TWI769698B - Image taking apparatus and handler using the same - Google Patents
Image taking apparatus and handler using the same Download PDFInfo
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- 238000003384 imaging method Methods 0.000 claims abstract description 71
- 230000005540 biological transmission Effects 0.000 claims abstract description 29
- 238000012360 testing method Methods 0.000 claims description 73
- 238000006073 displacement reaction Methods 0.000 claims description 7
- 229910003460 diamond Inorganic materials 0.000 claims 1
- 239000010432 diamond Substances 0.000 claims 1
- 239000000523 sample Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 3
- 230000032258 transport Effects 0.000 description 3
- 239000012530 fluid Substances 0.000 description 2
- 238000007664 blowing Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
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Abstract
Description
本發明提供一種可調整取像器之取像焦距,以提高取像品質之取像裝置。 The invention provides an image capturing device which can adjust the image capturing focal length of the imager to improve the image capturing quality.
在現今,電子元件日趨微小精密,如何使電子元件之接點與測試座之探針精準對位,著實相當重要;目前測試作業設備於機台設有具探針之測試座,並以壓接器將電子元件移載至測試座之上方,一配置於測試座側方之取像裝置,利用移動平台帶動取像器於固定取像作業高度作水平位移至電子元件與測試座之間,使取像器取像電子元件及測試座,以由取像資料判別電子元件之接點與測試座之探針是否相互對位,而供調整電子元件之擺置位置;惟,不同型式之電子元件,其應用之測試座型式、高度也不同,但取像裝置之移動平台僅能帶動取像器作水平位移,且於固定取像作業高度取像測試座,導致取像器之取像焦距無法因應不同高度之測試座而改變,易發生影像失焦模糊的情形,不僅影響取像器之取像品質,更加無法判斷電子元件之接點與測試座之探針是否精準對位,進而影響測試品質。 Nowadays, electronic components are getting smaller and more precise. It is very important to accurately align the contacts of the electronic components with the probes of the test seat. At present, the test operation equipment is equipped with a test seat with a probe on the machine table, and is crimped The electronic component is moved to the top of the test seat by the device, and an image pickup device is arranged on the side of the test seat. The moving platform is used to drive the image pickup device to horizontally displace between the electronic component and the test seat at a fixed image pickup height. The imager takes images of the electronic components and the test seat, so as to determine whether the contacts of the electronic components and the probes of the test seat are aligned with each other from the imaging data, so as to adjust the placement position of the electronic components; however, different types of electronic components , The type and height of the test stand used are also different, but the moving platform of the image acquisition device can only drive the image finder to move horizontally, and the test stand is taken at a fixed image acquisition height, resulting in the image finder. Depending on the height of the test seat, it is easy to cause the image to be out of focus and blurred, which not only affects the image acquisition quality of the viewfinder, but also cannot determine whether the contact of the electronic component and the probe of the test seat are accurately aligned, thus affecting the test. quality.
本發明之目的一,提供一種取像裝置,包含驅動機構、調焦機構及取像機構,驅動機構設有具第一傳動部件之移動具,並以移動具沿驅動軸線 位移,調焦機構設有具第二傳動部件之承載具,第二傳動部件供移動具之第一傳動部件驅動,使承載具位移作動,取像機構之至少一取像器裝配於承載具,並由承載具帶動位移至不同取像高度,以供調整取像器對不同物件之取像焦距;藉以可視物件之作業位置,利用驅動機構搭配調焦機構而調整取像機構對不同物件之取像焦距,以獲得清晰影像資料,進而提高取像品質。 The first object of the present invention is to provide an imaging device, which includes a driving mechanism, a focusing mechanism and an imaging mechanism. Displacement, the focusing mechanism is provided with a carrier with a second transmission component, and the second transmission component is driven by the first transmission component of the moving tool, so that the carrier is displaced and actuated, and at least one imager of the imaging mechanism is assembled on the carrier, It is driven by the carrier to move to different heights for taking images, so as to adjust the focal length of the image finder for different objects; in this way, the working position of the objects can be seen, and the driving mechanism and the focusing mechanism are used to adjust the capturing mechanism of the imaging mechanism for different objects. The image focal length can be obtained to obtain clear image data, thereby improving the image quality.
本發明之目的二,提供一種取像裝置,其驅動機構之移動具與調焦機構之承載具作平行配置,而可縮減取像裝置之整體高度,使取像裝置適用於狹小空間環境,進而提高使用效能。 The second objective of the present invention is to provide an imaging device, in which the moving part of the driving mechanism and the carrier of the focusing mechanism are arranged in parallel, so that the overall height of the imaging device can be reduced, so that the imaging device is suitable for a narrow space environment, and further Improve use efficiency.
