TWI724482B - Probe module - Google Patents

Probe module Download PDF

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TWI724482B
TWI724482B TW108127341A TW108127341A TWI724482B TW I724482 B TWI724482 B TW I724482B TW 108127341 A TW108127341 A TW 108127341A TW 108127341 A TW108127341 A TW 108127341A TW I724482 B TWI724482 B TW I724482B
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probes
board
circuit board
plate
plate body
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TW108127341A
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Chinese (zh)
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TW202107095A (en
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陳志華
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迅得機械股份有限公司
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Abstract

A probe module, which can be applied to a signal communicating device, includes a main body, a plurality of probes, a circuit board and an electrical connector. The probes are mounted on the main body. Each probe has a first end-part and a second end-part respectively formed at two ends thereof. The first end-parts of the probes are extended beyond the main body. The second end-parts of the probes are arranged in the main body. The circuit board is positioned on the main body. The second end-parts of the probes contact the circuit board, so that the probes are electrically connected to the circuit board. The electrical connector is positioned on the circuit board and exposed outside the main body. The electrical connector is electrically connected to the probes through the circuit board. The reliability of electrical connection is therefore enhanced.

Description

探針模組Probe module

本發明涉及一種探針模組,特別是涉及一種安裝於訊號接通裝置上,用於面板測試的探針模組。The invention relates to a probe module, in particular to a probe module installed on a signal connection device and used for panel testing.

現有的面板測試方式,必需在面板上設置一電連接器,並將連接於訊號裝置的軟排線,以人工方式插接於面板上的電連接器,用以接通訊號,以便進行面板測試。然而此種訊號接通方式,容易有接觸不良的情況發生,因此電性連接的可靠度較低。In the existing panel test method, an electrical connector must be provided on the panel, and the flexible flat cable connected to the signal device must be manually plugged into the electrical connector on the panel to connect the communication signal for the panel test. . However, this way of signal connection is prone to poor contact, so the reliability of the electrical connection is low.

本發明所要解決的技術問題在於,針對現有技術的不足提供一種探針模組,可使電性連接的可靠度提升。The technical problem to be solved by the present invention is to provide a probe module for the shortcomings of the prior art, which can improve the reliability of the electrical connection.

為了解決上述的技術問題,本發明提供一種探針模組,包括:一本體,該本體具有一第一表面及一第二表面,該第一表面及該第二表面分別位於該本體相對的兩面;多個探針,該些探針設置於該本體上,該些探針間隔的設置,每一該探針的兩端分別具有一第一端部及一第二端部,該些探針的第一端部伸出該本體的第一表面,該些探針的第二端部位於該本體內;一電路板,該電路板設置於該本體內,且該電路板部分伸出該本體外,該電路板設置有多個接點,該些探針的第二端部分別接觸該些接點,使該些探針與該電路板達成電性連接;以及一電連接器,該電連接器設置於該電路板上且位於該本體外,該電連接器透過該電路板與該些探針達成電性連接。In order to solve the above technical problems, the present invention provides a probe module including: a body having a first surface and a second surface, the first surface and the second surface are respectively located on two opposite sides of the body ; A plurality of probes, the probes are arranged on the body, the probes are arranged at intervals, each of the two ends of the probe has a first end and a second end, the probes The first end of the probe protrudes from the first surface of the body, and the second end of the probes is located in the body; a circuit board, the circuit board is arranged in the body, and the circuit board partially protrudes from the body Outside the body, the circuit board is provided with a plurality of contacts, and the second ends of the probes respectively contact the contacts, so that the probes and the circuit board are electrically connected; and an electrical connector, the electrical connector The connector is arranged on the circuit board and located outside the body, and the electrical connector is electrically connected with the probes through the circuit board.

為了解決上述的技術問題,本發明還提供一種探針模組,包括:一本體,該本體為絕緣體,該本體具有一第一表面及一第二表面,該第一表面及該第二表面分別位於該本體相對的兩面;多個探針,該些探針設置於該本體上,該些探針間隔的設置,每一該探針的兩端分別具有一第一端部及一第二端部,該些探針的第一端部伸出該本體的第一表面,該些探針的第二端部位於該本體內,該些探針的第一端部及第二端部具有彈性;一電路板,該電路板設置於該本體內,且該電路板部分伸出該本體外,該電路板設置有多個接點,該些探針的第二端部分別接觸該些接點,使該些探針與該電路板達成電性連接;以及一電連接器,該電連接器設置於該電路板上且位於該本體外,該電連接器透過該電路板與該些探針達成電性連接。In order to solve the above technical problems, the present invention also provides a probe module, including: a body, the body is an insulator, the body has a first surface and a second surface, the first surface and the second surface respectively Located on two opposite sides of the body; a plurality of probes, the probes are arranged on the body, the probes are arranged at intervals, and the two ends of each probe respectively have a first end and a second end The first ends of the probes protrude from the first surface of the body, the second ends of the probes are located in the body, and the first and second ends of the probes are elastic ; A circuit board, the circuit board is arranged in the body, and the circuit board is partially extended out of the body, the circuit board is provided with a plurality of contacts, the second ends of the probes respectively contact the contacts , The probes are electrically connected to the circuit board; and an electrical connector, the electrical connector is arranged on the circuit board and located outside the body, the electrical connector passes through the circuit board and the probes Achieve electrical connection.

