TW200841016A - Pronged fork probe tip - Google Patents

Pronged fork probe tip Download PDF

Info

Publication number
TW200841016A
TW200841016A TW096121506A TW96121506A TW200841016A TW 200841016 A TW200841016 A TW 200841016A TW 096121506 A TW096121506 A TW 096121506A TW 96121506 A TW96121506 A TW 96121506A TW 200841016 A TW200841016 A TW 200841016A
Authority
TW
Taiwan
Prior art keywords
probe
tip
axis
shaft
node
Prior art date
Application number
TW096121506A
Other languages
English (en)
Chinese (zh)
Inventor
Alexander Leon
Original Assignee
Hewlett Packard Development Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co filed Critical Hewlett Packard Development Co
Publication of TW200841016A publication Critical patent/TW200841016A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
TW096121506A 2007-04-13 2007-06-14 Pronged fork probe tip TW200841016A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2007/009156 WO2008127241A1 (fr) 2007-04-13 2007-04-13 Embout de sonde-fourche à facettes

Publications (1)

Publication Number Publication Date
TW200841016A true TW200841016A (en) 2008-10-16

Family

ID=38809811

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096121506A TW200841016A (en) 2007-04-13 2007-06-14 Pronged fork probe tip

Country Status (2)

Country Link
TW (1) TW200841016A (fr)
WO (1) WO2008127241A1 (fr)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0835986A (ja) * 1994-07-21 1996-02-06 Aiwa Co Ltd 基板検査用コンタクトプローブ
JP4398061B2 (ja) * 2000-04-28 2010-01-13 日置電機株式会社 コンタクトプローブの製造方法
US6538424B1 (en) * 2000-07-31 2003-03-25 Le Croy Corporation Notched electrical test probe tip
JP2005308619A (ja) * 2004-04-23 2005-11-04 Hioki Ee Corp プランジャー

Also Published As

Publication number Publication date
WO2008127241A1 (fr) 2008-10-23

Similar Documents

Publication Publication Date Title
KR100664393B1 (ko) 통전 시험용 프로브
JP5113392B2 (ja) プローブおよびそれを用いた電気的接続装置
TW492219B (en) Membrane probing system
JP4792465B2 (ja) 通電試験用プローブ
US6441315B1 (en) Contact structures with blades having a wiping motion
US7602200B2 (en) Probe for electrical test comprising a positioning mark and probe assembly
US20100213956A1 (en) Probe for current test, probe assembly and production method thereof
US7279912B2 (en) Dual arcuate blade probe tip
JP2007278859A5 (fr)
WO2007100713A2 (fr) Approche pour fabriquer des sondes de cantilever
TW201018939A (en) Circuit board testing using a probe
JP5631131B2 (ja) 通電試験用プローブ及びプローブ組立体
TW200841016A (en) Pronged fork probe tip
KR100988814B1 (ko) 프로브 카드용 프로브 및 그 제조 방법
JP5438908B2 (ja) 電気的試験用接触子、これを用いた電気的接続装置及び接触子の製造方法
US7316065B2 (en) Method for fabricating a plurality of elastic probes in a row
TW200848744A (en) Dual arcuate blade probe tip
US20070084903A1 (en) Pronged fork probe tip
JP2009216562A5 (fr)
JP3425125B2 (ja) Ｂｇａパッケージ用ソケット
JP2011089918A (ja) 接触子
TW200918917A (en) Testing probe and electrical connection method using the same
JP2006300807A (ja) 通電試験用プローブ
JPH0145029B2 (fr)
JP4308371B2 (ja) コンタクトプローブ及びプローブ装置