TW201305574A - 高頻訊號路徑調整方式及其測試裝置 - Google Patents

高頻訊號路徑調整方式及其測試裝置 Download PDF

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Publication number
TW201305574A
TW201305574A TW100125996A TW100125996A TW201305574A TW 201305574 A TW201305574 A TW 201305574A TW 100125996 A TW100125996 A TW 100125996A TW 100125996 A TW100125996 A TW 100125996A TW 201305574 A TW201305574 A TW 201305574A
Authority
TW
Taiwan
Prior art keywords
wire
wires
frequency signal
circuit board
probe
Prior art date
Application number
TW100125996A
Other languages
English (en)
Chinese (zh)
Other versions
TWI467190B (enExample
Inventor
wei-zheng Gu
zhi-hao He
zhen-guo Gao
zhao-ping Xie
Original Assignee
Mpi Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mpi Corp filed Critical Mpi Corp
Priority to TW100125996A priority Critical patent/TW201305574A/zh
Priority to CN201210247223.9A priority patent/CN102890168B/zh
Priority to US13/554,528 priority patent/US8816713B2/en
Publication of TW201305574A publication Critical patent/TW201305574A/zh
Application granted granted Critical
Publication of TWI467190B publication Critical patent/TWI467190B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW100125996A 2011-07-22 2011-07-22 高頻訊號路徑調整方式及其測試裝置 TW201305574A (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW100125996A TW201305574A (zh) 2011-07-22 2011-07-22 高頻訊號路徑調整方式及其測試裝置
CN201210247223.9A CN102890168B (zh) 2011-07-22 2012-07-17 高频讯号路径调整方式及其测试装置
US13/554,528 US8816713B2 (en) 2011-07-22 2012-07-20 Probe card having adjustable high frequency signal transmission path for transmission of high frequency signal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW100125996A TW201305574A (zh) 2011-07-22 2011-07-22 高頻訊號路徑調整方式及其測試裝置

Publications (2)

Publication Number Publication Date
TW201305574A true TW201305574A (zh) 2013-02-01
TWI467190B TWI467190B (enExample) 2015-01-01

Family

ID=47533733

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100125996A TW201305574A (zh) 2011-07-22 2011-07-22 高頻訊號路徑調整方式及其測試裝置

Country Status (3)

Country Link
US (1) US8816713B2 (enExample)
CN (1) CN102890168B (enExample)
TW (1) TW201305574A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI612312B (zh) * 2017-05-03 2018-01-21 創意電子股份有限公司 探針卡系統、探針載體裝置及探針載體裝置之製法
TWI620940B (zh) * 2016-11-14 2018-04-11 旺矽科技股份有限公司 探針卡及其多重訊號傳輸板
CN108802443A (zh) * 2017-05-03 2018-11-13 创意电子股份有限公司 探针卡系统、探针载体装置及探针载体装置的制法
TWI705255B (zh) * 2019-09-20 2020-09-21 中華精測科技股份有限公司 用於檢測晶片的測試裝置

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108362995A (zh) * 2013-10-12 2018-08-03 深圳市爱德特科技有限公司 一种创新的fpga的使用方法
US10406420B2 (en) * 2015-04-29 2019-09-10 More Useless Tools, Inc. Portable lighting apparatus and carrying rack
CN106935524B (zh) 2015-12-24 2020-04-21 台湾积体电路制造股份有限公司 探针卡和晶圆测试系统及晶圆测试方法
CN106053895A (zh) * 2016-07-22 2016-10-26 苏州韬盛电子科技有限公司 一种用于50GHz高频的检测装置及其检测方法
CN107765164A (zh) * 2017-09-28 2018-03-06 国营芜湖机械厂 一种电路板高频信号调整方法
TWI647457B (zh) * 2017-10-23 2019-01-11 旺矽科技股份有限公司 探針卡及訊號路徑切換模組總成
US10914756B2 (en) * 2018-08-14 2021-02-09 Keysight Technologies, Inc. Miniature test probe
CN112788865A (zh) * 2019-11-08 2021-05-11 相互股份有限公司 用于组装测试复合基板的装置及方法
TWI750683B (zh) * 2020-06-02 2021-12-21 緯穎科技服務股份有限公司 訊號測試裝置以及訊號測試方法
TWI788970B (zh) * 2020-10-14 2023-01-01 旺矽科技股份有限公司 整合不同電性測試之探針卡
CN114295931B (zh) * 2021-11-19 2023-07-14 广东电力通信科技有限公司 一种新型电力物联网配电网数据实时测量装置
US12467951B2 (en) * 2022-04-22 2025-11-11 Tecat Technologies (Suzhou) Limited Probe device

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004100105A1 (en) * 2003-05-07 2004-11-18 Koninklijke Philips Electronics N.V. Traffic information system for conveying information to drivers
KR100945369B1 (ko) * 2003-06-30 2010-03-08 엘지디스플레이 주식회사 표시기기의 검사장치 및 그 검사방법
TWI244169B (en) 2004-05-12 2005-11-21 Siliconware Precision Industries Co Ltd High electric performance semiconductor package
TW200804822A (en) 2006-07-06 2008-01-16 Microelectonics Technology Inc High-frequency probe card and transmission line for high-frequency probe card
TW200829923A (en) * 2007-01-15 2008-07-16 Microelectonics Technology Inc High frequency suspension arm probe
CN101266262B (zh) * 2007-03-13 2010-09-01 旺矽科技股份有限公司 高速测试卡
KR100965923B1 (ko) * 2007-06-05 2010-06-25 엠피아이 코포레이션 프로브 테스트 장치
CN101526553A (zh) * 2008-03-07 2009-09-09 旺矽科技股份有限公司 探针卡
TWM361631U (en) 2009-03-26 2009-07-21 Mpi Corp Cantilever probe card

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI620940B (zh) * 2016-11-14 2018-04-11 旺矽科技股份有限公司 探針卡及其多重訊號傳輸板
TWI612312B (zh) * 2017-05-03 2018-01-21 創意電子股份有限公司 探針卡系統、探針載體裝置及探針載體裝置之製法
CN108802443A (zh) * 2017-05-03 2018-11-13 创意电子股份有限公司 探针卡系统、探针载体装置及探针载体装置的制法
CN108802443B (zh) * 2017-05-03 2021-03-12 创意电子股份有限公司 探针卡系统、探针载体装置及探针载体装置的制法
TWI705255B (zh) * 2019-09-20 2020-09-21 中華精測科技股份有限公司 用於檢測晶片的測試裝置

Also Published As

Publication number Publication date
US8816713B2 (en) 2014-08-26
CN102890168B (zh) 2015-02-11
TWI467190B (enExample) 2015-01-01
US20130021053A1 (en) 2013-01-24
CN102890168A (zh) 2013-01-23

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