TW201423120A - Electronic component operation unit, operation method and operation apparatus applied thereof - Google Patents

Electronic component operation unit, operation method and operation apparatus applied thereof Download PDF

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TW201423120A
TW201423120A TW101146714A TW101146714A TW201423120A TW 201423120 A TW201423120 A TW 201423120A TW 101146714 A TW101146714 A TW 101146714A TW 101146714 A TW101146714 A TW 101146714A TW 201423120 A TW201423120 A TW 201423120A
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electronic component
transfer
image data
image capturing
place
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TW101146714A
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TWI465738B (en
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min-da Xie
rong-li Zhangjian
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Hon Tech Inc
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Abstract

Disclosed are an electronic component operation unit, an operation method and an operation apparatus applied thereof. At least a transfer placement apparatus, at least an operation section, at least an image capturing apparatus and a sampling comparison apparatus are provided on a machine table for the operation unit. The transfer placement apparatus is movable and transfers an electronic component to execute an operation to a position of the operation section. A holding base for placement of the electronic component is provided in the operation section so as to execute a preset operation for the electronic component. The image capturing apparatus captures images of the electronic component on the transfer placement apparatus in a path of moving the transfer placement apparatus or moving the holding base corresponding to the operation section, and transmits real-time video data obtained by capturing the images to the sampling comparison apparatus. The sampling comparison apparatus carries out comparison between the real-time video data and the sample video data stored in database, and further executes an alignment adjustment operation; accordingly, the real-time video data of the electronic component is acquired at the position above the holding base by the image capturing apparatus, and through the comparison by the sampling comparison apparatus, the electronic component on the transfer placement apparatus is placed in the holding base of the operation section accurately after the alignment adjustment operation is executed, such that practical effect of executing the operation effectively can be achieved.

Description

電子元件作業單元、作業方法及其應用之作業設備 Electronic component working unit, working method and working equipment thereof

本發明尤指其提供一種可使移載取放裝置上之電子元件精準對位放置於作業區之承置座內,進而有效執行作業之電子元件作業單元、作業方法及其應用之作業設備。 In particular, the present invention provides an operating device for an electronic component working unit, a working method and an application thereof, which can accurately position an electronic component on a transfer pick-and-place device in a mounting seat of a working area, thereby effectively performing the work.

現今電子元件正積極朝向小巧輕薄的小體積微接點發展,因此小體積微接點的電子元件置入於作業區之承置件內之精準度要求相當高,若精準度稍有偏差,即使得電子元件無法在承置件內有效的執行作業,而降低作業的品質。 Nowadays, electronic components are actively developing toward small, compact and small-sized micro-contacts. Therefore, the precision of the small-sized micro-contact electronic components placed in the mounting of the working area is quite high, and if the accuracy is slightly deviated, even Electronic components cannot be effectively performed in the mounting member, and the quality of the work is reduced.

以電子元件的測試分類機為例,請參閱第1圖,其係為本申請人所申請之台灣專利申請第96149417號『可使電子元件精準對位之移載裝置』專利案,該測試分類機之機台上係包括有供料裝置10、輸入端輸送裝置11、作業區12、輸出端輸送裝置13及收料裝置14;輸入端輸送裝置11係將供料裝置10上待測之電子元件分別輸送至作業區12內之供料載具121,作業區12內之第一、第二收料載具122、123上完測之電子元件,則依據檢測結果由輸出端輸送裝置13輸送至收料裝置14分類放置。請參閱第2圖,作業區12包括有測試站124、取像機構125、位於測試站124一側之第一收料載具122、位於測試站124另側之供料載具121及第二收料載具123、第一移載取放器126及第二移載取放器127;其中,該供料載具121之上方係設有複數個底面具鏤空孔且用以承置待測電子元件之承座1211,各承座1211係配置有複數個可為伺服馬達且呈不同軸向設置之調整件1212、1213、1214,而可利用調整件1212、1213、1214驅動承座1211作X-Y兩軸向及θ角之位移,而供料載具121之下方則設有滑軌組1215,而可於作業區12之供料處供輸入端輸送裝置將待測電子元件置入於各承座1211上後,利用滑軌組1215將待測電子元件移載至取像機構125處取像, 並以各調整件1212、1213、1214驅動承座1211作X-Y兩軸向及θ角之補償校正,而可精確調整待測電子元件之擺置,另該第一、二收料載具122、123則供承置完測之電子元件,該第一、二收料載具122、123係以固定的方式定位於相對測試站124的相關位置,以供第一、二移載取放器126、127及輸出端輸送裝置進行收料作業,該平行位於供料載具121側方之取像機構125,係為CCD取像器,並設置於機台之透明台板下方,且以線路連接訊號至中央控制器,於供料載具121移載電子元件至取像機構125處取像後,將取像訊號傳輸至中央控制器,且經由中央控制器之比對,而運算出其偏差量,進而命令供料載具121之各承座1211作位置或角度之補償校正,使電子元件精準正確擺置,以供第一移載取放器126取出並移載置入於測試站124上執行檢測作業。 Taking the tester of the electronic component as an example, please refer to FIG. 1 , which is a patent application of Taiwan Patent Application No. 96194417, which can be applied to the precise transfer of electronic components. The machine platform includes a feeding device 10, an input conveying device 11, a working area 12, an output conveying device 13 and a receiving device 14; the input conveying device 11 is an electronic device to be tested on the feeding device 10. The components are respectively transported to the feeding carrier 121 in the working area 12, and the electronic components that are completed on the first and second receiving carriers 122, 123 in the working area 12 are transported by the output conveying device 13 according to the detection result. The sorting device 14 is placed in a sort. Referring to FIG. 2, the work area 12 includes a test station 124, an image capture mechanism 125, a first receiving carrier 122 on the side of the test station 124, a supply carrier 121 on the other side of the test station 124, and a second The receiving carrier 123, the first transfer pick-and-place 126 and the second transfer pick-and-place 127; wherein the top of the feeding carrier 121 is provided with a plurality of bottom mask hollow holes for bearing the test The socket 1211 of the electronic component, each of the sockets 1211 is provided with a plurality of adjusting members 1212, 1213 and 1214 which can be servo motors and arranged in different axial directions, and the adjusting members 1212, 1213 and 1214 can be used to drive the socket 1211. The displacement of the XY two-axis and the θ angle, and the slide carrier 1215 is provided below the feeding carrier 121, and the input end conveying device can be placed in the feeding portion of the working area 12 to place the electronic component to be tested. After the socket 1211 is mounted, the electronic component to be tested is transferred to the image capturing mechanism 125 by the slide rail group 1215, and the image is taken. And the adjusting member 1212, 1213, 1214 drives the socket 1211 to compensate for the XY two-axis and the θ angle, and can precisely adjust the placement of the electronic component to be tested, and the first and second receiving carriers 122, 123 is for receiving the completed electronic component, and the first and second receiving carriers 122, 123 are fixedly positioned relative to the test station 124 in a fixed manner for the first and second transfer pickers 126 The 127 and the output end conveying device perform a receiving operation, and the image taking mechanism 125, which is located in the side of the feeding carrier 121, is a CCD image capturing device, and is disposed under the transparent platen of the machine table, and is connected by a line. The signal is sent to the central controller, and after the feeding carrier 121 transfers the electronic component to the image capturing mechanism 125, the image capturing signal is transmitted to the central controller, and the deviation is calculated by the central controller. The amount, and then the respective seats 1211 of the feeding carrier 121 are compensated for position or angle compensation, so that the electronic components are accurately and correctly placed for the first transfer picker 126 to be taken out and transferred to the test station 124. Perform a test job on it.

