CN108940902A - A kind of intelligent control method of test machine - Google Patents
A kind of intelligent control method of test machine Download PDFInfo
- Publication number
- CN108940902A CN108940902A CN201810365859.0A CN201810365859A CN108940902A CN 108940902 A CN108940902 A CN 108940902A CN 201810365859 A CN201810365859 A CN 201810365859A CN 108940902 A CN108940902 A CN 108940902A
- Authority
- CN
- China
- Prior art keywords
- chip
- sorting
- testing
- magazine
- control method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
Abstract
The invention discloses a kind of intelligent control method of test machine, specific steps are as follows: IC chip testing, sorting management system recalls IC chip to be tested from chip library to be measured according to production requirement；IC chip to be tested is transmitted on the feeding mechanism of testing, sorting board by transport mechanism, while scanning the bar code on IC chip magazine to be tested, and scanning result is transmitted to IC chip testing, sorting management system；IC chip testing, sorting management system recalls corresponding testing, sorting program according to the transport mechanism scanning information received, and by testing, sorting program transportation to the PLC of testing, sorting board；After the completion of production, the IC chip after sorting is respectively sent to non-defective unit library and defective products library by transport mechanism.
Description
Technical field
The present invention relates to a kind of intelligent control methods of test machine.
Background technique
When network, telecommunications and various consumer electronics occupy each corner of people's life, everything base is established
The semiconductor industry of plinth undoubtedly becomes the developing most important thing of national science and technology.What these microelectronic industries largely used
IC chip has the characteristics that small in size, easy to carry, cheap, is widely used in all types of industries electronic equipment, various households
Electric appliance, instrument etc..
After the completion of IC chip manufacture, needs to detect it, sort.As the integrated level of electronic product is higher and higher,
It is also increasing to the demand of IC chip.The quality of IC chip will affect the quality of entire electronic product, so IC chip
Testing, sorting is highly important process.
Although being designed currently, IC chip testing, sorting largely uses the advanced chip testing sorting based on PLC,
Be it is relatively simple in function, during actually generating, be still required test job personnel each model even each batch
IC chip testing, sorting forward stroke sequence pre-set and pre-debug work.This generation working method not only needs to consume people
Power is also easy to cause artificial mistake.
Summary of the invention
The technical problems to be solved by the present invention are: providing a kind of intelligent control method for substituting artificial test machine.
The present invention uses following technical scheme to solve above-mentioned technical problem:
The present invention provides a kind of intelligent control method of test machine, comprising the following specific steps
Step 1, IC chip testing, sorting management system is according to production requirement, by IC chip tune to be tested from chip library to be measured
Out；
Step 2, IC chip to be tested is transmitted on the feeding mechanism of testing, sorting board by transport mechanism, while being scanned to be measured
Bar code on the IC chip magazine of examination, and scanning result is transmitted to IC chip testing, sorting management system；
Step 3, IC chip testing, sorting management system recalls corresponding test point according to the transport mechanism scanning information received
Select program, and by testing, sorting program transportation to the PLC of testing, sorting board；
Step 4, after the completion of production, the IC chip after sorting is respectively sent to non-defective unit library and defective products library by transport mechanism.
As a further optimization solution of the present invention, the transport mechanism includes that magazine transport vehicle and setting are transported in magazine
On defeated vehicle for carrying the manipulator of IC chip magazine, be provided with barcode scanner on manipulator.
As a further optimization solution of the present invention, be provided on magazine transport vehicle to the IC chip magazine placed thereon into
The fixed device of the fixed magazine of row.
As a further optimization solution of the present invention, obstacle avoidance apparatus is provided on magazine transport vehicle.
As a further optimization solution of the present invention, obstacle avoidance apparatus is laser obstacle avoidance module.
As a further optimization solution of the present invention, multiple magazines for placing IC chip magazine are provided on magazine transport vehicle
Transport position.
The invention adopts the above technical scheme compared with prior art, has following technical effect that the present invention passes through IC core
Built-in testing sorts allotment of the management system to testing, sorting program, forms the accurate selection to testing, sorting program, improves survey
Try the efficiency of separation.Present invention employs the transmission that transport mechanism carries out non-defective unit and defective products after IC chip to be measured and sorting, mention
High production safety coefficient；Reduce the labor intensity of labourer.
