TWI604206B - Electronic component testing device and its application test classification equipment - Google Patents

Description

Electronic component testing device and test classification device thereof

The invention provides a test ring cover which can be assembled on a crimper or a tester. During the test operation, at least one ventilation through the crimper can be provided by using the test ring cover to abut the tester and the crimper. The test space of the part, and the electronic components on the tester perform preset test operations in the test space, thereby reducing the size of the test device and saving the electronic component test device for testing the energy cost.

Nowadays, electronic components are applied to different electronic devices. Since some of the electronic components may be in a positive pressure environment or a negative pressure environment, in order to ensure the quality of the electronic components, after the electronic components are manufactured, the electronic components are used. The test device of the test device performs a stress test operation on the electronic component to eliminate the defective product; referring to FIG. 1 , the test device is provided on the machine table 11 with a pressure test chamber 12 having a door panel 121, and the pressure test chamber 12 is Connected to a gas delivery tube 13 for injecting gas into the pressure test chamber 12, such that the interior of the pressure test chamber 12 has a predetermined test pressure, and the test chamber 12 is provided with testable electronic components. The tester 14 is provided with a crimper 15 above the tester 14. The crimper 15 is provided with a moving arm 151 for displacement in a first direction (such as the Z direction), and is crimped by the moving arm 151. The electronic component lower pressing block 152 is synchronously displaced; referring to FIG. 2, after the tester 14 is mounted on the electronic component 16 to be tested, the crimping device 15 drives the lower pressing block 152 to move the Z direction downward by the moving arm 151. Displacement The pressing block 152 is pressed against the electronic component 16 to be tested, so that the contact of the electronic component 16 to be tested is in true contact with the transmitting component of the tester 14. Since the inside of the pressure testing chamber 12 has a preset test pressure, the electronic component 16 is The pressure test can be performed in the pressure test chamber 12; however, the test The test device has the following defects in its use:

1. Since the pressure test chamber 12 is placed outside the crimper 15 and the tester 14 and is fixed on the machine table 11, the overall volume of the pressure test chamber 12 is bulky and occupies space of the machine 11 and is disadvantageous. The space configuration of the station 11.

2. Since the pressure inside the pressure test chamber 12 must reach the preset test pressure to provide the electronic component 16 for the pressure test operation, the volume of the pressure test chamber 12 is so large that the operator must inject the inside of the pressure test chamber 12. A large amount of gas can cause the inside of the pressure test chamber 12 to have a preset test pressure, resulting in a lack of cost of gas energy.

3. Referring to FIG. 3, when the lower pressing block 152 of the crimper 15 is pressed against the electronic component 16, the lower pressing block 152 and the electronic component 16 will make a large area contact, so that the electronic component 16 is easy to adhere to the lower pressing block 152. On the bottom surface, when the lower pressing block 152 is displaced upwards after the test operation is completed, the adhesive electronic component 16 is taken away from the tester 15, so that there is no electronic component 16 in the tester 15 for the relevant moving material. The device (not shown) takes the material, causing abnormalities in subsequent operations, and the staff must stop and eliminate the abnormality, resulting in the lack of smooth test operations.

An object of the present invention is to provide an electronic component testing device comprising a tester, a crimper and a test ring cover, the tester is for testing electronic components, and is provided with at least one bearing portion for receiving the electronic components. The crimping device is provided with a body that is displaced in at least one direction, and is provided with at least one venting portion on the bottom surface of the body, and at least one abutting member for crimping the electronic component, the test ring cover is assembled a tester or a crimper, after joining the tester and the crimper, forming a closed test space on the circumference of the bearing portion of the tester, and the test space is used for extracting or inputting gas into the vent of the crimper. In order to enable the electronic components on the mounting part to perform the preset test operation in the test space, the volume of the test device is effectively reduced, thereby achieving the practical benefit of improving the use efficiency and facilitating the space configuration.

A second object of the present invention is to provide an electronic component testing device, wherein the test ring cover can be mounted on a tester or a crimper, and when the test ring cover engages the tester and the crimper, the tester is placed A closed test space is formed on the peripheral side of the part, which not only effectively reduces the test space, but also does not require a large amount of gas to be injected into the test space during the pressure test operation or the cold test operation, so that the test space has a preset test pressure. Practical cost savings.

