CN108636828A - A kind of intelligence control system of test machine - Google Patents
A kind of intelligence control system of test machine Download PDFInfo
- Publication number
- CN108636828A CN108636828A CN201810365857.1A CN201810365857A CN108636828A CN 108636828 A CN108636828 A CN 108636828A CN 201810365857 A CN201810365857 A CN 201810365857A CN 108636828 A CN108636828 A CN 108636828A
- Authority
- CN
- China
- Prior art keywords
- chip
- sorting
- testing
- magazine
- test machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C2301/00—Sorting according to destination
- B07C2301/0008—Electronic Devices, e.g. keyboard, displays
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of intelligence control systems of test machine, system and transport mechanism are managed including IC chip testing, sorting, wherein, the transport mechanism includes magazine transport vehicle and the manipulator for carrying IC chip magazine being arranged on magazine transport vehicle, and barcode scanner is provided on the manipulator；The feed mechanism of testing, sorting board is taken out and be sent to IC chip to be tested by the transport mechanism from chip library to be measured, while scanning the bar code on IC chip magazine to be tested and scanning result is transmitted to IC chip testing, sorting and managing system；IC chip testing, sorting manages system according to the transport mechanism scanning information received, recalls corresponding testing, sorting program, and by testing, sorting program transportation to the PLC of testing, sorting board；After the completion of generation, the IC chip after sorting is respectively sent to non-defective unit library and defective products library by transport mechanism.
Description
Technical field
The present invention relates to a kind of intelligence control systems of test machine.
Background technology
When network, telecommunications and various consumer electronics occupy each corner of people's life, everything base is established
The semiconductor industry of plinth undoubtedly becomes the developing most important thing of national science and technology.What these microelectronic industries largely used
IC chip has the characteristics that small, easy to carry, cheap, is widely used in all types of industries electronic equipment, various households
Electric appliance, instrument etc..
After the completion of IC chip manufacture, needs to be detected it, sort.It is higher and higher with the integrated level of electronic product,
It is also increasing to the demand of IC chip.The quality of IC chip will influence the quality of entire electronic product, so IC chip
Testing, sorting is highly important process.
Although being designed currently, IC chip testing, sorting largely uses the advanced chip testing sorting based on PLC,
It is relatively simple in function, during actually generating, is still required for test job personnel in each model even each batch
IC chip testing, sorting forward stroke sequence pre-set and pre-debug work.This generation working method not only needs to consume people
Power is also easy to cause artificial mistake.
Invention content
The technical problem to be solved by the present invention is to：A kind of intelligence control system substituting artificial test machine is provided.
The present invention uses following technical scheme to solve above-mentioned technical problem：
The present invention provides a kind of intelligence control system of test machine, including IC chip testing, sorting management system and conveyer
Structure, wherein the transport mechanism include magazine transport vehicle and be arranged on magazine transport vehicle for carrying IC chip magazine
Manipulator, be provided with barcode scanner on the manipulator；The transport mechanism is by IC chip to be tested from core to be measured
The feed mechanism of testing, sorting board is taken out and be sent in valut, while scanning the bar code on IC chip magazine to be tested
And scanning result is transmitted to IC chip testing, sorting and manages system；IC chip testing, sorting manages system according to the biography received
Mechanism scanning information is sent, recalls corresponding testing, sorting program, and by testing, sorting program transportation to testing, sorting board
PLC；After the completion of generation, the IC chip after sorting is respectively sent to non-defective unit library and defective products library by transport mechanism.
As a further optimization solution of the present invention, the IC chip material to placing thereon is provided on the magazine transport vehicle
The magazine fixing device that box is fixed.
As a further optimization solution of the present invention, it is provided with obstacle avoidance apparatus on the magazine transport vehicle.
As a further optimization solution of the present invention, the obstacle avoidance apparatus is laser obstacle avoidance module.
As a further optimization solution of the present invention, multiple placement IC chip magazines are provided on the magazine transport vehicle
Magazine transports position.
