TWI445972B - Test handler for memory card - Google Patents

Description

Memory card tester

The invention relates to a test Handler for Memory Card, which connects a memory card with a test device and classifies the tested memory card according to the test result.

SD (Secure Digital) card, Compact Flash (CF) card, Multi Media Card (MMC), Memory Stick, Smart Media card, xD image (Extreme) A Memory Card such as a Digital Picture card is widely used as a medium that is portable and capable of storing a large amount of data. For example, these cards are used in electronic products such as digital cameras, mobile phones, and personal digital assistants (PDAs).

These memory cards are manufactured through a plurality of processes, including: one test process for testing the performance of the memory card; and a sorting process for classifying the memory cards according to the test results. Through these procedures, the memory card that is not operating normally is sorted with the functioning memory card, and then the normal operation memory card is shipped.

In the past, the test process and the sorting process were completed by the manual work of the operator. Therefore, it takes a long time to commercialize a memory card, and there is a problem that productivity is low. Further, since the test process and the sorting process are completed by the manual work of the operator, there is a problem that the reliability of the memory card performance is low.

Therefore, in view of the above problems, an object of the present invention is to provide a test sorting machine for a memory card, which can automatically execute a test procedure for testing the performance of a memory card and a memory card according to the test result. The classification process for classification.

In order to achieve the above object, the present invention comprises the following structure.

The test sorting machine for a memory card according to the present invention may comprise: a tray portion located in the tray area, a tray for holding a supply tray for storing the memory card to be tested, and a sorting and storing the tested memory card according to the test result a plurality of storage trays; a test portion comprising a plurality of test units for testing the memory card, the test units being respectively disposed in a first test area and a second test area for performing a test process of the test memory card; Between the tray portion and the test portion, the first buffer mechanism and a second buffer mechanism are disposed. The first buffer mechanism moves between the tray region where the tray portion is located and the first test area to carry the memory card. a second buffer mechanism moves between the tray area and the second test area to carry the memory card; and a picker, transports the memory card between the first buffer mechanism and the tray portion, and in the second buffer mechanism Transfer the memory card between the trays. The test portion may include a plurality of test pickers for transporting the memory card between the test unit and the buffer portion. The test portion may include a first test picker and a second test picker, the first test picker transporting the memory card between the test unit disposed in the first test area and the first buffer mechanism, and second The test picker transports the memory card between the test unit disposed within the second test area and the second buffer mechanism.

The test sorting machine for a memory card according to the present invention may include: a tray portion: a supply tray for accommodating a memory card to be tested, and a plurality of storage trays for sorting and storing the tested memory cards according to the test result; The test unit includes a plurality of test units for testing the memory card; a buffer unit disposed between the tray portion and the test portion for transporting the memory card; and a pick-up device for transporting between the buffer portion and the tray portion Memory card. The test portion may include a plurality of test pickers for transporting the memory card between the test unit and the buffer portion.

According to the present invention, the following effects can be achieved.

The present invention automatically executes a test process for testing the performance of the memory card and a sorting process for classifying the memory card according to the test result, thereby shortening the time required to perform the test process and the sorting process on the memory card, and improving the performance of the memory card. reliability.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a preferred embodiment of a test sorter for a memory card of the present invention will be described in detail with reference to the accompanying drawings.

Please refer to "FIG. 1". The test card sorting machine 1 for a memory card according to the present invention connects a memory card with a test device, and classifies the tested memory cards according to the test results. These cards can be SD (Secure Digital) cards, Compact Flash (CF) cards, Multi Media Cards (MMC), Memory Sticks, Smart Media cards, xD image (Extreme Digital Picture) card, etc.

The test sorting machine 1 for a memory card according to the present invention comprises: a tray portion 2 on which a memory card is placed; a transport picker 3 for transporting the memory card; a buffer portion 4 for transporting the memory card; A test portion 5 for testing the process of the memory card. The test section 5 includes: a plurality of test units 51 for testing the memory card; and a plurality of test pickers 52 for transporting the memory card between the buffer section 4 and the test unit 51. A test device for testing the memory card is provided on the test unit 51.

When the transport picker 3 transports the memory card to be tested from the tray portion 2 to the buffer portion 4, the buffer portion 4 carries the memory card to be tested to one side of the test portion 5. When the test picker 52 transports the memory card to be tested from the buffer unit 4 to the test unit 51, the test unit 51 connects the memory card to be tested with the test device. After the end of the test of the memory card, the test picker 52 transports the tested memory card from the test unit 51 to the buffer unit 4. After the pick-up picker 3 picks up the already tested memory card from the buffer unit 4, the picked-up memory card is graded according to the test result and transported to the tray unit 2.

Through the above steps, the test sorting machine 1 for a memory card according to the present invention can automatically execute a test procedure for testing the performance of the memory card, and a sorting process for classifying the memory card based on the test result. Therefore, the test sorter 1 for a memory card according to the present invention can shorten the time required for the test process and the sorting process, and can improve the productivity, compared with the prior art which completes the test process and the sorting process by the manual work of the operator. Further, the test sorter 1 for a memory card according to the present invention can improve the accuracy of the sorting process of classifying the memory card according to the test result as compared with the prior art, thereby improving the reliability of the performance of the memory card.

Next, the tray unit 2, the transport picker 3, the buffer unit 4, and the test unit 5 will be described in detail with reference to the drawings.

Referring to "FIG. 1", the tray portion 2 includes: a loading stacker 21 for accommodating a supply tray containing the memory card to be tested; and an unloading for accommodating the storage tray containing the tested memory card Stack 22

The loading stack 21 stores a plurality of supply trays for accommodating the memory card to be tested. A plurality of storage grooves (not shown) are formed in the supply tray, and the storage grooves are used to receive the memory card to be tested. The transport picker 3 picks up the memory card to be tested from the supply tray, and transports the picked-up memory card to the buffer unit 4.

The unloading stacker 22 stores a plurality of storage trays for storing the tested memory cards. A plurality of storage grooves (not shown) are formed in the storage tray, and the storage grooves are used to store the tested memory cards. The transport picker 3 picks up the tested memory card from the buffer unit 4, and transports the picked-up memory card to one of the storage trays based on the test result. The transport picker 3 can move in the first axial direction (Y-axis direction) and the second axial direction (X-axis direction) to transport the memory card. The unloading stacker 22 is disposed to be spaced apart from the loading stacker 21 by a predetermined interval in the second axial direction (X-axis direction). A plurality of storage trays are disposed on the unloading stacker 22 at a predetermined distance in the second axial direction (X-axis direction). A plurality of supply trays are disposed on the loading stacker 21 at a predetermined distance in the second axial direction (X-axis direction).

Referring to "Fig. 1" and "Fig. 2", the pick-up picker 3 transports a memory card between the tray unit 2 and the buffer unit 4. The transport picker 3 transports the memory card to be tested from the tray unit 2 to the buffer unit 4. The transport picker 3 transports the tested memory card from the buffer unit 4 to the tray unit 2.