為了解決上述的技術問題,本發明還提供一種探針模組,包括:一本體,該本體具有一第一表面及一第二表面,該第一表面及該第二表面分別位於該本體相對的兩面;多個探針,該些探針設置於該本體上,該些探針間隔的設置,每一該探針的兩端分別具有一第一端部及一第二端部,該些探針的第一端部伸出該本體的第一表面,該些探針的第二端部位於該本體內;一電路板,該電路板設置於該本體內,該電路板設置有多個接點,該些探針的第二端部分別接觸該些接點,使該些探針與該電路板達成電性連接;以及 一軟排線,該軟排線的一端電性連接於該電路板,該軟排線透過該電路板與該些探針達成電性連接。 In order to solve the above technical problem, the present invention also provides a probe module, including: a body having a first surface and a second surface, the first surface and the second surface are respectively located opposite to the body Two sides; a plurality of probes, the probes are arranged on the body, the probes are arranged at intervals, and the two ends of each probe respectively have a first end and a second end, the probes The first end of the needle protrudes from the first surface of the body, and the second ends of the probes are located in the body; a circuit board, the circuit board is arranged in the body, and the circuit board is provided with a plurality of connections Point, the second ends of the probes respectively contact the contacts, so that the probes are electrically connected to the circuit board; and A flexible flat cable, one end of the flexible flat cable is electrically connected to the circuit board, and the flexible flat cable is electrically connected with the probes through the circuit board.

本發明的有益效果在於,本發明的探針模組可安裝於訊號接通裝置上,用於面板的測試,該探針模組可通過電路板、電連接器(或軟排線)電性連接於訊號裝置,不易有接觸不良的情況發生,可使電性連接的可靠度提升。The beneficial effect of the present invention is that the probe module of the present invention can be installed on a signal connection device for panel testing, and the probe module can be electrically connected through a circuit board, an electrical connector (or a flexible flat cable) Connected to the signal device, it is not easy to have poor contact, and the reliability of the electrical connection can be improved.

再者,本發明探針的第一端部及第二端部彈性的設置,可提供第一端部及第二端部預壓的彈力,使該些探針的第一端部、第二端部可提供預壓功能,以具有較佳的接觸性。Furthermore, the elastic arrangement of the first end and the second end of the probe of the present invention can provide the elastic force of the first end and the second end to make the first end and the second end of the probe The end can provide a pre-compression function to have better contact.

另,本發明的本體可包含第一板體、第二板體及第三板體,其相互堆疊連接,使該本體形成一多層結構,以便於該些探針及電路板的安裝,且使該些探針及電路板可夾置於第一板體、第二板體及第三板體之間,而穩固的定位。In addition, the body of the present invention may include a first board, a second board, and a third board, which are stacked and connected to each other, so that the body forms a multi-layer structure to facilitate the installation of the probes and the circuit board, and The probes and the circuit board can be sandwiched between the first board body, the second board body and the third board body for stable positioning.

為使能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與圖式,然而所提供的圖式僅用於提供參考與說明,並非用來對本發明加以限制。In order to further understand the features and technical content of the present invention, please refer to the following detailed description and drawings about the present invention. However, the provided drawings are only for reference and description, and are not used to limit the present invention.

以下是通過特定的具體實施例來說明本發明所公開的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。The following are specific specific examples to illustrate the disclosed embodiments of the present invention, and those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be based on different viewpoints and applications, and various modifications and changes can be made without departing from the concept of the present invention. In addition, the drawings of the present invention are merely schematic illustrations, and are not drawn according to actual size, and are stated in advance. The following embodiments will further describe the related technical content of the present invention in detail, but the disclosed content is not intended to limit the protection scope of the present invention.

[實施例][Example]

請參閱圖1至圖4,本發明提供一種探針模組,該探針模組可安裝於訊號接通裝置上,用於面板的測試,該探針模組包括一本體1、多個探針2、一電路板3及一電連接器4。1 to 4, the present invention provides a probe module, the probe module can be installed on the signal connection device, used for panel testing, the probe module includes a body 1, a plurality of probes Pin 2, a circuit board 3 and an electrical connector 4.

