TW200801544A - Cool testing device for IC test handler - Google Patents

Cool testing device for IC test handler

Info

Publication number
TW200801544A
TW200801544A TW95121485A TW95121485A TW200801544A TW 200801544 A TW200801544 A TW 200801544A TW 95121485 A TW95121485 A TW 95121485A TW 95121485 A TW95121485 A TW 95121485A TW 200801544 A TW200801544 A TW 200801544A
Authority
TW
Taiwan
Prior art keywords
cool
press
coupling mechanism
cooling
testing
Prior art date
Application number
TW95121485A
Other languages
Chinese (zh)
Other versions
TWI291564B (en
Inventor
Jia Zhang Yang
Original Assignee
Hon Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Tech Inc filed Critical Hon Tech Inc
Priority to TW95121485A priority Critical patent/TWI291564B/en
Application granted granted Critical
Publication of TWI291564B publication Critical patent/TWI291564B/en
Publication of TW200801544A publication Critical patent/TW200801544A/en

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

A cool testing device for IC test handler comprises a pipe provided on a machine platform for connecting a cool testing chamber of an air dryer such that the dry air can be fed into, at least one test seat and a press coupling mechanism disposed in the interior of the cool testing chamber, wherein the press coupling mechanism is provided with a pressing rod driven by a driver, and beneath said pressing rod is mounted at least one cooling chip, a heat-emitting surfaces of which is coupled to a cooling structure, while a cooling surface of the cooling chip is coupled to a press fixture so that the press fixture can be maintained in a constant low-temperature condition by the cooling chip, thereby the press coupling mechanism can urge the press fixture to push against the untested IC of test seat in dry space of cool testing chamber such a manner that said untested IC can be tested in lower-temperature condition of the testing process.
TW95121485A 2006-06-15 2006-06-15 Cool testing device for IC test handler TWI291564B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW95121485A TWI291564B (en) 2006-06-15 2006-06-15 Cool testing device for IC test handler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95121485A TWI291564B (en) 2006-06-15 2006-06-15 Cool testing device for IC test handler

Publications (2)

Publication Number Publication Date
TWI291564B TWI291564B (en) 2007-12-21
TW200801544A true TW200801544A (en) 2008-01-01

Family

ID=39461208

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95121485A TWI291564B (en) 2006-06-15 2006-06-15 Cool testing device for IC test handler

Country Status (1)

Country Link
TW (1) TWI291564B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI426280B (en) * 2011-07-15 2014-02-11 Hon Tech Inc The crimping mechanism of the electronic component testing device
TWI559004B (en) * 2015-08-21 2016-11-21 Hon Tech Inc Electronic components operating equipment and its application of the test classification equipment
TWI564576B (en) * 2015-08-14 2017-01-01 Hon Tech Inc Electronic components crimping device and its application test classification equipment

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI386120B (en) * 2007-12-31 2013-02-11 Hon Hai Prec Ind Co Ltd Holding device for electronic product
TWI385388B (en) * 2009-04-02 2013-02-11 Hon Tech Inc Micro - sensing IC test classification machine
TWI385400B (en) * 2009-05-07 2013-02-11 Hon Tech Inc Test classifier cold test room cold source supply device
TWI403732B (en) * 2010-11-05 2013-08-01 Hon Tech Inc Semiconductor component testing sub-press under pressure device
CN114384404B (en) * 2022-03-23 2022-08-23 上海菲莱测试技术有限公司 Cooling test assembly unit and aging cooling device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI426280B (en) * 2011-07-15 2014-02-11 Hon Tech Inc The crimping mechanism of the electronic component testing device
TWI564576B (en) * 2015-08-14 2017-01-01 Hon Tech Inc Electronic components crimping device and its application test classification equipment
TWI559004B (en) * 2015-08-21 2016-11-21 Hon Tech Inc Electronic components operating equipment and its application of the test classification equipment

Also Published As

Publication number Publication date
TWI291564B (en) 2007-12-21

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Legal Events

Date Code Title Description
MC4A Revocation of granted patent