M281177 第二主體；其中： 該底底板、複數套管以及複數彈性件; 矣其ν 夕貝穿其頂底面之第—通孔，使得該等 一‘孔传分別由下而上依序設於該底板各第 通孔内，各絲管並與一該電線電性連結。 疊設二 ίΐί::有一頂板以及預定數量之探針;該頂板 G複^貫，板上’且其配合該電路板之線路設 盥辞 ^ &面之第二通孔，該等第二通孔並分別 反Ί通孔相通；該等探針分別可活動地設於 ]各第—通孔中’且各該探針身部兩端分別具有一檢 測端以及-抵接端’該抵接端並抵頂於—該彈性件上，使 縣探針㈣收财-第—錄上，#各賴針之檢測 &抵觸4電路板之線路時，並將向下朝—第二位置彈性位 移0 15 【實施方式】 為更詳細地說明本創作之結構，茲配合圖式，舉一較 佳實施例說明如下，其中： 第一圖係本創作一較佳實施例之使用示意圖。 第二圖係本創作一較佳實施例之剖視圖。 第三圖為延續第二圖之使用示意圖。 參閱第一圖，為本創作一較佳實施例「檢測裝置之探 針基座」，上述檢測裝置更包含有一檢測器（1〇〇)以及複數電 線(200)電性連結該檢測器（100)以及該探針基座(1)，使該探 5 M281177 針基座（1)可以對一電路板(300)之線路進行檢測，進而判斷 該電路板(300)之線路是否有短路情形。該探針基座(1)包含 有一第一主體(10)、一第二主體(20)以及一第三主體(3〇)。 其中： 5 配合第二及三圖，該第一主體(1〇)具有一底板(11)、複 數套管(12)以及複數彈性件(13)。其中，該底板(1〇)板身佈 設有多數貫穿其頂底面之第一通孔(111)，該等第一通孔 (111)係各為一上小下大之階狀孔，故，各在近其頂端處形 成一擋止部(112)。其次，該等套管（12)分別以焊接之方式固 1〇疋於该底板(10)各第一通孔(111)中，並各與一該電線(2⑻） 一端相接，進而再利用該等電線(2〇〇)另一端電性連結於上 述檢測器（100)。此外，該等彈性件(13)於本實施例中各為 一導電金屬材質製成之壓縮彈簧，其等分別設於該底板(11) 各第一通孔（111)内，並介於各該第一通孔(ηι)之擋止部 I5 (112)以及所在該套管（12)間，俾確實地將該等彈性件(13) 定位於該底板(11)中，又，該等彈性件(12)具有受外力壓迫 後長度縮小，並在外力移除後長度回覆至原有位置之特 性。而實施時，更為方便將該等套管（12)以及該等彈性件(13) 與該底板(11)結合，因此係將該底板(11)設計為由上下疊設 20之一上板片（lla)、一中板片（Ub)以及一下板片（lie)所組 成，該等第一通孔(11)之擋止部（112)即是形成於該上板片 (10a)中；藉此，即可先將該等套管(12)嵌固於該下板片（uc) 内，再依序將該中板片（lib)、該等彈性件(π)以及該上板片 (lla)結合於該下板片（lie)上；再者，該等套管（12)亦可以 M281177 銜接或他種固定方式結合於該底板(11)中。 该第二主體(20)具有一頂板(21)以及預定數量之探針 (22)。其中，該頂板pi)係疊設於該第一主體(1〇)之上板片 (11a)上，其在對應該電路板(300)之線路上設有複數貫穿其 5頂底面之第二通孔(211)，該等第二通孔(211)並分別與該底 板(11)一該第一通孔(11)相通；此外，該等第二通孔(211)分 別為一上大下小之階狀孔，分別在近其底端位置具有一肩 • 部(212)。再者，該等探針(22)係以導電金屬材質製成，且 分別以可活動之方式容置於該頂板(21)各第二通孔(211) ίο内；此外，該等探針(22)呈現中央粗大而兩端細長，分別具 有較大外徑之一身部(221)，其該身部(221)向上延伸較小外 徑之檢測端(222)，以及向下延伸較小外徑之抵接端(223)， 各該抵接端(223)並伸入該底板(11)一該第一通孔(in)中， 而以末端端緣頂抵於一該彈性件(13)頂緣上，故受該彈性件 15 (13)向上推頂之關係，而使該探針(22)維持在一第一位置(第 • 二圖)上；各該探針(22)在其檢測端(222)受力時，並將向下 朝一第二位置(第三圖)位移。換言之，即是該等彈性件(^) 係用以作為該等探針(22)受壓時之緩衝體，並可使各該探針 (22)之檢測端(222)恒與待檢物體表面接觸(在此係指上述電 2〇路板(300))。另外，在此特別說明的事，本實施例中，該第 二主體(20)為求加工方便，是以，該頂板(21)亦由上下疊設 之一第一板片（21a)以及一第二板片（21b)所組成，而該等第 二通孔(211)之肩部(212)係形成於該第一板片（21a)上。 该第二主體(30)呈板狀’其疊設於該第二主體(2〇)之第 7 M281177 一板片（21a)上，且該第三主體(30)在與該底板(10)相同位置 上佈設有多數貫穿其頂底面之第三通孔(31)，藉以使該等第 三通孔(31)套設於該等探針(22)之探測端(222)外，實質上， 該第三主體(30)是由上中下三夾板(3〇a)(3〇b)(30c)疊設構 5成，各該第三通孔(31)並在該上夾板(30a)形成一上支撐部 (31a)，而在該下夾板(30c)形成一下支撐部(3〇c)，以利用上 下該二支撐部(31a)(31c)共同防止所套設該探針(22)因受力 過大產生挫曲(Buckling)之情形發生，另外，該第三主體(3 〇) 之下支撐部(31c)與該頂板(21)之肩部(212)係分別住在該等 探針(22)之身部(221)上下二端，進而確實地將該等探針(22) 固定於該頂板(21)各第二通孔(211)内，避免該等探針(22) 由該頂板(21)中脫落。 如此，本創作電路板檢測裝置之探針基板在配合不同 電路板之線路進行檢測時，只需要更動到第二主體，將該 15第一主體舊的頂板更換掉，再替換上配合新電路板之線路 所設計新的頂板，同時，重新將該等探針置入該頂板之第 ,通孔内，即可重新將該第二主體結合於該第一主體上， 並將第二主體再度疊設於該第二主體上，俾對新的電路板 進行進一步之檢測作業。由此，可以看出本創作具有結構 2〇簡單，操作組合容易之優點。 M281177 【圖式簡單說明】 第一圖孫本創作一較佳實施例之使用示意圖。 第二圖係本創作一較佳實施例之剖視圖。 第三圖為延續第二圖之使用示意圖。 【主要元件符號說明】 探針基座(1) ® 第一主體(10) 底板(11) 10 上板片（11a) 中板片（lib) 下板片（11c) 第一通孔(111) 擋止部(112) 套管(12) 彈性件(13) 第二主體(20) 頂板(21) 15 第一板片（21a) 第二板片（21b) • 第二通孔(211) 肩部(212) 探針(22) 身部(221) 檢測端(222) 抵接端(223) 第三主體(30) 20 上夾板(30a) 中夾板(30b) 下夾板(30c) 第三通孔(31) 上支撐部(31a) 下夾板(31c) 檢測器（100) 電線(200) 電路板(300) 9M281177 The second body; of which: the bottom plate, the plurality of sleeves, and the plurality of elastic members; 矣 其 ν Xibei through the first through hole of its top and bottom surface, so that the one's hole is arranged in order from bottom to top, respectively In each of the first through holes of the bottom plate, each wire tube is electrically connected to a wire. Stacked two: a top plate and a predetermined number of probes; the top plate G is repeated on the plate, and the circuit board is provided with a second through hole on the surface, and the second The through-holes and the through-holes communicate with each other; the probes can be movably disposed in each of the first through-holes, and each of the two ends of the probe body has a detection end and a -contact end, respectively Terminate and abut on—the elastic piece, so that the county probe ㈣ collects money—the first record, when the detection of each of the needles is against the circuit of the 4 circuit board, it will face down to the second position Elastic displacement 0 15 [Embodiment] In