TWI834475B - Pressing mechanism, testing device, and processing machine - Google Patents

Abstract

The pressing mechanism includes a supporter, a pick-up unit, a pressing member, and a temperature control unit. The pick-up unit is disposed on the supporter and is adapted for picking up the electronic component by its pick-up member. The pressing member is disposed on the supporter and is adapted for pressing the electronic component by its pressing portion. The pressing member has a through hole for receiving the pick-up member, and a gas channel is formed between the through hole and the pick-up member. The gas channel is adapted for the gas at a predetermined temperature to flow through, and the gas is used to exchange the heat with the pick-up member so as to control the temperature of the pick-up member. The pick-up member presses the electronic component to test the electronic component at the predetermined temperature.

Description

Crimping mechanism, testing device and operating machine

The invention provides a crimping mechanism that facilitates temperature control of electronic components and saves energy costs.

Electronic components will be used in high-temperature or low-temperature environments in the future. Before leaving the factory, it is necessary to perform hot testing or cold testing on the electronic components using the testing device of the operating machine to eliminate defective products. Taking the cold test operation as an example, the test device includes a tester and a crimping mechanism. The tester is used to hold and test electronic components. The crimping mechanism is located above the tester and is equipped with a crimping tool to crimp electronic components. The air extraction hole of the connector is used for adsorbing and transferring electronic components. There is also a refrigerant seat above the crimping tool. Both ends of the refrigerant seat are connected to the refrigerant supply equipment with refrigerant delivery pipes, so that the refrigerant supply equipment can input refrigerant to the refrigerant seat. Using a temperature-controlled crimping tool, the crimping tool conducts low temperature to the electronic components, allowing the electronic components to perform cold testing operations in a low-temperature environment after simulating the future. The refrigerant seat then outputs the refrigerant to the refrigerant supply equipment.

Although this method can control the temperature of the crimping tool, using refrigerant as the energy source for temperature control not only increases the cost of temperature control energy, but the refrigerant supply equipment is large and must be configured independently. It also requires multiple transfer pipes and longer sizes. Refrigerant delivery pipes, etc., are required to transport the refrigerant to the refrigerant seat, which takes up considerable space and increases the inconvenience of the installation operation.

In addition, the refrigerant delivery pipe of the refrigerant supply equipment has a certain degree of rigidity for transporting refrigerant, so it is not easy to bend in a small arc. As a result, the crimping mechanism must reserve a large space around the crimping tool. The refrigerant delivery pipe can be installed to facilitate the space arrangement of the crimping mechanism.

Since the testing device of the working machine uses refrigerant as the temperature control energy, when the staff wants to move the working machine to different working places, they need to disassemble, transport and reassemble the working machine and the refrigerant supply equipment separately, causing transportation problems. The work is complicated.

One object of the present invention is to provide a crimping mechanism, which includes a mounter, a pick-up unit, a crimping tool and a temperature control unit. The pick-up unit is assembled on the mounter and is provided with a picker with a pick-up component. The electronic components are placed. The crimping tool is assembled on the mounter and is provided with a crimping part for crimping the electronic components. The temperature control unit is provided with a through hole in the crimping tool for placing the pick-up component, and in the through hole A gas flow channel is formed between the pick-up part and the gas flow channel for flowing gas with a preset temperature to allow heat exchange between the gas and the pick-up part. The temperature-controlled pick-up part is attached to the electronic component on the pick-up part, so that the electronic component can be Performing test operations in a simulated future application temperature environment not only effectively saves temperature control energy costs, but also ensures temperature control efficiency.

The second object of the present invention is to provide a crimping mechanism, the temperature control unit of which has at least one vent hole in the extension block of the crimping tool. The vent hole is used for the gas in the gas flow channel to flow out to the test space where the electronic components are located. It can not only increase the number of The heat exchange area between gas and electronic components keeps the test space where the electronic components are located at the preset test temperature, thereby improving the efficiency of temperature control.

