TWI769664B - Testing apparatus and testing equipment using the same - Google Patents

Abstract

The present invention reveals a testing apparatus, including a testing mechanism, a transporting mechanism, and a pressing mechanism. The testing mechanism has a socket for testing an electronic component being placed therein. The transporting mechanism has a transporter for transporting the electronic component. The pressing mechanism has a presser which is capable of moving along a second axis. The presser is aiming toward the socket. The transporter is adapted for carrying and moving the electronic component to a position between the presser and the socket. The presser then picks the electronic component and presses the electronic component on the socket after the transporter leaves. With the electronic component portaging of the transporter, the presser is then constructed within single axis motion. Location and alignment of the electronic component can precisely performed.

Description

Test equipment and test equipment for its application

The invention provides a testing device for improving the feeding accuracy of the pressure shifter for moving electronic components into the tester.

Nowadays, electronic components are becoming more and more tiny and precise. If there is a contact error between the contacts of the electronic components and the probes of the test device, the test quality will be affected. At present, the test device is equipped with a test seat on the machine table for holding and testing electronic components. A carrier transports the electronic components to be tested to the side of the test seat, a first driver of a pressing and moving mechanism drives the displacement device to move the X-axis to the top of the platform, and the second driver drives the displacement device to be the Z-axis Take out the electronic component to be tested on the moving stage, the first driver then drives the pressure shifter to move in the reverse direction of the X axis, and transfers the electronic component to be tested to the top of the test seat, and the second driver drives the pressure shifter to do Z The axial displacement moves the electronic component to be tested into the test seat to perform the test operation; however, the pressure-shift mechanism uses the first driver and the second driver to drive the pressure-shifter to perform two axial displacements. The connection and assembly error of the driver affects the feeding accuracy of moving the electronic components into the test seat ; Therefore, how to improve the feeding accuracy of the pressure shifter is very important.

The first objective of the present invention is to provide a testing device, which includes a testing mechanism, a conveying mechanism and a pressing and moving mechanism. The testing mechanism is provided with a tester in the work area for testing electronic components, and the conveying mechanism is provided with a conveyor for conveying electronic components. , The pressure-shift mechanism is provided with a pressure-shifter for the second axial displacement in the working area. The pressure-shifter is opposite to the tester. The conveyor is used to transport electronic components between the pressure-shifter and the tester. The pressure-shifter is located in the working area. Perform a single second axial displacement on the conveyor to take out the electronic components to be tested, and after the conveyor leaves, the pressure shifter makes a second axial displacement to accurately move the electronic components to be tested into the test seat to perform the test operation, thereby pressing the shifter A single axial displacement is performed in the working area to reduce the timing and transfer errors of other axial movements, thereby improving the feeding accuracy and test quality of the pressure shifter.

The second objective of the present invention is to provide a testing device, further comprising an image capturing mechanism, the image capturing mechanism is provided with at least one imager, and the imager is displaced between the pressure shifter and the tester to capture the image of the tester and the pressure shifter. The electronic components transferred by the device are transferred, and the image data is transmitted to the processor, so that the position of the electronic components can be fine-tuned by the pressure shifter, so that the contacts of the electronic components can be more accurately aligned with the probes of the test seat, thereby improving the testing of electronic components. quality.

The third object of the present invention is to provide a testing device, further comprising a first pick-up mechanism, the first pick-up mechanism is provided with a first pick-up tool for picking and placing the electronic components to be tested and the electronic components that have been tested on the conveyor in the first refueling area , thereby improving the efficiency of picking and unloading operations.

The fourth object of the present invention is to provide a testing device further comprising a first pick-up mechanism, a second pick-up mechanism, and a conveying mechanism having a first conveyor and a second conveyor, the first conveyor of the conveying mechanism is along the first axial direction It is moved to the first material changing area or working area for the first pick-up mechanism or pressure shifter to pick and place the electronic components to be tested and the electronic components that have been tested. The second conveyor of the conveying mechanism is displaced along the first axis to the second changing The material area or working area is used for the second pick-up mechanism or pressure shifter to pick and place the electronic components to be tested and the tested electronic components, so that the first pick-up mechanism and the second pick-up mechanism are matched with the first conveyor and the second conveyor of the conveying mechanism. to improve test throughput.

