TW201517398A - Anisotropic conductive connector, manufacturing and device thereof - Google Patents
Anisotropic conductive connector, manufacturing and device thereof Download PDFInfo
- Publication number
- TW201517398A TW201517398A TW103125430A TW103125430A TW201517398A TW 201517398 A TW201517398 A TW 201517398A TW 103125430 A TW103125430 A TW 103125430A TW 103125430 A TW103125430 A TW 103125430A TW 201517398 A TW201517398 A TW 201517398A
- Authority
- TW
- Taiwan
- Prior art keywords
- conductor
- forming substrate
- anisotropic conductive
- magnetic
- conductive connector
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/16—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for manufacturing contact members, e.g. by punching and by bending
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Abstract
Description
本發明是關於異方性導電連接器以及其生產方法,且更特定言之是關於異方性導電連接器,以及其生產方法以及裝置,其中防止外來材料(Sn)累積於導電部分的末端部分上,在測試時所述導電部分將要接觸待檢測的物件的端子。 The present invention relates to an anisotropic conductive connector and a method of producing the same, and more particularly to an anisotropic conductive connector, and a method and apparatus therefor, wherein a foreign material (Sn) is prevented from accumulating at an end portion of a conductive portion Above, the conductive portion will contact the terminal of the object to be inspected during testing.
待檢測的半導體晶片、電路板或類似物件形成有以高密度整合的精細圖案,且在製造過程期間經歷關於其是正常還是異常的測試。半導體晶片或電路板包含待檢測且具有精細間距的接點。同樣地,將用於測試的電信號提供至待檢測的物件的檢測性電路亦包含檢測性接點,所述檢測性接點的精細間距對應於待檢測物件的檢測接點的精細間距。 The semiconductor wafer, circuit board or the like to be inspected is formed with a fine pattern integrated at a high density, and undergoes a test as to whether it is normal or abnormal during the manufacturing process. The semiconductor wafer or circuit board contains contacts to be detected and having fine pitch. Likewise, the detector circuit that provides the electrical signal for testing to the object to be detected also includes a detective contact whose fine pitch corresponds to the fine pitch of the detected contact of the object to be detected.
為了檢測待檢測物件的電特徵,異方性導電連接器可用於在待檢測物件的檢測接點(凸塊)與檢測性電路的檢測性接點(襯墊)之間進行電連接。 In order to detect the electrical characteristics of the object to be inspected, an anisotropic conductive connector can be used to electrically connect between the sense contact (bump) of the object to be detected and the detective contact (pad) of the detector circuit.
圖1繪示習知的異方性導電連接器10。習知的異方性導 電連接器10包含具有多個導體12以及圍繞多個導體12形成的彈性絕緣體14的平坦彈性體12、14。多個導體12含有具有磁性質且以厚度方向定向的導電粒子,使得在厚度方向上可出現導電性。 FIG. 1 illustrates a conventional anisotropic conductive connector 10. Conventional heterosexuality The electrical connector 10 includes flat elastomers 12, 14 having a plurality of conductors 12 and an elastomeric insulator 14 formed around the plurality of conductors 12. The plurality of conductors 12 contain conductive particles having magnetic properties and oriented in the thickness direction so that conductivity can occur in the thickness direction.
導體12具有平面末端部分,其具有將要接觸待檢測物件的檢測接點(凸塊)的檢測性表面。在測試時,導體12的末端部分許多次按壓且接觸諸如凸塊的檢測接點。在此按壓以及接觸過程期間,外來材料(例如,錫(Sn))轉移至末端部分的表面,且因此增加接觸電阻,藉此縮短連接器的壽命。 The conductor 12 has a planar end portion having a detecting surface that will contact the detecting contact (bump) of the object to be inspected. At the time of testing, the end portion of the conductor 12 is pressed many times and contacts a detection joint such as a bump. During this pressing and contact process, foreign material (for example, tin (Sn)) is transferred to the surface of the end portion, and thus the contact resistance is increased, thereby shortening the life of the connector.
構想本發明以解決前述問題,且本發明的態樣欲提供一種異方性導電連接器,其具有可減少測試時所轉移的外來材料的累積的導體。 The present invention has been conceived to solve the aforementioned problems, and an aspect of the present invention is to provide an anisotropic conductive connector having a conductor which can reduce the accumulation of foreign materials transferred during testing.
本發明的另一態樣欲提供一種異方性導電連接器,其可降低用於電連接於待檢測物件的檢測接點與檢測性電路的檢測性接點之間的導體的電阻。 Another aspect of the present invention is to provide an anisotropic conductive connector that reduces the electrical resistance of a conductor between a sense contact electrically connected to an object to be detected and a detective contact of the detector circuit.
本發明的另一態樣欲提供一種用於製造異方性導電連接器的方法以及裝置,所述連接器具有可減少測試時所轉移外來材料的累積的導體。 Another aspect of the present invention is to provide a method and apparatus for fabricating an anisotropic conductive connector having a conductor that reduces accumulation of foreign material transferred during testing.
藉由提供一種異方性導電連接器而實現本發明的前述及/或其他態樣,所述異方性導電連接器包括:包括多個導體以及圍繞多個導體形成的彈性絕緣體的平面彈性體,所述多個導體中含有具有磁性的導電粒子,所述具有磁性的導電粒子在厚度方向上展示導電性並以厚度方向定向,導體以及彈性絕緣體由一種高分 子物質一體式製成,其中導體包括具有凹凸部分的末端部分,所述凹凸部分將要部分接觸待檢測物件的檢測接點的表面,末端部分比彈性絕緣體的表面較突出。 The foregoing and/or other aspects of the present invention are achieved by providing an anisotropic conductive connector comprising: a planar elastomer comprising a plurality of conductors and an elastomeric insulator formed around the plurality of conductors The plurality of conductors contain conductive particles having magnetic properties, the conductive particles exhibiting conductivity in a thickness direction and oriented in a thickness direction, and the conductor and the elastic insulator are subjected to a high score The sub-substance is integrally formed, wherein the conductor includes an end portion having a concavo-convex portion to be partially in contact with a surface of the detecting contact of the object to be inspected, and the end portion is more protruded than a surface of the elastic insulator.
在對應於多個導體的兩末端部分的位置處形成具有開口的絕緣薄膜,所述絕緣薄膜可配置於平面彈性體的兩側上。 An insulating film having an opening which is disposed on both sides of the planar elastic body is formed at a position corresponding to both end portions of the plurality of conductors.
末端部分可包括塗佈有導電材料的多個凹凸部分。 The end portion may include a plurality of concavo-convex portions coated with a conductive material.
多個凹凸部分可包括中心凹陷圓形尖端、多邊形尖端、圓錐形尖端以及尖端圓化圓錐形中的至少一者。 The plurality of concave and convex portions may include at least one of a central concave circular tip, a polygonal tip, a conical tip, and a tip rounded conical shape.
導體可包括配置於下側處的下部導電體。 The conductor may include a lower electrical conductor disposed at the lower side.
下部導電體可包括在待接觸導體的部分中的突起。 The lower electrical conductor may include a protrusion in a portion of the conductor to be contacted.
下部導電體可包括在待接觸導體的部分中的突起以及凹槽。 The lower electrical conductor may include protrusions and grooves in the portion of the conductor to be contacted.
