TW200801544A - Cool testing device for IC test handler - Google Patents
Cool testing device for IC test handlerInfo
- Publication number
- TW200801544A TW200801544A TW95121485A TW95121485A TW200801544A TW 200801544 A TW200801544 A TW 200801544A TW 95121485 A TW95121485 A TW 95121485A TW 95121485 A TW95121485 A TW 95121485A TW 200801544 A TW200801544 A TW 200801544A
- Authority
- TW
- Taiwan
- Prior art keywords
- cool
- press
- coupling mechanism
- cooling
- testing
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
A cool testing device for IC test handler comprises a pipe provided on a machine platform for connecting a cool testing chamber of an air dryer such that the dry air can be fed into, at least one test seat and a press coupling mechanism disposed in the interior of the cool testing chamber, wherein the press coupling mechanism is provided with a pressing rod driven by a driver, and beneath said pressing rod is mounted at least one cooling chip, a heat-emitting surfaces of which is coupled to a cooling structure, while a cooling surface of the cooling chip is coupled to a press fixture so that the press fixture can be maintained in a constant low-temperature condition by the cooling chip, thereby the press coupling mechanism can urge the press fixture to push against the untested IC of test seat in dry space of cool testing chamber such a manner that said untested IC can be tested in lower-temperature condition of the testing process.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95121485A TWI291564B (en) | 2006-06-15 | 2006-06-15 | Cool testing device for IC test handler |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95121485A TWI291564B (en) | 2006-06-15 | 2006-06-15 | Cool testing device for IC test handler |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI291564B TWI291564B (en) | 2007-12-21 |
TW200801544A true TW200801544A (en) | 2008-01-01 |
Family
ID=39461208
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95121485A TWI291564B (en) | 2006-06-15 | 2006-06-15 | Cool testing device for IC test handler |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI291564B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI426280B (en) * | 2011-07-15 | 2014-02-11 | Hon Tech Inc | The crimping mechanism of the electronic component testing device |
TWI559004B (en) * | 2015-08-21 | 2016-11-21 | Hon Tech Inc | Electronic components operating equipment and its application of the test classification equipment |
TWI564576B (en) * | 2015-08-14 | 2017-01-01 | Hon Tech Inc | Electronic components crimping device and its application test classification equipment |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI386120B (en) * | 2007-12-31 | 2013-02-11 | Hon Hai Prec Ind Co Ltd | Holding device for electronic product |
TWI385388B (en) * | 2009-04-02 | 2013-02-11 | Hon Tech Inc | Micro - sensing IC test classification machine |
TWI385400B (en) * | 2009-05-07 | 2013-02-11 | Hon Tech Inc | Test classifier cold test room cold source supply device |
TWI403732B (en) * | 2010-11-05 | 2013-08-01 | Hon Tech Inc | Semiconductor component testing sub-press under pressure device |
CN114384404B (en) * | 2022-03-23 | 2022-08-23 | 上海菲莱测试技术有限公司 | Cooling test assembly unit and aging cooling device |
-
2006
- 2006-06-15 TW TW95121485A patent/TWI291564B/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI426280B (en) * | 2011-07-15 | 2014-02-11 | Hon Tech Inc | The crimping mechanism of the electronic component testing device |
TWI564576B (en) * | 2015-08-14 | 2017-01-01 | Hon Tech Inc | Electronic components crimping device and its application test classification equipment |
TWI559004B (en) * | 2015-08-21 | 2016-11-21 | Hon Tech Inc | Electronic components operating equipment and its application of the test classification equipment |
Also Published As
Publication number | Publication date |
---|---|
TWI291564B (en) | 2007-12-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MC4A | Revocation of granted patent |