該設計雖然於機台之透明台板下方設有為CCD取像器之取像機構125,以供供料載具121移載電子元件至該處取像,並令供料載具121之各承座1211作位置或角度之補償校正,使電子元件精準正確擺置,供第一移載取放器126取出並移載置入於測試站124上執行檢測作業;惟,第一移載取放器126在供料載具121上取出並移載電子元件的過程中,第一移載取放器126將會因本身結構上的誤差或組裝間隙或移動上的定位問題,使得在移動至測試站124時,可能造成電子元件微幅偏移的現象,而無法準確置入於測試站124,亦即該設計可使電子元件精準正確擺置於供料載具121,但在第一移載取放器126移載置入於測試站124的重要階段中,卻可能造成電子元件微幅偏移的現象,這種情形對於現今講求小體積微接點的電子元件而言,精準度稍有偏差,即可能導致無法有效的執行作業,而降低作業的品質。 In this design, an image capturing mechanism 125 for the CCD image picker is disposed under the transparent platen of the machine for the feeding carrier 121 to transfer the electronic components to the image capturing device, and the feeding carriers 121 are respectively The seat 1211 is compensated for position or angle, so that the electronic components are accurately and correctly placed for the first transfer picker 126 to be taken out and transferred to the test station 124 for performing the test operation; During the process of removing and transferring the electronic component on the feeding carrier 121, the first transfer handler 126 will move to the positional error or assembly gap or movement problem. When the test station 124 is tested, the electronic component may be slightly offset, and it may not be accurately placed in the test station 124. That is, the design allows the electronic component to be accurately and correctly placed on the feeding carrier 121, but in the first shift. The loader 126 is placed in an important stage of the test station 124, but may cause a slight shift of the electronic components. This situation is slightly accurate for today's electronic components that require small-sized micro-contacts. There is a deviation, which may result in the inability to perform the job effectively. And reduce the quality of the work.

有鑑於此,本發明人為因應小體積電子元件的發展趨勢,係研創出一種可精準將電子元件置入作業區執行作業而提升品質之作業單元,此即為本發明之設計宗旨。 In view of this, the present inventors have developed a working unit that can accurately place electronic components into a work area to perform work and improve quality in response to the development trend of small-sized electronic components, which is the design object of the present invention.

本發明之目的一,係提供一種電子元件作業單元及作業方法,該作業單元係於機台上設有至少一移載取放裝置、至少一作業區、至少一取像裝置及取樣比對裝置;該移載取放裝置係可移動而將待執行作業之電子元件移載至作業區位置,該作業區係設有供電子元件對位置放之承置座,以對電子元件執行預設的作業,該取像裝置係於移載取放裝置移動的路徑中或移動對應於作業區之承置座上方位置時,對該移載取放裝置上之電子元件取像,並將取像所得之即時影像資料傳輸至取樣比對裝置,而由取樣比對裝置將該即時影像資料與儲存於資料庫之樣本影像資料進行比對,並進一步執行對位調整作業;藉此,利用移載取放裝置移動對應於作業區之承置座時,再由取像裝置進行取像,即可大幅排除移載取放裝置本身結構上的誤差或組裝間隙或移動定位等問題所造成的偏移誤差,進而獲致正確的即時影像資料,並經由取樣比對裝置的比對,於執行對位調整作業後,即可使移載取放裝置上之電子元件精準對位放置於作業區之承置座內,進而達到有效執行作業之實用效益。 An object of the present invention is to provide an electronic component working unit and a working method, wherein the working unit is provided with at least one transfer pick-and-place device, at least one working area, at least one image capturing device and a sampling comparison device on the machine table. The transfer pick-and-place device is movable to transfer the electronic components of the work to be executed to the working area, and the work area is provided with a socket for the electronic component to be placed to perform preset on the electronic component. The image capturing device is configured to take an image of the electronic component on the transfer pick-and-place device when the transfer device is moved in a path that moves the pick-and-place device or moves to a position above the mounting seat of the work area, and the image is obtained. The real-time image data is transmitted to the sampling comparison device, and the real-time image data is compared with the sample image data stored in the database by the sampling comparison device, and the alignment adjustment operation is further performed; thereby, the transfer operation is performed by using the transfer When the loading device moves corresponding to the bearing seat of the working area, and then the image capturing device performs image capturing, the structural error or assembly gap or moving positioning of the loading and unloading device itself can be largely eliminated. The resulting offset error, and thus the correct real-time image data, and through the comparison of the sampling comparison device, after performing the alignment adjustment operation, the electronic components on the transfer pick-and-place device can be accurately placed in the operation. In the housing of the district, the practical benefits of effective execution of the operation are achieved.

本發明之目的二,係提供一種電子元件作業單元應用之作業設備,該作業設備包含有供料裝置、收料裝置、作業單元、輸入端輸送裝置、輸出端輸送裝置及中央控制單元,供料裝置係配置於機台上,用以容納至少一待執行作業之電子元件,收料裝置係配置於機台上,用以容納至少一完成作業之電子元件,作業單元係配置於機台上,並設有至少一移載取放裝置、至少一作業區及至少一對位檢查裝置,用以對電子元件執行預設的作業,輸入端輸送裝置及輸出端輸送裝置係配置於機台上,用以將供料裝置上之電子元件輸入作業單元及自作業單元輸出電子元件至收料裝置,中央控制單元係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 The second object of the present invention is to provide a working device for applying an electronic component working unit, the working device comprising a feeding device, a receiving device, a working unit, an input end conveying device, an output end conveying device and a central control unit, and feeding The device is disposed on the machine platform for accommodating at least one electronic component to be executed, and the receiving device is disposed on the machine platform for accommodating at least one electronic component for completing the operation, and the working unit is disposed on the machine platform. And providing at least one transfer pick-and-place device, at least one working area and at least one pair of position checking devices for performing preset operations on the electronic components, wherein the input end conveying device and the output end conveying device are disposed on the machine table, The utility model is used for inputting the electronic components on the feeding device into the working unit and outputting the electronic components from the working unit to the receiving device. The central control unit is used for controlling and integrating the operations of the devices to perform the automatic operation, thereby achieving the practical benefit of improving the working efficiency. .