order to explain the structure of the present invention in more detail, a preferred embodiment is described below with reference to the drawings, wherein: The first diagram is a schematic diagram of a preferred embodiment of the present invention. The second figure is a cross-sectional view of a preferred embodiment of the present invention. The third diagram is a schematic diagram of the continuation of the second diagram. Referring to the first figure, a preferred embodiment of the “probe base of the detection device” is created. The above detection device further includes a detector (100) and a plurality of wires (200) electrically connected to the detector (100). ) And the probe base (1), so that the probe 5 M281177 pin base (1) can detect the circuit of a circuit board (300), and then determine whether the circuit of the circuit board (300) is short-circuited. The probe base (1) includes a first body (10), a second body (20), and a third body (30). Wherein: 5 In accordance with the second and third figures, the first body (10) has a bottom plate (11), a plurality of sleeves (12), and a plurality of elastic members (13). Among them, the bottom plate (10) is provided with a plurality of first through holes (111) penetrating through its top and bottom surfaces, and the first through holes (111) are each a stepped hole with an upper, lower, and larger size. A stopper (112) is formed near each of its top ends. Secondly, the bushings (12) are respectively fixed in the first through holes (111) of the base plate (10) by welding, and are respectively connected to one end of a wire (2), and then reused. The other end of the wires (200) is electrically connected to the detector (100). In addition, in this embodiment, each of the elastic members (13) is a compression spring made of a conductive metal material, and the elastic members (13) are respectively disposed in the first through holes (111) of the base plate (11) and interposed between the first through holes (111). Between the stop portion I5 (112) of the first through hole (η) and the sleeve (12), the elastic member (13) is surely positioned in the bottom plate (11), and The elastic member (12) has a characteristic that the length is reduced after being pressed by an external force, and the length is returned to the original position after the external force is removed. In practice, it is more convenient to combine the sleeves (12) and the elastic members (13) with the bottom plate (11), so the bottom plate (11) is designed to be one of the upper plates stacked 20 above and below. It is composed of a sheet (lla), a middle sheet (Ub), and a bottom sheet (lie). The stopper portions (112) of the first through holes (11) are formed in the upper sheet (10a). ; With this, the sleeves (12) can be embedded in the lower plate (uc) first, and then the middle plate (lib), the elastic members (π), and the upper plate can be sequentially installed. The plate (lla) is combined with the lower plate (lie); further, the sleeves (12) can also be combined with the plate (11) by M281177 connection or other fixing methods. The second body (20) has a top plate (21) and a predetermined number of probes (22). Wherein, the top plate pi) is stacked on the plate (11a) on the first body (10), and a second line is provided on the line corresponding to the circuit board (300). The through holes (211) and the second through holes (211) are respectively communicated with the base plate (11) and the first through hole (11); in addition, the second through holes (211) are respectively a large The lower stepped holes have a shoulder portion (212) near the bottom. Furthermore, the probes (22) are made of a conductive metal material and are respectively housed in the second through holes (211) of the top plate (21) in a movable manner; in addition, the probes (22) A large body (221) with a large center and slender ends, each having a larger outer diameter, the body (221) extending upwardly with a smaller