該本體1為絕緣體,其以絕緣材質製成,其材質並不限制,在本實施例中,該本體1是以電木製成。該本體1可為多件式結構,亦即本體1可為組合式的設計,以便於該些探針2及電路板3的安裝。在本實施例中,該本體1包含一第一板體11、一第二板體12及一第三板體13,第一板體11、第二板體12及第三板體13依序堆疊連接,亦即第二板體12設置於第一板體11及第三板體13之間,第一板體11、第二板體12及第三板體13相互堆疊連接,使該本體1形成一多層結構。The main body 1 is an insulator, which is made of insulating material, and the material is not limited. In this embodiment, the main body 1 is made of bakelite. The body 1 can be a multi-piece structure, that is, the body 1 can be a combined design to facilitate the installation of the probes 2 and the circuit board 3. In this embodiment, the main body 1 includes a first plate 11, a second plate 12, and a third plate 13, the first plate 11, the second plate 12, and the third plate 13 in sequence Stacking connection, that is, the second plate body 12 is arranged between the first plate body 11 and the third plate body 13, and the first plate body 11, the second plate body 12 and the third plate body 13 are stacked and connected to each other, so that the body 1 Form a multilayer structure.

該本體1具有一第一表面14及一第二表面15,該第一表面14及第二表面15分別位於本體1相對的兩面。該第一表面14可設於第一板體11上遠離第二板體12的一面。該第二表面15可設於第三板體13上遠離第二板體12的一面。該第二表面15亦可進一步堆疊連接一第四板體16,以便通過該第四板體16進一步連接於一固定座5,使該探針模組可通過該固定座5安裝於訊號接通裝置上。The main body 1 has a first surface 14 and a second surface 15. The first surface 14 and the second surface 15 are respectively located on two opposite sides of the main body 1. The first surface 14 may be provided on a side of the first board 11 away from the second board 12. The second surface 15 may be provided on a side of the third board 13 away from the second board 12. The second surface 15 can also be further stacked and connected to a fourth board 16 so as to be further connected to a fixing base 5 through the fourth board 16 so that the probe module can be installed in the signal connection through the fixing base 5 On the device.

第一板體11、第二板體12、第三板體13及第四板體16之間可利用螺絲鎖固或黏接等方式連接,其連接方式並不限制,例如可在第一板體11、第二板體12、第三板體13及第四板體16上設置相對應的穿孔(圖略),以供螺絲穿設連接。The first plate body 11, the second plate body 12, the third plate body 13 and the fourth plate body 16 can be connected by screw locking or bonding. The connection method is not limited. For example, it can be connected to the first plate. The body 11, the second board 12, the third board 13 and the fourth board 16 are provided with corresponding perforations (the figure is omitted) for screw connection.

該些探針2是以導電性良好的金屬材質製成,該些探針2的材質並不限制。該些探針2設置於本體1上,該些探針2間隔的設置,該些探針2可以排列成一排或多排。每一探針2的兩端分別具有一第一端部21及一第二端部22,第一端部21及第二端部22具有較小的外徑。該些探針2的第一端部21伸出本體1外,亦即該些探針2的第一端部21可伸出本體1的第一表面14,以便與待測試的面板接觸。該些探針2的第二端部22位於本體1內,亦即該些探針2的第二端部22可伸至第二板體12及第三板體13之間,以便與電路板3接觸達成電性連接。The probes 2 are made of a metal material with good conductivity, and the material of the probes 2 is not limited. The probes 2 are arranged on the body 1, the probes 2 are arranged at intervals, and the probes 2 can be arranged in one or more rows. Each probe 2 has a first end 21 and a second end 22 at both ends, and the first end 21 and the second end 22 have smaller outer diameters. The first ends 21 of the probes 2 protrude out of the body 1, that is, the first ends 21 of the probes 2 can protrude from the first surface 14 of the body 1 so as to contact the panel to be tested. The second end 22 of the probes 2 is located in the body 1, that is, the second end 22 of the probes 2 can extend between the second board 12 and the third board 13 so as to be connected to the circuit board. 3 Contact to achieve electrical connection.

較佳的,該些探針2可為具有彈性的探針,亦即該些探針2的第一端部21及第二端部22至少其中之一具有彈性,較佳的,該些探針2的第一端部21及第二端部22皆具有彈性,以便提供預壓的彈力,使該些探針2的第一端部21、第二端部22可提供預壓功能,以具有較佳的接觸性。該些探針2的彈性結構並不限制。Preferably, the probes 2 may be elastic probes, that is, at least one of the first end 21 and the second end 22 of the probes 2 has elasticity. Preferably, the probes 2 Both the first end 21 and the second end 22 of the needle 2 have elasticity, so as to provide pre-compression elasticity, so that the first end 21 and the second end 22 of the probes 2 can provide pre-compression function. Has better contact. The elastic structure of the probes 2 is not limited.

