TW200624830A - A PCB testing device - Google Patents
A PCB testing deviceInfo
- Publication number
- TW200624830A TW200624830A TW094100059A TW94100059A TW200624830A TW 200624830 A TW200624830 A TW 200624830A TW 094100059 A TW094100059 A TW 094100059A TW 94100059 A TW94100059 A TW 94100059A TW 200624830 A TW200624830 A TW 200624830A
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- substrate
- holes
- probe card
- plural
- Prior art date
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
A PCB testing device consists of a substrate having plural electrically conductive holes and connector insertion holes, a connector that is inserted into the connector insertion hole of the substrate, a probe card group installed across the substrate comprises plural layers of stacked board bodies, where the board bodies are fixed by penetrating connection columns. There are plural interlinked through holes and the test probes are inserted into the plural through holes. As Mentioned above, before testing first install the probe card group across the substrate so that the test probes of the probe card correspond to the electrically conductive holes of the substrate. During the test, the test personnel places the PCB on the probe card group and exerts a downward force on the PCB so as to indirectly shift the test probes downward until the electrically conductive holes are reached, so signals can be delivered to the test station through the connector, thereby achieving the purpose of rapid test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW94100059A TWI274885B (en) | 2005-01-03 | 2005-01-03 | A PCB testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW94100059A TWI274885B (en) | 2005-01-03 | 2005-01-03 | A PCB testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200624830A true TW200624830A (en) | 2006-07-16 |
| TWI274885B TWI274885B (en) | 2007-03-01 |
Family
ID=38624198
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW94100059A TWI274885B (en) | 2005-01-03 | 2005-01-03 | A PCB testing device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI274885B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI422846B (en) * | 2012-01-03 | 2014-01-11 | Rato High Tech Corp | The circuit board of the test fixture structure improved |
| TWI724482B (en) * | 2019-08-01 | 2021-04-11 | 迅得機械股份有限公司 | Probe module |
| CN114167259A (en) * | 2021-12-07 | 2022-03-11 | 华东光电集成器件研究所 | Method for programming and testing on-off of through holes of multi-piece substrate |
-
2005
- 2005-01-03 TW TW94100059A patent/TWI274885B/en not_active IP Right Cessation
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI422846B (en) * | 2012-01-03 | 2014-01-11 | Rato High Tech Corp | The circuit board of the test fixture structure improved |
| TWI724482B (en) * | 2019-08-01 | 2021-04-11 | 迅得機械股份有限公司 | Probe module |
| CN114167259A (en) * | 2021-12-07 | 2022-03-11 | 华东光电集成器件研究所 | Method for programming and testing on-off of through holes of multi-piece substrate |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI274885B (en) | 2007-03-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |