TW200841016A - Pronged fork probe tip - Google Patents

Pronged fork probe tip Download PDF

Info

Publication number
TW200841016A
TW200841016A TW096121506A TW96121506A TW200841016A TW 200841016 A TW200841016 A TW 200841016A TW 096121506 A TW096121506 A TW 096121506A TW 96121506 A TW96121506 A TW 96121506A TW 200841016 A TW200841016 A TW 200841016A
Authority
TW
Taiwan
Prior art keywords
probe
tip
axis
shaft
node
Prior art date
Application number
TW096121506A
Other languages
English (en)
Chinese (zh)
Inventor
Alexander Leon
Original Assignee
Hewlett Packard Development Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co filed Critical Hewlett Packard Development Co
Publication of TW200841016A publication Critical patent/TW200841016A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
TW096121506A 2007-04-13 2007-06-14 Pronged fork probe tip TW200841016A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2007/009156 WO2008127241A1 (fr) 2007-04-13 2007-04-13 Embout de sonde-fourche à facettes

Publications (1)

Publication Number Publication Date
TW200841016A true TW200841016A (en) 2008-10-16

Family

ID=38809811

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096121506A TW200841016A (en) 2007-04-13 2007-06-14 Pronged fork probe tip

Country Status (2)

Country Link
TW (1) TW200841016A (fr)
WO (1) WO2008127241A1 (fr)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0835986A (ja) * 1994-07-21 1996-02-06 Aiwa Co Ltd 基板検査用コンタクトプローブ
JP4398061B2 (ja) * 2000-04-28 2010-01-13 日置電機株式会社 コンタクトプローブの製造方法
US6538424B1 (en) * 2000-07-31 2003-03-25 Le Croy Corporation Notched electrical test probe tip
JP2005308619A (ja) * 2004-04-23 2005-11-04 Hioki Ee Corp プランジャー

Also Published As

Publication number Publication date
WO2008127241A1 (fr) 2008-10-23

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