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳 實施例並配合圖式,詳述如后:請參閱第3、4圖,本發明之作業單元20係於機台上設有至少一移載取放裝置21、至少一作業區22、至少一取像裝置23及取樣比對裝置24;該移載取放裝置21係可移動而將待執行作業之電子元件移載至作業區22位置,於本實施例中,該移載取放裝置21係包括有位於作業區22第一側之第一供料載台211及第一收料載台212、位於作業區22第二側之第二供料載台213及第二收料載台214、移動於作業區22與第一供料載台211及第一收料載台212間之第一移載取放器215以及移動於作業區22與第二供料載台213及第二收料載台214間之第二移載取放器216;位於作業區22第一側之第一供料載台211上係具有至少一第一供料承座2111,以於供料位置承置待執行作業之電子元件,並可移動至對應作業區22的側方位置,第一收料載台212上係具有至少一第一收料承座2121,並可移動至對應作業區22的側方位置,以承置完成作業之電子元件並移動至收料位置,位於作業區22第二側之第二供料載台213上係具有至少一第二供料承座2131,以於供料位置承置待執行作業之電子元件,並可移動至對應作業區22的側方位置,第二收料載台214上係具有至少一第二收料承座2141,並可移動至對應作業區22的側方位置,以承置完成作業之電子元件並移動至收料位置,第一移載取放器215係可移動至第一側之第一供料載台211位置,以將第一供料載台211上待執行作業之電子元件移載至作業區22位置,或將作業區22完成作業之電子元件移載至第一收料載台212上,第二移載取放器216係可移動至第二側之第二供料載台213位置,以將第二供料載台213上待執行作業之電子元件移載至作業區22位置,或將作業區22完成作業之電子元件移載至第二收料載台214上;至少一作業區22,作業區22係可供置入待執行作業之電子元件,以對該電子元件執行預設的作業,該預設的作業可以為印刷、模壓、外觀檢測或電性測試等, 於本實施例中該作業區22係執行電性測試作業,而於作業區22內設有測試電路板221,以及於測試電路板221上設有供電子元件對位置放之承置座222,由於本實施例為執行電性測試作業,承置座222內並設有複數個連接至電路板221之電性接點223,以供電子元件之接腳或錫球電性接觸該電性接點223;為了使第一移載取放器215或第二移載取放器216可以準確的將電子元件置放於承置座222內,並使電子元件之接腳或錫球可以精準的電性接觸承置座222內之電性接點223,本發明係設有取像裝置23、取樣比對裝置24及對位調整裝置25,該取像裝置23係為CCD取像器231,並可在第一移載取放器215或第二移載取放器216移動的路徑中,對該第一移載取放器215或第二移載取放器216上之電子元件取像,並將取像所得之即時影像資料傳輸至取樣比對裝置24;請參閱第5圖,或者取像裝置23亦可於第一移載取放器215或第二移載取放器216移動對應於作業區22之承置座222上方位置時,對該第一移載取放器215或第二移載取放器216上之電子元件取像,並將取像所得之即時影像資料傳輸至取樣比對裝置24;請參閱第3、5圖,該取樣比對裝置24係設有儲存樣本影像資料之資料庫(圖式未示)及執行比對之控制器(圖式未示),而可將即時影像資料與樣本影像資料進行比對,如超出誤差範圍時,則以對位調整裝置25進行對位調整;於本實施例中,該對位調整裝置25係於第一移載取放器215或第二移載取放器216上架置多層式的調整平台,以第一移載取放器215為例,該調整平台上方為固定座251,固定座251下方架設有一可由X軸向調整件252驅動作X軸向滑移之第一滑動座253,第一滑動座253下方再架設有一可由Y軸向調整件254驅動作Y軸向滑移及可由角度調整件255驅動作角度調整之第二滑動座256,第一移載取放器215取放電子元件之吸嘴2151則固定於第二滑動座256下方;由於多層式的調整平台已為習知的技術,因此其動作不再贅述,進而使得電子元 件可於第一移載取放器215或第二移載取放器216上進行對位調整;經由取樣比對裝置24進行比對,如未超出誤差範圍或超出誤差範圍而完成對位調整後之電子元件,則再由第一移載取放器215或第二移載取放器216直接下降移入承置座222,進而使電子元件之接腳或錫球可以精準的電性接觸承置座222內之電性接點223。 In order to make the reviewer further understand the present invention, it is better to The embodiment and the drawings are detailed as follows: Referring to Figures 3 and 4, the working unit 20 of the present invention is provided with at least one transfer pick-and-place device 21, at least one working area 22, at least one on the machine table. The image capturing device 23 and the sampling and comparing device 24; the transfer picking and placing device 21 is movable to transfer the electronic components of the work to be executed to the working area 22 position. In the embodiment, the transfer loading and unloading device 21 The first feeding stage 211 and the first receiving stage 212 on the first side of the working area 22, the second feeding stage 213 and the second receiving stage 214 on the second side of the working area 22 are included. And moving the first transfer picker 215 between the work area 22 and the first supply stage 211 and the first receiving stage 212, and moving to the work area 22 and the second supply stage 213 and the second collection a second transfer carrier 216 between the loading stations 214; the first supply carrier 211 on the first side of the working area 22 has at least one first supply holder 2111 for receiving at the feeding position The electronic component of the job to be executed can be moved to a side position corresponding to the working area 22, and the first receiving stage 212 has at least one first receiving socket 2121. And moving to a side position corresponding to the working area 22 to receive the electronic components of the work and moving to the receiving position, the second feeding stage 213 located on the second side of the working area 22 has at least a second The feeding socket 2131 is configured to receive the electronic component of the work to be performed at the feeding position, and can be moved to the lateral position of the corresponding working area 22, and the second receiving stage 214 has at least one second receiving receiving The seat 2141 is movable to a side position corresponding to the working area 22 to receive the electronic component of the work and moved to the receiving position, and the first transfer picker 215 is movable to the first side of the first side. The loading stage 211 is positioned to transfer the electronic components of the first feeding stage 211 to be executed to the working area 22 position, or to transfer the electronic components of the working area 22 to the first receiving stage 212. The second transfer picker 216 is movable to the second feed stage 213 position on the second side to transfer the electronic components of the second supply stage 213 to be executed to the work area 22 position. , or transfer the electronic components of the work area 22 to the second receiving stage 214; One less work area 22, the work area 22 is an electronic component that can be placed into the work to be executed to perform a preset job on the electronic component, and the preset work can be printing, molding, appearance inspection or electrical test, etc. , In the embodiment, the working area 22 performs an electrical test operation, and a test circuit board 221 is disposed in the working area 22, and a mounting seat 222 for placing the electronic component on the test circuit board 221 is disposed. In this embodiment, in order to perform an electrical test operation, a plurality of electrical contacts 223 connected to the circuit board 221 are disposed in the socket 222 for electrically contacting the pins or solder balls of the electronic component. Point 223; in order to enable the first transfer pick-and-place 215 or the second transfer pick-and-place 216 to accurately place the electronic components in the socket 222, and the pins or solder balls of the electronic components can be accurately The electrical contact 223 in the electrical contact holder 222 is provided with an image capturing device 23, a sampling comparison device 24 and a alignment adjusting device 25, and the image capturing device 23 is a CCD image capturing device 231. The electronic component on the first transfer picker 215 or the second transfer picker 216 can be imaged in a path in which the first transfer picker 215 or the second transfer picker 216 moves. And transmitting the obtained real-time image data to the sampling comparison device 24; please refer to FIG. 5, or the image capturing device 23 When the first transfer picker 215 or the second transfer picker 216 moves to a position above the receiving seat 222 corresponding to the working area 22, the first transfer picker 215 or the second transfer pick-and-place The electronic component on the device 216 takes an image and transmits the captured image data to the sampling comparison device 24; see Figures 3 and 5, the sampling comparison device 24 is provided with a database for storing sample image data. (not shown) and the controller (not shown), the real-time image data can be compared with the sample image data. If the error range is exceeded, the alignment adjustment device 25 is aligned. In the embodiment, the alignment adjusting device 25 is mounted on the first transfer pick-and-place 215 or the second transfer pick-and-place 216 to mount a multi-layer adjustment platform to the first transfer pick-and-place 215. For example, the upper part of the adjusting platform is a fixed seat 251. The first sliding seat 253 is driven by the X-axis adjusting member 252 to be X-axis sliding. The first sliding seat 253 is provided with a Y-receivable portion. The axial adjustment member 254 is driven to slide in the Y direction and can be driven by the angle adjustment member 255 for angle adjustment. The second sliding seat 256, the first transfer carrier 215 pick-and-place electronic nozzle 2151 is fixed under the second sliding seat 256; since the multi-layer adjustment platform has been a conventional technique, its action is not Elaborate The component can be aligned on the first transfer pick-and-place 215 or the second transfer pick-and-place 216; the comparison is performed via the sampling comparison device 24, and the alignment adjustment is completed if the error range is exceeded or the error range is exceeded. The electronic component is then directly lowered into the mounting seat 222 by the first transfer pick-and-place 215 or the second transfer pick-and-place 216, so that the pins or solder balls of the electronic components can be accurately electrically contacted. The electrical contacts 223 are placed in the holder 222.