The conveyance picker 3 is movable in the first axial direction (Y-axis direction) and the second axial direction (X-axis direction) in order to perform the process of transporting the memory card. The transport picker 3 can be moved within the tray area A. The tray portion 2 is located inside the tray area A. The transport picker 3 can pick up the memory card to be tested from the supply tray, and then store the picked-up memory card into the buffer portion 4 located inside the tray area A. The transport picker 3 can pick up the tested memory card from the buffer portion 4 located in the tray area A, and then store the picked-up memory card on the storage tray. The pick-up picker 3 can be lifted and lowered to perform the process of picking up the memory card and the process of accommodating the memory card. The test card sorting machine 1 for a memory card according to the present invention may include a drive unit (not shown) that causes the pick-up picker 3 to face the first axial direction (Y-axis direction) and the second axial direction (X-axis direction) Moving, and moving the picker 3 up and down. The drive unit may be a cylinder type using a hydraulic cylinder or an air cylinder, a gear type using a motor and a rack and a pinion (Pinion Geer), and a ball using a motor and a ball screw. The screw type, the belt type by a motor, a pulley, a belt, etc., and the linear motor are used, and the conveyance picker 3 is moved and raised.

Here, the memory card is accommodated in each of the tray unit 2 and the test unit 5, and the memory cards are spaced apart at different pitches to form a matrix. The memory cards accommodated in the test unit 5 are spaced apart from each other along the first axis (Y-axis direction) and the second axis direction (X-axis direction), and the memory card stored on the tray portion 2 is along the first axis. The distance between the direction (Y-axis direction) and the second axis direction (X-axis direction) is wide. Therefore, the test sorting machine 1 for a memory card according to the present invention can reduce the size of each of the supply tray and the storage tray, and can store more memory cards on the supply tray and the storage tray, respectively. Further, in the test sorting machine 1 for a memory card according to the present invention, since the memory card can be stored at a wider pitch on the test portion 5, the memory card can be prevented from interfering with each other on the test portion 5, so that the test memory card can be improved. The accuracy of the test procedure.

To this end, the test sorting machine 1 for a memory card according to the present invention moves the memory card between the tray unit 2 and the test unit 5 in the first axial direction (Y-axis direction) and the second axial direction (X). Axis direction) Adjusts the spacing of the memory cards from each other. In order to shorten the time required to adjust the pitch at which the memory cards are spaced apart from each other, the test sorter 1 for a memory card according to the present invention includes a buffer portion 4.

The buffer portion 4 is disposed between the tray portion 2 and the test portion 5. The buffer unit 4 and the test unit 5 accommodate the memory card so as to be spaced apart from each other by the same distance in the first axial direction (Y-axis direction). The test unit 5 is spaced apart from the buffer unit 4 by a wider distance in the second axial direction (X-axis direction) when the memory card is housed.

The buffer unit 4 and the tray unit 2 accommodate the memory card so as to be spaced apart from each other by the same distance in the second axial direction (X-axis direction). The buffer portion 4 is spaced apart from the tray portion 2 by a wider pitch in the first axial direction (Y-axis direction) when the memory card is housed. In the process of transporting the memory card between the tray unit 2 and the buffer unit 4, the transport picker 3 adjusts the separation pitch of the memory cards in the first axial direction (Y-axis direction). To this end, the transport picker 3 includes a transport nozzle 31 (shown in "Fig. 3") and a line pitch adjustment unit 32 (shown in "Fig. 3").

Please refer to "1st drawing", "3rd drawing" and "4th drawing", and the suction nozzle 31 sucks the memory card. The transport picker 3 includes a plurality of transport nozzles 31. A plurality of transport nozzles 31 forming a row and a row are disposed on the main body 33 of the transport picker 3. The transport nozzle 31 is disposed on the main body 33 of the transport picker 3 so as to be movable in the first axial direction (Y-axis direction). The transport nozzle 31 may be disposed on the main body 33 so as to be movable up and down.

Referring to "Fig. 1", "Fig. 3" and "Fig. 4", the line spacing adjusting unit 32 is for adjusting the distance separating the conveying nozzles 31 in the first axial direction (Y axis). When the memory card is formed in a row and is accommodated in the tray portion 2 and the buffer portion 4, the first axial direction (Y-axis direction) is the same direction as the row direction. That is, the line spacing adjusting unit 32 is for adjusting the distance in which the conveying nozzles 31 are spaced apart in the row direction (Y-axis direction). The line spacing adjustment unit 32 includes a first cam plate 321 and a first lifting unit 322.

The first cam plate 321 is disposed on the main body 33 so as to be movable up and down. A plurality of first cam grooves 3211 are formed on the first cam plate 321 . The transfer nozzles 31 are movably coupled to the first cam grooves 3211, respectively. The first cam grooves 3211 are formed obliquely in a direction (Z-axis direction) in which the first cam plate 321 is lifted and lowered, respectively, at inclination angles different from each other. The first cam grooves 3211 are respectively formed such that the distance from each other toward the first cam plate 321 is narrower. The first cam groove 3211 is for guiding the conveying nozzles 31 to be spaced apart or narrowed by the same distance.

The first lifting unit 322 is used to lift and lower the first cam plate 321. When the first lifting unit 322 causes the first cam plate 321 to move up and down, the conveying nozzle 31 moves along with the first cam groove 3211. Thereby, the pitch at which the transport nozzles 31 are spaced apart in the row direction (Y-axis direction) is adjusted.

As shown in "Fig. 3", when the first lifting unit 322 raises the first cam plate 321, the conveying nozzle 31 moves along the first cam groove 3211, so that the pitch in the row direction (Y-axis direction) becomes narrow. At this time, the distance between the transport nozzles 31 is adjusted to be the same as the pitch at which the memory card is stored in the tray portion 2 in the first axial direction (Y-axis direction) and the second axial direction (X-axis direction). Therefore, the transport picker 3 can pick up a plurality of memory cards to be tested from the supply tray at a time. Further, the transport picker 3 can simultaneously store a plurality of tested memory cards on the storage tray.

As shown in FIG. 4, when the first lifting unit 322 lowers the first cam plate 321, the conveying nozzle 31 moves with the first cam groove 3211, so that the pitch in the row direction (Y-axis direction) is changed. width. At this time, the distance between the transport nozzles 31 is adjusted to be the same as the pitch in which the memory card is accommodated in the buffer portion 4 in the first axial direction (Y-axis direction) and the second axial direction (X-axis reverse direction). Therefore, the transport picker 3 can simultaneously store a plurality of memory cards to be tested on the buffer unit 4 at the same time. Further, the transport picker 3 can pick up a plurality of tested memory cards from the buffer unit 4 at a time.

Therefore, the transport picker 3 can pick up a plurality of memory cards at a time in units of rows and columns, and can also accommodate a plurality of memory cards in units of rows and columns. Therefore, the test sorter 1 for a memory card according to the present invention can shorten the time required for the process of transporting the memory card between the tray unit 2 and the buffer unit 4. The first lifting unit 322 may be a cylinder type using a hydraulic cylinder or an air cylinder, a gear type using a motor, a rack, a pinion or the like, a ball screw type using a motor and a ball screw, a motor and a pulley, and a belt. The first cam plate 321 is lifted and lowered by a belt type or the like using a linear motor.