下部導電體可包括在待接觸導體的部分中的多個凹凸部分。 The lower electrical conductor may include a plurality of concave and convex portions in a portion of the conductor to be contacted.
藉由提供一種製造異方性導電連接器的方法而實現本發明的前述及/或其他態樣,所述方法包括:將第一非磁性形成基板以及第二非磁性形成基板配置成面向彼此,從而在其間留下預定空間,其中第一鐵磁體以預定圖案配置於所述第一非磁性形成基板中,第二鐵磁體以對應於預定圖案的位置配置於所述第二非磁性形成基板中,其中面向彼此的第一鐵磁體以及第二鐵磁體的相對末端部分中的至少一者自形成基板的表面凹陷,且包括凸凹部分;將其中分佈有具有磁性的導電粒子的液態高分子物質配置於面向彼此的第一形成基板與第二形成基板之間;分別將磁體配置於第一形成基板的外部以及第二形成基板的外部處,並施加磁體 的磁力,使得具有磁性的導電粒子可在第一鐵磁體與第二鐵磁體之間以厚度方向定向;以及在以厚度方向定向具有磁性的導電粒子的狀態下,硬化液態高分子物質,以便在第一鐵磁體與第二鐵磁體之間形成包括末端部分的導體,所述末端部分具有對應於多個凸凹部分的多個凹凸部分。 The foregoing and/or other aspects of the present invention are achieved by providing a method of fabricating an anisotropic conductive connector, the method comprising: arranging the first non-magnetic forming substrate and the second non-magnetic forming substrate to face each other, Thereby leaving a predetermined space therebetween, wherein the first ferromagnetic body is disposed in the first non-magnetic forming substrate in a predetermined pattern, and the second ferromagnetic body is disposed in the second non-magnetic forming substrate in a position corresponding to the predetermined pattern Wherein at least one of the first ferromagnetic body facing each other and the opposite end portion of the second ferromagnetic body is recessed from the surface of the forming substrate, and includes a convex-concave portion; the liquid high-molecular substance in which the conductive particles having magnetic properties are distributed Between the first forming substrate facing the other and the second forming substrate; respectively arranging the magnets on the outside of the first forming substrate and the outside of the second forming substrate, and applying the magnet Magnetic force, such that magnetically conductive particles can be oriented in a thickness direction between the first ferromagnet and the second ferromagnet; and in a state in which magnetically conductive particles are oriented in a thickness direction, the liquid polymer material is hardened so as to A conductor including a tip portion having a plurality of concavo-convex portions corresponding to the plurality of concavo-convex portions is formed between the first ferromagnet and the second ferromagnet.
藉由提供一種用於製造異方性導電連接器的裝置而實現 本發明的前述及/或其他態樣,所述裝置包括:第一非磁性形成基板,第一鐵磁體以預定圖案配置於所述第一非磁性形成基板中;第二非磁性形成基板,第二鐵磁體在對應於預定圖案的位置處配置於所述第二非磁性形成基板中;以及一對磁體,其分別配置於第一形成基板的外部處以及第二形成基板的外部處,其中第一形成基板以及第二形成基板經配置以面向彼此,從而留下預定空間,且面向彼此的第一鐵磁體以及第二鐵磁體的相對末端部分中的至少一者自形成基板的表面凹陷,並包括凸凹部分,且其中將其中分佈有具有磁性的導電粒子的液態高分子物質配置於面向彼此的第一形成基板與第二形成基板之間,磁體施加磁力,使得具有磁性的導電粒子可在第一鐵磁體與第二鐵磁體之間以厚度方向定向,在以厚度方向定向具有磁性的導電粒子的狀態下,硬化液態高分子物質,以便在第一鐵磁體與第二鐵磁體之間形成包括末端部分的導體,所述末端部分具有對應於多個凸凹部分的多個凹凸部分。 By providing a device for manufacturing an anisotropic conductive connector In the foregoing and/or other aspects of the present invention, the apparatus includes: a first non-magnetic forming substrate, a first ferromagnetic body disposed in the first non-magnetic forming substrate in a predetermined pattern; and a second non-magnetic forming substrate, a ferromagnetic body disposed in the second non-magnetic forming substrate at a position corresponding to the predetermined pattern; and a pair of magnets disposed at an outer portion of the first forming substrate and an outer portion of the second forming substrate, respectively A forming substrate and a second forming substrate are configured to face each other to leave a predetermined space, and at least one of the first ferromagnetic body facing each other and the opposite end portion of the second ferromagnetic body is recessed from a surface of the forming substrate, and A convex-concave portion is included, and a liquid high-molecular substance in which magnetic conductive particles are distributed is disposed between the first forming substrate and the second forming substrate facing each other, and the magnet applies a magnetic force so that the conductive particles having magnetic properties can be A ferromagnetic body and a second ferromagnetic body are oriented in a thickness direction, and in a state in which magnetic conductive particles are oriented in a thickness direction, hard The liquid high molecular substance is formed to form a conductor including a terminal portion having a plurality of concave and convex portions corresponding to the plurality of convex and concave portions between the first ferromagnetic body and the second ferromagnetic body.
藉由提供一種用於電連接於待檢測物件的檢測接點與檢測性電路的檢測性接點之間的異方性導電連接器而實現本發明的前述及/或其他態樣,所述異方性導電連接器包括:包括多個導體 以及圍繞多個導體形成的彈性絕緣體的平面彈性體,所述多個導體中含有具有磁性的導電粒子,所述具有磁性的導電粒子在厚度方向上展示導電性並以厚度方向定向,導體以及彈性絕緣體由一種高分子物質一體式製成,其中導體包括配置於下側處的下部導電體,且其中下部導電體包括具有待接觸導體的至少一突起或凹槽的末端部分。 The foregoing and/or other aspects of the present invention are achieved by providing an anisotropic conductive connector for electrically connecting a sensing contact of an object to be inspected with a detector contact of a detector circuit, the The square conductive connector includes: including a plurality of conductors And a planar elastomer surrounding an elastic insulator formed of a plurality of conductors, the plurality of conductors containing conductive particles having magnetic properties, the conductive particles exhibiting conductivity in a thickness direction and oriented in a thickness direction, a conductor and an elasticity The insulator is integrally formed of a high molecular material, wherein the conductor includes a lower electrical conductor disposed at a lower side, and wherein the lower electrical conductor includes an end portion having at least one protrusion or groove of the conductor to be contacted.
在根據本發明的異方性導電連接器中,導體的末端部分形成為尖銳尖端,使得即使多次執行按壓以及接觸過程仍可減少外來材料的累積,藉此不增加而是長期維持接觸電阻。因此,根據本發明的異方性導電連接器不僅改良檢測的可靠性,亦延長其壽命。 In the anisotropic conductive connector according to the present invention, the end portion of the conductor is formed as a sharp tip, so that the accumulation of the foreign material can be reduced even if the pressing and the contact process are performed a plurality of times, thereby not increasing but maintaining the contact resistance for a long period of time. Therefore, the anisotropic conductive connector according to the present invention not only improves the reliability of detection but also prolongs its life.