本發明之目的三,提供一種作業設備,包含機台、供料裝置、收料裝置、作業裝置、本發明取像裝置及中央控制裝置,供料裝置配置於機台,並設有至少一供料容置器,以供容置至少一待作業電子元件;收料裝置配置於機台,並設有至少一收料容置器,以供容置至少一已作業電子元件;作業裝置配置於機台,並設有作業機構及輸送機構,作業機構供對電子元件執行預設作業,輸送機構供輸送電子元件;本發明取像裝置配置於機台,並設有驅動機構、調焦機構及取像機構,以供取像作業裝置之作業機構及電子元件;中央控制裝置以控制及整合各裝置作動而執行自動化作業。 The third object of the present invention is to provide an operation equipment, including a machine, a feeding device, a receiving device, an operating device, an imaging device of the present invention, and a central control device. The feeding device is arranged on the machine, and is provided with at least one supply a material container for accommodating at least one electronic component to be operated; the material receiving device is arranged on the machine table, and at least one material receiving container is provided for accommodating at least one electronic component that has been operated; the working device is arranged in The machine table is provided with an operating mechanism and a conveying mechanism. The operating mechanism is used for performing preset operations on the electronic components, and the conveying mechanism is used for conveying the electronic components; the imaging device of the present invention is arranged on the machine table, and is provided with a driving mechanism, a focusing mechanism and The imaging mechanism is used for the operating mechanism and electronic components of the imaging operation device; the central control device controls and integrates the actions of each device to perform automatic operations.
10:取像裝置 10: imaging device
111:馬達 111: Motor
112:螺桿螺座組 112: Screw screw seat group
113:移動具 113: Mobile
114:斜向導槽 114: Oblique guide groove
115:第一滑軌組 115: The first slide rail group
121:承載具 121: Carrier
1211:第一面 1211: The first side
1212:第二面 1212: Second side
122:滾輪 122: Roller
123:固定架 123:Fixed frame
1231:通孔 1231: Through hole
124:第二滑軌組 124: The second rail group
131:取像器 131: Viewfinder
1311:第一取像部 1311: The first imaging department
1312:第二取像部 1312: The second imaging department
14:連結板 14: Link Board
15:移動平台 15: Mobile Platforms
21:機台 21: Machine
22、22A:測試座 22, 22A: Test seat
23、23A:電子元件 23, 23A: Electronic components
24:輸送器 24: Conveyor
A:驅動軸線 A: Drive axis
B:取像軸線 B: take the image axis
L1:第一取像高度 L1: The first acquisition height
L2:第二取像高度 L2: Second acquisition height
30:機台 30: Machine
40:供料裝置 40: Feeding device
41:供料容置器 41: Feed container
50:收料裝置 50: Receiving device
51:收料容置器 51: Receiving container
60:作業裝置 60: Working device
611:電路板 611: circuit board
612:測試座 612: Test seat
62:第一拾取具 62: First Pickup
63:第一載台 63: The first stage
64、64A:壓接器 64, 64A: crimper
65:測試室 65: Test Room
651:流體輸送管 651: Fluid Delivery Tube
66:溫控件 66: Temperature control
67:第二載台 67: Second stage
68:第二拾取具 68: Second Pickup
圖1:本發明取像裝置之俯視圖。 FIG. 1 is a top view of the imaging device of the present invention.
圖2:本發明取像裝置之前視圖。 Figure 2: Front view of the imaging device of the present invention.
圖3:本發明取像裝置之使用示意圖(一)。 FIG. 3 is a schematic diagram (1) of the use of the imaging device of the present invention.
圖4:本發明取像裝置之使用示意圖(二)。 FIG. 4 is a schematic diagram (2) of the use of the imaging device of the present invention.
圖5:本發明取像裝置之使用示意圖(三)。 FIG. 5 is a schematic diagram of the use of the imaging device of the present invention (3).
圖6:係圖5之放大示意圖。 FIG. 6 is an enlarged schematic view of FIG. 5 .
圖7:本發明第一實施例之測試設備。 Fig. 7: Test equipment of the first embodiment of the present invention.
圖8:本發明第一實施例作業裝置之示意圖。 FIG. 8 is a schematic diagram of the working device according to the first embodiment of the present invention.
圖9:本發明第二實施例之測試設備。 Fig. 9: Test equipment of the second embodiment of the present invention.