The third object of the present invention is to provide a crimping mechanism. The pickup part of the pickup has a tube part. The tube part is provided with a receiving space for assembling a suction nozzle that can be displaced in at least one direction. The suction nozzle can pick up electronic components. The temperature control unit has a perforation in the tube part of the pickup component. The perforation communicates with the gas flow channel and the accommodation space, so that the gas in the gas flow channel flows into the accommodation space of the pickup component through the perforation. When the suction nozzle is separated from the electronic component, it can be The gas in the accommodation space of the pickup component contacts the top surface of the electronic component to increase the heat exchange area, thereby improving the temperature control efficiency.

The fourth object of the present invention is to provide a crimping mechanism, the pickup unit of which is provided with a connector for accommodating the pickup, and an intermediary member with a plurality of holes is provided between the connector and the pickup, and the plurality of holes are connected to each other. A plurality of turbulent flow paths are formed for gas to pass through, so that the gas flows along the plurality of turbulent flow paths to increase the temperature conductivity of the joint parts with the pickup, thereby improving the temperature control efficiency.

The fifth object of the present invention is to provide a crimping mechanism in which the pickup unit is provided with a plurality of fins on the outer ring surface of the pickup part of the pickup. The plurality of fins are located in the gas flow channel to increase the heat between the gas and the pickup part. exchange area, thereby improving temperature conduction efficiency.

The sixth object of the present invention is to provide a testing device, which includes a testing mechanism and a crimping mechanism of the present invention. The testing mechanism is provided with at least one tester for testing electronic components; the crimping mechanism of the present invention is located above the testing mechanism and includes a mounting The tester, pick-up unit, crimping tool and temperature control unit are used to pick up, place and crimp the electronic components of the tester, and can temperature-control the electronic components to perform testing operations.

The seventh object of the present invention is to provide a testing device. The testing mechanism is provided with a base plate. The base plate is provided with at least one receiving portion for assembling the tester. The temperature control unit of the crimping mechanism is provided with a second air supply channel on the base plate. The gas is supplied into the supporting part to temperature-control the electronic components and maintain the preset test temperature in the test space where the electronic components are located, thus improving the temperature control efficiency.

The eighth object of the present invention is to provide a working machine, which includes a machine platform, a feeding device, a receiving device, a testing device, a conveying device and a central control device. The feeding device is arranged on the machine platform and is provided with at least one feeder. To accommodate at least one electronic component to be tested; the receiving device is arranged on the machine and is provided with at least one receiving device for accommodating at least one electronic component to be tested; the testing device is arranged on the machine and includes a testing mechanism and In the crimping mechanism of the present invention, the testing mechanism is provided with at least one tester for testing electronic components. The crimping mechanism is located above the testing mechanism and includes a mounter, a picking unit, a crimping tool and a temperature control unit for picking and placing. and electronic components of the crimp tester, and can perform testing operations on temperature-controlled electronic components; conveyor equipment It is placed on the machine platform and is provided with at least one conveyor for conveying electronic components; the central control device controls and integrates the actions of each device to perform automated operations.

10:Test device

11:Transfer arm

12: Pickup

121:Joining parts

122: Pick up parts

1221:Fins

123:Management Department

1231:Perforation

124: Accommodation space

125:Suction nozzle

126:Pumping channel

13: Connector

131:First connector

132:Second connector

133: Loading space

14:Crimping tool

141:Plate body

142:Extension block

1421:Vent hole

143: Crimping part

144:Through hole

1441: Large diameter section

145:Gas flow channel

146:First air supply channel

1461: First air supply section

1462: Second air supply section

1463: The third air supply section

151:Circuit board

152:Test seat

153:Substrate

1531:Acquisition Department

1532: Second air supply channel

16:Exhaust channel

17: Intermediaryware

21:Electronic components

30:Machine

40: Feeding device

50:Receiving device

60:Conveyor device

61: First conveyor

62: Second conveyor

63:Third conveyor

64:Fourth conveyor

Figure 1: Schematic diagram of the first embodiment of the crimping mechanism of the present invention.

Figure 2: Schematic diagram of the crimping mechanism of the present invention applied to a testing device.

Figure 3: Schematic diagram of the use of the crimping mechanism of the present invention.

Figure 4: This is a partially enlarged schematic diagram of Figure 3.

Figure 5: Schematic diagram of the second embodiment of the crimping mechanism of the present invention.