又,暫停檢測過程以及拆卸並清潔檢測裝置(此是歸因於外來材料在導體的末端部分上的累積)的次數得以降低,藉此減少生產成本。 Also, the number of times the detection process is suspended and the detecting device is disassembled and cleaned (this is due to the accumulation of foreign materials on the end portion of the conductor) is reduced, thereby reducing the production cost.
又,將導電結構配置於導體與檢測性電路的檢測性接點之間,且因此降低檢測性信號的導電路徑中的電阻。 Also, the conductive structure is disposed between the conductor and the detective contact of the detector circuit, and thus the resistance in the conductive path of the detective signal is reduced.
3‧‧‧檢測性電路板 3‧‧‧Detective circuit board
4‧‧‧襯墊 4‧‧‧ cushion
10‧‧‧異方性導電連接器 10‧‧‧ anisotropic conductive connector
12‧‧‧導體 12‧‧‧Conductor
13‧‧‧平面末端部分 13‧‧‧End of the plane
14‧‧‧彈性絕緣體 14‧‧‧Elastic insulator
100‧‧‧異方性導電連接器 100‧‧‧ anisotropic conductive connector
110‧‧‧導電外皮層 110‧‧‧Electrical outer skin
120‧‧‧導體 120‧‧‧ conductor
130、150‧‧‧末端部分 130, 150‧‧‧ end part
132、134‧‧‧凹凸部分 132, 134‧‧‧ concave part
140‧‧‧絕緣體 140‧‧‧Insulator
160‧‧‧第一絕緣薄膜 160‧‧‧First insulating film
180‧‧‧第二絕緣薄膜 180‧‧‧Second insulation film
190‧‧‧下部導電體 190‧‧‧Lower conductor
192‧‧‧突起 192‧‧ ‧ prominence
194‧‧‧凹槽 194‧‧‧ Groove
200‧‧‧第一形成基板 200‧‧‧First forming substrate
210‧‧‧第一鐵磁體 210‧‧‧First Ferromagnetic
212、214‧‧‧末端部分 212, 214‧‧‧ end part
300‧‧‧第二形成基板 300‧‧‧Second forming substrate
310‧‧‧第二鐵磁體 310‧‧‧Second ferromagnet
400、500‧‧‧電磁體 400, 500‧‧‧ electromagnets
L‧‧‧液態高分子物質 L‧‧‧Liquid polymer materials
P‧‧‧導電粒子 P‧‧‧ conductive particles
S110、S120、S130、S140‧‧‧步驟 S110, S120, S130, S140‧‧ steps
圖1為習知異方性導電連接器的部分橫截面圖。 1 is a partial cross-sectional view of a conventional anisotropic conductive connector.
圖2至圖8為分別繪示根據第一至第七例示性實施例的具有導體的異方性導電連接器的視圖。 2 to 8 are views respectively showing an anisotropic conductive connector having a conductor according to first to seventh exemplary embodiments.
圖9至圖12為根據例示性實施例的用於製造異方性導電連接器的過程的視圖。 9 through 12 are views of a process for fabricating an anisotropic conductive connector, in accordance with an exemplary embodiment.
圖13為繪示根據例示性實施例的製造異方性導電連接器的方法的流程圖。 FIG. 13 is a flow chart illustrating a method of fabricating an anisotropic conductive connector, in accordance with an exemplary embodiment.
圖14為繪示在本發明異方性導電連接器與習知異方性導電連接器之間的外來材料(Sn)的累積狀態的比較的相片。 Figure 14 is a photograph showing a comparison of the cumulative state of foreign material (Sn) between the anisotropic conductive connector of the present invention and a conventional anisotropic conductive connector.
圖15至圖17為分別繪示根據第八至第十例示性實施例的具有導體的異方性導電連接器的視圖。 15 to 17 are views respectively showing an anisotropic conductive connector having a conductor according to eighth to tenth exemplary embodiments.
在下文中,將參考隨附圖式較詳細地描述本發明的例示 性實施例。為清楚描述起見,將省略無關於描述的事物。又,貫穿全文,類似編號指代相同或類似元件。 Hereinafter, an illustration of the present invention will be described in more detail with reference to the accompanying drawings. Sexual embodiment. For the sake of clear description, things that are not described are omitted. Throughout the text, like numerals refer to like or like elements.
圖2為繪示根據第一例示性實施例的異方性導電連接器 100的視圖。異方性導電連接器100包含具有多個導體120以及圍繞多個導體120形成的彈性絕緣體140的平面彈性體120、140;配置於平面彈性體的一側處的第一絕緣薄膜160;以及配置於平面彈性體的另一側處的第二絕緣薄膜180。 2 is a diagram showing an anisotropic conductive connector according to a first exemplary embodiment 100 view. The anisotropic conductive connector 100 includes a planar elastomer 120, 140 having a plurality of conductors 120 and an elastic insulator 140 formed around the plurality of conductors 120; a first insulating film 160 disposed at one side of the planar elastomer; a second insulating film 180 at the other side of the planar elastomer.
如圖2中所繪示,導體120包含將要接觸待檢測半導體 或類似物件的端子(凸塊)的第一末端部分130,以及待接觸檢測性電路基板的襯墊(未繪示)的第二末端部分150。第一末端部分130包含將要部分接觸待檢測物件的檢測接點的表面的多個凹凸部分132以及凹凸部分134。 As shown in FIG. 2, the conductor 120 includes a semiconductor to be in contact with the semiconductor to be inspected. The first end portion 130 of the terminal (bump) of the or similar member, and the second end portion 150 of the pad (not shown) to be contacted with the detecting circuit substrate. The first end portion 130 includes a plurality of concavo-convex portions 132 and a concavo-convex portion 134 that are to partially contact the surface of the detecting joint of the object to be inspected.
多個凹凸部分132以及凹凸部分134經塑形為類似四尖 王冠(four point crown),藉由在長度以及寬度方向上自圓柱形末端部分的平面切割V形形狀而形成所述形狀。亦即,與四個圓柱 形表面相接的頂點134可接觸待檢測物件的檢測接點的表面。 The plurality of concave and convex portions 132 and the concave and convex portions 134 are shaped like a four-pointed shape A four point crown is formed by cutting a V shape from a plane of a cylindrical end portion in the length and width directions. That is, with four cylinders The apex 134 where the surface surfaces meet may contact the surface of the detection joint of the object to be inspected.
如圖9中所繪示,凹凸部分132、凹凸部分134由當形成時配置於第一形成基板200中的第一鐵磁體210的末端部分形狀212、214形成。亦即,凹凸部分132、凹凸部分134可由第一鐵磁體210的對應凸凹部分212、凸凹部分214形成。 As shown in FIG. 9, the uneven portion 132 and the uneven portion 134 are formed by the end portion shapes 212, 214 of the first ferromagnetic body 210 disposed in the first forming substrate 200 when formed. That is, the concavo-convex portion 132 and the concavo-convex portion 134 may be formed by the corresponding convex-concave portion 212 and the convex-concave portion 214 of the first ferromagnetic body 210.
舉例而言,凹凸部分132、凹凸部分134可包含電鍍有具有高導電性的金、銀、銅、鈀、銠等的導電外皮層110。可藉由濕式或乾式電鍍方法塗佈導電外皮層110。 For example, the concavo-convex portion 132 and the concavo-convex portion 134 may include a conductive outer skin layer 110 plated with gold, silver, copper, palladium, rhodium, or the like having high conductivity. The conductive skin layer 110 can be applied by a wet or dry plating method.