outer diameter detection end (222), and downwardly extending smaller The abutment ends (223) of the outer diameter, each abutment end (223) extends into the first through hole (in) of the bottom plate (11), and abuts against an elastic member with an end edge ( 13) On the top edge, the probe (22) is maintained in a first position (Fig. 2) by the relationship of the elastic member 15 (13) pushing upwards; each of the probes (22) When its detection end (222) is under force, it will move downward toward a second position (third picture). In other words, it means that the elastic members (^) are used as buffers when the probes (22) are compressed, and the detection end (222) of each probe (22) can be constant with the object to be inspected. Surface contact (referred to herein as the above-mentioned electrical circuit board (300)). In addition, in this particular case, in this embodiment, the second body (20) is for processing convenience, so that the top plate (21) is also composed of one first plate (21a) and one The second plate (21b) is composed of shoulders (212) of the second through holes (211) formed on the first plate (21a). The second body (30) is in a plate shape. It is stacked on the 7th M281177 plate (21a) of the second body (20), and the third body (30) is in contact with the bottom plate (10). A plurality of third through holes (31) penetrating the top and bottom surfaces of the same are arranged at the same position, so that the third through holes (31) are set outside the detection ends (222) of the probes (22). The third body (30) is composed of upper, middle, and lower three plywoods (30a) (30b) (30c), and each of the third through holes (31) is formed on the upper plywood (30a). ) Forms an upper supporting portion (31a), and a lower supporting portion (30c) is formed on the lower splint (30c), so as to prevent the probes from being set by using the upper and lower supporting portions (31a) (31c) together. 22) Buckling occurs due to excessive force. In addition, the support portion (31c) under the third body (30) and the shoulder (212) of the top plate (21) live separately in the Wait for the upper and lower ends of the body (221) of the probe (22), and then securely fix the probes (22) in the second through holes (211) of the top plate (21) to avoid such probes ( 22) Drop from the top plate (21). In this way, when the probe substrate of the circuit board detection device of the present invention is tested with the circuit of different circuit boards, it only needs to be changed to the second body, and the old top plate of the 15 first body is replaced, and then replaced with a new circuit. A new top plate is designed by the circuit of the board. At the same time, the probes are re-placed into the first through holes of the top plate, and the second body can be rejoined to the first body, and the second body can be re-attached. It is stacked on the second body, and the new circuit board is further inspected. From this, we can see that this creation has the advantages of simple structure 20 and easy operation and combination. M281177 [Brief description of the diagram] The first diagram is a schematic diagram of the use of a preferred embodiment created by Sun Ben. The second figure is a cross-sectional view of a preferred embodiment of the present invention. The third diagram is a schematic diagram of the continuation of the second diagram. [Description of main component symbols] Probe base (1) ® first body (10) bottom plate (11) 10 upper plate (11a) middle plate (lib) lower plate (11c) first through hole (111) Stop (112) Sleeve (12) Elastic member (13) Second body (20) Top plate (21) 15 First plate (21a) Second plate (21b) • Second through hole (211) Shoulder Part (212) probe (22) body (221) detection end (222) abutment end (223) third body (30) 20 upper splint (30a) middle splint (30b) lower splint (30c) third pass Hole (31) Upper support (31a) Lower clamp (31c) Detector (100) Wire (200) Circuit board (300) 9