在本實施例中,該第一板體11內設置多個第一安裝孔111(如圖4所示),且該些第一安裝孔111的一端各連接一第一開口112,該些第一開口112貫穿至第一表面14,該些第一安裝孔111的另一端貫穿至第一板體11上靠近第二板體12的一面。該第二板體12內設置多個第二安裝孔121,該些第二安裝孔121的一端各連接一第二開口122,該第二開口122貫穿至第二板體12上遠離第一板體11的一面,該些第二安裝孔121的另一端貫穿至第二板體12上靠近第一板體11的一面,該些第一安裝孔111分別與該些第二安裝孔121相連通,使得該些探針2可分別安裝於相連通的該些第一安裝孔111與該些第二安裝孔121中,且該些探針2的第一端部21可分別通過該些第一開口112而伸出本體1外,該些探針2的第二端部22可分別通過該些第二開口122而伸入本體1內。該些探針2可以穩固的被夾置定位於第一板體11及第二板體12之間。In this embodiment, the first board 11 is provided with a plurality of first mounting holes 111 (as shown in FIG. 4), and one end of the first mounting holes 111 is connected to a first opening 112. An opening 112 penetrates to the first surface 14, and the other end of the first mounting holes 111 penetrates to a surface of the first board 11 close to the second board 12. The second board 12 is provided with a plurality of second mounting holes 121. One end of the second mounting holes 121 is each connected to a second opening 122, which penetrates to the second board 12 away from the first board. On one side of the body 11, the other ends of the second mounting holes 121 penetrate to the side of the second board 12 that is close to the first board 11, and the first mounting holes 111 are respectively communicated with the second mounting holes 121 , So that the probes 2 can be respectively installed in the first mounting holes 111 and the second mounting holes 121, and the first ends 21 of the probes 2 can pass through the first The opening 112 extends out of the main body 1, and the second ends 22 of the probes 2 can respectively extend into the main body 1 through the second openings 122. The probes 2 can be firmly sandwiched and positioned between the first plate body 11 and the second plate body 12.

該電路板3設置於本體1內,且電路板3部分伸出本體1外。在本實施例中,該電路板3設置於本體1的第二板體12及第三板體13之間,且該第三板體13靠近第二板體12的一面設置一凹槽131,可供容納及定位該電路板3。該電路板3部分夾置於本體1的第二板體12及第三板體13之間,使電路板3部分位於本體1內,且電路板3設置有多個接點31,該些探針2的第二端部22分別接觸該些接點31,使該些探針2與電路板3達成電性連接。電路板3部分則伸出第二板體12的一側及第三板體13的一側而位於本體1外。The circuit board 3 is arranged in the main body 1, and the circuit board 3 partially extends out of the main body 1. In this embodiment, the circuit board 3 is disposed between the second board 12 and the third board 13 of the main body 1, and the third board 13 is provided with a groove 131 on the side close to the second board 12. The circuit board 3 can be accommodated and positioned. The circuit board 3 is partially sandwiched between the second board 12 and the third board 13 of the main body 1, so that the circuit board 3 is partially located in the main body 1, and the circuit board 3 is provided with a plurality of contacts 31. The second end 22 of the needle 2 contacts the contacts 31 respectively, so that the probes 2 and the circuit board 3 are electrically connected. The circuit board 3 protrudes from one side of the second board body 12 and one side of the third board body 13 to be located outside the body 1.

該電連接器4設置於電路板3上且位於本體1外,該電連接器4透過電路板3與該些探針2達成電性連接,亦即該電連接器4可透過電路板3上的線路(圖略)與該些探針2達成電性連接。該電連接器4可供訊號線(如軟排線)插接,使得該探針模組可通過訊號線電性連接於訊號裝置。The electrical connector 4 is arranged on the circuit board 3 and is located outside the body 1. The electrical connector 4 is electrically connected to the probes 2 through the circuit board 3, that is, the electrical connector 4 can penetrate the circuit board 3 The circuit (not shown in the figure) and the probes 2 are electrically connected. The electrical connector 4 can be plugged into a signal line (such as a flexible flat cable), so that the probe module can be electrically connected to a signal device through the signal line.