Figure 6: Schematic diagram of the third embodiment of the crimping mechanism of the present invention.

Figure 7: Schematic diagram of the fourth embodiment of the crimping mechanism of the present invention.

Figure 8: Schematic diagram of the fifth embodiment of the crimping mechanism of the present invention.

Figure 9: Schematic diagram of the sixth embodiment of the crimping mechanism of the present invention.

Figure 10: Schematic diagram of the testing device of the present invention applied to a work machine.

In order for the review committee to have a further understanding of the present invention, a preferred embodiment is cited and accompanied by drawings, which are described in detail below: Please refer to Figure 1. The first embodiment of the crimping mechanism of the present invention includes a mounter, Pick-up unit, crimping tool and temperature control unit.

The mounter is used to directly or indirectly assemble the pick-up unit, or assemble the pick-up unit and the crimping tool; depending on the operation requirements, the mounter can be fixed or movable, for example, the mounter can be a fixed rack, such as The mounter can be a movable transfer arm; in this embodiment, the mounter can be moved in at least one direction. The transfer arm 11 can be driven by a transfer driving source (not shown) to move in the Y-Z direction to drive the pickup unit, the crimping tool and the temperature control unit to move synchronously.

The pickup unit is assembled on the mounter and is provided with at least one pickup. The pickup is provided with at least one pickup component for picking up electronic components. Furthermore, a suction nozzle can be formed at one end of the pickup component to pick and place electronic components, or a suction nozzle can be installed inside the pickup component to use the suction nozzle to pick up and place electronic components. Depending on the operation requirements, the picker can be directly assembled to the mounter, or a connector can be configured between the picker and the mounter so that the picker can be indirectly mounted to the mounter.

In this embodiment, the pickup unit includes a pickup 12 and a connector 13 .

The pickup 12 is made of copper and is provided with a joint component 121 and a pickup component 122. The joint component 121 is a horizontally arranged panel, and a pickup component 122 extends in the Z direction on the bottom surface. One end of the pickup component 122 has a tube. The bottom surface of the tube part 123 is recessed toward the top surface with a receiving space 124 for assembling the suction nozzle 125; and the pickup 12 is provided with an air extraction channel 126 between the joint component 121, the pickup component 122 and the connector 13. One end of the air extraction channel 126 is connected to an air extraction device (not shown) through the connector 13 , and the other end is connected to the suction nozzle 125 of the pickup 12 for the suction nozzle 125 to pick up and place electronic components.

Depending on the operation requirements, the pickup 12 may also be provided with an air extraction channel between the joint component 121 and the pickup component 122. One end of the air extraction channel is connected to the air extraction equipment from the joint component 121, and the other end is connected to the suction nozzle 125, so that the suction nozzle 125 can take out the air. The discharge electronic components are not limited to this embodiment.

The connector 13 is used for connecting and assembling the mounter and the picker 12 . In this embodiment, the connector 13 includes a first connector 131 and a second connector 132. The top of the first connector 131 is connected to the assembly transfer arm 11, and can be driven by the transfer arm 11 to move in the Y-Z direction. The first connection A receiving space 133 is recessed from the bottom of the member 131 toward the top. The top of the second connecting member 132 is assembled on the inner top surface of the receiving space 133 of the first connecting member 131 , and the bottom is used for assembling the joint component 121 of the pickup 12 , so that the pickup 12 is located at the first connecting piece 131 The loading space 133 can be synchronously displaced in the Y-Z direction along with the connector 13 . According to operational requirements, the receiving space 133 of the connector 13 can further accommodate the crimping tool 14 .

Depending on the operation requirements, the first connecting piece 131 and the second connecting piece 132 of the connecting tool 13 can also be integrally formed, or the connecting tool 13 is only equipped with the first connecting piece 131 and the first connecting piece 131 is used for assembling the picker 12 . In addition, the first connecting member 131 may not have a receiving space, and the pickup 12 may be directly assembled at the bottom. The second connector 132 can also be used to assemble the pickup 12 and the crimping tool 14, and is not limited to this embodiment.