請參閱第6圖,為了建立取樣比對裝置24之樣本影像資料,於本實施例中,該取樣比對裝置24更包含設有移動式取像器241,該移動式取像器241係為菱鏡組及CCD取像器,並可移動至作業區22之承置座222與第一移載取放器215或與第二移載取放器216間的位置,移動式取像器241由於裝設有菱鏡組,因此可透過菱鏡組同時對第一移載取放器215或第二移載取放器216上之電子元件及作業區22之承置座222進行雙向的位置取像,再由CCD取像器攝取菱鏡組的影像,而獲致電子元件及承置座222間相對位置的取像資料,最後再將該取像資料傳輸至控制器進行比對,若比對結果超出誤差值,則進一步由對位調整裝置25執行對位調整,完成對位調整後再由取像裝置23之CCD取像器231取像,而獲得正確的樣本影像資料,並進一步儲存於資料庫,從而於資料庫中建立樣本影像資料。 Referring to FIG. 6 , in order to establish the sample image data of the sampling comparison device 24 , in the embodiment, the sampling comparison device 24 further includes a movable image finder 241 , wherein the mobile image finder 241 is The mirror group and the CCD image picker can be moved to the position between the socket 222 of the working area 22 and the first transfer pick-and-place 215 or the second transfer pick-and-place 216, and the movable image finder 241 Since the prism group is installed, the electronic component on the first transfer handler 215 or the second transfer handler 216 and the holder 222 of the work area 22 can be simultaneously bidirectionally positioned through the prism group. Taking the image, the CCD imager takes the image of the lens group, and obtains the image data of the relative position between the electronic component and the mounting base 222, and finally transmits the image data to the controller for comparison. If the result exceeds the error value, the alignment adjustment device 25 performs the alignment adjustment, and after the alignment adjustment is completed, the image is taken by the CCD image pickup unit 231 of the image capturing device 23 to obtain the correct sample image data, and further stored. In the database, the sample image data is created in the database.

請參閱第7圖,本發明於執行作業前,係先進行建立樣本影像資料程序,其係由第一移載取放器215移載電子元件26至作業區22之承置座222的上方位置,取樣比對裝置24之移動式取像器241並移動至作業區22之承置座222與第一移載取放器215上之電子元件26間的位置,而由移動式取像器241進行雙向的位置取像,並將該取像資料傳輸至取樣比對裝置24之控制器進行比對,若比對結果超出誤差值,則進一步由對位調整裝置25執行對位調整程序,如無超出誤差值或完成對位調整程序後,再由取像裝置23之CCD取像器231取像,於本實施例中,該CCD取像器231係對電子元件26的接腳或錫 球進行取像,並進一步儲存於資料庫,從而於資料庫中建立樣本影像資料。 Referring to FIG. 7, the present invention performs a process of establishing a sample image data by the first transfer handler 215 to transfer the electronic component 26 to the upper position of the holder 222 of the work area 22 before performing the work. The movable image pickup unit 241 of the sampling device 24 is moved to the position between the mounting base 222 of the working area 22 and the electronic component 26 on the first transfer pick-and-place unit 215, and the movable image pickup unit 241 is moved. The bidirectional position acquisition is performed, and the image data is transmitted to the controller of the sampling comparison device 24, and if the comparison result exceeds the error value, the alignment adjustment program is further performed by the registration adjustment device 25, such as After the error value is not exceeded or the alignment adjustment procedure is completed, the CCD imager 231 of the image capturing device 23 takes an image. In the embodiment, the CCD imager 231 is connected to the pin or tin of the electronic component 26. The ball is imaged and further stored in a database to create sample image data in the database.

