CN215812873U

CN215812873U - Electrical performance testing device for multi-layer FPC

Info

Publication number: CN215812873U
Application number: CN202121264986.5U
Authority: CN
Inventors: 王燕民; 王淦
Original assignee: Suiwa High Technology Electronic Industries Xiamen Co ltd
Current assignee: Suiwa High Technology Electronic Industries Xiamen Co ltd
Priority date: 2021-06-07
Filing date: 2021-06-07
Publication date: 2022-02-11
Anticipated expiration: 2031-06-07

Abstract

The utility model relates to an electrical property testing device for a multilayer FPC, which is provided with a welding finger and a layered finger, and can comprise a testing machine and a testing clamp, wherein the testing machine and the testing clamp are electrically connected through a transfer flat cable, a testing program is preinstalled in the testing machine, the testing clamp is provided with a base, a first clamp and a second clamp, the first clamp and the second clamp are installed on the base, the base is provided with a socket and is used for being plugged with the transfer flat cable, the first clamp is provided with a probe which is used for being in conductive connection with the welding finger, the second clamp is provided with a conductive adhesive which is used for being in contact with the layered finger to form a loop, and the probe and the conductive adhesive are connected to the socket through a lead.

Description

Electrical performance testing device for multi-layer FPC

Technical Field

The utility model relates to the field of FPCs (flexible printed circuits), in particular to an electrical property testing device for a multi-layer FPC.

Background

With the rapid development of the scientific and technical level, the application range of the FPC in various industries is wider and wider, and especially in the field of medical application, the requirement on the electrical property of the product is stricter. The FPC is used as a part of a finished medical equipment assembly, the quality of the electrical performance of the FPC is directly related to the equipment, and the measurement and test of an instrument are accurate or not, so that the life safety of people is possibly influenced.

The flexible circuit board has the difficulties of complex structure, diversified lamination, precise fingers and the like during processing and manufacturing. Aiming at a multi-layer FPC board (with welding fingers and layered fingers) with a complex and special structure, the electrical performance test of the multi-layer FPC board is often difficult, but the traditional electrical test can only be performed by pricking pins on the outermost layer of golden fingers, and the conductivity of the inner layer of golden fingers cannot be tested, so that whether obvious appearance defects exist can be distinguished only by simple methods such as AOI (automated optical inspection) and visual inspection; the open and short circuit defects existing in the FPC via hole or the circuit are difficult to intercept, and the risk of defective products flowing out exists.

Disclosure of Invention

The present invention is directed to provide an electrical property testing apparatus for a multi-layer FPC to solve the above problems. Therefore, the utility model adopts the following specific technical scheme:

an electrical property testing device for a multilayer FPC is provided with a welding finger and a layering finger, and can comprise a testing machine and a testing clamp which are electrically connected through a switching flat cable, the testing machine is preassembled with a testing program, the testing clamp is provided with a base, a first clamp and a second clamp, the first clamp and the second clamp are mounted on the base, a socket is arranged on the base and used for being connected with the switching flat cable in an inserting mode, the first clamp is provided with a probe which is used for being in conductive connection with the welding finger, the second clamp is provided with a conductive adhesive which is used for being in contact with the layering finger to form a loop, and the probe and the conductive adhesive are connected to the socket through a lead.

Further, the first clamp can include a first bottom plate, a first quick clamping hand, a locating pin and the probe, the first bottom plate is fixed on the base, the locating pin and the probe are arranged on the first bottom plate, the locating pin is used for locating the welding finger on the first bottom plate, and the first quick clamping hand is located above the first bottom plate and used for enabling the welding finger to contact with the probe.

Further, the first rapid clamping hand can comprise a fixing seat, an operating handle, a left connecting plate, a right connecting plate, a lifting shaft and a pressing assembly, the fixing seat is fixed on a support erected on the base, the lower end of the fixing seat is a guide sleeve, the head end of the operating handle is provided with a first hinge point and a second hinge point, the first hinge point is hinged to the upper end of the fixing seat, the second hinge point is hinged to the upper ends of the left connecting plate and the right connecting plate, the lower ends of the left connecting plate and the right connecting plate are hinged to the upper end of the lifting shaft, the lifting shaft vertically penetrates through the guide sleeve, the lower end of the lifting shaft is connected to the pressing assembly, and the pressing assembly is used for enabling the welding fingers to be in contact with the probes.

Further, the pushing assembly can comprise an upper plate, a lower plate and a buffer piece, the upper plate is fixedly connected with the lower plate through four connecting rods, the lower end of the lifting shaft is fixed on the upper plate, and the buffer piece is installed on the position, corresponding to the region where the probe is located, of the lower plate.

Further, the buffer piece is a spring pin, the lower plate is provided with an opening, and the spring pin is installed in the opening through a mounting plate.

Further, the upper plate is mounted on the two guide posts through linear bearings.