另,如圖5所示,在本實施例中,該探針2具有一筒體23,第一端部21及第二端部22設置於筒體23內靠近兩端處,第一端部21及第二端部22能分別伸出筒體23的兩端。筒體23內設置一彈簧24,該彈簧24的兩端分別抵觸於第一端部21及第二端部22,使第一端部21及第二端部22彈性的設置於探針2上,以便提供第一端部21及第二端部22預壓的彈力,使該些探針2的第一端部21、第二端部22可提供預壓功能。惟,本發明探針2的結構並不限制,可為各種現有的探針結構。In addition, as shown in FIG. 5, in this embodiment, the probe 2 has a cylinder 23. The first end 21 and the second end 22 are arranged in the cylinder 23 near the two ends. The first end 21 and the second end 22 can respectively extend out of the two ends of the cylinder 23. A spring 24 is arranged in the cylinder 23, and the two ends of the spring 24 respectively abut against the first end 21 and the second end 22, so that the first end 21 and the second end 22 are elastically arranged on the probe 2 , So as to provide the elastic force of the first end 21 and the second end 22 for pre-compression, so that the first end 21 and the second end 22 of the probes 2 can provide the pre-compression function. However, the structure of the probe 2 of the present invention is not limited, and can be various existing probe structures.

請參閱圖6,本發明的探針模組可安裝於一訊號接通裝置100上,用於面板的測試,亦即可利用該訊號接通裝置100驅動該探針模組移動,使該探針模組可以接觸面板的接點,使探針模組與面板達成電性連接,以便進行面板的測試,例如可進行AOI(自動光學檢測)等測試。Please refer to FIG. 6, the probe module of the present invention can be installed on a signal connecting device 100 for panel testing, that is, the signal connecting device 100 can be used to drive the probe module to move to make the probe The needle module can contact the contacts of the panel, so that the probe module and the panel can be electrically connected, so that the panel can be tested, for example, AOI (Automatic Optical Inspection) and other tests can be performed.

另,請參閱圖7,本發明上述實施例中的電連接器4亦能以一軟排線6取代,該軟排線6的一端電性連接於電路板3,該軟排線6透過電路板3與該些探針2達成電性連接,使得該探針模組可通過軟排線6電性連接於訊號裝置。In addition, referring to FIG. 7, the electrical connector 4 in the above-mentioned embodiment of the present invention can also be replaced by a flexible flat cable 6. One end of the flexible flat cable 6 is electrically connected to the circuit board 3, and the flexible flat cable 6 passes through the circuit The board 3 and the probes 2 are electrically connected, so that the probe module can be electrically connected to the signal device through the flexible flat cable 6.

[實施例的有益效果][Beneficial effects of the embodiment]

本發明的有益效果在於,本發明的探針模組可安裝於訊號接通裝置上,用於面板的測試,該探針模組包括一本體、多個探針、一電路板及一電連接器,該些探針設置於本體上,該些探針的第一端部伸出本體外,該些探針的第二端部位於本體內。電路板設置於本體內,且電路板部分伸出本體外,該些探針的第二端部接觸電路板,使該些探針與電路板達成電性連接。電連接器設置於電路板上且位於本體外,電連接器透過電路板與該些探針達成電性連接,訊號裝置的訊號線可插接於電連接器,使得該探針模組可通過電路板及電連接器電性連接於訊號裝置,不易有接觸不良的情況發生,可使電性連接的可靠度提升。The beneficial effect of the present invention is that the probe module of the present invention can be installed on a signal connection device for panel testing. The probe module includes a body, a plurality of probes, a circuit board, and an electrical connection. The probes are arranged on the body, the first ends of the probes extend out of the body, and the second ends of the probes are located in the body. The circuit board is arranged in the body, and the circuit board partially extends out of the body, and the second ends of the probes contact the circuit board, so that the probes and the circuit board are electrically connected. The electrical connector is arranged on the circuit board and located outside the body. The electrical connector is electrically connected to the probes through the circuit board. The signal line of the signal device can be plugged into the electrical connector so that the probe module can pass through The circuit board and the electrical connector are electrically connected to the signal device, so that poor contact is not easy to occur, and the reliability of the electrical connection can be improved.

再者,本發明探針的第一端部及第二端部彈性的設置,可提供第一端部及第二端部預壓的彈力,使該些探針的第一端部、第二端部可提供預壓功能,以具有較佳的接觸性。Furthermore, the elastic arrangement of the first end and the second end of the probe of the present invention can provide the elastic force of the first end and the second end to make the first end and the second end of the probe The end can provide a pre-compression function to have better contact.

另,本發明的本體可進一步包含第一板體、第二板體及第三板體,其相互堆疊連接,使該本體形成一多層結構,以便於該些探針及電路板的安裝,且使該些探針及電路板可夾置於第一板體、第二板體及第三板體之間,而穩固的定位。In addition, the body of the present invention may further include a first board, a second board, and a third board, which are stacked and connected to each other, so that the body forms a multi-layer structure to facilitate the installation of the probes and the circuit board. And the probes and circuit boards can be sandwiched between the first board body, the second board body and the third board body for stable positioning.

以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的申請專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的申請專利範圍內。The content disclosed above is only the preferred and feasible embodiments of the present invention, and does not limit the scope of the patent application of the present invention. Therefore, all equivalent technical changes made using the description and schematic content of the present invention are included in the application of the present invention. Within the scope of the patent.