請參閱第8圖,本發明於執行作業時係先進行移入料程序,其係由移載取放裝置21將待執行作業之電子元件移載至對應作業區22位置,於本實施例中,移載取放裝置21之第一供料載台211係將第一供料承座2111內待執行作業之電子元件26a移載至對應作業區22的側方位置,第一移載取放器215並移動至第一供料載台211上方位置,以吸取待執行作業之電子元件26a。請參閱第9圖,接著第一移載取放器215移載待執行作業之電子元件26a,第一移載取放器215係可於移動的路徑中移動至如第4圖所示位置,於本實施例中,第一移載取放器215係移動至對應於作業區22之承置座222的上方位置。 Referring to FIG. 8 , in the present invention, the loading and unloading process is performed first, and the electronic components of the work to be executed are transferred to the corresponding working area 22 by the transfer pick-and-place device 21, in this embodiment, The first feeding stage 211 of the transfer pick-and-place device 21 transfers the electronic component 26a of the first feeding holder 2111 to be executed to the lateral position of the corresponding working area 22, and the first transfer pick-and-place device 215 and move to a position above the first supply stage 211 to draw the electronic component 26a of the work to be performed. Referring to FIG. 9, the first transfer picker 215 then transfers the electronic component 26a of the work to be performed, and the first transfer picker 215 can move to the position shown in FIG. 4 in the moving path. In the present embodiment, the first transfer picker 215 is moved to an upper position corresponding to the holder 222 of the work area 22.

請參閱第10圖,本發明為了使待執行作業之電子元件26a可以精準對位放置於作業區22之承置座222內,接著進行取像比對程序,其係由取像裝置23之CCD取像器231對第一移載取放器215上待執行作業之電子元件26a進行取像,於本實施例中,該CCD取像器231係對待執行作業之電子元件26a的接腳或錫球進行即時影像資料的取像,再將該即時影像資料傳輸至取樣比對裝置24,該取樣比對裝置24即與資料庫中建立的樣本影像資料進行比對,如果比對結果在誤差值內,即可進行下一作業程序,若比對結果超出誤差值,則進一步執行對位調整程序,本實施例中,由於係在第一移載取放器215移載待執行作業之電子元件26a至對應於作業區22之承置座222的上方位置後才進行即時影像資料的取像,亦即以對位前的最終位置進行取像,而可以排除第一移載取放器215本身結構上的誤差或組裝間隙或移動定位等問題所造成的偏移誤差,進而獲致正確的即時影像資料。在完成取像比對程序後,若取像比對程序之比對結果超出誤差值時,則需進一步執行對位調整程序,於本實施例中,對位調整程序係由第一移載取放器215上多層式的 調整平台之X軸向調整件252、Y軸向調整件254及角度調整件255,使電子元件26a可於第一移載取放器215上進行對位調整程序。 Referring to FIG. 10, in order to enable the electronic component 26a of the work to be performed to be accurately placed in the mounting seat 222 of the working area 22, the imaging comparison program is performed, which is performed by the CCD of the image capturing device 23. The image finder 231 takes an image of the electronic component 26a on the first transfer pick and place 215 to be executed. In the embodiment, the CCD imager 231 is a pin or tin of the electronic component 26a to be executed. The ball performs image capturing of the real-time image data, and then transmits the real-time image data to the sampling comparison device 24, and the sampling comparison device 24 compares with the sample image data established in the database, if the comparison result is in the error value The next operation program can be performed. If the comparison result exceeds the error value, the alignment adjustment program is further executed. In this embodiment, the electronic component to be executed is transferred by the first transfer handler 215. After the 26a is corresponding to the upper position of the mounting base 222 of the working area 22, the image data of the instant image is taken, that is, the final position before the alignment is taken, and the first transfer picker 215 itself can be excluded. Structural error or Means a gap or offset error problems caused by mobile positioning, thereby attainable correct real-time image data. After the image matching program is completed, if the comparison result of the image matching program exceeds the error value, the alignment adjustment program needs to be further performed. In this embodiment, the alignment adjustment program is taken by the first transfer. Multi-layer on the 215 The X-axis adjustment member 252, the Y-axis adjustment member 254 and the angle adjustment member 255 of the adjustment platform enable the electronic component 26a to perform an alignment adjustment procedure on the first transfer handler 215.

請參閱第11、12圖,完成取像比對程序後,若比對結果在誤差值內或超出誤差值但完成對位調整程序,則接著進行置料執行作業程序,其係使第一移載取放器215下降,將待執行作業之電子元件26a置入作業區22之承置座222內執行作業,本實施例中,由於在第一移載取放器215將待執行作業之電子元件26a移載至承置座222上方後,先以取像裝置23及取樣比對裝置24進行即時影像資料的取像比對程序,而可有效改善第一移載取放器215因本身結構上的誤差或組裝間隙或移動定位等問題所造成的偏移誤差,使得待執行作業之電子元件26a的接腳或錫球可準確電性接觸承置座222內之電性接點223,以有效的執行電性測試作業,並獲致正確的測試結果,於本實施例中,該電性測試作業係採壓測的方式進行,其第一移載取放器215上將待執行作業之電子元件26a置入作業區22之承置座222內後,係以第一移載取放器215保持壓抵於待執行作業之電子元件26a的上方,以確保待執行作業之電子元件26a的接腳或錫球可保持電性接觸承置座222內之電性接點223。此外,在第一移載取放器215壓抵待執行作業之電子元件26a執行電性測試作業時,第二移載取放器216係移動至第二供料載台213位置,並準備進行移入料程序,而吸取第二供料載台213內另一待執行作業之電子元件26b。 Referring to Figures 11 and 12, after the image matching program is completed, if the comparison result is within the error value or exceeds the error value but the alignment adjustment program is completed, then the nesting execution operation program is executed, which causes the first shift The loading and unloading device 215 is lowered, and the electronic component 26a of the work to be executed is placed in the receiving seat 222 of the working area 22 to perform the work. In this embodiment, the electronic work to be executed is performed in the first transfer pick-and-place device 215. After the component 26a is transferred to the upper surface of the mounting base 222, the image capturing device 23 and the sampling comparison device 24 are used to perform an image capturing comparison program of the instant image data, thereby effectively improving the structure of the first transfer pick-and-place device 215. The error caused by the error or the assembly gap or the movement positioning causes the pin or the solder ball of the electronic component 26a to be accurately electrically contacted with the electrical contact 223 in the socket 222 to The electrical test operation is performed efficiently and the correct test result is obtained. In the embodiment, the electrical test operation is performed by using a pressure measurement method, and the first transfer carrier 215 is to perform an operation of the electronic device. The component 26a is placed in the work area 22 After 222, the first transfer picker 215 is kept pressed against the electronic component 26a of the work to be performed to ensure that the pins or solder balls of the electronic component 26a to be executed can be electrically contacted. Electrical contacts 223 in the housing 222. In addition, when the first transfer handler 215 is pressed against the electronic component 26a of the work to be performed to perform the electrical test operation, the second transfer handler 216 is moved to the position of the second supply stage 213, and is ready to be performed. The feeding program is moved, and the electronic component 26b of another work to be performed in the second feeding stage 213 is sucked.