Further, the second anchor clamps include second bottom plate, punch holder, lower plate and with the quick tong of the second that first quick tong structure is the same, the second bottom plate is fixed on the base, the lower plate through the unsettled installation of first spring pin on the second bottom plate, the punch holder through the unsettled installation of second spring pin in the lower plate top, the punch holder with the lower surface of lower plate all scribbles electrically conductive glue, two-layer arranging respectively of layering finger the second bottom plate with between the lower plate with the punch holder with between the lower plate, the quick tong of second be used for with the punch holder with the lower plate pushes down, so that the layering finger with electrically conductive glue touches and forms the return circuit.

Further, the upper and lower clamping plates are made of glass fiber plates.

Further, the support can be composed of three vertical plates and a transverse plate.

Further, the first jig and the second jig are arranged left and right.

By adopting the technical scheme, the utility model has the beneficial effects that: the electric performance of the FPC can be effectively intercepted, the test bottleneck of the multilayer FPC with a complex structure is solved, functional complaints of the client are effectively solved, meanwhile, the working efficiency of operators is improved, and the production requirement is met.

Drawings

To further illustrate the various embodiments, the utility model provides the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments of the utility model and, together with the description, serve to explain the principles of the embodiments. Those skilled in the art will appreciate still other possible embodiments and advantages of the present invention with reference to these figures. Elements in the figures are not drawn to scale and like reference numerals are generally used to indicate like elements.

FIG. 1 is a perspective view of a test fixture of the present invention;

fig. 2 is a perspective view of a quick grip of the test fixture of the present invention.

Detailed Description

The utility model will now be further described with reference to the accompanying drawings and detailed description.

Referring to fig. 1-2, an electrical property testing device for a multi-layer FPC100 is described. Wherein the multi-layer FPC100 has a soldering finger and a layering finger respectively at the left and right ends. The electrical property testing apparatus may include a testing machine (not shown) and a testing jig, which are electrically connected by a transfer cable (not shown). The tester is pre-loaded with a test program, and can automatically test the electrical performance of the multilayer FPC 100. And (4) displaying a test result on a screen, displaying green OK if the test result is good, and displaying red NG if the test result is not good. The tester is an existing device and will not be described here. The test fixture has a base 1 and first and

second fixtures

2 and 3 installed at left and right sides of the base 1, respectively. Wherein, the base 1 is box-shaped, and a socket (not shown) is arranged on the rear side of the base and is used for plugging the switching flat cable. The first jig 2 is used for positioning a bonding finger for holding the FPC100, and has a probe 21 for electrically conductive connection with the bonding finger. The probe 21 may be connected to the socket by a wire. The second jig 2 is used for positioning a layered finger holding the FPC100, and has a conductive paste (not shown) for forming a loop in contact with the layered finger. By operating the first and

second clamps

2 and 3, the FPC100 can be tested for the presence of a short circuit or open circuit failure. Specifically, if only the first jig 2 is operated, only a short circuit failure is detected; if the first and

second clamps

2 and 3 are operated simultaneously, only open circuit defects are measured.

The first fixture 2 may include a probe 21, a first base plate 22, a first quick grip 23, and a locating pin 24. The first base plate 22 is fixed (e.g., by screws) to the base 1. The probe 21 and the positioning pin 24 are mounted on the first base plate 22. Wherein the positioning pins 24 are used to position the soldering fingers of the FPC100 on the first chassis 22. The connecting wires between the probe 21 and the socket are located in the base 1. A first quick gripper 23 is located above the first base plate 22 for bringing the welding fingers into contact with the probe 21.

Specifically, the first quick clamping handle 23 may include a fixing base 231, an operating handle 232, left and right connecting pieces 233, a lifting shaft 234, an upper plate 235, a lower plate 236, a plurality of spring pins 237, and the like. A support 4 is vertically arranged on the base 21 and can be composed of three vertical plates and a transverse plate. The fixing seat 231 is fixed (e.g., by screws) to the mount 4 (specifically, the cross plate). The holder 231 has hinge points and guide sleeves 2311 at upper and lower ends, respectively. The head end of the operating handle 232 has a first hinge point and a second hinge point, wherein the first hinge point is close to the end and is hinged to the upper end of the fixing seat 231, and the second hinge point is hinged to the upper ends of the left and right connecting pieces 233. The lower ends of the left and right connecting pieces 233 are hinged to the upper end of the lifting shaft 234. The elevating shaft 233 vertically passes through the guide sleeve 2311 and is connected at its lower end to the upper plate 235. The upper plate 235 and the lower plate 236 are fixedly connected by four links 238. The lower plate 236 is provided with an opening directly above the area where the probes are located. A plurality of spring pins 237 are mounted in the openings by a mounting plate 239. The spring pins 237 may act as a buffer to prevent crushing of the FPC 100. The upper plate 235, lower plate 236 and plurality of spring pins 237 form a hold-down assembly that allows a solder finger of the FPC100 to contact the probe 21 as actuated by the operating handle 232.

To improve the stability of the hold-down assembly, the upper plate 236 is mounted on the two guide posts 5 by linear bearings (not shown). I.e. the hold-down assembly can move along the guide post 5.

