplied to the working chamber 514 to reduce the moisture content of the air in the working chamber 514, and the dew condensation of the presser 53 or the electronic component is effectively prevented. The conveying device 60 drives the first stage 61 to shift in the Y direction by the third driving source 613. Up to the presser 53 of the working device 50 The electronic component 71 to be tested is taken out by the extractor 53 for driving the first stage 61 to be reversely displaced in the Y direction and left below the presser 53, and the second of the working device 50. The driving source 54 drives the presser 53 to perform displacement in the Z direction, and the electronic component 71 to be tested is moved into and pressed against the test socket 522 to perform a test operation. Since the presser 53 is provided with a temperature control 531, Performing the cold test operation in the test environment where the electronic component 71 to be tested is in a simulated low temperature, and then transmitting the test data to the central control device by the circuit board 521 electrically connected to the test socket 522, and the central control device determines the test of the electronic component. The fourth driving source 623 of the conveying device 60 can drive the first shifter 62 and the image picker 63 to be displaced in the XY direction to the feeding device 30 on the feeding device 31 of the image picker 63. After the image-receiving electronic component 72 is imaged, the first pick-up member 621 of the first shifter 62 takes out a plurality of electronic components 72 to be tested on the feeder-mounted device 31.

Referring to FIGS. 8 and 9, after the electronic component 71 is tested, the second driving source 54 of the working device 50, that is, the driving presser 53 is reversely displaced in the Z direction, so that the crimper 53 will measure the measured electronic components. The belt 71 is separated from the test socket 522, and the transport device 60 drives the first stage 61 to be displaced in the Y direction below the presser 53 by the third driving source 613 for the presser 53 to move the measured electronic component 71 into the The second accommodating groove 612 of the first stage 61 drives the first stage 61 to be reversely displaced in the Y direction and is separated from the lower side of the ejector 53 to be displaced to the first stage 61. When a port 511 is below, the first driving source 513 of the working device 50 drives the first door panel 512 to be displaced in the Y direction to open the first port 511. Since the first feeder 62 of the conveying device 60 has been tested The electronic component 72 is transferred to the first port 511 of the working device 50. The first pipe feeder 62 can be displaced in the Z direction by the second picking member 622 and the second receiving slot of the first stage 61. The measured electronic component 71 is taken out on the 612, and the first pick-up member 621 is used for the Z-direction displacement to move the next batch of the plurality of electronic components 72 to be tested. A first receiving groove 611 of the first stage 61; carrier of the electronic component under test 61 to first stage 72, the working device 50 of the first The driving source 513 drives the first door panel 512 to be displaced in the Y direction to close the first port 511, so that the first stage 61 carries the electronic component 72 to be tested in the working chamber 514 to perform a test operation, and the conveying device 60 The fourth driving source 623 drives the first shifter 62 and the image picker 63 to be displaced in the XY direction to the receiving device 40, so that the second picking member 622 is displaced in the Z direction, and the measured electrons are measured according to the test result. The element 71 is moved into the receiving device 41 of the receiving device 40 and sorted and placed.

Please refer to FIGS. 10 and 11 , which are another embodiment of the electronic component working machine of the present invention, which comprises a machine table 20 , a feeding device 30 , a receiving device 40 , a working device 50 , a conveying device 60 and a central control device ( Not shown), the difference is that the feeding device 30 is located on one side of the working device 50, and the receiving device 40 is located on the other side of the working device 50, and the inside of the outer cover 51 of the working device 50 is a working room 514, and a first port 511 is opened on one side, and a second port 516 is formed on the other side. The first port 511 is provided with at least one first door that is controlled to be opened and closed by the first driving source 513. 512, and at the second port 516, at least one second door plate 518 controlled by the fifth driving source 517 is opened, and the working chamber 514 is connected to at least one fluid conveying pipe 515 for conveying the pre-warming fluid. The working device 50 is provided with at least one working device in the working chamber 514. In the embodiment, the working device is provided with an electrically connected circuit board 521 and a test socket 522 for performing a test operation on the electronic component. The presser 53 is located above the test seat 522 and is provided with at least one temperature control 531. The electronic component is placed in an analog pre-temperature test environment, and the presser 53 is driven by a second driving source 54 to be displaced in the Z direction to pick up and press the electronic component; the conveying device 60 is attached to one side of the working chamber 514 The second stage 64 is provided with at least one direction displacement. The second stage 64 has a plurality of third receiving grooves 641 for receiving the electronic components to be operated, and the second stage 64 is driven by the sixth driving source. The 642 drive is displaced in the Y direction to reciprocate between the lower portion of the presser 53 and the lower portion of the first port 511, and the conveying device 60 is disposed on the other side of the working chamber 514 for at least one direction displacement. Three stages 65, the third stage 65 has a plurality of fourth The slot 651 is received for receiving the electronic component that has been operated, and the third stage 65 is driven by the seventh driving source 652 to be displaced in the Y direction so as to be below the presser 53 and below the second port 516. Reciprocating displacement, the conveying device 60 is provided with a second feeder 66 between the feeding device 30 and the second stage 64, and the second feeder 66 is provided with at least one third suitable electronic component to be placed The pickup member 661 is driven by the eighth driving source 662 to be displaced in the XYZ direction to take the electronic component to be operated between the feeding device 30 and the second loading table 64, and the eighth driving source 662 drives an image capturing device 63. Displacement in the XY direction to take the electronic component to be tested on the image feeding device 30, and transmit the image capturing data to the central control device to perform an visual inspection operation on the electronic component, and the conveying device 60 is disposed in the receiving device 40 A third shifter 67 is disposed between the third stage 65. The third shifter 67 is provided with at least one fourth pick-up member 671 for picking up the operated electronic components, and is driven by the ninth driving source 672 for the XYZ direction. Displacement to take and place the electronic components that have been operated between the receiving device 40 and the third stage 65; A control device (not shown) for controlling the system and integration of each apparatus actuated to perform automated operations.