The crimping tool 14 is assembled on the mounter and is provided with at least one crimping portion for crimping electronic components. Depending on the operation requirements, the crimping tool 14 can be directly assembled with the mounter; it can also be assembled with the picker 12 or the connector 13 and indirectly mounted with the mounter. In this embodiment, the crimping tool 14 is made of plastic material and is provided with a horizontally arranged plate body 141. The top surface of the plate body 141 is assembled to the joint component 121 of the pickup 12, and the bottom surface is provided with an extension in the Z direction. Block 142, the bottom surface of the extension block 142 is provided with a crimping portion 143 at a position corresponding to the pin of the electronic component (not shown), and the crimping portion 143 is used for crimping the pin of the electronic component.

The temperature control unit is provided with a through hole in the crimping tool 14 for placing the pickup component 122 of the pickup 12, and a gas flow channel is formed between the through hole and the pickup component 122, and the gas flow channel allows the flow of gas with a preset temperature. The gas is used to temperature-control the pickup part 122, and the pickup part 122 keeps the electronic components at a preset operating temperature. Furthermore, the temperature control unit is provided with a first air supply channel in the pickup unit, and the first air supply channel can transport gas to the gas flow channel.

In this embodiment, the temperature control unit is provided with a through hole 144 on the crimping tool 14 that passes through the plate body 141 and the extension block 142. The through hole 144 is provided with a large diameter section 1441 at one end close to the top surface of the plate body 141. The through hole 144 is The pickup component 122 of the pickup 12 is accommodated, and a gas flow channel 145 is formed between the through hole 144 and the pickup component 122. The gas flow channel 145 is used for flowing gas with a preset temperature (such as low-temperature gas or high-temperature gas). The temperature control unit is provided with a first air supply channel 146. The first air supply channel 146 is connected to the joint component 121 and the connector 13 of the pickup 12. The first connecting piece 131 and the second connecting piece 132 are respectively provided with a first air supply section 1461, a second air supply section 1462 and a third air supply section 1463. One end of the first air supply section 1461 is connected to the gas flow channel. 145. One end of the second gas supply section 1462 is connected to a gas equipment. The gas equipment outputs gas with a preset temperature. The gas passes through the first gas supply section 1461, the second gas supply section 1462 and the third gas supply section of the first gas supply channel 146. The gas section 1463 flows into the gas flow channel 145 to control the temperature of the gas pickup component 122 with a preset temperature. The gas flow channel 145 then discharges the gas from the bottom end of the through hole 144 so that the discharged gas can temperature control electronic components.

Therefore, the temperature control unit of the crimping mechanism uses gas with a preset temperature as the temperature control energy, which not only effectively saves costs, but also makes the gas equipment small in size and can be conveniently installed on the operating machine and shortens the length of the gas supply pipe. It is also beneficial to the space configuration of the site, as well as the transportation of operating machines and gas equipment, thereby improving the convenience of configuration operations.

The first air supply channel 146 of the temperature control unit is connected to the gas supply conveying pipe. The air supply conveying pipe does not need to remain rigid and can be bent into a smaller arc to facilitate reducing the space occupied by the pickup 12, thereby facilitating Spatial configuration of the crimping mechanism.

Depending on the operation requirements, the temperature control unit can be provided with an exhaust channel on the crimping tool 14. One end of the exhaust channel is connected to the gas flow channel 145, and the other end is connected to external or gas equipment.

Depending on the operation requirements, the crimping mechanism can be equipped with at least one heating element (not shown) on the pickup 12, the connecting tool 13 or the crimping tool 14 to coordinately adjust the preset temperature of the gas. In addition, at least one sensor (not shown) can be configured on the pickup 12 or the crimping tool 14 to sense temperature.

Please refer to Figures 2 to 4. The crimping mechanism of the present invention is applied to the test device 10. The test device 10 includes a testing mechanism and a crimping mechanism. The testing mechanism is equipped with at least one tester for testing electronic components. In this embodiment, the test The device is provided with an electrically connected circuit board 151 and a test socket 152. The test socket 152 is used to hold and test electronic components. The test mechanism is also provided with a substrate 153. The substrate 153 is provided with at least one receiving portion 1531. , for assembling the test socket 152 of the tester. The crimping mechanism of the present invention is arranged above the testing mechanism, and uses the suction channel 126 of the pickup 12 to suck and pick up an electronic component 21 with pins through the suction nozzle 125. The top surface of the electronic component 21 is attached to the pickup 12 The tube part 123 of the pickup component 122 is located between the two crimping parts 143 of the crimping tool 14, and the pins are extended below the crimping parts 143 to electrically connect the contacts of the test socket 152; in the pickup After the suction nozzle 125 picks up the electronic component 21 , the transfer arm 11 of the crimping mechanism drives the pickup 12 and the connector 13 to move above the test seat 152 .