在導體120中,用以在厚度方向上展示導電性的具有磁性的導電粒子P以厚度方向定向。導電粒子P必須具有磁性,以便由液態高分子物質(稍後描述)內的強磁力定向。 In the conductor 120, magnetically-conductive particles P for exhibiting conductivity in the thickness direction are oriented in the thickness direction. The conductive particles P must have magnetic properties to be oriented by a strong magnetic force in a liquid high molecular substance (described later).
導體120的導電粒子P可(例如)包含鐵、鈷、鎳或類似金屬的粒子或其合金的粒子。 The conductive particles P of the conductor 120 may, for example, comprise particles of iron, cobalt, nickel or a metal-like particle or alloy thereof.
又,導電粒子P可包含含有鐵、鈷、鎳或類似金屬的粒子,或各自包含被視作核心粒子的上述粒子且電鍍有具有高導電性的金、銀、銅、鈀、銠等的粒子。 Further, the conductive particles P may include particles containing iron, cobalt, nickel or the like, or particles each containing the above-mentioned particles regarded as core particles and plated with gold, silver, copper, palladium, rhodium or the like having high conductivity. .
又,導電粒子P可各自包含被視作核心粒子且電鍍有諸如鎳、鈷等的導電磁性金屬的無機或聚合粒子,諸如非磁性金屬粒子或玻璃珠子。 Further, the conductive particles P may each contain inorganic or polymeric particles, such as non-magnetic metal particles or glass beads, which are regarded as core particles and plated with a conductive magnetic metal such as nickel, cobalt or the like.
絕緣體140由待由熱量硬化的高分子物質製成。絕緣體140使多個導體120彼此絕緣。藉由在導電粒子P在液態高分子物質形成時分佈於液態高分子物質內的狀態下,將強磁力應用於形成導體120的側,並藉此將導電粒子P聚集至導體120上,絕緣體140可具有絕緣性。 The insulator 140 is made of a polymer material to be hardened by heat. The insulator 140 insulates the plurality of conductors 120 from each other. The strong magnetic force is applied to the side where the conductor 120 is formed in a state where the conductive particles P are distributed in the liquid high molecular substance at the time of formation of the liquid high molecular substance, and thereby the conductive particles P are collected onto the conductor 120, and the insulator 140 It can be insulated.
可用於獲得構成導體120以及絕緣體140的高分子物質 的熱固性高分子物質形成材料可(例如)包含聚丁二烯橡膠、天然橡膠、聚異戊二烯橡膠、苯乙烯-丁二烯共聚物橡膠、丙烯腈-丁二烯共聚物橡膠,以及類似共軛二烯橡膠以及其氫化物;苯乙烯-丁二烯-二烯嵌段共聚物橡膠、苯乙烯-異戊二烯嵌段共聚物,以及類似嵌段共聚物橡膠以及其氫化物;氯丁二烯、胺基甲酸酯橡膠、聚酯橡膠、表氯醇橡膠、矽橡膠、乙烯-丙烯共聚物橡膠,以及乙烯-丙烯-二烯共聚物橡膠等。其中,考慮到耐久性、形成可加工性以及電性質,可使用矽橡膠。作為矽橡膠,液態矽液態矽橡膠可經交聯或經縮合。液態矽橡膠可(例如)包含二甲基矽生橡膠、甲基乙烯基矽生橡膠、甲基苯基乙烯基矽生橡膠等。又,矽橡膠可具有10,000至40,000的分子量Mw(亦即,針對標準聚苯乙烯所轉換的重量平均分子量)。又,所獲得導體120具有良好的耐熱性,且因此分子量分佈指數(亦即,針對標準聚苯乙烯所轉換的重量平均分子量Mw與針對標準聚苯乙烯所轉換的數量平均分子量Mn的比率Mw/Mn)可等於或小於2。 Can be used to obtain a polymer substance constituting the conductor 120 and the insulator 140 The thermosetting polymer material forming material may, for example, comprise polybutadiene rubber, natural rubber, polyisoprene rubber, styrene-butadiene copolymer rubber, acrylonitrile-butadiene copolymer rubber, and the like. Conjugated diene rubber and hydride thereof; styrene-butadiene-diene block copolymer rubber, styrene-isoprene block copolymer, and similar block copolymer rubber and hydride thereof; chlorine Butadiene, urethane rubber, polyester rubber, epichlorohydrin rubber, ruthenium rubber, ethylene-propylene copolymer rubber, and ethylene-propylene-diene copolymer rubber. Among them, ruthenium rubber can be used in consideration of durability, workability, and electrical properties. As the ruthenium rubber, the liquid ruthenium liquid ruthenium rubber can be crosslinked or condensed. The liquid ruthenium rubber may, for example, comprise dimethyl ruthenium rubber, methyl vinyl ruthenium rubber, methyl phenyl vinyl ruthenium rubber or the like. Further, the ruthenium rubber may have a molecular weight Mw of 10,000 to 40,000 (i.e., a weight average molecular weight converted for standard polystyrene). Further, the obtained conductor 120 has good heat resistance, and thus the molecular weight distribution index (that is, the ratio of the weight average molecular weight Mw converted for the standard polystyrene to the number average molecular weight Mn converted for the standard polystyrene Mw/ Mn) may be equal to or less than 2.
根據例示性實施例,凹凸部分132、凹凸部分134僅形成 於異方性導電連接器100的導體120的第一末端部分130中,但並不限於此情況。替代性地,凹凸部分可視需要形成於第二末端部分150中。類似於此情況,可藉由處理第二形成基板300的第二鐵磁體310的末端部分,以在其形成時使其對應於所要的凹凸部分,而容易地形成第二末端部分150的凹凸部分。 According to an exemplary embodiment, the uneven portion 132 and the uneven portion 134 are formed only In the first end portion 130 of the conductor 120 of the anisotropic conductive connector 100, but is not limited thereto. Alternatively, the uneven portion may be formed in the second end portion 150 as needed. Similarly to this case, the concavo-convex portion of the second end portion 150 can be easily formed by processing the end portion of the second ferromagnetic body 310 of the second forming substrate 300 so as to correspond to the desired concavo-convex portion when it is formed. .
圖3繪示根據第二例示性實施例的異方性導電連接器100。 FIG. 3 illustrates an anisotropic conductive connector 100 in accordance with a second exemplary embodiment.
如圖3中所繪示,導體120的第一末端部分130包含將要部分接觸待檢測物件的檢測接點的表面的凹凸部分132、凹凸部分134。藉由在圓柱形末端部分的表面上形成圓錐形凹槽而塑形根據第二例示性實施例的凹凸部分132、凹凸部分134。 As illustrated in FIG. 3, the first end portion 130 of the conductor 120 includes a concavo-convex portion 132, a concavo-convex portion 134 that is to partially contact the surface of the detecting contact of the object to be inspected. The concavo-convex portion 132, the concavo-convex portion 134 according to the second exemplary embodiment is shaped by forming a conical groove on the surface of the cylindrical end portion.