The second clamp 3 may include a second base plate 31, an upper clamping plate 32, a lower clamping plate 33, and a second quick clamping hand 34. The second base plate 31 is fixed (e.g., by screws) to the base 1, and may have a plurality of positioning posts 35 thereon for positioning the FPC 100. The lower clamp plate 33 is mounted on the second base plate 31 in a floating manner by a first spring pin 36, and the lower clamp plate 33 can move relative to the second base plate 31. The upper plate 32 is mounted above the lower plate 33 by a second spring pin 37 so that the upper plate 32 is movable relative to the lower plate 33. The lower surfaces of the upper clamping plate 3 and the lower clamping plate 33 are coated with conductive adhesive. Two layers of the layered fingers of the FPC100 are interposed between the second chassis 31 and the lower clip 33 and between the upper clip 32 and the lower clip 33, respectively. The second quick clamp 34 is used to press down the upper and

lower clamping plates

32 and 33 to make the laminated fingers contact the conductive glue to form a loop. The second quick gripper 34 has the same structure as the first quick gripper, and will not be described herein.

In the present embodiment, the upper and

lower clamping plates

32 and 33 may be made of glass fiber plates.

The working process of the utility model is briefly described as follows: connecting the test fixture with the test machine through a 64pin switching flat cable; placing the FPC to be tested on a test fixture, paying attention to the fact that layered fingers need to be correspondingly placed on an upper glass fiber board and a lower glass fiber board on the right side of the fixture, and only testing poor short circuit if only pressing down a left rapid clamping hand; if the quick clamping hands on the left side and the right side are pressed down simultaneously, only poor open circuit is detected; if the test result is good, green OK is displayed, otherwise red NG is displayed.

While the utility model has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the utility model as defined by the appended claims.

Claims

1. The electric performance testing device for the multilayer FPC is characterized by comprising a testing machine and a testing clamp, wherein the testing machine and the testing clamp are electrically connected through a switching flat cable, a testing program is preinstalled in the testing machine, the testing clamp comprises a base, a first clamp and a second clamp, the first clamp and the second clamp are installed on the base, a socket is arranged on the base and used for being connected with the switching flat cable in an inserting mode, the first clamp is provided with a probe which is used for being in conductive connection with the welding finger, the second clamp is provided with a conductive adhesive which is used for being in contact with the layering finger to form a loop, and the probe is connected to the socket through a lead.

2. The electrical property test apparatus for a multi-layer FPC as claimed in claim 1, wherein the first jig includes a first base plate fixed on the base, a first quick grip, a positioning pin, and the probe, the positioning pin and the probe being provided on the first base plate, the positioning pin being used to position the soldering finger on the first base plate, the first quick grip being located above the first base plate for contacting the soldering finger with the probe.

3. The electrical property test device for the multi-layer FPC as claimed in claim 2, wherein the first quick grip includes a fixing base fixed on a support erected on the base and having a guide bush at a lower end thereof, an operating handle having a first hinge point and a second hinge point at a head end thereof, the first hinge point being hinged to an upper end of the fixing base, a left and right connection piece hinged to an upper end of the left and right connection piece, a lower end of the left and right connection piece being hinged to an upper end of the lifting shaft, a lifting shaft vertically passing through the guide bush and having a lower end connected to the hold-down assembly, and a hold-down assembly for bringing the welding finger into contact with the probe.

4. An electrical property test device for a multi-layer FPC as claimed in claim 3, wherein the hold-down assembly includes an upper plate, a lower plate and a buffer member, the upper plate and the lower plate are fixedly connected by four links, the lower end of the elevating shaft is fixed to the upper plate, and the buffer member is mounted on the lower plate at a position corresponding to the region where the probes are located.

5. An electrical property test device for a multi-layer FPC as claimed in claim 4, wherein the buffer member is a spring pin, and the lower plate is provided with an opening in which the spring pin is fitted by a mounting plate.

6. An electrical property test device for a multi-layer FPC as claimed in claim 4, wherein the upper board is mounted on two guide posts by means of linear bearings.

7. An electrical property test apparatus for a multi-layer FPC as recited in any one of claims 3 to 6, it is characterized in that the second clamp comprises a second bottom plate, an upper clamping plate, a lower clamping plate and a second quick clamping hand with the same structure as the first quick clamping hand, the second bottom plate is fixed on the base, the lower clamping plate is arranged on the second bottom plate in a suspended manner through a first spring pin, the upper clamping plate is suspended above the lower clamping plate through a second spring pin, the lower surfaces of the upper clamping plate and the lower clamping plate are coated with the conductive adhesive, two layers of the layered fingers are respectively arranged between the second bottom plate and the lower clamping plate and between the upper clamping plate and the lower clamping plate, the second quick clamping hand is used for pressing the upper clamping plate and the lower clamping plate downwards so that the layered fingers are contacted with the conductive glue to form a loop.

8. An electrical property test device for a multi-layer FPC as claimed in claim 7, wherein the upper and lower clamping plates are made of a glass fiber board.

9. An electrical property test device for multi-layer FPC as claimed in claim 3, wherein the support is constituted by three vertical plates and one horizontal plate.

10. An electrical property test device for a multi-layer FPC as claimed in claim 1, wherein the first jig and the second jig are arranged right and left.