圖10:本發明第二實施例作業裝置之示意圖。 FIG. 10 is a schematic diagram of the working device according to the second embodiment of the present invention.
圖11:本發明第三實施例之測試設備。 Fig. 11: Test equipment of the third embodiment of the present invention.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱圖1、2,本發明取像裝置10包含驅動機構、調焦機構及取像機構。
In order to make your examiners have a further understanding of the present invention, a preferred embodiment is hereby exemplified in conjunction with the drawings. The detailed description is as follows: Please refer to FIGS. 1 and 2. The
驅動機構設有至少一可位移作動之移動具,移動具設有第一傳動部件;更進一步,驅動機構以驅動源驅動該移動具位移,即驅動源驅動該移動具沿驅動軸線A位移,驅動源可為壓缸、馬達或包含馬達及傳動組;移動具可為塊體、楔形塊或凸輪,第一傳動部件可為斜向導槽、楔形面、凸輪面或滾輪等,驅動軸線A可為線性軸線或旋轉軸線,不受限於本實施例。 The driving mechanism is provided with at least one movable tool that can be displaced and actuated, and the movable device is provided with a first transmission component; further, the driving mechanism uses a driving source to drive the moving tool to displace, that is, the driving source drives the moving tool to move along the drive axis A to drive the displacement. The source can be a pressure cylinder, a motor or a motor and a transmission group; the moving tool can be a block, a wedge block or a cam, the first transmission part can be an oblique guide groove, a wedge surface, a cam surface or a roller, etc., and the drive axis A can be The linear axis or the rotational axis is not limited to this embodiment.
於本實施例,驅動機構之驅動源呈一為X方向之驅動軸線A配置,包含馬達111及驅動傳動組,驅動傳動組為螺桿螺座組112,螺桿螺座組112之螺座裝配一移動具113,移動具113之內部開設一為斜向導槽114之第一傳動部件;另於移動具113之頂面配置至少一呈驅動軸線A配置之第一滑軌組115,而輔助作線性位移。
In this embodiment, the drive source of the drive mechanism is arranged in a drive axis A in the X direction, including a
調焦機構設置一具第二傳動部件之承載具,第二傳動部件以供驅動機構之第一傳動部件驅動,使承載具位移作動;更進一步,該承載具與該移動具113平行配置;第二傳動部件可為滾輪或斜向導槽等,例如第一傳動部件為斜向導槽,第二傳動部件為滾輪;反之,第一傳動部件為滾輪,第二傳動部件為斜向導槽;於本實施例,承載具121於第一面1211設有一為滾輪122之第二傳動部件,滾輪122嵌置於移動具113之斜向導槽114。
The focusing mechanism is provided with a carrier with a second transmission component, and the second transmission component is driven by the first transmission component of the driving mechanism to make the carrier move; further, the carrier is arranged in parallel with the moving
更進一步,承載具121之一方設有固定架123,固定架123、承載具121與移動具113平行配置,固定架123與承載具121之間設有第二滑軌組124,以輔助承載具121作線性位移;於本實施例,承載具121於第一面1211之前方設置固定架123,固定架123開設有通孔1231供穿置承載具121之滾輪122;然固定架123之形狀或尺寸亦可迴避滾輪122之位置,則不需開設通孔,不受限本實施例。
Furthermore, one side of the
取像機構於承載具121裝配至少一取像器,以供取像物件,取像器由承載具121帶動位移而調整取像焦距;更進一步,取像器依作業需求,而搭配至少一取像部,以取像至少一物件;又取像機構可沿取像軸線B配置至少一取像部,更佳者,取像器可配置複數個取像部,複數個取像部取像複數個物件,又取像部可為菱鏡或全反射鏡;於本實施例,取像機構於承載具121之第二面1212裝配一為CCD之取像器131,並由承載具121帶動位移至不同取像高度,取像器131搭配沿取像軸線B配置複數個取像部,複數個取像部包含第一取像部1311及第二取像部1312,以分別取像不同物件(如電子元件及測試座)。