A third object of the present invention is to provide an electronic component testing device, wherein the crimping device is provided with at least one top releasing member on a circumferential side of the abutting member, and the crimping device is oriented in the Z direction after the test operation is completed. During displacement, the top piece can be used to push the tested electronic component out of the abutting component to prevent the abutting component from sticking away from the tested electronic component, thereby allowing the measured electronic component to be placed in the tester. The relevant shifter can take the material and smoothly carry out the subsequent operation, thereby achieving the practical benefit of improving the smoothness of the operation.

A fourth object of the present invention is to provide a test classification device for applying an electronic component testing device, which is provided with a feeding device, a receiving device, a testing device, a conveying device and a central control device, which are arranged on the machine table. Providing at least one feeding device for accommodating the electronic component to be tested, the receiving device is provided with at least one receiving device for accommodating the tested electronic component, the testing device is provided with a tester, a crimper and Testing the ring cover to perform a preset test operation on the electronic component, the transport device being provided with at least one shifter for moving the electronic component, the central control device for controlling and integrating the operation of each device to perform an automated operation To achieve the practical benefits of improving the production efficiency of the operation.

[study]

11‧‧‧ machine

12‧‧‧ Pressure test room

121‧‧‧ Door panel

13‧‧‧Transport

14‧‧‧Tester

15‧‧‧Crimper

151‧‧‧ moving arm

152‧‧‧ Lower press block

16‧‧‧Electronic components

〔this invention〕

20‧‧‧Testing device

21‧‧‧Tester

211‧‧‧Substrate

212‧‧‧ boards

213‧‧‧ test seat

214‧‧‧Holding Department

22‧‧‧Crimper

221‧‧‧ moving arm

222‧‧‧ body

223‧‧‧ Ventilation Department

224‧‧‧ delivery tube

225‧‧‧Resist parts

226‧‧‧Top pieces

2261‧‧‧Top block

227‧‧‧Cooling module

2271‧‧‧ runner

2272‧‧‧ fluid input tube

2273‧‧‧ fluid output tube

228‧‧‧heating parts

229‧‧‧ Temperature sensing parts

23‧‧‧Test ring cover

231‧‧‧Test space

31‧‧‧Electronic components

40‧‧‧ machine

50‧‧‧Feeding device

51‧‧‧Feeder

60‧‧‧ receiving device

61‧‧‧Receipt receiver

70‧‧‧Conveyor

71‧‧‧First mover

72‧‧‧First transfer station

73‧‧‧Second transfer station

74‧‧‧Second shifter

75‧‧‧third shifter

Figure 1: Schematic diagram of a conventional test device.

Figure 2: Schematic diagram of the use of a conventional test device (1).

Figure 3: Schematic diagram of the use of the conventional test device (2).

Figure 4: Schematic diagram of the test device of the present invention.

Figure 5: Schematic diagram of the use of the test device of the present invention (1).

Figure 6: Schematic diagram of the use of the test device of the present invention (2).

Figure 7: Schematic diagram of the use of the test device of the present invention (3).

Figure 8: Schematic diagram of the test device of the present invention applied to a test classification device.

In order to make the reviewer further understand the present invention, a preferred embodiment will be described in conjunction with the drawings, as follows:

Referring to FIG. 4, the testing device 20 of the present invention comprises a tester 21, a crimper 22 and a test ring cover 23 for testing electronic components and providing at least one mounting electronic component. The tester 21 further includes at least one substrate, and the substrate can be a panel of a separate panel or a machine. In the embodiment, the tester 21 is a substrate 211 of the machine, and is disposed on the substrate 211. The circuit board 212 and the test socket 213 are mounted on the second electrical connection. The test socket 213 is provided with a plurality of mounting portions 214 for mounting electronic components. The mounting portion 214 has at least one transmission component, and the transmission component can be The probe is electrically connected to the contact between the circuit board 212 and the electronic component; the crimper 22 is provided with a body that is displaced in at least one direction, and at least one venting portion is disposed on the bottom surface of the body, and At least one abutting component for crimping the electronic component, and further, the crimper 22 can be a pressure transfer device for transferring and depressing the electronic component, or a pressing device for simply pressing the electronic component, in this embodiment The crimper 22 is simply pressed under the electronic component, and Above the tester 21, the crimper 22 is provided with a moving arm 221 driven by a driving source (not shown) for displacement in a first direction (such as a Z direction), and the moving arm 221 drives at least one body 222. The venting portion 223 is connected to the at least one conveying pipe 224, and the conveying pipe 224 can be connected to the suction device or the air supply device. The delivery pipe 224 is connected to a gas supply device (not shown) to deliver gas to the vent 223, and the vent 223 outputs a gas (such as dry air) for performing an electronic component pressure test operation. The crimping device 22 is provided with a plurality of abutting members 225 for crimping electronic components on the bottom surface of the body 222, so that the contacts of the electronic components are surely contacted by the receiving portion 214. The stress test operation is smoothly performed by the input member. Further, in order to make the crimper 22 shift upward in the Z direction, the abutting member 225 can be smoothly separated from the measured electronic component, and the crimper 22 is attached to the body 222. The bottom surface and the peripheral side of the abutting member 225 are equipped with at least one pushable electronic component detached from the top detaching member 226 of the abutting member 225, so as to prevent the abutting member 225 from being detached from the tested electronic component, so that the measured component is The electronic component is placed in the tester 21 to improve the smoothness of the work. The top release member 226 can be a spring or a rod having an elastic telescopic top block. In this embodiment, the top release member 226 is a rod member. And a top block 2261 which is elastically stretchable and displaceable at one end to push the measured electronic component out of the abutting member 225, and the crimper 22 further comprises at least one temperature control unit, the temperature control unit And providing at least one temperature control for the abutting component 225 to crimp the electronic component at a preset test temperature, the temperature control may be a cryogenic wafer or a heating component, or a fluid module, in this embodiment The temperature control unit is provided with a first temperature control and a plurality of second temperature controls The first temperature control is a cooling module 227 having a low temperature fluid, and the cooling module 227 can be integrally formed with the body 222 or each of the independent components. In this embodiment, the cooling is assembled above the body 222. The module 227 has an S-shaped flow channel 2271 inside the cooling module 227. One end of the flow channel 2271 is connected to a fluid input pipe 2272 capable of inputting a low temperature fluid, and the other end is connected to a fluid capable of outputting a low temperature fluid. The output tube 2273 is a refrigerant. When the refrigerant flows in the flow channel 2271, the bottom surface of the cooling module 227 forms a cooling surface, and the plurality of second temperature controls are heating elements 228. The heating element 228 The device can be independently mounted under the cooling module 227, or mounted inside the body 222, or assembled to the abutting member 225. In this embodiment, a plurality of heating members 228 are disposed inside the body 222, and a plurality of heating elements are provided. The device 228 controls the output power by at least one controller (not shown), and the temperature control unit is provided with a plurality of temperature sensing members 229 to sense the temperature of the temperature control or the abutment member 225, and The temperature sensitive data is transmitted to the controller. Embodiment, based on the internal body 222 provided with a plurality of temperature sensing member 229, respectively, to sense a plurality of sensing a temperature of 225 weeks abutting the side member, and the temperature sensing data transmitted to the controller, for use by the controller The output power of the plurality of heating elements 228 is instantaneously adjusted according to a plurality of different temperature sensing data, so that the plurality of abutting members 225 are crimped to the electronic components at the same or different preset test temperatures; the test ring cover 23 is assembled for testing. After the tester 21 and the crimper 22 are engaged, a closed test space is formed on the circumferential side of the receiving portion 214 of the tester 21, and the test space is provided for the vent of the crimper 22. The gas is extracted or input to enable the electronic component on the receiving portion 214 to perform a preset test operation in the test space. Further, the test ring cover 23 can be mounted on the test seat 213 of the tester 21 or the top surface of the substrate 211. In the embodiment, the test ring cover 23 is a snorkel ring and is mounted on the bottom surface of the body 222 of the crimper 22, and the ring is disposed on the plurality of dampers. The test ring cover 23 can be displaced in the Z direction with the crimper 22 and the test seat 213 of the tester 21 is applied to the periphery of the connecting member 225, the plurality of top releasing members 226 and the plurality of venting portions 223. a circumferential test side of the receiving portion 214 forms a closed test space, The test space and the plurality of vents 223 of the crimper 22 inject gas or extract gas to have a predetermined test pressure of positive or negative pressure, so that the electronic components in the receiving portion 214 perform the pressure test operation in the test space. Not only effectively reducing the test space, but also facilitating the space configuration of the machine, and reducing the cost of the test gas, thereby saving costs.

