TW200632345A - Electronic component test apparatus - Google Patents

Electronic component test apparatus

Info

Publication number
TW200632345A
TW200632345A TW095102781A TW95102781A TW200632345A TW 200632345 A TW200632345 A TW 200632345A TW 095102781 A TW095102781 A TW 095102781A TW 95102781 A TW95102781 A TW 95102781A TW 200632345 A TW200632345 A TW 200632345A
Authority
TW
Taiwan
Prior art keywords
connector
electronic component
board
component test
test apparatus
Prior art date
Application number
TW095102781A
Other languages
Chinese (zh)
Other versions
TWI277756B (en
Inventor
Satoshi Takeshita
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200632345A publication Critical patent/TW200632345A/en
Application granted granted Critical
Publication of TWI277756B publication Critical patent/TWI277756B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

Electronic component test equipment comprising a body side board (600) electrically connected with a test head body (500) and having a male side connector (620), and a socket board (700) fixed with an IC socket (710) to be in electrical contact with an IC device (IC) and having a female side connector (740) which is removably connected with the first connector (620). The body side board (600) has a connector (620) for supporting the male side connector (620) to be opposite to the socket board (700), and an opening (613) larger than the male side connector (620) and at least having a first portion capable of passing the connector (620) is formed in a connector base (610).
TW095102781A 2005-02-09 2006-01-25 Electronic component test equipment TWI277756B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2005/001942 WO2006085364A1 (en) 2005-02-09 2005-02-09 Electronic component test equipment

Publications (2)

Publication Number Publication Date
TW200632345A true TW200632345A (en) 2006-09-16
TWI277756B TWI277756B (en) 2007-04-01

Family

ID=36792939

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095102781A TWI277756B (en) 2005-02-09 2006-01-25 Electronic component test equipment

Country Status (2)

Country Link
TW (1) TWI277756B (en)
WO (1) WO2006085364A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI457572B (en) * 2009-04-28 2014-10-21 Nihon Micronics Kk Method for testing electric products

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101104288B1 (en) * 2008-10-09 2012-01-11 가부시키가이샤 아드반테스트 Interface members, test part unit, and electronic part testing apparatus
JP5631020B2 (en) * 2009-05-01 2014-11-26 株式会社日本マイクロニクス Test equipment for flat specimen
JP7143201B2 (en) 2018-12-14 2022-09-28 株式会社アドバンテスト sensor test equipment
TWI724482B (en) * 2019-08-01 2021-04-11 迅得機械股份有限公司 Probe module

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH083516B2 (en) * 1988-11-01 1996-01-17 三菱電機株式会社 Test head for semiconductor device and test method
JPH0735334Y2 (en) * 1990-06-27 1995-08-09 エスエムケイ株式会社 Connector mounting structure on the mounting board
JP2544486Y2 (en) * 1991-05-30 1997-08-20 第一電子工業株式会社 Connector with lock mechanism
JPH11326448A (en) * 1998-05-20 1999-11-26 Advantest Corp Ic testing device
US6312285B1 (en) * 1999-02-25 2001-11-06 Molex Incorporated Panel mounting system for electrical connectors

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI457572B (en) * 2009-04-28 2014-10-21 Nihon Micronics Kk Method for testing electric products

Also Published As

Publication number Publication date
WO2006085364A1 (en) 2006-08-17
TWI277756B (en) 2007-04-01

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