1 本體 11第一板體 111第一安裝孔 112第一開口 12第二板體 121第二安裝孔 122第二開口 13第三板體 131凹槽 14第一表面 15第二表面 16第四板體 2 探針 21第一端部 22第二端部 23筒體 24彈簧 3 電路板 31接點 4 電連接器 5 固定座 6 軟排線 100訊號接通裝置 1 body 11 first board body 111 first mounting hole 112 first opening 12 second board body 121 second mounting hole 122 second opening 13 third board 131 groove 14 first surface 15 second surface 16 fourth board 2 Probe 21 first end 22 second end 23 cylinder 24 spring 3 Circuit board 31 contacts 4 Electrical connector 5 Fixing seat 6 Flexible flat cable 100 signal connection device

圖1為本發明探針模組的立體圖。Figure 1 is a perspective view of the probe module of the present invention.

圖2為本發明探針模組的立體分解圖。Figure 2 is a three-dimensional exploded view of the probe module of the present invention.

圖3為圖1的Ⅲ-Ⅲ剖視圖。Fig. 3 is a cross-sectional view taken along line III-III of Fig. 1.

圖4為圖1的Ⅳ-Ⅳ剖視圖。Fig. 4 is a sectional view taken along the line IV-IV in Fig. 1.

圖5為本發明探針的剖視圖。Figure 5 is a cross-sectional view of the probe of the present invention.

圖6為本發明探針模組安裝於訊號接通裝置的示意圖。FIG. 6 is a schematic diagram of the probe module of the present invention installed in the signal connection device.

圖7為本發明探針模組另一實施例的立體圖。FIG. 7 is a perspective view of another embodiment of the probe module of the present invention.

1 本體 11第一板體 12第二板體 13第三板體 14第一表面 16第四板體 2 探針 21第一端部 3 電路板 4 電連接器 5 固定座 1 body 11 first board body 12 second board body 13 third board 14 first surface 16 fourth board 2 Probe 21 first end 3 Circuit board 4 Electrical connector 5 Fixing seat

Claims (8)