The transfer arm 11 drives the connector 13, the pickup 12, the crimping tool 14 and the electronic component 21 to simultaneously move downward in the Z direction, causing the pickup 12 to move the electronic component 21 into the test seat 152. The pins of the electronic component 21 are electrically Connect the contacts of the test socket 152, the first connector 131 of the connector 13 is placed on the top surface of the base plate 153, and the receiving space 133 of the first connector 131, the receiving portion 1531 of the base plate 153 and the test socket 152 are connected. A test space is formed between them to avoid random dispersion of gas, so that the electronic component 21 can perform testing operations in the test space with gas at a preset temperature. There is an appropriate gap between the bottom surface of the first connecting member 131 and the top surface of the base plate 153 to form an exhaust channel 16 for exhausting gas.

Depending on the operation requirements, if the test mechanism is not equipped with the substrate 153, the connector 13 of the crimping mechanism can also have an appropriate gap with the test seat 152 to form an exhaust channel 16 for exhausting gas, which is not limited to this embodiment.

During the cold test operation, the first air supply channel 146 of the crimping mechanism receives the low-temperature gas input from the gas equipment. The low-temperature gas flows into the pickup 12 through the first flow channel section 1461, the second flow channel section 1462, and the third flow channel section 1463. The gas flow channel 145 between the pick-up part 122 and the extension block 142 of the crimping tool 14, that is, the low-temperature gas flows in from the inlet end of one end of the gas flow channel 145, so that the low-temperature gas directly exchanges heat with the pick-up part 122, thereby increasing the temperature. conductivity to facilitate rapid temperature control of the pick-up component 122 to a preset low temperature state. Since the tube portion 123 of the pick-up component 122 is in contact with the top surface of the electronic component 21, the low temperature can be conducted to the electronic component 21, making the electronic component Part 21 performs cold testing operations in a simulated low-temperature environment in the future. In addition, the electronic component 21 is located at the end of the through hole 144 of the crimping tool 14, that is, at the outlet end of the other end of the gas flow channel 145. The low-temperature gas flowing out of the gas flow channel 145 will flow through the electronic component 21 for heat exchange. To assist in lowering the temperature of the electronic component 21, the low-temperature gas then flows to a test space composed of the test seat 152, the receiving portion 1531 of the substrate 153, and the receiving space 133 of the first connector 131 to avoid any rapid dispersion of the gas. By providing the test space with low-temperature gas, the electronic component 21 can be placed in the test space with low-temperature gas to perform cold testing operations; then, the low-temperature gas in the test space is discharged from the exhaust channel 16 between the first connector 131 and the substrate 153 .

Please refer to Figure 5. The design of the second embodiment of the crimping mechanism of the present invention is basically the same as that of the first embodiment. The difference is that the extension block 142 of the crimping tool 14 is provided with at least one vent hole 1421, and the vent hole 1421 is used for the gas flow channel 145. The gas flows out separately to the space where the electronic component 21 is located (such as the test space) to increase the heat exchange area between the gas and the electronic component 21 and to maintain the preset test temperature in the space where the electronic component 21 is located more quickly.