根據第二例示性實施例的凹凸部分132、凹凸部分134經塑形為類似漏斗,且具有接觸待檢測物件的檢測接點的表面的外邊緣。可藉由處理配置於第一形成基板200中的第一鐵磁體210的末端部分212、末端部分214,以在其如圖9中所繪示形成時使其具有圓錐形形狀,而容易地形成根據第二例示性實施例的凹凸部分132、凹凸部分134。 The concavo-convex portion 132, the concavo-convex portion 134 according to the second exemplary embodiment is shaped like a funnel, and has an outer edge that contacts the surface of the detecting joint of the object to be detected. The end portion 212 and the end portion 214 of the first ferromagnetic body 210 disposed in the first forming substrate 200 can be easily formed by having a conical shape when formed as shown in FIG. The uneven portion 132, the uneven portion 134 according to the second exemplary embodiment.
同樣地,根據第二例示性實施例的凹凸部分132、凹凸部分134可包含電鍍有具有高導電性的金、銀、銅、鈀、銠等的導電外皮層110。 Likewise, the uneven portion 132 and the uneven portion 134 according to the second exemplary embodiment may include a conductive outer skin layer 110 plated with gold, silver, copper, palladium, rhodium, or the like having high conductivity.
圖4繪示根據第三例示性實施例的異方性導電連接器100。 FIG. 4 illustrates an anisotropic conductive connector 100 in accordance with a third exemplary embodiment.
如圖4中所繪示,導體120的第一末端部分130包含將要部分接觸待檢測物件的檢測接點的表面的凹凸部分132、凹凸部分134。藉由在長度以及寬度方向上自截頭式四邊角錐形的頂表面切割V形形狀兩次,而形成根據第三例示性實施例的凹凸部分132、凹凸部分134。 As illustrated in FIG. 4, the first end portion 130 of the conductor 120 includes a concavo-convex portion 132, a concavo-convex portion 134 that is to partially contact the surface of the detecting contact of the object to be inspected. The concavo-convex portion 132 and the concavo-convex portion 134 according to the third exemplary embodiment are formed by cutting the V-shaped shape twice from the top surface of the truncated quadrangular pyramid in the length and width directions.
根據第三例示性實施例的凹凸部分132、凹凸部分134包含九個四邊角錐形,使得四邊角錐形的九個頂點可接觸待檢測物件的檢測接點的表面。可藉由處理配置於第一形成基板200中的第一鐵磁體210的末端部分212、末端部分214,以在其如圖9 中所繪示形成時使其具有九個四邊角錐形凹槽,而容易地形成根據第三例示性實施例的凹凸部分132、凹凸部分134。 The concavo-convex portion 132, the concavo-convex portion 134 according to the third exemplary embodiment includes nine quadrangular pyramids such that nine vertices of the quadrangular pyramid shape can contact the surface of the detecting joint of the object to be detected. The end portion 212 and the end portion 214 of the first ferromagnetic body 210 disposed in the first forming substrate 200 may be processed to be in FIG. 9 It is shown that it has nine quadrangular pyramidal grooves when formed, and the uneven portion 132 and the uneven portion 134 according to the third exemplary embodiment are easily formed.
同樣地,根據第三例示性實施例的凹凸部分132、凹凸部 分134可包含電鍍有具有高導電性的金、銀、銅、鈀、銠等的導電外皮層110。 Similarly, the uneven portion 132 and the uneven portion according to the third exemplary embodiment The sub-section 134 may comprise a conductive outer skin layer 110 plated with gold, silver, copper, palladium, rhodium, etc. having high electrical conductivity.
圖5繪示根據第四例示性實施例的異方性導電連接器 100。 FIG. 5 illustrates an anisotropic conductive connector according to a fourth exemplary embodiment 100.
如圖5中所繪示,導體120的第一末端部分130包含將 要部分接觸待檢測物件的檢測接點的表面的凹凸部分132、凹凸部分134。藉由在長度以及寬度方向上自圓柱形末端部分的平面切割V形形狀七次,形成根據第四例示性實施例的凹凸部分132、凹凸部分134。當然,可視需要變化四邊角錐形的數目。 As depicted in Figure 5, the first end portion 130 of the conductor 120 contains The concave and convex portion 132, the uneven portion 134 of the surface of the detecting joint of the object to be detected is partially contacted. The concavo-convex portion 132, the concavo-convex portion 134 according to the fourth exemplary embodiment is formed by cutting the V-shape seven times from the plane of the cylindrical end portion in the length and width directions. Of course, the number of quadrangular pyramids can be varied as needed.
根據第四例示性實施例的凹凸部分132、凹凸部分134 包含多個四邊角錐形,使得四邊角錐形的頂點可接觸待檢測物件的檢測接點的表面。可藉由處理配置於第一形成基板200中的第一鐵磁體210的末端部分212、末端部分214,以在其如圖9中所繪示形成時使其具有多個四邊角錐形凹槽,而容易地形成根據第四例示性實施例的凹凸部分132、凹凸部分134。 The uneven portion 132, the uneven portion 134 according to the fourth exemplary embodiment A plurality of quadrangular pyramids are included such that the apex of the quadrangular pyramid can contact the surface of the detection joint of the object to be inspected. The end portion 212 and the end portion 214 of the first ferromagnetic body 210 disposed in the first forming substrate 200 may be processed to have a plurality of quadrangular pyramidal grooves when formed as shown in FIG. The uneven portion 132 and the uneven portion 134 according to the fourth exemplary embodiment are easily formed.
同樣地,根據第四例示性實施例的凹凸部分132、凹凸部 分134可包含電鍍有具有高導電性的金、銀、銅、鈀、銠等的導電外皮層110。 Similarly, the uneven portion 132 and the uneven portion according to the fourth exemplary embodiment The sub-section 134 may comprise a conductive outer skin layer 110 plated with gold, silver, copper, palladium, rhodium, etc. having high electrical conductivity.
圖6繪示根據第五例示性實施例的異方性導電連接器 100。 FIG. 6 illustrates an anisotropic conductive connector according to a fifth exemplary embodiment 100.
如圖6中所繪示,導體120的第一末端部分130包含將 要部分接觸待檢測物件的檢測接點的表面的凹凸部分132、凹凸部分134。藉由在長度以及寬度方向上自截頭圓錐形的頂表面切割V形形狀一次,形成根據第五例示性實施例的凹凸部分132、凹凸部分134。 As depicted in Figure 6, the first end portion 130 of the conductor 120 contains The concave and convex portion 132, the uneven portion 134 of the surface of the detecting joint of the object to be detected is partially contacted. The concavo-convex portion 132 and the concavo-convex portion 134 according to the fifth exemplary embodiment are formed by cutting the V-shape once from the top surface of the frustoconical shape in the length and width directions.
根據第五例示性實施例的凹凸部分132、凹凸部分134 包含四個多邊角錐形,使得四個頂點可接觸待檢測物件的檢測接點的表面。可藉由處理配置於第一形成基板200中的第一鐵磁體210的末端部分212、末端部分214,以在其如圖9中所繪示形成時使其圓錐形凹槽的切割底部上具有交叉脊,而容易地形成根據第五例示性實施例的凹凸部分132、凹凸部分134。 The uneven portion 132 and the uneven portion 134 according to the fifth exemplary embodiment The four polygonal pyramids are included such that the four vertices can contact the surface of the detection joint of the object to be inspected. The end portion 212 and the end portion 214 of the first ferromagnetic body 210 disposed in the first forming substrate 200 may be processed to have a tapered bottom portion of the conical groove when it is formed as shown in FIG. The uneven portion 132 and the uneven portion 134 according to the fifth exemplary embodiment are easily formed by intersecting the ridges.