Referring to "Fig. 1" and "fifth diagram", the buffer unit 4 and the test unit 51 accommodate the memory card such that the memory cards are spaced apart from each other by the same distance in the first axial direction (Y-axis direction). The test unit 51 accommodates the memory card at a wider pitch in the second axial direction (X-axis direction) than the buffer portion 4. The test picker 52 adjusts the distance between the memory cards in the second axial direction (X-axis direction) in the process of transporting the memory card between the buffer portion 4 and the test unit 51. To this end, the test picker 52 includes a test nozzle 521 (shown in "figure 5") and a column of pitch adjustment unit 522 (shown in "figure 5").

Please refer to "Figure 1" and "Figure 5". The test nozzle 521 is used to suck the memory card. The test picker 52 includes a plurality of test nozzles 521. A plurality of test nozzles 521 are disposed on the main body 523 of the test picker 52 in such a manner as to form a row. The test nozzle 521 can also be disposed on the main body 523 so as to be movable up and down.

Referring to "Fig. 1" and "Fig. 5", the column pitch adjusting unit 522 is for adjusting the pitch of the test nozzles 521 spaced along the second axis direction (X-axis direction). When the memory card is formed in a row and is accommodated in the buffer portion 4 and the test unit 51, the second axial direction (X-axis direction) is the same direction as the column direction. That is, the column pitch adjusting unit 522 adjusts the separation pitch of the test nozzles 521 in the column direction (X-axis direction). The column spacing adjustment unit 522 includes a second cam plate 5221 and a second lifting unit 5222.

The second cam plate 5221 is vertically disposed on the main body 523. A plurality of second cam grooves 5221a are formed on the second cam plate 5221. The test nozzles 521 are movably coupled to the second cam grooves 5221a, respectively. The second cam grooves 5221a are formed obliquely in a direction (Z-axis direction) in which the second cam plate 5221 is lifted and lowered at an inclination angle different from each other. The second cam grooves 5221a are respectively formed such that the distance between them decreases toward the second cam plate 5221. The second cam groove 5221a is for guiding the test nozzles 521 to be spaced apart or narrowed by the same distance.

The second lifting unit 5222 causes the second cam plate 5221 to move up and down. When the second lifting unit 5222 causes the second cam plate 5221 to move up and down, the test suction nozzle 521 moves along with the second cam groove 5221a. Thereby, the pitch of the test nozzle 521 is adjusted in the column direction (X-axis direction).

For example, when the second lift unit 5222 lowers the second cam plate 5221, the test suction nozzle 521 moves with the second cam groove 5221a, thereby narrowing the pitch in the column direction (X-axis direction). At this time, the pitch at which the test nozzle 521 is narrowed in the column direction (X-axis direction) is the same as the pitch at which the memory card is spaced apart from the buffer portion 4 in the column direction (X-axis direction). Therefore, the distance between the test nozzles 521 is adjusted to be the same as the pitch in which the memory card is accommodated in the buffer portion 4 in the first axial direction (Y-axis direction) and the second axial direction (X-axis reverse direction). Therefore, the test picker 52 can pick up a plurality of memory cards to be tested from the buffer unit 4 at a time. Further, the test picker 52 can simultaneously store a plurality of tested memory cards in the buffer portion 4.

For example, when the second lift unit 5222 causes the second cam plate 5221 to ascend, the test suction nozzle 521 moves with the second cam groove 5221a, thereby widening the pitch in the column direction (X-axis direction). "5th drawing" is a schematic view showing a state in which the distance between the test nozzles 521 in the column direction (X-axis direction) is widened. At this time, the pitch at which the test nozzle 521 is widened in the column direction (X-axis direction) is the same as the pitch at which the memory card is accommodated in the column direction (X-axis direction) on the test unit 51. Therefore, the pitch of the test nozzle 521 is adjusted to be the same as the pitch at which the memory card is accommodated in the first axial direction (Y-axis direction) and the second axial direction (X-axis direction) of the test unit 51. Therefore, the test picker 52 can simultaneously store a plurality of memory cards to be tested on the test unit 51 at the same time. In addition, the test picker 52 is capable of picking up a plurality of tested memory cards at a time from the test unit 51.

Therefore, the test picker 52 can pick up a plurality of memory cards at a time in units of rows and columns, and can also accommodate a plurality of memory cards in units of rows and columns. Therefore, the test sorter 1 for a memory card according to the present invention can shorten the time required for the process of transporting the memory card between the buffer unit 4 and the test unit 5. The second lifting unit 5222 can be a cylinder type using a hydraulic cylinder or an air cylinder, a gear type using a motor, a rack, a pinion or the like, a ball screw type using a motor and a ball screw, a motor, a pulley, and a belt. The second cam plate 5221 is raised and lowered by a belt type or the like using a linear motor.

Please refer to "1st drawing", "2nd drawing" and "6th drawing", and the buffer part 4 is used to carry a memory card. The buffer unit 4 includes a buffer mechanism 41 (shown in FIG. 6) for accommodating a plurality of memory cards, and a drive mechanism 42 for moving the buffer mechanism 41 in the first axial direction (Y-axis direction). (shown in "Figure 6").

The buffer mechanism 41 includes a plurality of buffer grooves 411 (shown in "Fig. 6") for accommodating the memory card. The buffer groove 411 is spaced apart from the second axial direction (X-axis direction) by a predetermined pitch in the first axial direction (Y-axis direction) to form a matrix. The buffer grooves 411 are spaced apart from each other in the first axial direction (Y-axis direction), and are spaced apart from the memory card in the first axial direction (Y-axis direction) on the test unit 51 (shown in FIG. 1). The spacing of the storage is the same. The pitch of the buffer grooves 411 spaced apart from each other in the second axial direction (X-axis direction) is the same as the pitch at which the memory card is accommodated in the second axial direction (X-axis direction) on the supply tray and the storage tray.

The drive mechanism 42 moves the buffer mechanism 41 in the first axial direction (Y-axis direction). The drive mechanism 42 moves the buffer mechanism 41 such that the buffer mechanism 41 is located within the tray area A or the test area B. The test area B is an area in which the test unit 51 is disposed. The transport picker 3 transports the memory card between the buffer mechanism 41 located in the tray area A and the tray unit 2. The test picker 52 transports the memory card between the buffer mechanism 41 located in the test area B and the test unit 51. Therefore, the transport picker 3 and the test picker 52 can perform the process of transporting the memory card to the buffer mechanism 41 located at different positions from each other. Therefore, the test sorter 1 for a memory card according to the present invention can prevent the pick-up picker 3 and the test picker 52 from colliding with each other in the process of transporting the memory card.

The drive mechanism 42 can be a cylinder type using a hydraulic cylinder or an air cylinder, a gear type using a motor, a rack, a pinion or the like, a ball screw type using a motor and a ball screw, a motor, a pulley, a belt, or the like. The buffer mechanism 41 is moved in the first axial direction (Y-axis direction) by a belt type or a linear motor.