The fifth object of the present invention is to provide a test device, further comprising a temperature control mechanism. The temperature control mechanism is provided with a test space inside the frame of the pressure-shift mechanism, and dry air is input into the test space to prevent dew condensation. The pressure-moving mechanism or the testing mechanism is provided with a temperature control, so that the electronic components can perform the test operation under the simulated environment temperature in the future, thereby improving the test quality.

The sixth object of the present invention is to provide a testing equipment, including a machine, a feeding device, a receiving device, the testing device of the present invention and a central control device, the feeding device is arranged on the machine, and is provided with at least one feeding container , for accommodating at least one electronic component to be tested; the receiving device is arranged on the machine, and there is at least one receiving container for accommodating at least one electronic component that has been tested; the testing device of the present invention is arranged on the machine , and has a testing mechanism, a conveying mechanism and a pressing and moving mechanism for conveying and testing electronic components; the central control device controls and integrates the actions of each device to perform automated operations.

In order to make your examiners further understand the present invention, hereby give a preferred embodiment and cooperate with the drawings, the details are as follows:

1, 2, and 3, the testing equipment of the present invention includes a machine 10, a feeding device 20, a receiving device 30, a testing device 40 according to the first embodiment of the present invention, and a central control device (not shown).

The feeding device 20 is disposed on the machine 10 and is provided with at least one feeding container 21 for accommodating at least one electronic component to be tested. In this embodiment, the feeding device 20 faces from the front section of the machine 10 The rear section conveys a plurality of feeding containers 21 for the electronic components to be tested; the receiving device 30 is arranged on the machine table 10 and is provided with at least one feeding container 31 for accommodating at least one electronic component to be tested , in this embodiment, the receiving device 30 conveys the receiving container 31 with a plurality of tested electronic components from the rear section of the machine 10 to the front section; the central control device controls and integrates the actions of each device to perform automated operations .

The testing device 40 according to the first embodiment of the present invention is disposed on the machine 10 and includes a testing mechanism, a conveying mechanism and a pressing and moving mechanism for conveying and testing electronic components.

The testing institution is provided with at least one tester in the work area A for testing electronic components; the tester has a circuit board 411 and a test seat 412 that are electrically connected, and the circuit board 411 itself may have a test program, or be electrically connected to a tester ; In this embodiment, the circuit board 411 is electrically connected to a tester 413, and the test seat 412 has a plurality of probes, and is used to hold and test electronic components.

The conveying mechanism is provided with at least one conveyor, and the conveyor is displaced in the first refueling area B1 and the working area A for conveying electronic components; further, the conveyor can be a turntable or a stage, and performs a rotary motion or a linear motion to For conveying electronic components, the conveyor can be provided with at least one positioning component for positioning the electronic components, and the positioning component can be a groove, a suction hole or a clamp, etc., which is not limited to this embodiment; for example, the conveyor can be a turntable, and the turntable has a plurality of Each slot is used to hold electronic components, and the turntable rotates to transport the electronic components to be tested from the first changing area B1 to the working area A, and the electronic components that have been tested are transported from the working area A to the first changing area B1 ; In this embodiment, the conveying mechanism drives a conveyer for the first carrier 422 to make the first axial X-linear displacement with the delivery drive source 421, and the first carrier 422 is provided with a plurality of grooves for supporting electronic components , and transport the electronic components to be tested from the first refueling area B1 to the working area A, which is located above the test seat 412 , and transport the electronic components under test from the working area A to the first changing area B1 .

The pressure-shift mechanism is provided with at least one pressure-shifter in the operation area A. The pressure-shifter is relative to the tester, and the pressure-shifter performs a second axial Z displacement, so as to pick and place the electronic components on the conveyor, and pick and place the tester and the tester. crimping electronic components; in this embodiment, a frame 431 is set on the machine table 10 for the pressing mechanism, and the frame 431 is equipped with a pressing driving source. The pressing driving source can be a linear motor, a pressing cylinder, or a motor and a transmission group; in In this embodiment, the driving of the pressure movement comes from the motor 432 provided in the frame 431. The motor 432 drives one of the transmission groups of the pulley group 433, and the belt pulley group 433 drives the other transmission group of the screw screw seat group. The screw screw seat group is the second Axial Z is arranged, and a bearing member 435 is driven by a screw 434 to make a second axial Z displacement. The bearing member 435 is provided with a fine-tuning device 436 at a position relative to the test seat 412. Like data, the position of the pressure shifter 437 can be fine-tuned, and the pressure shifter 437 is used for crimping and picking and placing electronic components.