請參閱第13圖,作業區22完成電子元件26a的電性測試作業後,接著進行移出料程序,其係由移載取放裝置21將完成作業之電子元件移出作業區22,於本實施例中,其係以第一移載取放器215將電子元件26a移出作業區22之承置座222,並將電子元件26a移載放置於第一收料載台212上,第一收料載台212再將完成作業之電子元件26a移載至收料位置;此時由於第一移載取放器215已經移出作業區22,而 由第二移載取放器216接替將待執行作業之電子元件26b移載至作業區22位置,以進行相同的移入料程序、取像比對程序、置料執行作業程序以及移出料程序。 Referring to FIG. 13, after the work area 22 completes the electrical test operation of the electronic component 26a, the transfer and discharge process is performed, and the electronic component of the completed work is removed from the work area 22 by the transfer pick-and-place device 21, in this embodiment. The first loading carrier 215 removes the electronic component 26a from the mounting base 222 of the working area 22, and the electronic component 26a is placed on the first receiving stage 212. The first receiving load is carried. The stage 212 then transfers the electronic component 26a of the completed job to the receiving position; at this time, since the first transfer picker 215 has been removed from the work area 22, The second transfer handler 216 takes over the transfer of the electronic component 26b of the job to be executed to the position of the work area 22 to perform the same shifting program, the image matching program, the stocking execution program, and the shifting and discharging program.

請參閱第14圖,本發明之作業單元20應用於作業設備時,以測試分類機為例,其係於機台上設有供料裝置30、輸入端輸送裝置40、作業單元20、輸出端輸送裝置50及收料裝置60;輸入端輸送裝置40係將供料裝置30上待執行測試作業之電子元件分別輸送至作業單元20之第一供料載台211及第二供料載台213,作業單元20之第一收料載台212及第二收料載台214上完成測試作業之電子元件,則依據測試結果由輸出端輸送裝置50輸送至收料裝置60分類放置,中央控制單元係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Referring to FIG. 14 , when the working unit 20 of the present invention is applied to a working device, the test sorting machine is taken as an example, and the feeding machine is provided with a feeding device 30, an input conveying device 40, a working unit 20, and an output end. The conveying device 50 and the receiving device 60; the input conveying device 40 is configured to convey the electronic components of the feeding device 30 to be tested to the first feeding stage 211 and the second feeding stage 213 of the working unit 20, respectively. The electronic components of the first receiving platform 212 and the second receiving carrier 214 of the working unit 20 that complete the testing operation are transported by the output conveying device 50 to the receiving device 60 according to the test result, and the central control unit is disposed. It is used to control and integrate the operation of each device to perform automated operations and achieve practical benefits of improving operational efficiency.

習知部分: Conventional part:

10‧‧‧供料裝置 10‧‧‧Feeding device

11‧‧‧輸入端輸送裝置 11‧‧‧Input conveyor

12‧‧‧作業區 12‧‧‧Working area

121‧‧‧供料載具 121‧‧‧Feeding vehicle

1211‧‧‧承座 1211‧‧ ‧ socket

1212‧‧‧調整件 1212‧‧‧Adjustment

1213‧‧‧調整件 1213‧‧‧Adjustment

1214‧‧‧調整件 1214‧‧‧Adjustment

1215‧‧‧滑軌組 1215‧‧‧Slide group

121‧‧‧第一收料載具 121‧‧‧First receiving vehicle

123‧‧‧第二收料載具 123‧‧‧Second receiving vehicle

124‧‧‧測試站 124‧‧‧Test Station

125‧‧‧取像機構 125‧‧‧Image agency

126‧‧‧第一移載取放器 126‧‧‧First transfer picker

127‧‧‧第二移載取放器 127‧‧‧Second transfer picker

13‧‧‧輸出端輸送裝置 13‧‧‧Output conveyor

14‧‧‧收料裝置 14‧‧‧ Receiving device

本發明部分: Part of the invention:

20‧‧‧作業單元 20‧‧‧Operating unit

21‧‧‧移載取放裝置 21‧‧‧Transfer pick and place device

211‧‧‧第一供料載台 211‧‧‧First feeding platform

2111‧‧‧第一供料承座 2111‧‧‧First supply seat

212‧‧‧第一收料載台 212‧‧‧First receiving platform

2121‧‧‧第一收料承座 2121‧‧‧First receiving receptacle

213‧‧‧第二供料載台 213‧‧‧Second feed stage

2131‧‧‧第二供料承座 2131‧‧‧Second feed holder

214‧‧‧第二收料載台 214‧‧‧Second receiving platform

2141‧‧‧第二收料承座 2141‧‧‧Second receipt holder

215‧‧‧第一移載取放器 215‧‧‧First transfer picker

2151‧‧‧吸嘴 2151‧‧‧ nozzle

216‧‧‧第二移載取放器 216‧‧‧Second transfer picker

22‧‧‧作業區 22‧‧‧Working area

221‧‧‧測試電路板 221‧‧‧Test circuit board

222‧‧‧承置座 222‧‧‧ socket

223‧‧‧電性接點 223‧‧‧Electrical contacts

23‧‧‧取像裝置 23‧‧‧Image capture device

231‧‧‧CCD取像器 231‧‧‧CCD imager

24‧‧‧取樣比對裝置 24‧‧‧Sampling comparison device

241‧‧‧移動式取像器 241‧‧‧Mobile Imager

25‧‧‧對位調整裝置 25‧‧‧ alignment adjustment device

251‧‧‧固定座 251‧‧‧ fixed seat

252‧‧‧X軸向調整件 252‧‧‧X axial adjustment

253‧‧‧第一滑動座 253‧‧‧First sliding seat

254‧‧‧Y軸向調整件 254‧‧‧Y axial adjustment

255‧‧‧角度調整件 255‧‧‧Angle adjustment

256‧‧‧第二滑動座 256‧‧‧Second sliding seat

26a‧‧‧電子元件 26a‧‧‧Electronic components

26b‧‧‧電子元件 26b‧‧‧Electronic components

30‧‧‧供料裝置 30‧‧‧Feeding device

40‧‧‧輸入端輸送裝置 40‧‧‧Input conveyor

50‧‧‧輸出端輸送裝置 50‧‧‧Output conveying device

60‧‧‧收料裝置 60‧‧‧ receiving device

第1圖:台灣申請第96149417號專利案於測試分類機之配置示意圖。 Figure 1: Schematic diagram of the configuration of the Taiwan patent application No. 96194417 in the test classification machine.