The buffer portion 4 may include a plurality of buffer mechanisms 41 and a plurality of drive mechanisms 42. The buffer mechanism 41 can move toward the first axial direction (Y-axis direction) independently of each other. Therefore, the transport picker 3 can perform the process of transporting the memory card to the buffer mechanism 41 located in the tray area A of the buffer mechanism 41. Further, the test picker 52 can perform a process of transporting the memory card to the buffer mechanism 41 located in the test area B of the buffer mechanism 41. Since the transport picker 3 and the test picker 52 can simultaneously perform the process of transporting the memory card to the different buffer mechanism 41, the test sorter 1 for a memory card according to the present invention can shorten the test procedure and the sorting process. Time.

Please refer to "1", "2", "7" and "8". The test unit 5 includes a test unit 51 and a test picker 52.

The test unit 51 is connected to the test device T (shown in "Fig. 7"). The test device T is used to test a memory card housed on the test unit 51. The test unit 51 includes a connection pin (not shown) for electrically connecting to the test device T. The test unit 51 includes: a test socket 511 for accommodating the memory card (shown in FIG. 8); a claw 512 for connecting the memory card received in the test socket 511 to the test device T. (shown in "Fig. 8"); and a test board 513 equipped with a plurality of test sockets 511 (shown in "Fig. 7").

The test socket 511 includes a test slot 5111 for housing a memory card. The test socket 511 is provided with a plurality of test plates 513 such that the test grooves 5111 are formed in a row along the first axial direction (Y-axis direction) and the second axial direction (X-axis direction) by a predetermined distance from each other. The pitch of the test grooves 5111 spaced apart from each other in the first axial direction (Y-axis direction) is the same as the spacing between the buffer grooves 411 (shown in "Fig. 6") in the first axial direction (Y-axis direction) .

The test socket 511 includes a first socket body 5112 (shown in "Fig. 8") and a second socket body 5113 (shown in "Fig. 8").

The first socket body 5112 is coupled to the second socket body 5113 in a liftable manner. The first socket body 5112 is elastically coupled to the second socket body 5113 by a spring (not shown) as a medium. When no external force is applied to the first socket body 5112, the first socket body 5112 can be raised in accordance with the elastic force of the spring. The test slot 5111 is formed on the first socket body 5112. The claw 512 is coupled to the first socket body 5112.

The second socket body 5113 is combined with the test board 513. Referring to FIG. 8, a support member 5114, an elastic member 5115, and a connecting member 5116 are disposed on the second socket body 5113.

The support member 5114 is elastically coupled to the second socket body 5113 with the elastic member 5115 as a medium. The memory card is housed in the test slot 5111 and mounted on the support member 5114. The memory card mounted on the support member 5114 is electrically connected to the connection member 5116.

The elastic member 5115 is located between the support member 5114 and the second socket body 5113. One side of the elastic member 5115 is coupled to the support member 5114, and the other side is coupled to the second socket body 5113. When the claw 512 presses the memory card attached to the support member 5114, the elastic member 5115 is pressed by the support member 5114 to be compressed. When the claw 512 is separated from the memory card mounted on the support member 5114, the elastic member 5115 is stretched to cause the support member 5114 to ascend. The test socket 511 can include a plurality of elastic members 5115.

One side of the connecting member 5116 is coupled to the support member 5114, and the other side is coupled to the second socket body 5113. One side of the connecting member 5116 is electrically connected to a memory card mounted on the supporting member 5114. The other side of the connecting member 5116 is electrically connected to the test board 513 (shown in "Fig. 7"). Therefore, the memory card mounted on the support member 5114 is electrically connected to the test device T through the connecting member 5116 and the test board 513. Test socket 511 can include a plurality of connection components 5116.

Referring to "Fig. 1", "Fig. 2", "Fig. 7" and "Fig. 8", a claw 512 (shown in "Fig. 8") is movably provided in the test socket 511. When the memory card is housed in the test slot 5111, the claw 512 is rotated to a position that does not hinder the memory card from being accommodated by the test slot 5111. When the memory card is housed in the test slot 5111, the claw 512 is rotated to a position where the memory card accommodated in the test slot 5111 can be pressed. The memory card stored in the test slot 5111 is connected to the test device T as the claw 512 presses the memory card housed in the test slot 5111. A plurality of claws 512 may be coupled to the first socket body 5112.

The claw 512 is rotatably disposed on the first socket body 5112. The claw 512 can be elastically rotatably coupled to the first socket body 5112 as a medium by a spring (not shown). When the first socket body 5112 is raised, the claw 512 is rotated to be able to press the memory card housed in the test slot 5111 in accordance with the elastic force of the spring. When the first socket body 5112 is lowered, the claw 512 is rotated to a position that does not hinder the memory card from being received through the test slot 5111.

The test board 513 (shown in "Fig. 7") supports the test socket 511. A plurality of test sockets 511 are disposed on the test board 513. The test socket 511 is formed in a row along the first axial direction (Y-axis direction) and the second axial direction (X-axis direction), and is disposed on the test board 513. A connecting pin (not shown) for electrically connecting to the test device T is disposed on the test board 513. The test board 513 is electrically connected to the connection member 5116 of the test socket 511. Therefore, the test device T can test the memory card stored in the test socket 511 through the connecting member 5116 and the connecting pin. The test board 513 as a whole may be formed in a rectangular plate shape.

Please refer to "1", "2", "7" and "8", and the test picker 52 (shown in "1") is in the buffer unit 4 and the test unit 51. Transfer the memory card between. The test picker 52 transports the memory card to be tested from the buffer unit 4 to the test unit 51. The test picker 52 transports the tested memory card from the test unit 51 to the buffer unit 4.

The test picker 52 moves in the first axial direction (Y-axis direction) and the second axial direction (X-axis direction) in order to perform the process of transporting the memory card. The test picker 52 can be moved within the test area B (shown in "Fig. 2"). The test unit 51 is located within the test area B. The test picker 52 picks up the memory card to be tested from the buffer portion 4 located in the test area B, and then stores the picked-up memory card on the test unit 51. The test picker 52 picks up the tested memory card from the test unit 51, and then stores the picked-up memory card in the buffer portion 4 located inside the test area B. The test picker 52 can be lifted and lowered to perform a process of picking up a memory card and a process of accommodating a memory card. The test portion 5 may include a driving unit (not shown) that moves the test picker 52 toward the first axial direction (Y-axis direction) and the second axial direction (X-axis direction), and causes the test to be picked up The device 52 is raised and lowered. The drive unit can be a cylinder type using a hydraulic cylinder or an air cylinder, a gear type using a motor, a rack and a pinion, a ball screw type using a motor and a ball screw, and a belt using a motor, a pulley, and a belt. The test picker 52 is moved and raised and lowered by means of a linear motor or the like.

Please refer to "1", "2", "7" to "10", and the test unit 5 includes an opening and closing for moving the claw 512 (shown in "Fig. 8"). Unit 53 (shown in "Figure 7").