Please refer to Figure 6. The design of the third embodiment of the crimping mechanism of the present invention is basically the same as that of the first embodiment. The difference is that the temperature control unit opens at least one through hole 1231 in the tube portion 123 of the pickup component 122. The through hole 1231 communicates with the gas flow channel. 145 and accommodation space 124. Furthermore, the suction nozzle 125 can be driven by a suction nozzle driver (not shown) to displace in at least one direction (eg, Z direction). Therefore, the low-temperature gas in the gas flow channel 145 of the temperature control unit can flow into the accommodating space 124 through the perforation 1231 of the pickup component 122, so that the accommodating space 124 has low-temperature gas, and the low-temperature gas in the accommodating space 124 can be used with the electronic components 21 The top surface performs heat exchange to increase the temperature conductivity, thereby improving the temperature control efficiency. Furthermore, when the temperature control unit uses the nozzle driver to drive the suction nozzle 125 to move upward in the Z direction and away from the top surface of the electronic component 21 , the low-temperature gas in the accommodation space 124 of the pickup component 122 directly contacts the top of the electronic component 21 surface, which can further increase the heat exchange area, thereby further improving the temperature control efficiency.

Please refer to Figure 7. The design of the fourth embodiment of the crimping mechanism of the present invention is basically the same as that of the first embodiment. The difference is that the pickup unit is provided with at least one fin 1221 on the outer ring surface of the pickup component 122 of the pickup 12; In this embodiment, the pickup 12 is provided with a plurality of fins 1221 on the outer annular surface of the pickup component 122 and at positions corresponding to the large-diameter section 1441 of the through hole 144 to increase the flow of gas between the pickup component 122 and the gas flow channel 145 . heat exchange area.

Please refer to Figure 8. The design of the fifth embodiment of the crimping mechanism of the present invention is basically the same as that of the first embodiment. The difference is that the temperature control unit is equipped with at least one intermediary member 17 between the connector 13 and the pickup 12. The intermediary member 17 A plurality of holes that communicate with each other are opened, and a spoiler path is formed between the plurality of holes, and the plurality of holes communicate with the first air supply channel 146 . In this embodiment, the temperature control unit can be provided with an intermediary member 17 between the first connecting member 131 of the connector 13 and the joint component 121 of the pickup 12. The intermediary member 17 is made of foam metal and has a plurality of holes that communicate with each other. A spoiler path is formed between the plurality of holes. The gas in the second flow channel section 1462 of the first air supply channel 146 can flow into the interconnected holes of the intermediary member 17 and flow into the first flow channel section 1461 of the pickup 12 along the spoiler path. , and then flows into the gas flow channel 145 from the first flow channel section 1461. Since the gas flows in the turbulent flow path of the intermediary member 17, the heat exchange area between the gas and the joint component 121 of the pickup 12 can be increased, thereby further improving the temperature control pickup. 12 usage efficiency.

Please refer to Figure 9. The design of the sixth embodiment of the crimping mechanism of the present invention is basically the same as that of the first embodiment. The difference is that the temperature control unit of the crimping mechanism is provided with a second air supply channel 1532 on the substrate 153 of the testing mechanism. The gas flows into the inside of the receiving part 1531 and the test seat 152, and can directly temperature control the electronic component 21, thereby improving the temperature control efficiency.

Please refer to Figures 1 to 4 and 10. The crimping mechanism of the present invention is applied to an electronic component working machine. The working machine includes a machine table 30, a feeding device 40, a receiving device 50, a testing device 10, a conveying device 60 and a central control device. (not shown in the figure); the feeding device 40 is assembled on the machine 30 and is provided with at least one feeder to accommodate At least one electronic component to be tested; the receiving device 50 is assembled on the machine 30 and is provided with at least one receiving device to accommodate at least one electronic component that has been tested; the testing device 10 is configured on the machine 30 and includes a testing mechanism and In the crimping mechanism of the present invention, the testing mechanism is provided with at least one tester for testing electronic components. The crimping mechanism is used for picking up, placing and crimping the electronic components of the tester, and can temperature-control the electronic components to perform testing operations; in this invention In the embodiment, the tester is provided with an electrically connected circuit board 151 and a test socket 152 with transmission parts (such as probes). The test socket 152 is used to hold and test electronic components. In addition, a substrate 153 is provided on the machine 30. For assembling the test seat 152; the conveying device 60 is assembled on the machine 30 and is provided with at least one conveyor for conveying electronic components; in this embodiment, the conveying device 60 is provided with a first conveyor 61 for feeding the feeding device The feeder 40 takes out the electronic components to be tested and transfers the electronic components to be tested to the second conveyor 62. The second conveyor 62 carries the electronic components to be tested to the side of the testing device 10. The crimping mechanism uses the transfer arm 11 to transfer the connector 13, the picker 12 and the crimping tool 14 to above the second conveyor 62, and uses the picker 12 to transfer the electronic components to be tested on the second conveyor 62. Go to the test seat 152 to perform the test operation, and transfer the tested electronic components to the third conveyor 63 for loading. The fourth conveyor 64 takes out the tested electronic components from the third conveyor 63 and transports them to the receiving device. 50 pieces of materials are sorted and stored at the receiving device; the central control device (not shown) is used to control and integrate the actions of each device to perform automated operations and achieve practical benefits of improving operating efficiency.