一種探針模組,包括:一本體,該本體具有一第一表面及一第二表面,該第一表面及該第二表面分別位於該本體相對的兩面;多個探針,該些探針設置於該本體上,該些探針間隔的設置,每一該探針的兩端分別具有一第一端部及一第二端部,該些探針的第一端部伸出該本體的第一表面,該些探針的第二端部位於該本體內;一電路板,該電路板設置於該本體內,且該電路板部分伸出該本體外,該電路板設置有多個接點,該些探針的第二端部分別接觸該些接點,使該些探針與該電路板達成電性連接;以及一電連接器,該電連接器設置於該電路板上且位於該本體外,該電連接器透過該電路板與該些探針達成電性連接;其中該本體包含一第一板體、一第二板體及一第三板體,該第二板體設置於該第一板體及該第三板體之間,該第一板體、該第二板體及該第三板體相互堆疊連接,該第一表面設於該第一板體上遠離該第二板體的一面,該第二表面設於該第三板體上遠離該第二板體的一面,該些探針的第二端部伸至該第二板體及該第三板體之間,且該電路板設置於該第二板體及該第三板體之間;該第三板體靠近該第二板體的一面設置一凹槽,供容納及定位該電路板,使該電路板部分位於該本體內,且該電路板部分伸出該第二板體的一側及該第三板體的一側。 A probe module includes: a body having a first surface and a second surface, the first surface and the second surface are respectively located on two opposite sides of the body; a plurality of probes, the probes Are arranged on the body, the probes are arranged at intervals, each of the probes has a first end and a second end at both ends, and the first ends of the probes extend out of the body On the first surface, the second ends of the probes are located in the body; a circuit board, the circuit board is arranged in the body, and the circuit board partially extends out of the body, the circuit board is provided with a plurality of connections Point, the second ends of the probes respectively contact the contacts, so that the probes are electrically connected to the circuit board; and an electrical connector, the electrical connector is disposed on the circuit board and is located Outside of the main body, the electrical connector is electrically connected to the probes through the circuit board; wherein the main body includes a first board body, a second board body, and a third board body, and the second board body is provided Between the first plate body and the third plate body, the first plate body, the second plate body and the third plate body are stacked and connected to each other, and the first surface is provided on the first plate body away from the One side of the second plate body, the second surface is provided on the side of the third plate body away from the second plate body, and the second ends of the probes extend to the second plate body and the third plate body And the circuit board is arranged between the second board and the third board; the third board is provided with a groove on the side close to the second board for accommodating and positioning the circuit board so that The circuit board part is located in the body, and the circuit board part protrudes from one side of the second board body and one side of the third board body. 如請求項1所述的探針模組,其中該本體為絕緣體。 The probe module according to claim 1, wherein the body is an insulator. 如請求項1所述的探針模組,其中該第一板體內設置多個第一安裝孔,且該些第一安裝孔的一端各連接一第一開口,該些 第一開口貫穿至該第一表面,該些第一安裝孔的另一端貫穿至該第一板體上靠近該第二板體的一面,該第二板體內設置多個第二安裝孔,該些第二安裝孔的一端各連接一第二開口,該第二開口貫穿至該第二板體上遠離該第一板體的一面,該些第二安裝孔的另一端貫穿至該第二板體上靠近該第一板體的一面,該些第一安裝孔分別與該些第二安裝孔相連通,該些探針分別安裝於相連通的該些第一安裝孔與該些第二安裝孔中,且該些探針的第一端部分別通過該些第一開口而伸出該本體外,該些探針的第二端部分別通過該些第二開口而伸入該本體內。 The probe module according to claim 1, wherein the first board body is provided with a plurality of first mounting holes, and one end of the first mounting holes is each connected to a first opening, and the The first opening penetrates to the first surface, the other end of the first mounting holes penetrates to the side of the first plate body close to the second plate body, the second plate body is provided with a plurality of second mounting holes, the One ends of the second mounting holes are respectively connected to a second opening, the second opening penetrates to a side of the second board away from the first board, and the other end of the second mounting holes penetrates to the second board On the side of the body close to the first board body, the first mounting holes are respectively communicated with the second mounting holes, and the probes are respectively mounted on the communicating first mounting holes and the second mounting holes In the hole, the first ends of the probes respectively extend out of the body through the first openings, and the second ends of the probes respectively extend into the body through the second openings. 如請求項1所述的探針模組,其中該本體通過一固定座安裝於一訊號接通裝置上。 The probe module according to claim 1, wherein the body is installed on a signal connection device through a fixing base. 如請求項1所述的探針模組,其中該些探針為具有彈性的探針,該些探針的第一端部及第二端部至少其中之一具有彈性。 The probe module according to claim 1, wherein the probes are elastic probes, and at least one of the first end and the second end of the probes is elastic. 如請求項1所述的探針模組,其中該些探針各具有一筒體,該第一端部及該第二端部設置於該筒體內靠近兩端處,且該第一端部及該第二端部能分別伸出該筒體的兩端,該筒體內設置有彈簧,該彈簧的兩端分別抵觸於該第一端部及該第二端部,使該第一端部及該第二端部彈性的設置於該探針上,而能提供該第一端部及該第二端部預壓的彈力。 The probe module according to claim 1, wherein each of the probes has a cylinder, the first end and the second end are disposed in the cylinder near two ends, and the first end And the second end can respectively extend out of both ends of the cylinder. A spring is arranged in the cylinder. The two ends of the spring abut against the first end and the second end respectively, so that the first end And the second end is elastically arranged on the probe, and can provide the elastic force for pre-compression of the first end and the second end. 一種探針模組,包括:一本體,該本體為絕緣體,該本體具有一第一表面及一第二表面,該第一表面及該第二表面分別位於該本體相對的兩面;多個探針,該些探針設置於該本體上,該些探針間隔的設置,每一該探針的兩端分別具有一第一端部及一第二端部,該些探針的第一端部伸出該本體的第一表面,該些探針的第二端部位於該本體內,該些探針的第一端部及第二端部具有彈性; 一電路板,該電路板設置於該本體內,且該電路部分伸出該本體外,該電路板設置有多個接點,該些探針的第二端部分別接觸該些接點,使該些探針與該電路板達成電性連接;以及一電連接器,該電連接器設置於該電路板上且位於該本體外,該電連接器透過該電路板與該些探針達成電性連接;其中該本體包含一第一板體、一第二板體及一第三板體,該第二板體設置於該第一板體及該第三板體之間,該第一板體、該第二板體及該第三板體相互堆疊連接,該第一表面設於該第一板體上遠離該第二板體的一面,該第二表面設於該第三板體上遠離該第二板體的一面,該些探針的第二端部伸至該第二板體及該第三板體之間,且該電路板設置於該第二板體及該第三板體之間;該第三板體靠近該第二板體的一面設置一凹槽,供容納及定位該電路板,使該電路板部分位於該本體內,且該電路板部分伸出該第二板體的一側及該第三板體的一側。 