The testing device further includes an image capturing mechanism, the image capturing mechanism is provided with at least one image capturing device, and the image capturing device is used for capturing the image testing device and electronic components; further, the image capturing device is connected to a processor to transmit the image capturing data to the processing unit. The processor determines whether the contacts of the electronic components and the probes of the test seat 412 are aligned or not, which is better , the imaging mechanism can be used to determine whether the pressure shifter 437 has electronic components or whether the test seat 412 has residual electronic components; , the second axis Z and the third axis Y are displaced to capture the electronic components transferred by the test seat 412 and the pressure shifter 437 in the working area A, and for the pressure shifter 437 to fine-tune the position of the electronic components, so that the electronic components The contacts of the components are more precisely aligned with the probes of the test seat 412 .

The testing device further includes a first pick-up mechanism, and the first pick-up mechanism is provided with a first pick-up tool for picking and placing electronic components on the conveyor in the first material changing area B1; in this embodiment, the first pick-up mechanism is driven by the first The source 451 drives the first pickup 452 to move in the first axis X, the second axis Z and the third axis Y, and the first pickup 452 is located in the feeding device 20, the receiving device 30 and the first changing area B1 The first stage 422 transfers the electronic components to be tested or the electronic components that have been tested.

The test device further includes a temperature control mechanism. The temperature control mechanism is provided with a test space 461 inside the frame 431 of the pressure-shift mechanism, and a temperature control mechanism is provided in the pressure-shift mechanism or the test mechanism for temperature-controlled electronic components. , so that the electronic components perform the test operation under the simulated environment temperature in the future, thereby improving the test quality; further, the temperature control mechanism inputs dry air in the test space 461 to prevent condensation; in this embodiment, the temperature control mechanism is in the test space 461 A fluid delivery pipe 462 is connected, and the fluid delivery pipe 462 delivers dry air to the test space 461 to reduce the dew point of the test space 461 and prevent condensation. The element 463 can be a heating element, a cooling chip or a base with fluid. In this embodiment, the temperature control 463 is a cooling chip, which is used to perform cold testing operations on electronic components.

Please refer to FIGS. 1 and 4 , the first pickup mechanism drives the first pickup 452 by the first drive source 451 to move the first axis X, the second axis Z, and the third axis Y, to supply the feeding device 20 The material container 21 takes out the electronic components 51 to be tested, and transfers them to the first changing area B1 , and the first pick-up tool 452 moves the electronic components 51 to be tested into the first stage 422 located in the first changing area B1 .

Please refer to FIG. 5 , the conveying mechanism drives the first stage 422 to make a first axial X-linear displacement by the conveying drive source 421 , and the first stage 422 conveys the electronic component 51 to be tested from the first refueling area B1 to the working area A , and is located between the pressure shifter 437 and the test seat 412, so that the electronic component 51 to be tested corresponds to the pressure shifter 437; the pressure shift mechanism drives the pulley set 433 and the screw 434 of the screw screw base set by the motor 432, so that the screw 434 drives The carrier 435 is displaced downward in a single second axis Z, and the carrier 435 drives the trimmer 436 and the pressure shifter 437 to move downward synchronously. Since the first carrier 422 transports the electronic component 51 under test corresponding to the pressure shifter 437 , the pressure shifter 437 does not need to perform a plurality of different axial displacements, and the pressure shifter 437 can directly take out the electronic component 51 to be tested on the first stage 422, thereby preventing the pressure shifter 437 from assembling errors due to a plurality of different axial drivers Then, the electronic component 51 under test is shifted and biased.