The opening and closing unit 53 can move the claw 512 to open the test slot 5111. In a state where the test slot 5111 is open, the test picker 52 can store the memory card M to be tested (shown in "Fig. 9") in the test socket 511. In a state where the test slot 5111 is open, the test picker 52 can pick up the tested memory card M from the test socket 511.

The opening and closing unit 53 can move the claw 512 to close the test slot 5111. In a state where the test slot 5111 is closed, the claw 512 can press the memory card M housed in the test socket 511. Therefore, the memory card M accommodated in the test socket 511 is connected to the test device T (shown in "Fig. 7") for testing. The opening and closing unit 53 includes an opening and closing mechanism 531, a first moving mechanism 532 (shown in "Fig. 7"), and a second moving mechanism 533 (shown in "Fig. 7").

The opening and closing mechanism 531 can raise and lower the first socket body 5112. As shown in FIG. 9, when the opening and closing mechanism 531 lowers the first socket main body 5112, the claw 512 is rotated to open the test slot 5111. As shown in FIG. 10, when the opening and closing mechanism 531 is separated from the first socket main body 5112, the claw 512 is rotated to close the test slot 5111. The opening and closing mechanism 531 may include a plurality of through holes 5311. When the opening and closing mechanism 531 lowers the first socket main body 5112, the through holes 5311 are respectively located at positions corresponding to the test grooves 5111. Thereby, in a state where the opening and closing mechanism 531 lowers the first socket main body 5112, the test picker 52 can store the memory card M in the test socket 511 through the through hole 5311. Further, in a state where the opening and closing mechanism 531 causes the first socket main body 5112 to descend, the test picker 52 can pick up the memory card M from the test socket 511 through the through hole 5311. The opening and closing mechanism 531 as a whole can be formed in a rectangular plate shape.

The first moving mechanism 532 (shown in "Fig. 7") is used for the elevation opening and closing mechanism 531. When the first moving mechanism 532 lowers the opening and closing mechanism 531, the opening and closing mechanism 531 causes the first socket main body 5112 to descend. Therefore, the claw 512 is rotated to open the test slot 5111. When the first moving mechanism 532 causes the opening and closing mechanism 531 to rise, the opening and closing mechanism 531 is separated from the first socket main body 5112. Therefore, the claw 512 is rotated to close the test slot 5111. The first moving mechanism 532 can be a cylinder type using a hydraulic cylinder or an air cylinder, a gear type using a motor, a rack and a pinion, a ball screw type using a motor and a ball screw, a motor and a pulley, and a belt. The opening and closing mechanism 531 is lifted and lowered by a belt type or the like using a linear motor.

The second moving mechanism 533 (shown in "Fig. 7") moves the opening and closing mechanism 531 in the first axial direction (Y-axis direction). A plurality of test units 51 are coupled to the test board 513 in the first axial direction (Y-axis direction). The second moving mechanism 533 moves the opening and closing mechanism 531 in the first axial direction (Y-axis direction) so that the opening and closing mechanism 531 selects a part of the test unit 51 to open and close. Therefore, during the test process of the memory card M stored in a part of the test unit 51, the test picker 52 can perform the process of accommodating the memory card M on the other test units 51 or pick up the memory card M from the other test unit 51. Process. Therefore, the test sorter 1 for a memory card according to the present invention can use an opening and closing mechanism 531 in common for a plurality of test units 51, thereby reducing the number of opening and closing mechanisms 531. Therefore, the test sorter 1 for a memory card according to the present invention can reduce the material cost and can reduce the manufacturing cost of the entire apparatus.

A first moving mechanism 532 can be coupled to the second moving mechanism 533. The second moving mechanism 533 moves the first moving mechanism 532 toward the first axial direction (Y-axis direction), thereby moving the opening and closing mechanism 531 toward the first axial direction (Y-axis direction). The second moving mechanism 533 can be a cylinder type using a hydraulic cylinder or an air cylinder, a gear type using a motor, a rack, a pinion, or the like, a ball screw type using a motor and a ball screw, a motor, a pulley, and a belt. The first moving mechanism 532 is moved in the first axial direction (Y-axis direction) by a belt type or the like using a linear motor.

Here, please refer to "Fig. 2" and "Fig. 7". The test unit 5 can be in the first test area B1 (shown in "Fig. 2") and the second test area B2 (in Fig. 2). A plurality of test units 51 are respectively disposed within the middle of the display. The first test area B1 and the second test area B2 are spaced apart by a predetermined interval in the second axial direction (X-axis direction). At this time, the buffer unit 4 includes: a first buffer mechanism 41a (shown in "second diagram") for transporting the memory card between the tray area A and the first test area B1; and a second buffer mechanism 41b (shown in "Fig. 2") for transporting the memory card between the tray area A and the second test area B2. The test unit 5 includes a first test picker 52a (shown in FIG. 2), and transfers the memory between the test unit 51 and the first buffer mechanism 41a disposed in the first test area B1. The card and a second test picker 52b (shown in "Fig. 2") transport the memory card between the test unit 51 and the second buffer mechanism 41b disposed in the second test area B2. Therefore, the test sorter 1 for a memory card according to the present invention can have the following effects.

First, the test sorting machine 1 for a memory card according to the present invention, the test unit 51 respectively disposed in the first test area B1 and the second test area B2 with respect to one tray unit 2 can perform the memory separately Card testing process. Therefore, even if any one of the test unit 51 disposed within the first test area B1 or the test unit 51 disposed within the second test area B2 malfunctions, the test score for the memory card according to the present invention is The sorting machine 1 can also perform a test process on the memory card by using the test unit 51 disposed in the first test area B1 or the test unit 51 provided in the second test area B2 without any malfunction. . Therefore, the test sorter 1 for a memory card according to the present invention can continuously perform a test process on a memory card, thereby enabling a test process to be performed on more memory cards in a short time.

Secondly, in the test sorting machine 1 for a memory card according to the present invention, the first buffer mechanism 41a and the first test picker 52a can perform the process of transporting the memory card with respect to one tray portion 2, independently of this. The second buffer mechanism 41b and the second test picker 52b can perform the process of transporting the memory card. Therefore, even if the first buffer mechanism 41a and the first test picker 52a or the second buffer mechanism 41b and the second test picker 52b malfunction, the test card sorting machine 1 for a memory card according to the present invention It is also possible to perform a transport process on the memory card by using any one of the first buffer mechanism 41a and the first test picker 52a or the second buffer mechanism 41b and the second test picker 52b. Therefore, the test sorter 1 for a memory card according to the present invention can continuously execute the process of transporting the memory card between the tray unit 2, the buffer unit 4, and the test unit 5, thereby enabling execution of more memory cards in a short time. Test procedure.

Third, the time required for the test device T to test the memory card is compared with that required when the pickup picker 3 and the test picker 52 transfer the memory card between the tray portion 2, the buffer portion 4, and the test portion 5. long time. Therefore, for one tray portion 2, if there is only one of the test unit 51 disposed within the first test area B1 or the test unit disposed within the second test area B2, up to the test equipment When the test of the memory card is completed, the time during which the picker 3 and the test picker 52 stand by will occur.