同樣地,根據第五例示性實施例的凹凸部分132、凹凸部 分134可包含電鍍有具有高導電性的金、銀、銅、鈀、銠等的導電外皮層110。 Similarly, the uneven portion 132 and the uneven portion according to the fifth exemplary embodiment The sub-section 134 may comprise a conductive outer skin layer 110 plated with gold, silver, copper, palladium, rhodium, etc. having high electrical conductivity.
圖7繪示根據第六例示性實施例的異方性導電連接器 100。 FIG. 7 illustrates an anisotropic conductive connector according to a sixth exemplary embodiment 100.
如圖7中所繪示,導體120的第一末端部分130包含將 要部分接觸待檢測物件的檢測接點的表面的凹凸部分132、凹凸部分134。根據第六例示性實施例的凹凸部分132、凹凸部分134經塑形為類似圓錐形。 As depicted in Figure 7, the first end portion 130 of the conductor 120 contains The concave and convex portion 132, the uneven portion 134 of the surface of the detecting joint of the object to be detected is partially contacted. The uneven portion 132 and the uneven portion 134 according to the sixth exemplary embodiment are shaped like a conical shape.
根據第六例示性實施例的凹凸部分132、凹凸部分134 包含一圓錐形,使得一頂點可接觸待檢測物件的檢測接點的表面。可藉由處理配置於第一形成基板200中的第一鐵磁體210的末端部分212、末端部分214,以在其如圖9中所繪示形成時具有圓錐形凹槽,而容易地形成根據第六例示性實施例的凹凸部分 132、凹凸部分134。 The uneven portion 132, the uneven portion 134 according to the sixth exemplary embodiment A conical shape is included such that a vertex can contact the surface of the detection joint of the object to be inspected. The end portion 212 and the end portion 214 of the first ferromagnetic body 210 disposed in the first forming substrate 200 can be processed to have a conical groove when formed as shown in FIG. 9, and can be easily formed according to Concave convex portion of the sixth exemplary embodiment 132, concave and convex portion 134.
同樣地,根據第六例示性實施例的凹凸部分132、凹凸部 分134可包含電鍍有具有高導電性的金、銀、銅、鈀、銠等的導電外皮層110。 Similarly, the uneven portion 132 and the uneven portion according to the sixth exemplary embodiment The sub-section 134 may comprise a conductive outer skin layer 110 plated with gold, silver, copper, palladium, rhodium, etc. having high electrical conductivity.
圖8繪示根據第七例示性實施例的異方性導電連接器100。 FIG. 8 illustrates an anisotropic conductive connector 100 in accordance with a seventh exemplary embodiment.
如圖8中所繪示,導體120的第一末端部分130包含將要部分接觸待檢測物件的檢測接點的表面的凹凸部分132、凹凸部分134。藉由圓化圓錐形的尖銳尖端部分而形成根據第七例示性實施例的凹凸部分132、凹凸部分134。 As illustrated in Fig. 8, the first end portion 130 of the conductor 120 includes a concavo-convex portion 132, a concavo-convex portion 134 that is to be partially in contact with the surface of the detecting joint of the object to be inspected. The concavo-convex portion 132, the concavo-convex portion 134 according to the seventh exemplary embodiment is formed by rounding a conical sharp tip portion.
根據第七例示性實施例的凹凸部分132、凹凸部分134包含具有經圓化尖端部分的一圓錐形,使得相對較大接點可與待檢測物件的檢測接點的表面接觸。可藉由處理配置於第一形成基板200中的第一鐵磁體210的末端部分212、末端部分214,以在其如圖9中所繪示形成時使其具有圓錐形凹槽的經圓化底部,而容易地形成根據第七例示性實施例的凹凸部分132、凹凸部分134。 The concavo-convex portion 132, the concavo-convex portion 134 according to the seventh exemplary embodiment includes a conical shape having a rounded tip portion such that a relatively large contact can come into contact with a surface of the detecting contact of the object to be detected. The end portion 212 and the end portion 214 of the first ferromagnetic body 210 disposed in the first forming substrate 200 can be processed to have a rounded shape of a conical groove when it is formed as shown in FIG. At the bottom, the uneven portion 132, the uneven portion 134 according to the seventh exemplary embodiment is easily formed.
同樣地,根據第七例示性實施例的凹凸部分132、凹凸部分134可包含電鍍有具有高導電性的金、銀、銅、鈀、銠等的導電外皮層110。 Also, the uneven portion 132, the uneven portion 134 according to the seventh exemplary embodiment may include a conductive outer skin layer 110 plated with gold, silver, copper, palladium, iridium, or the like having high conductivity.
在下文中,將參考圖9描述用於製造前述異方性導電連接器100的裝置,所述連接器包含具有根據第一至第七例示性實施例的凹凸部分132、凹凸部分134的第一末端部分。 Hereinafter, a device for manufacturing the aforementioned anisotropic conductive connector 100 including the first end having the uneven portion 132, the uneven portion 134 according to the first to seventh exemplary embodiments will be described with reference to FIG. section.
如圖9中所繪示,用於製造根據本發明的異方性導電連接器100的裝置可包含:第一鐵磁體210以預定圖案配置於其中 的非磁性第一形成基板200;第二鐵磁體310對應於預定圖案地定位於其中的非磁性第二形成基板300;以及分別配置於第一形成基板200以及第二形成基板300的外部上的一對電磁體400、電磁體500。 As illustrated in FIG. 9, the apparatus for manufacturing the anisotropic conductive connector 100 according to the present invention may include the first ferromagnetic body 210 being disposed therein in a predetermined pattern. a non-magnetic first forming substrate 200; a second ferromagnetic body 310 corresponding to the non-magnetic second forming substrate 300 positioned therein in a predetermined pattern; and respectively disposed on the outer portions of the first forming substrate 200 and the second forming substrate 300 A pair of electromagnets 400 and an electromagnet 500.
第一形成基板200以及第二形成基板300經配置以在預 定間隔處面向彼此,且面向彼此的第一鐵磁體210以及第二鐵磁體310的相對末端部分中的至少一者包含凸凹部分。 The first forming substrate 200 and the second forming substrate 300 are configured to be in advance The spaced apart portions face each other, and at least one of the first ferromagnetic body 210 facing each other and the opposite end portions of the second ferromagnetic body 310 includes a convex and concave portion.
在下文中,將參考圖9至圖13描述製造包含導體120的 異方性導電連接器100的方法,所述導體具有具根據例示性實施例的凹凸部分132、凹凸部分134的第一末端部分130。 Hereinafter, the fabrication of the conductor 120 including the conductor 120 will be described with reference to FIGS. 9 to 13 . In the method of the anisotropic conductive connector 100, the conductor has a first end portion 130 having a concavo-convex portion 132, a concavo-convex portion 134 according to an exemplary embodiment.