The present invention has the following technical effects using above technical scheme is compared with the prior art：
The present invention manages allotment of the system to testing, sorting program by IC chip testing, sorting, is formed to testing, sorting program
Accurate selection, improves testing, sorting efficiency.Non-defective unit after carrying out IC chip to be measured present invention employs transport mechanism and sort
With the transmission of defective products, production safety coefficient is improved；Reduce the labor intensity of labourer.
Specific implementation mode
Embodiments of the present invention are described below in detail, and the embodiment described is exemplary, are only used for explaining this
Invention, and be not construed as limiting the claims.
Those skilled in the art of the present technique it is understood that unless expressly stated, singulative " one " used herein,
"one", " described " and "the" may also comprise plural form.It is to be further understood that used in the specification of the present invention
Wording " comprising " refers to that there are the feature, integer, step, operation, element and/or component, but it is not excluded that in the presence of or add
Add other one or more features, integer, step, operation, element, component and/or their group.It should be understood that when we claim
Element is " connected " or when " coupled " to another element, it can be directly connected or coupled to other elements, or can also deposit
In intermediary element.In addition, " connection " used herein or " coupling " may include being wirelessly connected or coupling.Wording used herein
"and/or" includes any cell of one or more associated list items and all combines.
Those skilled in the art of the present technique are it is understood that unless otherwise defined, all terms used herein（Including skill
Art term and scientific terminology）With meaning identical with the general understanding of the those of ordinary skill in fields of the present invention.Also
It should be understood that those terms such as defined in the general dictionary should be understood that with in the context of the prior art
The consistent meaning of meaning, and unless defined as here, will not be explained with the meaning of idealization or too formal.
Technical scheme of the present invention is described in further detail below：
The present invention provides a kind of intelligence control system of test machine, including IC chip testing, sorting management system and conveyer
Structure, wherein the transport mechanism include magazine transport vehicle and be arranged on magazine transport vehicle for carrying IC chip magazine
Manipulator, be provided with barcode scanner on the manipulator；The transport mechanism is by IC chip to be tested from core to be measured
The feed mechanism of testing, sorting board is taken out and be sent in valut, while scanning the bar code on IC chip magazine to be tested
And scanning result is transmitted to IC chip testing, sorting and manages system；IC chip testing, sorting manages system according to the biography received
Mechanism scanning information is sent, recalls corresponding testing, sorting program, and by testing, sorting program transportation to testing, sorting board
PLC；After the completion of generation, the IC chip after sorting is respectively sent to non-defective unit library and defective products library by transport mechanism.
Further, it is solid that the magazine that the IC chip magazine placed thereon is fixed is provided on the magazine transport vehicle
Determine device, to ensure that magazine transports the safety of process, IC chip offset caused by magazine transport vehicle is avoided to cause security risk.
Further, it is provided with multiple magazines for placing IC chip magazine on the magazine transport vehicle and transports position, Ke Yishi
It is transported while now once completing multiple magazines to the transport process of magazine.
Further, it is provided with obstacle avoidance apparatus on the magazine transport vehicle, being used for can in magazine transport vehicle transportational process
Timely avoiding obstacles avoid causing security risk.
The above, the only specific implementation mode in the present invention, but scope of protection of the present invention is not limited thereto, appoints
What is familiar with the people of the technology within the technical scope disclosed by the invention, it will be appreciated that expects transforms or replaces, and should all cover
Within the scope of the present invention, therefore, the scope of protection of the invention shall be subject to the scope of protection specified in the patent claim.
