WO2008142754A1 - Electronic component testing device and electronic component testing method - Google Patents
Electronic component testing device and electronic component testing method Download PDFInfo
- Publication number
- WO2008142754A1 WO2008142754A1 PCT/JP2007/060212 JP2007060212W WO2008142754A1 WO 2008142754 A1 WO2008142754 A1 WO 2008142754A1 JP 2007060212 W JP2007060212 W JP 2007060212W WO 2008142754 A1 WO2008142754 A1 WO 2008142754A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electronic component
- component testing
- blasting
- contact arms
- testing device
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
An electronic component testing device comprises contact arms (321, 331) for transporting an IC device so that the IC device is pressed on a socket (6) of a test head (5), feeding systems (320, 330) for feeding the IC device to the contact arms (321, 331), upper side air blasting devices (232, 242) for blasting warm air from the upper side to the IC device fed by the feeding systems (320, 330), and lower side air blasting devices (233, 243) for blasting warm air from the lower side to the IC device held by the contact arms (321, 331).
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/060212 WO2008142754A1 (en) | 2007-05-18 | 2007-05-18 | Electronic component testing device and electronic component testing method |
JP2009515024A JPWO2008142754A1 (en) | 2007-05-18 | 2007-05-18 | Electronic component testing apparatus and electronic component testing method |
TW097113779A TW200900711A (en) | 2007-05-18 | 2008-04-16 | Electronic component testing device and electronic component testing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/060212 WO2008142754A1 (en) | 2007-05-18 | 2007-05-18 | Electronic component testing device and electronic component testing method |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008142754A1 true WO2008142754A1 (en) | 2008-11-27 |
Family
ID=40031481
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/060212 WO2008142754A1 (en) | 2007-05-18 | 2007-05-18 | Electronic component testing device and electronic component testing method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2008142754A1 (en) |
TW (1) | TW200900711A (en) |
WO (1) | WO2008142754A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI769664B (en) * | 2021-01-15 | 2022-07-01 | 鴻勁精密股份有限公司 | Testing apparatus and testing equipment using the same |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI401766B (en) * | 2009-03-23 | 2013-07-11 | Evertechno Co Ltd | Test handler and method for transferring component thereof |
TWI414798B (en) * | 2010-05-21 | 2013-11-11 | Hon Tech Inc | Testing and classifying machine for testing electronic elements at high and lower temperature |
JP2013024829A (en) * | 2011-07-26 | 2013-02-04 | Seiko Epson Corp | Electronic component carrying device and electronic component carrying method |
JP5942459B2 (en) * | 2012-02-14 | 2016-06-29 | セイコーエプソン株式会社 | Handler and parts inspection device |
KR102270760B1 (en) * | 2019-11-29 | 2021-06-30 | 에이엠티 주식회사 | The test apparatus of the device having fine pitch |
CN113326167B (en) * | 2021-05-13 | 2022-07-08 | 山东英信计算机技术有限公司 | Constant temperature adjustable tester and test method based on communication of substrate management controller |
US11740283B2 (en) | 2021-07-23 | 2023-08-29 | Chroma Ate Inc. | Multistory electronic device testing apparatus |
TWI787919B (en) * | 2021-07-23 | 2022-12-21 | 致茂電子股份有限公司 | Multi-layer feeding and binning device and electronic device testing apparatus comprising the same |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62127677A (en) * | 1985-11-29 | 1987-06-09 | Ando Electric Co Ltd | Heating device for parts |
JPS62121579U (en) * | 1986-01-24 | 1987-08-01 | ||
JPH1164437A (en) * | 1997-08-22 | 1999-03-05 | Ando Electric Co Ltd | Ic-heating device |
JP2002148303A (en) * | 2000-11-10 | 2002-05-22 | Advantest Corp | Holding device for electronic part test, electronic part testing device and electronic part test method |
-
2007
- 2007-05-18 JP JP2009515024A patent/JPWO2008142754A1/en active Pending
- 2007-05-18 WO PCT/JP2007/060212 patent/WO2008142754A1/en active Application Filing
-
2008
- 2008-04-16 TW TW097113779A patent/TW200900711A/en unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62127677A (en) * | 1985-11-29 | 1987-06-09 | Ando Electric Co Ltd | Heating device for parts |
JPS62121579U (en) * | 1986-01-24 | 1987-08-01 | ||
JPH1164437A (en) * | 1997-08-22 | 1999-03-05 | Ando Electric Co Ltd | Ic-heating device |
JP2002148303A (en) * | 2000-11-10 | 2002-05-22 | Advantest Corp | Holding device for electronic part test, electronic part testing device and electronic part test method |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI769664B (en) * | 2021-01-15 | 2022-07-01 | 鴻勁精密股份有限公司 | Testing apparatus and testing equipment using the same |
Also Published As
Publication number | Publication date |
---|---|
TW200900711A (en) | 2009-01-01 |
JPWO2008142754A1 (en) | 2010-08-05 |
TWI373626B (en) | 2012-10-01 |
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