Referring to Figures 12 and 13, the transport device 60 drives the second shifter 66 and the image picker 63 to be displaced in the XY direction to the feeding device 30 by the eighth driving source 662, so that the image picker 63 feeds the material. The electronic component 71 to be tested on the receiver 31 takes an image, and transmits the image data to the central control device to perform an appearance inspection operation on the electronic component. After the image capturing is completed, the eighth driving source 662 drives the second shift. The hopper 66 and the image finder 63 are displaced in the XY direction, so that the third picking member 661 of the second hopper 66 picks up a plurality of electronic components 71 to be tested on the feeding receiver 31; then the eighth driving source 662 The second shifter 66 and the image picker 63 are driven to move in the XY direction to the working device 50. The first driving source 513 of the working device 50 drives the first door panel 512 on the outer cover 51 to be displaced in the Y direction to open the first The port 511, because the third pick-up member 661 of the second shifter 66 corresponds to the third receiving groove 641 of the second stage 64, the third pick-up member 661 can be displaced in the Z direction to be the electronic component to be tested. 71 is moved into the third receiving groove 641.

Referring to FIG. 14, after the second stage 64 carries the electronic component 71 to be tested, the first driving source 513 drives the first door panel 512 on the outer cover 51 to reversely shift in the Y direction to close the first opening 511. The working chamber 514 in the outer cover 51 is formed into a closed space. Since the working chamber 514 is connected to the fluid conveying pipe 515, the fluid conveying pipe 515 delivers dry cold air to the working chamber 514 to reduce the air moisture content of the working chamber 514. The condensation device 53 or the electronic component or the like is effectively prevented from dew condensation, and the conveying device 60 drives the second stage 64 to shift in the Y direction to the lower side of the presser 53 of the working device 50 for the presser 53. The electronic component 71 to be tested is taken out on the second stage 64, and the sixth driving source 642 drives the second stage 64 to be reversely displaced in the Y direction and is separated from the lower side of the presser 53, and the second driving of the working device 50. The source 54 drives the presser 53 to perform displacement in the Z direction, and the electronic component 71 to be tested is moved in and pressed against the test socket 522 to perform a test operation. Since the presser 53 is provided with a temperature control 531, The electronic component 71 to be tested is subjected to cold measurement in a simulated low temperature test environment. Then, the test data is transmitted to the central control device by the circuit board 521 of the electrical connection test socket 522. The central control device determines the test quality of the electronic component, and the eighth drive source 662 of the transport device 60 drives the second. The hopper 66 and the image finder 63 are displaced in the XY direction to the feeding device 30. After the image taking device 63 takes the image of the electronic component 72 to be tested on the feeding device 31, the second hopper 66 is removed. The third pick-up member 661 takes out a plurality of electronic components 72 to be tested on the feed receiver 31.