Claims (5)
1. a kind of intelligence control system of test machine, which is characterized in that manage system and transmission including IC chip testing, sorting
Mechanism, wherein the transport mechanism include magazine transport vehicle and be arranged on magazine transport vehicle for carrying IC chip material
The manipulator of box is provided with barcode scanner on the manipulator；The transport mechanism is by IC chip to be tested to be measured
The feed mechanism of testing, sorting board is taken out and be sent in chip library, while scanning the bar shaped on IC chip magazine to be tested
Scanning result is simultaneously transmitted to IC chip testing, sorting management system by code；IC chip testing, sorting manages system according to receiving
Transport mechanism scanning information, recalls corresponding testing, sorting program, and by testing, sorting program transportation to testing, sorting board
PLC；After the completion of generation, the IC chip after sorting is respectively sent to non-defective unit library and defective products library by transport mechanism.
2. a kind of intelligence control system of test machine according to claim 1, which is characterized in that on the magazine transport vehicle
It is provided with the magazine fixing device that the IC chip magazine placed thereon is fixed.
3. a kind of intelligence control system of test machine according to claim 1, which is characterized in that on the magazine transport vehicle
It is provided with obstacle avoidance apparatus.
4. a kind of intelligence control system of test machine according to claim 3, which is characterized in that the obstacle avoidance apparatus is sharp
Light obstacle avoidance module.
5. a kind of intelligence control system of test machine according to claim 1, which is characterized in that on the magazine transport vehicle
It is provided with multiple magazines for placing IC chip magazine and transports position.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810365857.1A CN108636828A (en) | 2018-04-23 | 2018-04-23 | A kind of intelligence control system of test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810365857.1A CN108636828A (en) | 2018-04-23 | 2018-04-23 | A kind of intelligence control system of test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108636828A true CN108636828A (en) | 2018-10-12 |
Family
ID=63747170
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810365857.1A Pending CN108636828A (en) | 2018-04-23 | 2018-04-23 | A kind of intelligence control system of test machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108636828A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5805472A (en) * | 1996-02-27 | 1998-09-08 | Kabushiki Kaisha Toshiba | Test handler for semiconductor devices |
| CN201522545U (en) * | 2009-06-11 | 2010-07-07 | 致茂电子(苏州)有限公司 | Independent testing machine station for testing semiconductor elements and test sorting system |
| CN102755964A (en) * | 2011-04-29 | 2012-10-31 | 未来产业株式会社 | Testing and classifying machine for memory cards |
| CN106249134A (en) * | 2016-09-22 | 2016-12-21 | 英华达（上海）科技有限公司 | Electronic product test production line and method of testing thereof |
| CN106444783A (en) * | 2016-11-15 | 2017-02-22 | 江苏智石科技有限公司 | Intelligent material box transport vehicle based on laser |
| CN106558504A (en) * | 2016-11-15 | 2017-04-05 | 江苏智石科技有限公司 | A kind of loading and unloading method for chip package |
| CN107030013A (en) * | 2015-12-09 | 2017-08-11 | 泰克元有限公司 | Semiconducter device testing separator and its information processing method |
-
2018
- 2018-04-23 CN CN201810365857.1A patent/CN108636828A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5805472A (en) * | 1996-02-27 | 1998-09-08 | Kabushiki Kaisha Toshiba | Test handler for semiconductor devices |
| CN201522545U (en) * | 2009-06-11 | 2010-07-07 | 致茂电子(苏州)有限公司 | Independent testing machine station for testing semiconductor elements and test sorting system |
| CN102755964A (en) * | 2011-04-29 | 2012-10-31 | 未来产业株式会社 | Testing and classifying machine for memory cards |
| CN107030013A (en) * | 2015-12-09 | 2017-08-11 | 泰克元有限公司 | Semiconducter device testing separator and its information processing method |
| CN106249134A (en) * | 2016-09-22 | 2016-12-21 | 英华达（上海）科技有限公司 | Electronic product test production line and method of testing thereof |
| CN106444783A (en) * | 2016-11-15 | 2017-02-22 | 江苏智石科技有限公司 | Intelligent material box transport vehicle based on laser |
| CN106558504A (en) * | 2016-11-15 | 2017-04-05 | 江苏智石科技有限公司 | A kind of loading and unloading method for chip package |
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|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20181012 |