Please refer to FIGS. 2 and 6 , the conveying mechanism drives the first stage 422 by the conveying drive source 421 to perform a first axial X-linear reverse displacement, the first stage 422 is displaced from the working area A to the first material changing area B1, and Exit between the pressure shifter 437 and the test seat 412; since the electronic component 51 to be tested may have a slight displacement in the first stage 422, in order to further improve the feeding accuracy of the pressure shifter 437, the imaging mechanism is driven by the imaging The source 441 drives the image finder 442 to move to the working area A in the third axis Y, and is located between the pressure shifter 437 and the test seat 412, so that the image finder 442 takes the probe of the test seat 412 downward, and upward The contacts of the electronic component 51 under test carried by the image shifter 437 are captured, and the captured data are transmitted to the processor (not shown in the figure), and the processor determines the contacts of the electronic component 51 to be tested and the test seat 412 Whether the probe has a slight offset, if not, after the imager 442 is reset, the pressure shifter 437 moves the electronic component 51 to be tested into the test seat 412, if so, the pressure shifter 436 is used by the pressure shift mechanism to fine-tune the pressure shifter 437 and the position of the electronic component 51 to be tested, so that the contacts of the electronic component 51 to be tested are more accurately aligned with the probes of the test seat 412, thereby improving the test quality.

Please refer to FIGS. 1 , 2 and 7 , after the image finder 442 exits between the pressure shifter 437 and the test seat 412 , the pressure shift mechanism drives the pulley set 433 and the screw 434 of the screw base set with the motor 432 , so that the screw 434 drives the The carrier 435 is displaced downward in a single second axis Z, and the carrier 435 drives the trimmer 436, the pressure shifter 437 and the electronic component 51 to be tested to move downward synchronously in the work area A, so that the pressure shifter 437 is precisely moved downward. Move the electronic component 51 to be tested into the test seat 412, so that the contacts of the electronic component 51 to be tested are accurately pressed against the probes of the test seat 412 to perform the test operation, and the temperature control 463 of the temperature control mechanism can make the electronic component 51 to be tested 51 The test operation is performed under the simulated ambient temperature for future use, thereby improving the test quality.

Therefore, after the test is completed, the pressure shifter 437 moves the tested electronic component 51 out of the test seat 412 , the first stage 422 is displaced below the pressure shifter 437 to hold the tested electronic components 51 , and the tested electronic components 51 are transported from the working area A to the first changing area B1 for the first pick-up tool 452 takes out the tested electronic components 51 from the first stage 422, and according to the test results, transfers the tested electronic components 51 to the receiving device 30 for storage and sorting.

Please refer to FIGS. 8 and 9 , the testing device 40 according to the second embodiment of the present invention is equipped with the same testing mechanism, conveying mechanism, and pressing mechanism as in the first embodiment, and further includes a first picking mechanism, an imaging mechanism, and a temperature control mechanism. The difference between the testing device 40 of the second embodiment of the present invention and the first embodiment is that it further includes a second pickup mechanism and a conveying mechanism with a first conveyor and a second conveyor.

The first conveyor and the second conveyor of the conveying mechanism are displaced along the first axis X, so as to convey electronic components in the first changing area B1, the working area A and the second changing area B2; further, the first conveyor The electronic components to be tested can be transported, the second conveyor can transport the electronic components tested, or the first conveyor and the second conveyor can transport the electronic components to be tested and the electronic components tested, and the first conveyor and the second conveyor can transport the electronic components to be tested. The displacement can be driven by an independent conveying drive source, or the displacement of the first conveyor and the second conveyor can be driven by the same conveying drive source. According to the operation requirements, it is not limited to this embodiment; in this embodiment, the first conveyor of the conveying mechanism One conveyor is the first stage 422, the second conveyor is the second stage 423, and the first stage 422 and the second stage 423 are driven by the same conveying driving source 421 to displace along the first axis X, so that the A carrier 422 is moved to the first changing area B1 and the working area A to transport the electronic components to be tested, and the second carrier 423 is moved to the working area A and the second changing area B2 to deliver the tested electronic components.

The second pick-up mechanism is provided with a second pick-up tool for transferring electronic components to the second conveyor in the second material changing area B2; in this embodiment, the second pick-up mechanism uses the second drive source 471 to drive the second pick-up The pickup 472 is displaced in the first axis X, the second axis Z and the third axis Y. The second pickup 472 transfers the tested electronic components on the receiving device 30 and the second stage 423, according to the operation requirements, The first pick-up tool 452 of the first pick-up mechanism transfers the electronic components to be tested on the feeding device 20 and the first stage 422, thereby effectively improving the testing capacity.