The test card sorting machine 1 for a memory card according to the present invention, the first buffer mechanism 41a, the test point unit 51 disposed in the first test area B1, and the first test picker 52a can form a system to The process of transferring the memory card between the tray unit 2 and the test unit 5 and the process of testing the memory card are performed. In addition, the test card sorting machine 1 for a memory card according to the present invention, the first driving mechanism 42a, the test point unit 51 and the second test picker 52b disposed in the second test area B2 can form a system. The process of transferring the memory card between the tray unit 2 and the test unit 5 and the process of testing the memory card are performed. Therefore, the test sorter 1 for a memory card according to the present invention can shorten the standby time for transporting the picker 3 and the test picker 52. Therefore, the test sorter 1 for a memory card according to the present invention can perform a test process and a sorting process for a plurality of memory cards in a short time.

Referring to "Fig. 2" and "Fig. 7", a test plate 513 spaced apart from the second axial direction (X-axis direction) by a predetermined interval is disposed in the first test area B1. Therefore, the test unit 51 is disposed inside the first test region B1 so as to form a matrix in the first axial direction (Y-axis direction) and the second axial direction (X-axis direction). The first test picker 52a moves within the first test area B1. The first test picker 52a is in the first buffer mechanism 41a and the test unit 51 disposed in the first test area B1. Transfer the memory card between. The buffer unit 4 includes a plurality of first buffer mechanisms 41a. The first buffer mechanism 41a is disposed at a predetermined interval in the second axial direction (X-axis direction). The buffer portion 4 includes a plurality of first drive mechanisms 42a that move the first shock absorbing mechanism 41a in the first axial direction (Y-axis direction). The first drive mechanism 42a causes the first buffer mechanism 41a to move between the tray area A and the first test area B1. The transport picker 3 transports the memory card between the tray unit 2 and the first buffer mechanism 41a located inside the tray area A. The first test picker 52a transports the memory card between the test unit 51 located within the first test area B1 and the first buffer mechanism 41a located within the first test area B1. The first test picker 52a includes: a first test nozzle (not shown) for absorbing the memory card; and a first column spacing adjustment unit (not shown) for adjusting the column direction of the first test nozzle ( X-axis direction) spacing. An opening and closing unit 53 is disposed on each of the test boards 513 disposed in the first test area B1.

Referring to "Fig. 2" and "Fig. 7", a test plate 513 is disposed at a predetermined interval in the second axial direction (X-axis direction) within the second test area B2. Therefore, the test unit 51 is disposed inside the second test region B2 so as to form a matrix in the first axial direction (Y-axis direction) and the second axial direction (X-axis direction). The second test picker 52b moves within the second test area B2. The second test picker 52b transports the memory card between the second buffer mechanism 41b and the test unit 51 disposed within the second test area B2. The buffer unit 4 includes a plurality of second buffer mechanisms 41b. The second buffer mechanism 41b is disposed at a predetermined interval in the second axial direction (X-axis direction). The buffer portion 4 includes a plurality of second drive mechanisms 42b that move the second shock absorbing mechanism 41b in the first axial direction (Y-axis direction). The second drive mechanism 42b causes the second buffer mechanism 41b to move between the tray area A and the second test area B2. The transport picker 3 transports the memory card between the tray unit 2 and the second buffer mechanism 41b located inside the tray area A. The second test picker 52b transports the memory card between the test unit 51 located within the second test area B2 and the second buffer mechanism 41b located within the second test area B2. The second test picker 52b includes: a second test nozzle (not shown) for absorbing the memory card; and a second column pitch adjusting unit (not shown) for adjusting the column direction of the second test nozzle (X-axis direction) spacing. An opening and closing unit 53 is disposed on each of the test boards 513 disposed in the second test area B2.

Here, the memory card can be stored in the tray unit 2 by being stored in different supply trays according to product information. The product information may include at least one of a memory card vendor information, a memory card type, and a memory card specification. The supply tray is supplied to the tray unit 2, that is, the memory card having the first product information is preferentially transported from the tray unit 2 to the test unit 5, and then the memory card having the second product information is transported from the tray unit 2 to Test section 5. Therefore, the memory card having the first product information can be preferentially classified and stored in the storage tray according to the test result, and then the memory card having the second product information can be classified and stored in the storage tray according to the test result. The memory card having the first product information and the memory card having the second product information are housed in different storage trays so as to be able to be delivered separately by the storage tray. Here, if the time required to test the memory card having the first product information is longer than that required to test the memory card having the second product information, the first product information may be mixed and stored on the buffer portion 4. Memory card and memory card with second product information. Therefore, there is a problem that the memory card having the first product information is mixed with the memory card having the second product information. In order to solve these problems, the test card sorting machine 1 for a memory card according to the present invention includes a reading unit 6 (shown in "Fig. 11") for obtaining product information of the memory card M.

Referring to "Fig. 11", the reading unit 6 reads a barcode (not shown) formed on the memory card M, thereby obtaining product information of the memory card M. The reading unit 6 can supply the obtained product information to the transport picker 3. The conveyance picker 3 can convey the tested memory card M accommodated in the buffer unit 4 to the storage tray by product information.

For example, the transport picker 3 can preferentially store all the memory cards M having the first product information in the tested memory card M on the storage tray, and then store the memory card M having the second product information on the storage tray. . The test sorter 1 for a memory card according to the present invention includes a storage unit (not shown) for storing the number of products corresponding to product information and product information of the memory card supplied to the tray unit 2. The transport picker 3 can preferentially transport the memory card M having the first product information in the tested memory card M from the buffer unit 4 to the storage tray for transport to the memory card having the first product information on the storage tray. The number of M reaches the number of memory cards M having the first product information stored in the storage unit. When all the memory cards M having the first product information are stored in the storage tray according to the test results, the storage trays are replaced by the empty storage trays. Thereafter, the transport picker 3 stores the memory card M having the second product information on the replaced storage tray. Therefore, the test sorter 1 for a memory card according to the present invention can separate the memory cards M having different product information from each other by the storage tray.

Referring to "Fig. 11", the reading unit 6 can be disposed on the transport picker 3. Before the pick-up picker 3 picks up the memory card M stored in the buffer unit 4, the reading unit 6 moves the product information obtained from the memory card M stored in the buffer unit 4. The number of the reading portions 6 that are the same as the number of the memory cards M accommodated in the buffer portion 4 in the second axial direction (X-axis direction) can be disposed in the transport picker 3. For example, as shown in FIG. 11, eight memory cards M can be accommodated in the buffer portion 4 in the second axial direction (X-axis direction), and the transport picker 3 can be along the second axis direction ( Eight reading units 6 are provided in the X-axis direction. Therefore, when the conveyance picker 3 moves toward the first axial direction (Y-axis direction), the reading portion 6 can be obtained on the buffer portion 4 in the first axial direction (Y-axis direction) and the second axial direction (X The axial direction is the product information of the memory card M that is stored in a matrix. The reading unit 6 can be disposed on the moving picker 3 so as to be spaced apart from the moving nozzle 31 by a predetermined distance in the first axial direction (Y-axis direction).