首先,如圖9中所繪示,將非磁性第一形成基板200與 非磁性第二形成基板300置放為面向彼此,從而留下預定空間(圖13中所繪示的步驟S110),其中第一鐵磁體210以預定圖案配置於非磁性第一形成基板200中,且第二鐵磁體310對應於前述圖案地配置於非磁性第二形成基板300中。此時,處理面向彼此的第一鐵磁體以及第二鐵磁體的相對末端部分中的至少一者,以具有凸凹部分214、凸凹部分212。 First, as shown in FIG. 9, the non-magnetic first forming substrate 200 is The non-magnetic second forming substrates 300 are placed to face each other, thereby leaving a predetermined space (step S110 illustrated in FIG. 13 ) in which the first ferromagnetic body 210 is disposed in the non-magnetic first forming substrate 200 in a predetermined pattern, And the second ferromagnet 310 is disposed in the non-magnetic second forming substrate 300 corresponding to the aforementioned pattern. At this time, at least one of the first ferromagnetic body facing each other and the opposite end portions of the second ferromagnetic body are treated to have the convex-concave portion 214 and the convex-concave portion 212.
然後,將其中分佈有具有磁性的導電粒子P的液態高分 子物質L配置於面向彼此的第一形成基板與第二形成基板之間(圖13中所繪示的步驟S120)。 Then, a liquid high score in which the conductive particles P having magnetic properties are distributed The sub-substance L is disposed between the first forming substrate and the second forming substrate facing each other (step S120 illustrated in FIG. 13).
接著,將電磁體400以及電磁體500分別配置於第一形 成基板200的外部處以及第二形成基板300的外部處,以將磁力施加至第一形成基板200以及第二形成基板300,藉此如圖10中所繪示地在第一鐵磁體210與第二鐵磁體310之間的厚度上定向 導電粒子P(圖13中所繪示的步驟S130)。 Next, the electromagnet 400 and the electromagnet 500 are respectively disposed in the first shape At the outer portion of the substrate 200 and at the outer portion of the second forming substrate 300, a magnetic force is applied to the first forming substrate 200 and the second forming substrate 300, whereby the first ferromagnetic body 210 is Orientation in thickness between second ferromagnetic bodies 310 Conductive particles P (step S130 depicted in Fig. 13).
最後,在於厚度方向上定向具有磁性的導電粒子P的狀 態下,硬化液態高分子物質。接著,移除第一形成基板200以及第二形成基板300,以形成如圖11中所繪示的具有第一末端部分130的導體120以及包含環繞導體120的絕緣體140的平面彈性體,所述第一末端部分具有對應於凸凹部分214、凸凹部分212的凹凸部分(圖13中所繪示的步驟S140)。然後,藉由濕式或乾式電鍍方法,將電鍍有具有高導電性的金、銀、銅、鈀、銠等的導電外皮層110形成於第一末端部分130上。可在附著第一絕緣薄膜以及第二絕緣薄膜(稍後描述)之後,形成導電外皮層110。 Finally, the shape of the conductive particles P having magnetic properties is oriented in the thickness direction. In the state, the liquid polymer substance is hardened. Next, the first forming substrate 200 and the second forming substrate 300 are removed to form a conductor 120 having a first end portion 130 as illustrated in FIG. 11 and a planar elastomer including an insulator 140 surrounding the conductor 120, The first end portion has a concavo-convex portion corresponding to the convex-concave portion 214 and the convex-concave portion 212 (step S140 illustrated in Fig. 13). Then, a conductive outer skin layer 110 plated with gold, silver, copper, palladium, rhodium, or the like having high conductivity is formed on the first end portion 130 by a wet or dry plating method. The conductive outer skin layer 110 may be formed after attaching the first insulating film and the second insulating film (described later).
又,如圖12中所繪示,形成有開口170以及開口190的 第一絕緣薄膜160以及第二絕緣薄膜180附著於對應於相對末端130以及末端150的位置處,使得導體120的末端130以及末端150兩者可曝露於平面彈性體120、140的兩表面。 Also, as shown in FIG. 12, an opening 170 and an opening 190 are formed. The first insulating film 160 and the second insulating film 180 are attached at positions corresponding to the opposite ends 130 and the ends 150 such that both the ends 130 and the ends 150 of the conductors 120 can be exposed to both surfaces of the planar elastic bodies 120, 140.
根據例示性實施例,將第一末端部分130插入於第一絕 緣薄膜160的開口170中,當待檢測物件的端子為凸塊時,此操作是較佳的。因此,若待檢測物件的端子經塑形為類似柱、孔、襯墊以及引線,則可將末端部分形成為對應於端子的形狀。 According to an exemplary embodiment, the first end portion 130 is inserted into the first In the opening 170 of the edge film 160, this operation is preferable when the terminal of the object to be detected is a bump. Therefore, if the terminals of the object to be inspected are shaped like columns, holes, pads, and leads, the end portions can be formed to correspond to the shape of the terminals.
如上文所描述,根據例示性實施例,導體120的第一末 端部分130的突起132將要接觸待檢測物件的檢測性接點的表面,且因此轉移諸如錫(Sn)的外來材料的可能性較低。 As described above, in accordance with an exemplary embodiment, the first end of the conductor 120 The protrusion 132 of the end portion 130 will contact the surface of the detective contact of the item to be inspected, and thus the possibility of transferring foreign material such as tin (Sn) is low.
圖14為繪示具有平面末端部分13的習知導體12以及本發明導體120的在測試100,000次之後的錫(Sn)轉移的相片,其中所述本發明導體120具有根據例示性實施例的凹凸部分的末端 部分130。如圖14中所繪示,在習知導體中,錫(Sn)轉移並累積得較多。 14 is a photograph showing a conventional conductor 12 having a planar end portion 13 and a tin (Sn) transfer after 100,000 tests of the conductor 120 of the present invention, wherein the conductor 120 of the present invention has a bump according to an exemplary embodiment. Partial end Part 130. As shown in Fig. 14, in the conventional conductor, tin (Sn) is transferred and accumulated more.
圖15繪示根據第八例示性實施例的異方性導電連接器100,其中下部導電體190配置於導體120的下側處。 FIG. 15 illustrates an anisotropic conductive connector 100 in accordance with an eighth exemplary embodiment, wherein the lower electrical conductor 190 is disposed at a lower side of the conductor 120.
下部導電體190用以將檢測性電路板3的襯墊4與連接器120電連接。下部導電體190可包含在將要接觸導體120的部分中的突起192。因此,當包含於導體120中的導電粒子接觸下部導電體190時,突起192允許較多導電粒子接觸下部導電體190,藉此降低電阻。另一方面,圖1中所繪示的習知異方性導電連接器10具有相對較高電阻,此是因為較少導電粒子接觸導體的相對較小橫截面區域。下部導電體190可由金、銀、銅、鈀、銠或類似高導電性金屬製成。 The lower conductor 190 is used to electrically connect the gasket 4 of the circuit board 3 to the connector 120. The lower electrical conductor 190 can include a protrusion 192 in the portion that will contact the conductor 120. Therefore, when the conductive particles contained in the conductor 120 contact the lower conductor 190, the protrusion 192 allows more conductive particles to contact the lower conductor 190, thereby lowering the electric resistance. On the other hand, the conventional anisotropic conductive connector 10 illustrated in Figure 1 has a relatively high electrical resistance because less conductive particles contact a relatively small cross-sectional area of the conductor. The lower conductor 190 may be made of gold, silver, copper, palladium, rhodium, or a similar highly conductive metal.