Referring to FIGS. 15 and 16, after the electronic component 71 is tested, the second driving source 54 of the working device 50, that is, the driving presser 53 is reversely displaced in the Z direction, so that the crimper 53 will measure the measured electronic components. The belt 71 is separated from the test socket 522, and the transport device 60 drives the third stage 65 to be displaced in the Y direction to the lower side of the presser 53 of the working device 50 for the presser 53 to measure the measured electrons. The component 71 moves into the fourth receiving groove 651 of the third stage 65, and the seventh driving source 652 drives the third stage 65 to reversely shift in the Y direction and exits the lower side of the presser 53 and is displaced to the second pass. Below port 516, the The fifth driving source 517 of the working device 50 drives the second door panel 518 to shift in the Y direction to open the second opening 516. Since the third shifter 67 of the conveying device 60 has been displaced above the second opening 516, the third The fourth pick-up member 671 of the shifter 67 is displaced in the Z direction to take out the measured electronic component 71 on the fourth receiving slot 651 of the third stage 65, and the third picker 67 takes out the measured electronic component. In the case of the component 71, the first driving source 513 of the working device 50 drives the first door panel 512 to be displaced in the Y direction to open the first opening 511, so that the second shifter 66 can take the next batch of electronic components 72 to be tested. Moving into the second stage 64; after the third shifter 67 takes out the tested electronic component 71, and the second shifter 66 places the next batch of electronic components 72 to be tested, the fifth drive of the working device 50 The source 517 drives the second door panel 518 to displace in the Y direction to close the second port 516, and the first driving source 513 drives the first door panel 512 to displace in the Y direction to close the first port 511. The conveying device 60 The ninth driving source 672 drives the third shifter 67 to be displaced in the XY direction to the receiving device 40, so that the fourth picking member 671 Displacement in the Z direction, and according to the test result, the measured electronic component 71 is moved into the receiving device 41 of the receiving device 40 for sorting and storage, and the second carrier 64 is carried in the working chamber 514 to be tested. The electronic component 72 continues the test operation.

20‧‧‧ machine

30‧‧‧Feeding device

31‧‧‧Feeder

40‧‧‧Receiving device

41‧‧‧Receipt receiver

50‧‧‧Working device

51‧‧‧ Cover

511‧‧‧ first port

512‧‧‧first door panel

513‧‧‧First drive source

514‧‧‧Workroom

515‧‧‧ fluid delivery tube

521‧‧‧ boards

522‧‧‧ test seat

53‧‧‧Presser

60‧‧‧Conveyor

61‧‧‧First stage

611‧‧‧First accommodating slot

612‧‧‧Second accommodating slot

613‧‧‧ third drive source

62‧‧‧First mover

621‧‧‧First pickup

622‧‧‧Second pickup

623‧‧‧fourth drive source

63‧‧‧Imager

Claims (10)

An electronic component working machine comprising: a machine; a feeding device: mounted on the machine, and provided with at least one feeding device for accommodating electronic components to be operated; and a receiving device: being assembled on the machine And at least one receiving device for accommodating the electronic components for operation; the working device is mounted on the machine, and is provided with at least one opening cover, and the outer cover is provided with at least one opening and closing a door panel of the port, and at least one working chamber is disposed therein, the working chamber is provided with at least one pair of electronic components to perform a preset operation, and at least one presser for pressing the electronic components; Mounted on the machine table, and provided at least one loading platform in the working chamber of the working device, the at least one loading platform carrying the electronic component between the presser and the at least one opening, and the conveying device is Providing at least one shifter for moving the electronic component outside the cover, the at least one shifter is provided with at least one pick-up member for picking and placing electronic components between the outside of the cover and the at least one stage in the work chamber Central control unit: for use And integration control means of each actuator to perform automatic operation. The electronic component working machine according to claim 1, wherein the outer cover of the working device is provided with a first opening on one side, and at least one openable and closable first in the first opening Door panel. The electronic component working machine according to claim 2, wherein the feeding device and the receiving device are located on the same side of the working device. The electronic component working machine according to claim 2, wherein the conveying device is provided with a first stage in which at least one direction is displaced, and the first stage has at least one mounting electron The component accommodates the slot and is pressed Reciprocating displacement between the device and the first port. The electronic component working machine according to claim 4, wherein the conveying device is provided with a first shifter for at least one direction displacement, and the first shifter is provided with at least one pick-and-place electronic component The picking member transfers the electronic component between the feeding device, the receiving device and the first stage. The electronic component working machine according to claim 2, wherein the working device is provided with a second opening on the other side of the outer cover, and at least one opening and closing is provided at the second opening The second door panel. The electronic component working machine according to claim 6, wherein the conveying device is provided with a second stage for shifting in at least one direction on a working chamber side of the working device, the second stage having At least one of the third receiving slots of the electronic component to be operated, and reciprocally displaced between the crimper and the first opening, the conveying device is disposed on the other side of the working chamber for at least one direction a third stage of displacement, the third stage having at least one fourth receiving groove for holding the operated electronic component, and reciprocatingly displaced between the presser and the second opening. The electronic component working machine according to claim 7, wherein the conveying device is provided with a second shifting device for at least one direction displacement, and the second shifting device is provided with at least one third picking member. The electronic component to be operated is transferred between the feeding device and the second stage, and the conveying device is provided with a third shifting device for at least one direction displacement, and the third feeder is provided with At least one fourth picking member for transferring the electronic components that have been operated between the receiving device and the third stage. The electronic component working machine according to claim 1, wherein the conveying device is provided with an image taking device of at least one image capturing electronic component. The electronic component working machine according to claim 1, wherein the working chamber of the working device is connected to at least one fluid conveying pipe for conveying fluid, and the press device of the working device is provided with at least one temperature control. So that the electronic components are in an analog pre-temperature test environment.