12: Pickup

122: Pick up parts

123:Management Department

125:Suction nozzle

131:First connector

133: Loading space

14:Crimping tool

142:Extension block

145:Gas flow channel

1461: First air supply section

1463: The third air supply section

152:Test seat

153:Substrate

1531:Acquisition Department

16:Exhaust channel

21:Electronic components

Claims (15)

A crimping mechanism, including: a mounter; a pick-up unit: assembled on the mounter and provided with at least one pick-up, the pick-up is provided with at least one pick-up component for picking up electronic components; a crimping tool: assembly The holder is provided with at least one crimping portion for crimping the electronic component; the temperature control unit is provided with a through hole on the crimping tool for inserting the pickup component of the pickup, and A gas flow channel is formed between the through hole and the pick-up component, and the gas flow channel is used to flow gas with a preset temperature to temperature-control the pick-up component. The pick-up component can maintain the preset operating temperature of the electronic component. As for the crimping mechanism described in claim 1, the temperature control unit has at least one vent hole in the extension block of the crimping tool, and the vent hole is used to allow the gas in the gas flow channel to flow out to the space where the electronic component is located. . As for the crimping mechanism according to claim 1, the pickup part of the pickup is provided with a tube part, and the tube part is provided with a receiving space for assembling a suction nozzle, and the suction nozzle is connected to the air extraction channel to be able to pick up the electronics. element. As for the crimping mechanism described in claim 3, the temperature control unit has at least one perforation in the tube part of the pickup component, and the perforation communicates with the gas flow channel and the accommodation space. As for the crimping mechanism described in claim 4, the suction nozzle can be displaced in at least one direction. According to the crimping mechanism of claim 1, the pickup unit further includes a connector for connecting the mounter and the pickup. The crimping mechanism according to claim 6, wherein there is between the connector and the pickup There is an intermediary member, and the intermediary member is provided with a plurality of holes that communicate with each other, and a turbulent flow path is formed between the plurality of holes for the circulation of the gas. The crimping mechanism according to any one of claims 1 to 7, wherein the temperature control unit is provided with a first air supply channel in the pickup unit, and the first air supply channel can deliver the gas to the gas flow channel. The crimping mechanism according to any one of claims 1 to 7, wherein the pickup unit is provided with at least one fin on the outer annular surface of the pickup component. For the crimping mechanism according to any one of claims 1 to 7, the mounter can be displaced in at least one direction. A testing device, including: a testing mechanism: equipped with at least one tester for testing electronic components; at least one crimping mechanism as described in claim 1: for picking up, placing and crimping the electronic components of the tester, And can temperature control the electronic component. The test device of claim 11, wherein the test mechanism is provided with a base plate, and the base plate is provided with at least one receiving portion for assembling the tester. As for the test device described in claim 12, the temperature control unit of the crimping mechanism is provided with a second air supply channel on the substrate to allow gas to flow into the receiving portion and temperature control the electronic component. As claimed in claim 12 or 13, the pickup unit of the crimping mechanism further includes a connector for connecting the assembly mounter and the pickup, and an exhaust gas is formed between the connector and the substrate. channel for exhausting gas. An operating machine, including: a machine platform; a feeding device: configured on the machine platform and provided with at least one feeder for accommodating at least one electronic component to be tested; Receiving device: disposed on the machine, and provided with at least one receiving device for accommodating at least one tested electronic component; at least one testing device as described in claim 11: disposed on the machine; conveying device : Configured on the machine and equipped with at least one conveyor for conveying electronic components; central control device: to control and integrate the actions of each device to perform automated operations.

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