10: Machine 20: Feeding device 21: Feed container 30: Receiving device 31: Receiving container 40: Test device 411: circuit board 412: Test seat 413: Tester 421: Conveying drive source 422: The first stage 423: Second stage 431: Rack 432: Motor 433: Pulley set 434: Screw 435: Carrier 436: Spinner 437: Shifter 441: Image acquisition drive source 442: Viewfinder 451: First drive source 452: First Pickup 461: Test Space 462: Fluid Delivery Tube 463: Temperature control 471: Second drive source 472: Second Pickup 51: Electronic Components A: work area B1: The first refueling area B2: The second refueling area X: the first axis Z: the second axis Y: the third axis

Figure 1: Schematic diagram of the testing equipment of the present invention. FIG. 2 is a top view of the first embodiment of the testing device of the present invention. Figure 3: Front view of the first embodiment of the testing device of the present invention. FIG. 4 is a schematic diagram (1) of the use of the first embodiment of the testing device of the present invention. FIG. 5 is a schematic diagram (2) of the use of the first embodiment of the testing device of the present invention. FIG. 6 is a schematic diagram (3) of the use of the first embodiment of the testing device of the present invention. FIG. 7 is a schematic diagram (4) of the use of the first embodiment of the testing device of the present invention. FIG. 8 is a top view of the second embodiment of the testing device of the present invention. Figure 9: Front view of the second embodiment of the testing device of the present invention.

10: Machine

411: circuit board

412: Test seat

413: Tester

421: Conveying drive source

422: The first stage

431: Rack

432: Motor

433: Pulley set

434: Screw

435: Carrier

436: Spinner

437: Shifter

441: Image acquisition drive source

442: Viewfinder

451: First drive source

452: First Pickup

461: Test Space

462: Fluid Delivery Tube

463: Temperature control

A: work area

B1: The first refueling area

X: the first axis

Z: the second axis

Claims (8)

A testing device, comprising: a testing mechanism: at least one tester is provided in an operation area for testing electronic components; a conveying mechanism: at least one conveyor is provided, and the conveyor is displaced in the first refueling area and the operation area, For conveying electronic components; press-shift mechanism: a frame is arranged in the operation area for assembling a press-shift drive source, the press-shift drive source drives the carrier to perform a second axial displacement, and the carrier is equipped with at least one press-shifter , the pressure shifter can make the second axial displacement relative to the tester to pick and place electronic components on the conveyor, and pick and place and crimp electronic components on the tester. The carrier is opposite to the tester. The position is equipped with a trimmer, and the trimmer is equipped with the pressure shifter for independent fine adjustment of the pressure shifter. The test device according to claim 1, further comprising a temperature control mechanism, the temperature control mechanism is provided with a test space inside the rack of the pressure-displacement mechanism, and a fluid conveying pipe is provided for conveying dry air to the test space . The test device as claimed in claim 1 further comprises a temperature control mechanism, and the temperature control mechanism is provided with a temperature control device in the pressure-shift mechanism or the test mechanism for temperature control electronic components. The testing device according to claim 1, further comprising a first pick-up mechanism, and the first pick-up mechanism is provided with a first pick-up tool for picking and placing electronic components on the conveyor in the first material changing area. The test device according to claim 4, wherein the conveying mechanism is provided with a first conveyor and a second conveyor for conveying electronic components in the first material changing area, the working area and the second material changing area, the test The device further includes a second pick-up mechanism, and the second pick-up mechanism is provided with a second pick-up tool for picking and placing electronic components from the second conveyor in the second material changing area. The testing device according to any one of claims 1 to 5, further comprising an image capturing mechanism, the image capturing mechanism is provided with at least one imager, the imager is used for capturing the tester in the working area and the Electronic component. The testing device according to claim 6, wherein the image pickup mechanism is provided with an image pickup drive source for driving the image pickup device to displace in the first axial direction, the second axial direction and the third axial direction. A testing equipment, comprising: a machine; a feeding device: arranged on the machine, and provided with at least one feeding container for accommodating at least one electronic component to be tested; a receiving device: arranged on the machine , and is provided with at least one receiving container for accommodating at least one tested electronic component; at least one test device as described in claim 1: configured on the machine for conveying and testing electronic components; central Control device: to control and integrate the actions of various devices to perform automated operations.

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