A probe module includes: a body, the body is an insulator, the body has a first surface and a second surface, the first surface and the second surface are respectively located on two opposite sides of the body; a plurality of probes , The probes are arranged on the body, the probes are arranged at intervals, each of the probes has a first end and a second end at both ends, and the first ends of the probes Extending from the first surface of the body, the second ends of the probes are located in the body, and the first and second ends of the probes are elastic; A circuit board, the circuit board is arranged in the body, and the circuit part extends out of the body, the circuit board is provided with a plurality of contacts, and the second ends of the probes respectively contact the contacts to make The probes are electrically connected to the circuit board; and an electrical connector is arranged on the circuit board and located outside the body, and the electrical connector is electrically connected to the probes through the circuit board. Sexual connection; wherein the body includes a first plate, a second plate and a third plate, the second plate is disposed between the first plate and the third plate, the first plate Body, the second plate body, and the third plate body are stacked and connected to each other, the first surface is provided on a side of the first plate body away from the second plate body, and the second surface is provided on the third plate body On the side away from the second board, the second ends of the probes extend between the second board and the third board, and the circuit board is disposed on the second board and the third board The third board is provided with a groove on the side close to the second board for accommodating and positioning the circuit board, so that the circuit board is partly located in the body, and the circuit board partly extends out of the second One side of the board and one side of the third board. 一種探針模組,包括:一本體,該本體具有一第一表面及一第二表面,該第一表面及該第二表面分別位於該本體相對的兩面;多個探針,該些探針設置於該本體上,該些探針間隔的設置,每一該探針的兩端分別具有一第一端部及一第二端部,該些探針的第一端部伸出該本體的第一表面,該些探針的第二端部位於該本體內;一電路板,該電路板設置於該本體內,該電路板設置有多個接點,該些探針的第二端部分別接觸該些接點,使該些探針與該電路板達成電性連接;以及一軟排線,該軟排線的一端電性連接於該電路板,該軟排線透過該電路板與該些探針達成電性連接; 其中該本體包含一第一板體、一第二板體及一第三板體,該第二板體設置於該第一板體及該第三板體之間,該第一板體、該第二板體及該第三板體相互堆疊連接,該第一表面設於該第一板體上遠離該第二板體的一面,該第二表面設於該第三板體上遠離該第二板體的一面,該些探針的第二端部伸至該第二板體及該第三板體之間,且該電路板設置於該第二板體及該第三板體之間;該第三板體靠近該第二板體的一面設置一凹槽,供容納及定位該電路板,使該電路板部分位於該本體內,且該電路板部分伸出該第二板體的一側及該第三板體的一側。 A probe module includes: a body having a first surface and a second surface, the first surface and the second surface are respectively located on two opposite sides of the body; a plurality of probes, the probes Are arranged on the body, the probes are arranged at intervals, each of the probes has a first end and a second end at both ends, and the first ends of the probes extend out of the body On the first surface, the second ends of the probes are located in the body; a circuit board, the circuit board is arranged in the body, the circuit board is provided with a plurality of contacts, and the second ends of the probes Do not touch the contacts, so that the probes are electrically connected to the circuit board; and a flexible flat cable, one end of the flexible flat cable is electrically connected to the circuit board, the flexible flat cable passes through the circuit board and These probes are electrically connected; The body includes a first plate, a second plate, and a third plate. The second plate is disposed between the first plate and the third plate. The first plate, the The second plate body and the third plate body are stacked and connected to each other, the first surface is provided on the side of the first plate body away from the second plate body, and the second surface is provided on the third plate body away from the first plate body. On one side of the two board bodies, the second ends of the probes extend between the second board body and the third board body, and the circuit board is arranged between the second board body and the third board body ; The third board is close to the second board with a groove for receiving and positioning the circuit board, so that the circuit board is partly located in the body, and the circuit board part extends out of the second board One side and one side of the third board.
TW108127341A 2019-08-01 2019-08-01 Probe module TWI724482B (en)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM281177U (en) * 2005-06-02 2005-11-21 Tzeng Wen Chi Probe base for circuit inspecting apparatus of circuit board
TW200624830A (en) * 2005-01-03 2006-07-16 Insight Electronic Group Inc A PCB testing device
WO2006085364A1 (en) * 2005-02-09 2006-08-17 Advantest Corporation Electronic component test equipment
TWM472197U (en) * 2013-07-09 2014-02-11 Rato Technology Corp Density panel module of circuit board test device
TW201512678A (en) * 2013-07-11 2015-04-01 Johnstech Int Corp Testing apparatus and method for microcircuit and wafer level IC testing

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200624830A (en) * 2005-01-03 2006-07-16 Insight Electronic Group Inc A PCB testing device
WO2006085364A1 (en) * 2005-02-09 2006-08-17 Advantest Corporation Electronic component test equipment
TWM281177U (en) * 2005-06-02 2005-11-21 Tzeng Wen Chi Probe base for circuit inspecting apparatus of circuit board
TWM472197U (en) * 2013-07-09 2014-02-11 Rato Technology Corp Density panel module of circuit board test device
TW201512678A (en) * 2013-07-11 2015-04-01 Johnstech Int Corp Testing apparatus and method for microcircuit and wafer level IC testing

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