Referring to Fig. 12, the test sorter 1 for a memory card according to the present invention includes an image portion 7 for performing a visual inspection on the memory card M.

The image portion 7 can take a memory card M located on the test unit 51 to obtain an inspection image regarding the memory card M. The image portion 7 performs visual inspection of the memory card M by comparing the obtained inspection image with a standard image. The standard image is an image of the memory card M in a normal state. The target is stored in the image portion 7. Quasi-image. The image portion 7 may include a charge-coupled device (CCD) camera for capturing the memory card M located on the test unit 51. The image portion 7 can also capture a claw 512 (shown in "Fig. 8") provided in the test socket 511 to obtain an inspection image relating to the claw 512. Therefore, the image portion 7 can also perform an appearance check regarding the damage of the claw 512. The image portion 7 can also obtain an inspection image including the memory card M pressed by the image portion 7 and the claws 512.

Referring to FIG. 12, the image portion 7 can be disposed on the test picker 52. The test picker 52 is moved to pick up the inspection image from the memory card M housed on the test unit 51 before picking up the memory card M stored on the test unit 51. The image pickup unit 5 may be provided with the same number of image portions 7 as the number of the memory cards M accommodated in the second axial direction (X-axis direction) on the test unit 51. For example, as shown in FIG. 12, eight memory cards M may be accommodated in the second axis direction (X-axis direction) on the test unit 51, and in the second axis direction on the test picker 52 ( Eight image portions 7 are provided in the X-axis direction. Therefore, when the test picker 52 is moved toward the first axial direction (Y-axis direction), the image portion 7 can be obtained in the first axial direction (Y-axis direction) and the second axial direction (X-axis direction) in the test unit 51. The inspection image of the memory card M accommodated in the row and the row is formed. The image unit 7 is disposed on the test picker 52 so as to be spaced apart from the test nozzle 521 by a predetermined pitch in the first axial direction (Y-axis direction). When the test portion 5 includes a plurality of test pickers 52, the image pickup portion 5 may be provided in the test picker 52, respectively. The image portion 7 can supply the inspection result regarding the memory card M to the transport picker 3. Carrying and picking up The memory 3 separates and stores the memory card M on the storage tray based on the inspection result supplied from the image unit 7.

Please refer to FIG. 13 and FIG. 14 . The test sorter 1 for a memory card according to the present invention includes a sensor unit 8 for obtaining status information of the memory card M located on the test unit 51.

The sensor unit 8 can obtain status information of the memory card M housed in the test unit 51. The status information may be a state in which two or more memory cards M combined with each other are stored in the test unit 51, a state in which the memory card M is tilted and stored on the test unit 51, and the like. As shown in "Fig. 14", when two or more memory cards M combined with each other are stored in the test unit 51, the test picker 52 (shown in "Fig. 13") can hold the memory card M. The self-test socket 511 is picked up and transported to the buffer unit 4 (shown in FIG. 1) to prevent the test process from being performed on the memory card M. The transport picker 3 can store two or more memory cards M coupled to each other on a separate storage tray. Although not shown, when the memory card M is obliquely stored in the test socket 511, the test picker 52 can pick up the memory card M and then re-storage it into the test socket 511.

Referring to "Fig. 13" and "Fig. 14", the sensor portion 8 can be disposed on the test picker 52. The test picker 52 can be moved before the test process is performed on the memory card M housed on the test unit 51 so that the sensor section 8 obtains state information about the memory card M housed on the test unit 51. The test picker 52 may be disposed to be accommodated in the second axial direction (X-axis direction) on the test unit 51. The number of memory cards M is the same number of sensor sections 8. For example, as shown in FIG. 13, eight memory cards M are accommodated in the second axial direction (X-axis direction) on the test unit 51, and in the second axial direction on the test picker 52 (X) In the axial direction, eight sensor sections 8 are provided. Therefore, when the test picker 52 is moved toward the first axial direction (Y-axis direction), the sensor portion 8 can be obtained in the first axial direction (Y-axis direction) and the second axial direction on the test unit 51 (X The axis direction is the state information of the memory card M which is formed in a row and is accommodated. The sensor portion 8 is disposed on the test picker 52 from the test nozzle 521 at a predetermined interval from the first axial direction (Y-axis direction). When the test portion 5 includes a plurality of test pickers 52, the sensor portions 8 may be separately provided in the test picker 52. The sensor section 8 can provide status information about the memory card M to the test picker 52.

Referring to FIG. 13 and FIG. 14, the sensor unit 8 may include a light-emitting sensor 81 (shown in FIG. 14) facing the memory card M located on the test unit 51. Emitting light; a light receiving sensor 82 (shown in "Fig. 14") for receiving light emitted by the light emitting sensor 81; and a detecting unit 83 for obtaining light by the light received by the light sensor The status information of the memory card M on the test unit 51.

The light-emitting sensor 81 and the light-receiving sensor 82 may be spaced apart from each other by a predetermined distance. The light emitted by the illuminating sensor 81 can be reflected by the memory card M and then received by the light receiving sensor 82. The light sensor 82 can use the light emitted by the light-emitting sensor 81 to pass through the light-receiving sensor 82 for the required time to obtain the state information of the memory card M. When two or more memory cards M combined with each other are accommodated in the test socket 511, the light-receiving sensor 82 receives light emitted from the light-emitting sensor 81 as compared with when the memory card M is housed in the test socket 511. The time required is reduced. Thereby, the detecting unit 83 can confirm that the memory card M is in a state in which two or more are coupled to each other and housed in the test socket 511. The detecting unit 83 can also use the amount of light received by the light receiving sensor 82 to obtain status information about the memory card M housed in the test socket 511. When the memory card M is obliquely stored in the test socket 511, the amount of light emitted from the light-emitting sensor 81 received by the light-receiving sensor 82 is reduced as compared with when the memory card M is normally stored in the test socket 511. Thereby, the detecting unit 83 can confirm that the memory card M is in a state of being stored in the test socket 511 obliquely. The detecting unit 83 can supply status information about the memory card M to the test picker 52.

The invention described above is not limited to the above-described embodiments and the accompanying drawings, and various alternatives, modifications and changes can be made without departing from the spirit and scope of the invention.