圖16繪示根據第九例示性實施例的異方性導電連接器100,其中用於電連接於檢測性電路板3的襯墊4與連接器120之間的下部導電體190配置於導體120的下側處。下部導電體190可包含在將要接觸導體120的部分中的突起192以及凹槽194。因此,當包含於導體120中的導電粒子接觸下部導電體190時,突起192以及凹槽194允許較多導電粒子接觸下部導電體190。 16 illustrates an anisotropic conductive connector 100 in which a lower electrical conductor 190 between a pad 4 for electrically connecting to the detector circuit board 3 and the connector 120 is disposed on the conductor 120, in accordance with a ninth exemplary embodiment. At the lower side. The lower electrical conductor 190 can include protrusions 192 and recesses 194 in the portion that will contact the conductor 120. Therefore, when the conductive particles contained in the conductor 120 contact the lower conductor 190, the protrusion 192 and the groove 194 allow more conductive particles to contact the lower conductor 190.
圖17繪示根據第十例示性實施例的異方性導電連接器100,其中用於電連接於檢測性電路板3的襯墊4與連接器120之間的下部導電體190配置於導體120的下側處。下部導電體190可包含在將要接觸導體120的部分中的多個突起192以及凹槽194。因此,當包含於導體120中的導電粒子接觸下部導電體190時,突起192以及凹槽194允許較多導電粒子接觸下部導電體 190。儘管已繪示並描述幾個例示性實施例,但熟習此項技術者將瞭解,可在不脫離本發明的原理以及精神的情況下,對此等例示性實施例作出改變,在所附申請專利範圍以及其等效物中定義本發明的範疇。 17 illustrates an anisotropic conductive connector 100 in which a lower electrical conductor 190 between a pad 4 for electrically connecting to the detector circuit board 3 and the connector 120 is disposed on the conductor 120, in accordance with the tenth exemplary embodiment. At the lower side. The lower electrical conductor 190 can include a plurality of protrusions 192 and recesses 194 in the portion that will contact the conductor 120. Therefore, when the conductive particles contained in the conductor 120 contact the lower conductor 190, the protrusion 192 and the recess 194 allow more conductive particles to contact the lower conductor 190. While several illustrative embodiments have been shown and described, it will be understood by those skilled in the art The scope of the invention is defined by the scope of the patent and its equivalents.
100‧‧‧異方性導電連接器 100‧‧‧ anisotropic conductive connector
110‧‧‧導電外皮層 110‧‧‧Electrical outer skin
120‧‧‧導體 120‧‧‧ conductor
130、150‧‧‧末端部分 130, 150‧‧‧ end part
132‧‧‧凹凸部分 132‧‧‧ concave part
134‧‧‧凹凸部分 134‧‧‧ concave and convex parts
140‧‧‧絕緣體 140‧‧‧Insulator
160‧‧‧第一絕緣薄膜 160‧‧‧First insulating film
180‧‧‧第二絕緣薄膜 180‧‧‧Second insulation film
Claims (11)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020130101607A KR101318351B1 (en) | 2013-08-27 | 2013-08-27 | Anisotropic conductive connector, production method and production device therefor |
KR1020140058037A KR101580549B1 (en) | 2014-05-14 | 2014-05-14 | Anisotropic conductive connector, production method and production device therefor |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201517398A true TW201517398A (en) | 2015-05-01 |
TWI542086B TWI542086B (en) | 2016-07-11 |
Family
ID=52586863
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103125430A TWI542086B (en) | 2013-08-27 | 2014-07-25 | Anisotropic conductive connector, manufacturing and device thereof |
Country Status (2)
Country | Link |
---|---|
TW (1) | TWI542086B (en) |
WO (1) | WO2015030357A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110546517A (en) * | 2017-02-27 | 2019-12-06 | 迪睿合株式会社 | Inspection jig for electrical characteristics |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018084438A (en) * | 2016-11-21 | 2018-05-31 | 株式会社エンプラス | Electric contactor and socket for electric component |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006051845A1 (en) * | 2004-11-12 | 2006-05-18 | Jsr Corporation | Probe member for wafer inspection, probe card for wafer inspection and wafer inspection apparatus |
CN101449426B (en) * | 2006-04-11 | 2012-05-16 | Jsr株式会社 | Anisotropic conductive connector and anisotropic conductive connector device |
JP2008164476A (en) * | 2006-12-28 | 2008-07-17 | Jsr Corp | Anisotropic conductive connector apparatus and manufacturing method of the same, and inspection apparatus for circuit apparatus |
JP2009244096A (en) * | 2008-03-31 | 2009-10-22 | Jsr Corp | Sheet-like probe and method for manufacturing of same |
-
2014
- 2014-06-20 WO PCT/KR2014/005491 patent/WO2015030357A1/en active Application Filing
- 2014-07-25 TW TW103125430A patent/TWI542086B/en active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110546517A (en) * | 2017-02-27 | 2019-12-06 | 迪睿合株式会社 | Inspection jig for electrical characteristics |
US11402408B2 (en) | 2017-02-27 | 2022-08-02 | Dexerials Corporation | Electrical characteristics inspection tool |
Also Published As
Publication number | Publication date |
---|---|
TWI542086B (en) | 2016-07-11 |
WO2015030357A1 (en) | 2015-03-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101573450B1 (en) | Test socket | |
KR101706331B1 (en) | Test socket | |
TWI526700B (en) | Test socket with high density conduction section | |
KR101339166B1 (en) | Test socket with conductive powder having through-hole and fabrication method thereof | |
TWI692642B (en) | Conductive contact and anisotropic conductive sheet with the same | |
KR101366171B1 (en) | Test socket with high density conduction section | |
KR101353481B1 (en) | Test socket with high density conduction section | |
KR101976701B1 (en) | anisotropic conductive sheet | |
KR101606866B1 (en) | Test connector | |
KR101471116B1 (en) | Test socket with high density conduction section | |
KR101318351B1 (en) | Anisotropic conductive connector, production method and production device therefor | |
KR101614472B1 (en) | Test connector | |
KR101575830B1 (en) | Test socket | |
KR102153221B1 (en) | Anisotropic conductive sheet | |
TWI542086B (en) | Anisotropic conductive connector, manufacturing and device thereof | |
KR20160023162A (en) | Electrical connecting connector | |
TWI550980B (en) | Connection connector and method of manufacturing the same | |
TW201611443A (en) | Contact sheet and socket structure | |
KR102173427B1 (en) | Anisotropic conductive sheet | |
KR102004501B1 (en) | Anisotropic conductive sheet | |
US20220057434A1 (en) | Conductive particle and testing socket comprising the same | |
KR101580549B1 (en) | Anisotropic conductive connector, production method and production device therefor | |
KR20190050688A (en) | Anisotropic conductive sheet | |
KR100972662B1 (en) | Test socket having pressing protection member | |
KR20240010319A (en) | Conductive particles for electrical test, connector for electrical test and fabrication method of conductive particles |