第2圖:台灣申請第96149417號專利案作業區之配置示意圖。 Figure 2: Schematic diagram of the configuration of the operating area of Taiwan Patent Application No. 96194417.

第3圖:本發明作業單元之配置示意圖(一)。 Figure 3: Schematic diagram of the configuration of the working unit of the present invention (1).

第4圖:本發明作業單元之配置示意圖(二)。 Figure 4: Schematic diagram of the configuration of the working unit of the present invention (2).

第5圖:本發明作業單元取像裝置之另一實施例圖。 Fig. 5 is a view showing another embodiment of the image pickup device of the working unit of the present invention.

第6圖:本發明作業單元取樣比對裝置之示意圖。 Figure 6 is a schematic view of the sampling unit of the working unit of the present invention.

第7圖:本發明作業單元之動作示意圖(一)。 Figure 7: Schematic diagram of the operation of the working unit of the present invention (1).

第8圖:本發明作業單元之動作示意圖(二)。 Figure 8: Schematic diagram of the operation of the working unit of the present invention (2).

第9圖:本發明作業單元之動作示意圖(三)。 Figure 9: Schematic diagram of the operation of the working unit of the present invention (3).

第10圖:本發明作業單元之動作示意圖(四)。 Figure 10: Schematic diagram of the operation of the working unit of the present invention (4).

第11圖:本發明作業單元之動作示意圖(五)。 Figure 11: Schematic diagram of the operation of the working unit of the present invention (5).

第12圖:本發明作業單元之動作示意圖(六)。 Figure 12: Schematic diagram of the operation of the working unit of the present invention (6).

第13圖:本發明作業單元之動作示意圖(七)。 Figure 13: Schematic diagram of the operation of the working unit of the present invention (7).

第14圖:本發明作業單元應用於作業設備之配置示意圖。 Figure 14: Schematic diagram of the configuration of the working unit of the present invention applied to the working equipment.

20‧‧‧作業單元 20‧‧‧Operating unit

21‧‧‧移載取放裝置 21‧‧‧Transfer pick and place device

211‧‧‧第一供料載台 211‧‧‧First feeding platform

2111‧‧‧第一供料承座 2111‧‧‧First supply seat

212‧‧‧第一收料載台 212‧‧‧First receiving platform

2121‧‧‧第一收料承座 2121‧‧‧First receiving receptacle

213‧‧‧第二供料載台 213‧‧‧Second feed stage

2131‧‧‧第二供料承座 2131‧‧‧Second feed holder

214‧‧‧第二收料載台 214‧‧‧Second receiving platform

2141‧‧‧第二收料承座 2141‧‧‧Second receipt holder

215‧‧‧第一移載取放器 215‧‧‧First transfer picker

216‧‧‧第二移載取放器 216‧‧‧Second transfer picker

22‧‧‧作業區 22‧‧‧Working area

221‧‧‧測試電路板 221‧‧‧Test circuit board

222‧‧‧承置座 222‧‧‧ socket

223‧‧‧電性接點 223‧‧‧Electrical contacts

23‧‧‧取像裝置 23‧‧‧Image capture device

231‧‧‧CCD取像器 231‧‧‧CCD imager

24‧‧‧取樣比對裝置 24‧‧‧Sampling comparison device

241‧‧‧移動式取像器 241‧‧‧Mobile Imager

Claims (10)