The image pickup mechanism is equipped with at least one image pickup device on the
然,取像機構之取像器依作業需求而裝配不同角度,取像機構之取像部依作業需求搭配取像器而裝配不同角度,易言之,只要使第一取像部1311及第二取像部1312取像物件即可。
However, the image finder of the image capturing mechanism is assembled at different angles according to the operation requirements, and the image capturing portion of the image capturing mechanism is assembled with the image finder at different angles according to the operation requirements. The second
請參閱圖3,本發明取像裝置10可裝配於機台21或移動平台15,例如取像裝置10裝配於機台21,而定點式取像物件,例如取像裝置10裝配於移動平台15,而於不同位置取像不同物件;於本實施例,取像裝置10以連結板14連結驅動機構之馬達111、調焦機構之固定架123、第一滑軌組115之滑軌及移動平台15,使移動平台15可經由連結板14帶動馬達111、承載具121及取像器131等作複數個方向位移調整擺置位置;另於機台21設置具探針之測試座22,以供測試電子元件23,測試座22之上方配置輸送器24,以供移載電子元件23。
Referring to FIG. 3 , the
請參閱圖1、4,於輸送器24將電子元件23移載至測試座22之上方時,取像裝置10之移動平台15以連結板14帶動驅動機構、調焦機構及取像機構同步沿驅動軸線A位移,令取像機構之第一取像部1311及第二取像部1312位於電子元件23與測試座22之間,且使取像器131位於第一取像高度L1,取像器131利用第一取像部1311沿取像軸線B向上取像電子元件23,並以第二取像部1312沿取像軸線B向下取像測試座22,取像器131將電子元件影像資料及測試座影像資料傳輸至一處理器(圖未示出),以供判別電子元件23之接點與測試座22之探針是否準確對位,使輸送器24精確將電子元件23移入測試座22而執行測試作業。
Please refer to FIGS. 1 and 4 , when the
請參閱圖1、5、6,於取像不同電子元件23A時,取像機構可搭配輸送器24作Z方向位移而調整電子元件23A之移載高度,以配合取像器131之取像焦距;然由於不同型式之測試座22A,其體積高度也不相同,在測試座22A固
設於機台21之條件下,取像器131對測試座22A之取像焦距也必須改變,以便清晰取像測試座22A。
Please refer to FIGS. 1 , 5 and 6 . When taking images of different
當機台21配置不同型式之測試座22A時,取像裝置10之馬達111經螺桿螺座組112之螺座而帶動該移動具113沿驅動軸線A位移,移動具113以斜向導槽114頂抵承載具121之滾輪122向下位移,滾輪122即傳動承載具121同步位移,承載具121利用第二滑軌組124沿取像軸線B作Z方向線性向下位移,以帶動取像器131、第一取像部1311及第二取像部1312同步向下位移,取像器131由第一取像高度L1調整位於第二取像高度L2,以調整第一取像部1311對電子元件23A之取像焦距,及調整第二取像部1312對測試座22A之取像焦距,使取像器131搭配第一取像部1311及第二取像部1312分別清晰取像電子元件23A及測試座22A,以利處理器(圖未示出)依清晰的電子元件影像資料及測試座影像資料而精準判別電子元件23A之接點與測試座22A之探針是否準確對位,使輸送器24精確將電子元件23A移入測試座22A而執行測試作業。
When the
請參閱圖1~2、7、8,本發明第一實施例之測試設備,包含機台30、供料裝置40、收料裝置50、作業裝置60、本發明取像裝置10及中央控制裝置(圖未示出)。供料裝置40配置於機台30,並設有至少一供料容置器41,以供容置至少一待作業電子元件,於本實施例,供料裝置40由機台30之前段部朝向後段部輸送具複數個待測電子元件之供料容置器41;收料裝置50配置於機台30,並設有至少一收料容置器51,以供容置至少一已作業電子元件,於本實施例,收料裝置50由機台30之後段部朝向前段部輸送具複數個已測電子元件之收料容置器51;中央控制裝置以控制及整合各裝置作動而執行自動化作業。
Please refer to FIGS. 1 to 2 , 7 and 8 , the testing equipment according to the first embodiment of the present invention includes a
作業裝置60配置於機台30,並設有作業機構及輸送機構,作業機構設有至少一作業器,供對電子元件執行預設作業,輸送機構設有至少一輸送器,以供輸送電子元件。於本實施例,作業機構之作業器為測試器,測試器具有電性連接之電路板611及測試座612,以供承置及測試電子元件;輸送機構設有一為第一拾取具62之第一輸送器,以於供料裝置40取出待測電子元件,並移載至一為第一載台63之第二輸送器,第一載台63將待測電子元件輸送至測試座612之上方;一位於測試座612上方之壓接器64於第一載台63取出待測電子元件;又作業裝置60更包含溫控機構,該溫控機構於輸送機構之壓接器64設置溫控件;該作業裝置於該作業機構之該作業器外部設置測試室65;於本實施例,作業裝置60於測試座612之外部設置測試室65,於冷測作業時,以流體輸送管651輸送乾燥空氣至測試室65,溫控機構於壓接器64設有溫控件66,以供溫控電子元件,使電子元件於模擬日後使用環境溫度下執行測試作業。