Referring to FIG. 5, the test apparatus 20 of the present invention can be applied to a preset test operation such as a stress test operation, a cold test operation or a thermal test operation of an electronic component. In the embodiment, the test device 20 is applied to the electronic component 31. In the pressure test operation, the electronic component 31 to be tested is placed in the tester 21 by a shifter (not shown) that is displaced in the first, second, and third directions (such as Z, X, and Y directions). The bearing portion 214 of the test socket 213 is placed in the contact portion of the electronic component 31 to be tested to electrically contact the transmission member in the receiving portion 214.

Referring to FIG. 6, after the electronic component 31 is mounted on the mounting portion 214 of the test socket 213, the crimping device 22 is configured to perform the pressure test operation on the electronic component 31 to be tested under an analog preset pressure environment. The moving arm 221 drives the body 222, the temperature control unit and the test ring cover 23 to be displaced downward in the Z direction, and The plurality of abutting members 225 and the plurality of top stripping members 226 are pressed against the plurality of electronic components 31 to be tested in the test socket 213, so that the joints of the plurality of electronic components 31 to be tested actually contact the transmitting member of the test socket 213, and the plurality of The top block 2261 of the top release member 226 is compressed and moved inwardly, and after the test ring cover 23 is engaged with the top surface of the test seat 213 of the tester 21, a closed test space is formed around the plurality of receiving portions 214 of the tester 21. 231, then the venting portion 223 of the crimper 22 can inject gas into the test space 231, and the test ring cover 23 can prevent the gas in the test space 231 from leaking, so that the test space 231 has a preset test pressure due to The test ring cover 23 is disposed between the tester 21 and the crimper 22, which not only effectively reduces the volume, but also reduces the test space 231, so that the venting portion 223 does not need to inject a large amount of gas into the test space 231, thereby saving the test gas cost. Further, the electronic component 31 to be tested in the plurality of receiving portions 214 of the tester 21 can perform a stress test operation in the test space 231 having a preset test pressure; however, when the electronic component 31 to be tested performs the stress test operation, The pressure The temperature control unit of the device 22 uses the fluid input pipe 2272 of the cooling module 227 to input the refrigerant into the flow channel 2271, and the refrigerant flows from the front end to the rear end of the flow channel 2271 to conduct the low temperature to each part of the body 222 due to the flow of the refrigerant. When the flow in the channel 2271 is gradually increased due to the exchange of heat and cold, the different portions of the cooling module 227 have different low temperatures, and the plurality of temperature sensing members 229 of the temperature control unit respectively sense the temperature of the peripheral side of the plurality of heating members 228, and The plurality of temperature sensing data are transmitted to the controller (not shown), and the controller individually controls the plurality of heating elements 228 to adjust the power of the compensation output according to the plurality of temperature sensing data, so that the plurality of abutting members 225 are pre- The test temperature is pressed against the electronic component 31 to be tested, so that the plurality of electronic components 31 to be tested are subjected to the cold test operation in the simulated low temperature test environment. Therefore, the test of the plurality of electronic components 31 on the tester 21 in the test ring cover 23 The pressure test operation and the cold test operation are performed in the space 231. The tester 21 transmits the test data to the controller (not shown) via the test socket 213 and the circuit board 212 for the controller to determine the electronic component. Quality of 31.

Please refer to Figure 7 for stress testing on electronic component 31. After the cold-test operation, the crimper 22 drives the body 222, the temperature control unit and the test ring cover 23 to move upward in the Z direction, and causes the venting portion 223 of the crimper 22 to stop outputting gas. The test ring cover 23 is separated from the top surface of the test seat 213 of the tester 21. The top block 2261 of the top release member 226 of the crimper 22 is outwardly displaced by the return elastic force, and pushes the measured electronic component 31 out. The component 225 is abutted to prevent the abutting component 225 from being detached from the tested electronic component 31, so that the measured electronic component 31 is actually placed on the receiving portion 214 of the test seat 213 for the feeder (not shown). Show) reclaiming.