一種電子元件作業單元,係包含有:作業區:係設有供待執行作業之電子元件對位置放的承置座,以對該電子元件執行預設的作業;移載取放裝置:係設有至少一移載取放器,以將待執行作業之電子元件移載至作業區之承置座,以及將作業區承置座內完成作業之電子元件移出承置座;取像裝置:係於移載取放裝置之移載取放器移動的路徑中或移載取放器移動對應於作業區之承置座位置時,對該移載取放器上之電子元件取像,而獲得電子元件之即時影像資料;取樣比對裝置:係設有儲存樣本影像資料之資料庫及執行比對之控制器,以將取像裝置傳輸之即時影像資料與資料庫之樣本影像資料進行比對。 An electronic component working unit includes: a working area: a mounting base for positioning an electronic component to be executed to perform a preset operation on the electronic component; and a loading and unloading device: Having at least one transfer pick-and-place device for transferring the electronic components of the work to be performed to the mounting seat of the work area, and moving the electronic components of the work area receiving work from the mounting seat; the image capturing device: Obtaining an image of the electronic component on the transfer pick-and-place device when the transfer pick-and-place device moves the path of the transfer pick-and-place device or when the transfer pick-and-placer moves to the position of the mount corresponding to the work area Instant image data of electronic components; sampling comparison device: a database for storing sample image data and a controller for performing comparison to compare the real-time image data transmitted by the image capturing device with the sample image data of the data library . 依申請專利範圍第1項所述之電子元件作業單元,其中,該作業區係設有測試電路板,以及於測試電路板上設有供電子元件對位置放之承置座,承置座內並設有複數個連接至電路板之電性接點,以供電子元件對位置放並執行電性測試作業。 The electronic component working unit according to claim 1, wherein the working area is provided with a test circuit board, and the test circuit board is provided with a mounting seat for placing the electronic component on the position, and the mounting seat is disposed. And a plurality of electrical contacts connected to the circuit board for electronic components to position and perform electrical test operations. 依申請專利範圍第1項所述之電子元件作業單元,其中,該移載取放裝置係於作業區設有至少一供料載台、收料載台及至少一移動於供料載台、作業區與收料載台間之移載取放器。 The electronic component working unit according to claim 1, wherein the transfer loading and unloading device is provided with at least one feeding stage, a receiving stage and at least one moving on the feeding stage in the working area, A transfer picker between the work area and the receiving stage. 依申請專利範圍第1項所述之電子元件作業單元,其中,該取樣比對裝置更包含設有移動式取像器,該移動式取像器係為菱鏡組及CCD取像器,並可移動至作業區之承置座與移載取放器間的位置,以同時對移載取放器上之電子元件及作業區之承置座進行雙向的位置取像,而獲致電子元件及承置座間相對位置的取像資料,並傳輸至控制器進行比對,再由取像裝置取像,而獲得正確的樣本影像資料,並儲存於資料 庫。 The electronic component working unit according to claim 1, wherein the sampling comparison device further comprises a movable image capturing device, wherein the movable image capturing device is a prism group and a CCD image capturing device, and It can be moved to the position between the bearing seat of the working area and the transfer pick-and-place device to simultaneously perform the bidirectional position image capturing of the electronic components on the transfer pick-and-place device and the mounting base of the working area, thereby obtaining the electronic components and The image data of the relative position between the seats is taken and transmitted to the controller for comparison, and then the image capturing device is taken to obtain the correct sample image data and stored in the data. Library. 依申請專利範圍第1或4項所述之電子元件作業單元,更包含設有對位調整裝置,於取樣比對裝置將即時影像資料與樣本影像資料進行比對而有誤差時,或移動式取像器將電子元件及承置座間相對位置的取像資料傳輸至控制器進行比對而有誤差時,對電子元件可進行對位調整。 The electronic component working unit according to Item 1 or 4 of the patent application scope further includes a matching adjustment device, wherein when the sampling comparison device compares the instantaneous image data with the sample image data and has an error, or moves When the image pickup device transmits the image data of the relative position between the electronic component and the socket to the controller for comparison and has an error, the electronic component can be aligned. 依申請專利範圍第5項所述之電子元件作業單元,其中,該對位調整裝置係於移載取放器上架置多層式的調整平台,該調整平台上方為固定座,固定座下方架設有一可由X軸向調整件驅動作X軸向滑移之第一滑動座,第一滑動座下方再架設有一可由Y軸向調整件驅動作Y軸向滑移及可由角度調整件驅動作角度調整之第二滑動座,移載取放器取放電子元件之吸嘴則固定於第二滑動座下方,而直接於移載取放器上對電子元件進行對位調整。 The electronic component working unit according to claim 5, wherein the alignment adjusting device is configured to mount a multi-layer adjusting platform on the transfer pick-and-place device, wherein the upper portion of the adjusting platform is a fixing seat, and the fixing frame is provided with a lower frame. The first sliding seat for X-axis sliding can be driven by the X-axis adjusting member, and the Y-axis adjusting member can be driven by the Y-axis adjusting member to be Y-axis sliding and can be driven by the angle adjusting member for angle adjustment. The second sliding seat, the suction nozzle of the pick-and-place pick-and-place electronic component is fixed under the second sliding seat, and the electronic component is aligned directly on the transfer pick-and-place device. 一種電子元件作業方法,係包含有:建立樣本影像資料程序:係由移載取放裝置之移載取放器將待執行作業之電子元件移載至對應作業區之承置座位置,接著取樣比對裝置之移動式取像器移動至作業區之承置座與移載取放器上之電子元件間的位置進行雙向的位置取像,並將該取像資料傳輸至控制器進行比對,再由取像裝置取像並儲存於資料庫,而於資料庫中建立樣本影像資料;移入料程序:待執行作業之電子元件由移載取放裝置之移載取放器移載至對應作業區之承置座位置;取像比對程序:係於移載取放器移動的路徑中或移載取放器移動對應於作業區之承置座位置時,由取像裝置對移載取放器上待執行作業之電子元件進行即時影像資料的取像,再將該即時影像資料傳輸至取樣比對裝置,該取樣比對裝置即對該即 時影像資料與資料庫中的樣本影像資料進行比對;置料執行作業程序:完成取像比對程序後,由移載取放器將待執行作業之電子元件置入作業區之承置座內執行作業。 An electronic component working method includes: establishing a sample image data program: transferring, by a transfer pick-and-place device of a transfer pick-and-place device, an electronic component of a work to be executed to a position of a socket of a corresponding work area, and then sampling The movable image pickup device of the comparison device moves to the position between the mounting seat of the working area and the electronic component on the transfer pick-and-place device for two-way position image capturing, and transmits the image capturing data to the controller for comparison And the image capturing device takes image and stores it in the database, and the sample image data is created in the database; the loading and feeding program: the electronic component of the work to be executed is transferred by the transfer pick and place device of the transfer loading device to the corresponding The position of the mounting area of the working area; the image matching program: when the transfer picker moves in the path or when the transfer picker moves corresponding to the position of the mounting area of the working area, the image capturing device is transferred The electronic component of the work to be performed on the pick and place device performs image capturing of the instant image data, and then transmits the instant image data to the sampling comparison device, and the sampling comparison device is immediately The image data is compared with the sample image data in the database; the loading execution program: after the image matching program is completed, the electronic components of the work to be executed are placed in the mounting area of the work area by the transfer pick and place device. Execute the job inside. 依申請專利範圍第7項所述之電子元件作業方法,其中,該建立樣本影像資料程序於取像資料傳輸至控制器進行比對後,若比對結果超出誤差值,則進一步執行對位調整程序,完成對位調整程序後,再由取像裝置取像並儲存於資料庫,而於資料庫中建立樣本影像資料。 According to the method for operating an electronic component according to claim 7, wherein the method for establishing a sample image data is transmitted to the controller for comparison, and if the comparison result exceeds the error value, the alignment adjustment is further performed. After the program completes the alignment adjustment program, the image capturing device takes image and stores it in the database, and the sample image data is created in the database. 依申請專利範圍第7項所述之電子元件作業方法,其中,該取像比對程序若比對結果超出誤差值,則進一步執行對位調整程序,完成對位調整程序後,再進行置料執行作業程序。 According to the electronic component operation method of claim 7, wherein if the comparison result exceeds the error value, the alignment adjustment program is further executed, and after the alignment adjustment procedure is completed, the registration is performed. Execute the operating program. 一種應用電子元件作業單元之作業設備,係包含有:供料裝置:係設於機台上,用以承置待執行作業之電子元件;收料裝置:係設於機台上,用以承置完成作業之電子元件;作業單元:係設於機台上,並設有至少一依申請專利範圍第1項所述之作業區、移載取放裝置、取像裝置及取樣比對裝置,用以對電子元件執行預設的作業;輸入端輸送裝置:係將供料裝置上待執行作業之電子元件輸送至作業單元;輸出端輸送裝置:係將作業單元上完成測試作業之電子元件依據作業結果分類放置於收料裝置。中央控制裝置:係用以控制及整合各裝置作動,以執行自動化作業。 An operation device for applying an electronic component working unit includes: a feeding device: is disposed on a machine platform for holding an electronic component to be executed; and a receiving device is disposed on the machine platform for receiving The electronic component for completing the operation; the working unit is disposed on the machine table, and is provided with at least one working area, a loading and unloading device, an image capturing device and a sampling comparison device according to the first item of the patent application scope. The utility model is used for performing preset operations on the electronic components; the input end conveying device is: the electronic component of the feeding device to be executed is sent to the working unit; the output conveying device is the electronic component for completing the testing operation on the working unit. The job results are sorted and placed in the receiving device. Central Control Unit: Used to control and integrate the various units to perform automated operations.
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TWI690712B (en) * 2018-08-20 2020-04-11 鴻勁精密股份有限公司 Electronic component testing device and application classification equipment

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