The
然依作業需求,於熱測作業時,測試室65內可配置鼓風機,以供吹送熱風,使測試室65之內部升溫,亦無不可。
However, according to the operation requirements, during the thermal measurement operation, a blower can be arranged in the
本發明之取像裝置10配置於機台30,包含驅動機構、調焦機構及取像機構,各機構如上所述,於本實施例,取像裝置10之移動平台15驅動取像器131作驅動軸線A位移,令取像器131之第一取像部1311及第二取像部1312位於電子元件及測試座612之間,驅動機構以移動具113傳動承載具121及取像器131沿取像軸線B作線性位移,以調整取像器131之第一取像部1311及第二取像部1312對電子元件及測試座612之取像焦距,而清晰取像電子元件及測試座612,使處理器(圖未示出)精準判別電子元件之接點與測試座612之探針是否準確對位。於取像完畢,取像器131復位,壓接器64將待測電子元件移入測試座612執行
測試作業,於測試完畢,壓接器64將已測電子元件移出測試座612,第一載台63位移至壓接器64之下方承置已測電子元件,並移出測試室65,以供第一拾取具62於第一載台63取出已測電子元件,並依測試結果,將已測電子元件移載至收料裝置50收置分類。
The
請參閱圖1~2、9、10,本發明第二實施例之作業設備,其配置有相同第一實施例作業設備之機台30、供料裝置40、收料裝置50、本發明取像裝置10及中央控制裝置(圖未示出),因此不再贅述;本發明第二實施例與第一實施例之差異在於輸送裝置60更包含第三輸送器及第四輸送器,第三輸送器載出已測電子元件,第四輸送器於第三輸送器及收料裝置50間移載已測電子元件;於本實施例,輸送裝置60之第一拾取具62將待測電子元件移入第一載台63,第一載台63將待測電子元件載入測試室65,於測試完畢,一為第二載台67之第三輸送器載出已測電子元件,一為第二拾取具68之第四輸送器於第二載台67取出已測電子元件,並移載至收料裝置50收料。
Please refer to FIGS. 1-2, 9, and 10. The operation equipment of the second embodiment of the present invention is equipped with the
請參閱圖1~2、11,本發明第三實施例之作業設備,其配置有相同第一實施例作業設備之機台30、供料裝置40、收料裝置50、本發明取像裝置10及中央控制裝置(圖未示出),因此不再贅述;本發明第三實施例與第一實施例之差異在於該第二輸送器以供該第一輸送器取放電子元件,並輸送電子元件至該作業器側方,該壓接器於該第二輸送器及該作業器移載電子元件;於本實施例,第一拾取具62將待測電子元件移入第一載台63,第一載台63將待測電子元件載入測試室65,且位於測試座612之側方,壓接器64A於第一載台63取出待測電子元件,並移入測試座612執行測試作業,於測試完畢,壓接器64A將已測
電子元件移入第二載台67,第二載台67將已測電子元件載出測試室65,以供第二拾取具68將第二載台67上之已測電子元件移載至收料裝置50收料。
Please refer to FIGS. 1-2 and 11 , the operation equipment of the third embodiment of the present invention is equipped with the same machine table 30 , the
10:取像裝置 10: imaging device
111:馬達 111: Motor
112:螺桿螺座組 112: Screw screw seat group
113:移動具 113: Mobile
114:斜向導槽 114: Oblique guide groove
115:第一滑軌組 115: The first slide rail group
121:承載具 121: Carrier
122:滾輪 122: Roller
123:固定架 123:Fixed frame
1231:通孔 1231: Through hole
124:第二滑軌組 124: The second rail group
131:取像器 131: Viewfinder
1311:第一取像部 1311: The first imaging department
1312:第二取像部 1312: The second imaging department
A:驅動軸線 A: Drive axis
B:取像軸線 B: take the image axis
Claims (17)
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TWI867720B (en) * | 2023-08-29 | 2024-12-21 | 鴻勁精密股份有限公司 | Pressing mechanism, testing device, and processing machine |
TWI867719B (en) * | 2023-08-29 | 2024-12-21 | 鴻勁精密股份有限公司 | Testing device and processing machine |
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TWI867719B (en) * | 2023-08-29 | 2024-12-21 | 鴻勁精密股份有限公司 | Testing device and processing machine |
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