Specific embodiment
Embodiments of the present invention are described below in detail, and the embodiment described is exemplary, are only used for explaining this
Invention, and be not construed as limiting the claims.
Those skilled in the art can understand that unless expressly stated, singular " one " used herein,
"one", " described " and "the" may also comprise plural form.It is to be further understood that used in specification of the invention
Wording " comprising " refers to that there are the feature, integer, step, operation, element and/or component, but it is not excluded that in the presence of or add
Add other one or more features, integer, step, operation, element, component and/or their group.It should be understood that when we claim
Element is " connected " or when " coupled " to another element, it can be directly connected or coupled to other elements, or can also deposit
In intermediary element.In addition, " connection " used herein or " coupling " may include being wirelessly connected or coupling.Wording used herein
"and/or" includes one or more associated any cells for listing item and all combinations.
Those skilled in the art can understand that unless otherwise defined, all terms used herein (including skill
Art term and scientific term) there is meaning identical with the general understanding of those of ordinary skill in fields of the present invention.Also
It should be understood that those terms such as defined in the general dictionary should be understood that have in the context of the prior art
The consistent meaning of meaning will not be explained in an idealized or overly formal meaning and unless defined as here.
Technical solution of the present invention is described in further detail below:
The present invention provides a kind of intelligent control method of test machine, comprising the following specific steps
Step 1, IC chip testing, sorting management system is according to production requirement, by IC chip tune to be tested from chip library to be measured
Out；
Step 2, IC chip to be tested is transmitted on the feeding mechanism of testing, sorting board by transport mechanism, while being scanned to be measured
Bar code on the IC chip magazine of examination, and scanning result is transmitted to IC chip testing, sorting management system；
Step 3, IC chip testing, sorting management system recalls corresponding test point according to the transport mechanism scanning information received
Select program, and by testing, sorting program transportation to the PLC of testing, sorting board；
Step 4, after the completion of production, the IC chip after sorting is respectively sent to non-defective unit library and defective products library by transport mechanism.
Further, transport mechanism include magazine transport vehicle and be arranged on magazine transport vehicle for carrying IC chip
The manipulator of magazine is provided with barcode scanner on manipulator.
Further, the fixed dress of magazine that the IC chip magazine placed thereon is fixed is provided on magazine transport vehicle
It sets, to guarantee that magazine transports the safety of process, the offset of IC chip caused by magazine transport vehicle is avoided to cause security risk.
Further, it is provided with multiple magazines for placing IC chip magazine on magazine transport vehicle and transports position, may be implemented one
The secondary transport process to magazine is completed to transport while multiple magazines.
Further, it is provided with obstacle avoidance apparatus on magazine transport vehicle, being used for can be timely in magazine transport vehicle transportational process
Avoiding obstacles avoid security risk.
The above, the only specific embodiment in the present invention, but scope of protection of the present invention is not limited thereto, appoints
What is familiar with the people of the technology within the technical scope disclosed by the invention, it will be appreciated that expects transforms or replaces, and should all cover
Within scope of the invention, therefore, the scope of protection of the invention shall be subject to the scope of protection specified in the patent claim.
Claims (6)
1. a kind of intelligent control method of test machine, which is characterized in that comprising the following specific steps
Step 1, IC chip testing, sorting management system is according to production requirement, by IC chip tune to be tested from chip library to be measured
Out；
Step 2, IC chip to be tested is transmitted on the feeding mechanism of testing, sorting board by transport mechanism, while being scanned to be measured
Bar code on the IC chip magazine of examination, and scanning result is transmitted to IC chip testing, sorting management system；
Step 3, IC chip testing, sorting management system recalls corresponding test point according to the transport mechanism scanning information received
Select program, and by testing, sorting program transportation to the PLC of testing, sorting board；
Step 4, after the completion of production, the IC chip after sorting is respectively sent to non-defective unit library and defective products library by transport mechanism.
2. a kind of intelligent control method of test machine according to claim 1, which is characterized in that the transport mechanism includes
Magazine transport vehicle and be arranged on magazine transport vehicle for carrying the manipulator of IC chip magazine, be provided with item on manipulator
Code scanner.