1. . . Memory card tester

2. . . Tray section

3. . . Transport picker

4. . . Buffer section

5. . . Testing Division

6. . . Reading unit

7. . . Image department

8. . . Sensor section

twenty one. . . Loading stack

22‧‧‧Unloading the stack

31‧‧‧Transport nozzle

32‧‧‧ line spacing adjustment unit

33‧‧‧ Subject

41‧‧‧buffering mechanism

41a‧‧‧First buffer mechanism

41b‧‧‧Second buffer mechanism

42‧‧‧ drive mechanism

42a‧‧‧First drive mechanism

42b‧‧‧second drive mechanism

51‧‧‧Test unit

52‧‧‧Test picker

52a‧‧‧First test picker

52b‧‧‧Second test picker

53‧‧‧Opening and closing unit

81‧‧‧Lighting sensor

82‧‧‧Photodetector

83‧‧‧Detection unit

321‧‧‧First cam plate

322‧‧‧First lifting unit

411‧‧‧buffer tank

511‧‧‧ test socket

512‧‧‧ jaws

513‧‧‧ test board

521‧‧‧Test nozzle

522‧‧‧column spacing adjustment unit

523‧‧‧ Subject

531‧‧‧Opening and closing agency

532‧‧‧First mobile agency

533‧‧‧Second mobile agency

3211‧‧‧First cam groove

5111‧‧‧ test slot

5112‧‧‧First socket body

5113‧‧‧Second socket body

5114‧‧‧Support parts

5115‧‧‧Flexible parts

5116‧‧‧Connecting parts

5221‧‧‧2nd cam plate

5221a‧‧‧second cam groove

5222‧‧‧Second lifting unit

5311‧‧‧through holes

A‧‧‧Tray area

B. . . Test area

T. . . Test Equipment

M. . . Memory card

B1. . . First test area

B2. . . Second test area

1 is a schematic plan view of a test sorter for a memory card according to the present invention;

2 is a conceptual plan view for explaining a tray area and a test area according to the present invention;

3 and 4 are schematic side views of the transport picker according to the present invention;

Figure 5 is a schematic perspective view of the test picker according to the present invention;

Figure 6 is a schematic plan view of a buffer portion according to the present invention;

Figure 7 is a schematic perspective view of the test unit and the opening and closing unit according to the present invention;

8 to 10 are schematic side cross-sectional views taken along the line I-I of Fig. 7 for explaining the operational relationship between the test unit and the opening and closing unit according to the present invention;

Figure 11 is a conceptual plan view for explaining a reading portion according to the present invention;

Figure 12 is a conceptual plan view for explaining an image portion according to the present invention;

Figure 13 is a conceptual top view for explaining a sensor portion of the present invention;

Figure 14 is a schematic side cross-sectional view for explaining the operational relationship of the sensor portion of the present invention.

1. . . Memory card tester

2. . . Tray section

3. . . Transport picker

4. . . Buffer section

5. . . Testing Division

twenty one. . . Loading stack

twenty two. . . Unloading the stack

41. . . Buffer mechanism

42. . . Drive mechanism

51. . . Test unit

52. . . Test picker

Claims (11)

A test card sorting machine for a memory card, comprising: a tray portion disposed in a tray area, the tray area is provided with a supply tray for accommodating a memory card to be tested, and the test is classified according to the test result. a plurality of storage trays of the memory card; a test unit comprising a plurality of test units for testing the memory card, respectively disposed in the first test area and the second test area of one of the test procedures for performing the test memory card There is a test unit; a buffer portion is disposed between the tray portion and the test portion, and includes a first buffer mechanism and a second buffer mechanism, wherein the first buffer mechanism is in the tray region and the first buffer mechanism Moving between the test areas to carry the memory card, the second buffer mechanism moves between the tray area and the second test area to carry the memory card; and a transport picker is attached to the first buffer mechanism Transferring a memory card between the tray portions, and transferring a memory card between the second buffer mechanism and the tray portion; the test portion includes transferring the memory between the test unit and the buffer portion a plurality of test pickers, wherein the test portion includes a first test picker and a second test picker, the first test picker is disposed in the test unit disposed within the first test area The first buffer mechanism transports the memory card, and the second test picker transports the memory card between the test unit disposed in the second test area and the second buffer mechanism. The test card sorting machine for a memory card according to Item 1, wherein the transport picker includes a plurality of transport nozzles for adsorbing the memory card, and for adjusting a pitch of the transport nozzles. a line spacing adjustment unit; the first test picker includes a plurality of first test nozzles for adsorbing the memory card, and a first column spacing adjustment unit for adjusting the direction spacing of the first test nozzles The second test picker includes a plurality of second test nozzles for adsorbing the memory card, and a second column pitch adjusting unit for adjusting the direction spacing of the second test nozzles. A test card sorting machine for a memory card, comprising: a tray portion, a supply tray for accommodating a memory card to be tested, and a plurality of storage trays for storing the tested memory card according to the test result; The part includes a plurality of test units for testing the memory card; a buffer portion is disposed between the tray portion and the test portion, and includes a first buffer mechanism and a second buffer mechanism, the first buffer The mechanism moves between the tray area and the first test area to carry the memory card, the second buffer mechanism moves between the tray area and the second test area to carry the memory card; and a transport picker A memory card is transported between the buffer portion and the tray portion; wherein the test portion includes a plurality of test pickers for transporting a memory card between the test unit and the buffer portion. The test card sorting machine for a memory card according to Item 3, wherein the transport picker includes a plurality of transport nozzles for adsorbing the memory card, and for adjusting a pitch of the transport nozzles. a row spacing adjustment unit; the test pickers respectively comprise a plurality of test nozzles for absorbing the memory card, and a column spacing adjustment unit for adjusting the direction spacing of the test nozzles. The test card sorting machine for a memory card according to claim 1 or 3, further comprising a reading unit, the reading unit being disposed on the transport picker for reading on the memory card Obtaining the product information of the memory card by the barcode formed thereon; wherein the transport picker transfers the tested memory card stored in the buffer portion from the buffer portion to the storage tray by using the product information obtained by the reading portion . The test card sorting machine for a memory card according to claim 5, wherein the reading unit obtains product information, the product information including at least one of a memory card vendor information, a memory card type, and a memory card specification, The transport picker transports the tested memory card from the buffer unit to the storage trays so that the tested memory cards are stored on the storage trays according to the product information. The test card sorting machine for a memory card according to Item 1 or Item 3, further comprising an image portion, wherein the image portion captures a memory card located on the test unit to perform a visual inspection on the memory card , The image portions are respectively disposed on each of the test pickers. The test card for a memory card according to the above item 1 or 3, further comprising a sensor portion, wherein the sensor portion is configured to obtain status information of the memory card in the test unit, wherein the The sensor portion is disposed on each of the test pickers. The test card for a memory card according to claim 8, wherein the sensor portion comprises: a light-emitting sensor that emits light toward a memory card located in the test unit; and a light-receiving sensor For receiving light emitted by the illuminating sensor; and a detecting unit, using the light received by the photodetector to obtain status information of the memory card located in the testing unit. The test card for a memory card according to claim 1 or 3, wherein the test unit comprises: a test socket for accommodating a memory card; and a claw movably coupled to the test The test socket is connected such that the memory card received in the test socket is connected to the test device. The test card for a memory card according to claim 10, wherein the test socket includes a test slot for accommodating a memory card; the test portion includes an opening and closing for moving the claw to open and close the test slot a mechanism in which a plurality of through holes for passing the test pickers are formed, The test pickers perform the process of accommodating the memory card in the test slot and the process of picking up the memory card from the test slot through the through holes.