Please refer to FIGS. 4 and 8 , which are schematic diagrams of the testing device 20 of the present invention applied to an electronic component testing and sorting device. The testing and sorting device is disposed on the machine 40 with a feeding device 50 , a receiving device 60 , a conveying device 70 , a central control device (not shown) and at least one test device 20 of the present invention, the supply device 50 is provided with at least one supply receptacle 51 for accommodating electronic components to be tested, and the receiving device 60 is provided At least one receiving device 61 for accommodating the tested electronic component, at least one testing device 20 of the present invention comprises a tester 21, a crimper 22 and a test ring cover 23 for performing a preset test operation on the electronic component. In an embodiment, a plurality of test devices 20 of the present invention are disposed on opposite sides of the machine table 40 to perform a test operation on the electronic components. The transport device 70 is provided with at least one shifter for The electronic component is transferred, and in the embodiment, the first feeder 71 of the conveying device 70 takes out the electronic component to be tested at the feeding device 51 of the feeding device 50, and transfers it to the first Transfer station 72 and second transfer stage 73, first transfer stage 72 and second transfer The stage 73 carries the electronic component to be tested to the refueling position for the second shifter 74 and the third shifter 75 to take the material, and the second shifter 74 and the third shifter 75 respectively The electronic component to be tested is transferred to the testing device 20 to perform a test operation, and the measured electronic components of the testing device 20 are transferred to the first transfer stage 72 and the second transfer stage 73, and the first shifter 71 is attached to the first A rotating stage 72 and a second rotating stage 73 take out the measured electronic components, and according to the test result, the measured electronic components are sent to the receiving device 60 for sorting and storage, and the central control device is used for control and integration. Each device is actuated to perform automated work, Achieve practical benefits of improving operational performance.

20‧‧‧Testing device

21‧‧‧Tester

211‧‧‧Substrate

212‧‧‧ boards

213‧‧‧ test seat

214‧‧‧Holding Department

22‧‧‧Crimper

221‧‧‧ moving arm

222‧‧‧ body

223‧‧‧ Ventilation Department

224‧‧‧ delivery tube

225‧‧‧Resist parts

226‧‧‧Top pieces

2261‧‧‧Top block

227‧‧‧Cooling module

2271‧‧‧ runner

2272‧‧‧ fluid input tube

2273‧‧‧ fluid output tube

228‧‧‧heating parts

229‧‧‧ Temperature sensing parts

23‧‧‧Test ring cover

Claims (10)

An electronic component testing device comprising: a tester for testing the electronic component and having at least one receiving portion for receiving the electronic component; the crimping device: having a body for displacement in at least one direction, and Providing at least one venting portion on the bottom surface of the body, and at least one abutting member for crimping the electronic component; the test ring cover being mounted on the tester or the crimping device for engaging the tester and After the crimper, a closed test space is formed on the circumferential side of the receiving portion, and the test space is used for the venting portion to extract or input gas, so that the electronic component performs a preset test operation in the test space. The electronic component testing device according to claim 1, wherein the testing device is provided with an electrically connected circuit board and a test socket, and the test socket is provided with at least one bearing for the electronic component. Set up. The electronic component testing device of claim 2, wherein the tester is provided with at least one substrate. The electronic component testing device according to claim 1, wherein the crimping device is provided with a moving arm that drives the body to be displaced in at least one direction. The electronic component testing device of claim 1, wherein the crimper is provided with at least one top release member on a bottom surface of the body. The electronic component testing device according to claim 1, wherein the crimping device is a pressure transfer device for transferring and pressing the electronic component, or a pressing device for simply pressing the electronic component. The electronic component testing device according to claim 1, wherein the crimping device is provided with at least one temperature control unit, and the temperature control unit is provided with at least one temperature control. The electronic component testing device of claim 1, wherein the test ring cover is mounted on a bottom surface of the body of the crimper. The electronic component testing device according to claim 1, wherein the test ring cover is a deflation ring. A test classification device for applying an electronic component testing device, comprising: a machine table; a feeding device: is mounted on the machine table, and is provided with at least one feeding device for accommodating electronic components to be tested; and a receiving device: assembling And at least one receiving device for accommodating the tested electronic components; at least one electronic component testing device according to claim 1 is assembled on the machine and includes the test , the crimper and the test ring cover to perform a preset test operation on the electronic component; the transport device is mounted on the machine, and is provided with at least one shifter for transferring the electronic component; Central Control Unit: Used to control and integrate the operation of each unit to perform automated operations.