3. a kind of intelligent control method of test machine according to claim 1, which is characterized in that be arranged on magazine transport vehicle
There is the fixed device of magazine that the IC chip magazine placed thereon is fixed.
4. a kind of intelligent control method of test machine according to claim 1, which is characterized in that be arranged on magazine transport vehicle
There is obstacle avoidance apparatus.
5. a kind of intelligent control method of test machine according to claim 4, which is characterized in that obstacle avoidance apparatus is kept away for laser
Barrier module.
6. a kind of intelligent control method of test machine according to claim 1, which is characterized in that be arranged on magazine transport vehicle
There are multiple magazines for placing IC chip magazine to transport position.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810365859.0A CN108940902A (en) | 2018-04-23 | 2018-04-23 | A kind of intelligent control method of test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810365859.0A CN108940902A (en) | 2018-04-23 | 2018-04-23 | A kind of intelligent control method of test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108940902A true CN108940902A (en) | 2018-12-07 |
Family
ID=64498743
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810365859.0A Pending CN108940902A (en) | 2018-04-23 | 2018-04-23 | A kind of intelligent control method of test machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108940902A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111842184A (en) * | 2019-04-28 | 2020-10-30 | 深圳市聚飞光电股份有限公司 | Defective LED processing method, system, device and computer readable storage medium |
| CN112371535A (en) * | 2020-10-16 | 2021-02-19 | 南通斯康泰智能装备有限公司 | MC & QC AOI inspection equipment and inspection method thereof |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5805472A (en) * | 1996-02-27 | 1998-09-08 | Kabushiki Kaisha Toshiba | Test handler for semiconductor devices |
| CN201522545U (en) * | 2009-06-11 | 2010-07-07 | 致茂电子(苏州)有限公司 | Independent testing machine station for testing semiconductor elements and test sorting system |
| CN102755964A (en) * | 2011-04-29 | 2012-10-31 | 未来产业株式会社 | Testing and classifying machine for memory cards |
| CN106249134A (en) * | 2016-09-22 | 2016-12-21 | 英华达（上海）科技有限公司 | Electronic product test production line and method of testing thereof |
| CN106444783A (en) * | 2016-11-15 | 2017-02-22 | 江苏智石科技有限公司 | Intelligent material box transport vehicle based on laser |
| CN106558504A (en) * | 2016-11-15 | 2017-04-05 | 江苏智石科技有限公司 | A kind of loading and unloading method for chip package |
| CN107030013A (en) * | 2015-12-09 | 2017-08-11 | 泰克元有限公司 | Semiconducter device testing separator and its information processing method |
-
2018
- 2018-04-23 CN CN201810365859.0A patent/CN108940902A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5805472A (en) * | 1996-02-27 | 1998-09-08 | Kabushiki Kaisha Toshiba | Test handler for semiconductor devices |
| CN201522545U (en) * | 2009-06-11 | 2010-07-07 | 致茂电子(苏州)有限公司 | Independent testing machine station for testing semiconductor elements and test sorting system |
| CN102755964A (en) * | 2011-04-29 | 2012-10-31 | 未来产业株式会社 | Testing and classifying machine for memory cards |
| CN107030013A (en) * | 2015-12-09 | 2017-08-11 | 泰克元有限公司 | Semiconducter device testing separator and its information processing method |
| CN106249134A (en) * | 2016-09-22 | 2016-12-21 | 英华达（上海）科技有限公司 | Electronic product test production line and method of testing thereof |
| CN106444783A (en) * | 2016-11-15 | 2017-02-22 | 江苏智石科技有限公司 | Intelligent material box transport vehicle based on laser |
| CN106558504A (en) * | 2016-11-15 | 2017-04-05 | 江苏智石科技有限公司 | A kind of loading and unloading method for chip package |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111842184A (en) * | 2019-04-28 | 2020-10-30 | 深圳市聚飞光电股份有限公司 | Defective LED processing method, system, device and computer readable storage medium |
| CN112371535A (en) * | 2020-10-16 | 2021-02-19 | 南通斯康泰智能装备有限公司 | MC & QC AOI inspection equipment and inspection method thereof |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20181207 |