TW200841016A - Pronged fork probe tip - Google Patents

Abstract

Provided is a pronged fork probe tip (100) for probing a node, such as a through-hole node (1900), on a circuit. The probe tip (100) has a shaft (104) made from an electrically conductive material, concentric to a longitudinal probe axis (102), and two fork prongs (106, 108) coupled to the shaft (104) and positioned parallel to the probe axis (102). The two fork prongs (106, 108) provide two geometrically singular points of contact (110, 112), concentrating applied force from the shaft (104) to the node hole (1900), and more particularly, to solder (1904) within the node hole (1900), at two points. A self-cleaning space (116, 600) between the fork prongs (106, 108) aid in preventing clogging of the probe (100) by flux material (1906) and/or debris. The shaft (104) may also include a plunger (1800) and/or a structure to provide a preferred fixed orientation by preventing rotation of the probe (100) about the probe axis (102).

Description

200841016 IX. INSTRUCTIONS: [Technical Leadership of the Invention] Field of the Invention The present invention generally relates to the field of electrical test probes, and in particular to a sharp-pointed 5-fork probe; [off ^ month VI #支冬好] BACKGROUND OF THE INVENTION In general, modern electrical products employ printed circuit assemblies (PCAs), such as printed circuit boards. A wide range of products, including, for example, mobile phones, 10 laptops, MP3 players, gaming panels, Personal Data Assistants and Aircraft Components • The printed circuits within these products interconnect a variety of different circuit components, such as diodes, transistors, resistors, integrated circuits, and the like. One or more feet or pins (often referred to as lead wires). Use a circuit board that provides electrical traces for different components and facilitates the permanent mounting of components on the board to make individual components effective. Due to the manufacturing complexity of many products, the PCA is assembled in stages. A given PCA and at least some of its components may therefore be subject to repeated processing steps. Therefore, the components frequently need to be monitored and tested during the process to ensure that the final device can operate. If an uncorrectable flaw is detected early, further assembly of the product can be stopped to save additional manufacturing costs. An electrical connection is provided between the PCA component and the test instrument. ^ ^Electrical test plate needle ' is normally joined to an electrically conductive axis 5 200841016 = guided detection tip composed of 'the electrically conductive axis is connected to — The board and ten are aligned to the test accessories of a specific component. " The components are connected to pcA by __. The ring has caused the (four) material-based solder to no material. Using the error-free solder for assembly and Test process caused extra ==

10 15

, the pick-up, can pass through the hole back ... and the clothes to the board to borrow > Xiao Xiao wave soldering process and cost. The method of installing the Τ 组件 组件 component is a type of surface adhesion technology (SMT) component (5). 5. The dry material is applied to the board in a lean form using a template. The assembly is then I: brought into the weld month, and/or along with the solder paste into the holes in the panel. The plate is then heated to the solder melting temperature to allow the solder to flow back so that it wets the surface and/or the port will be bonded to the pins of one of the plates. In addition to solder metal, 'there is also a combination of chemicals called fluxes that help the solder maintain I ^ / as an adhesive to adhere the paste to the pads and pins, thereby holding the components on the plate after reflow. The metal of the pad and the pins are cleaned up to achieve a good bridging joint. The reflow process releases the flux component of the paste and leaves a entanglement residue on the board and solder joint. The cosolvent residue is a combination of non-conductive materials. Holes in the board are frequently used to mount components and/or provide board interconnections. When the reflowed solder flows into the holes, it may be partially or completely filled. The flux material will also flow into the holes and collect on top of the reflowed solder. The flux material can be located below the pad of the aperture, flush or overflow or protrude above it. When the hole and/or its surrounding pad is the target of a test probe, the flux 6 200841016 agent residue may prevent a reliable and reproducible electrical connection between the pad and the target. Also, a specific amount of force is typically used when the test probe tip is driven into the recording. If excessive force is applied, this can damage the fresh joints, components or the board itself. If too little force is applied, the probe may not be charged to -5 points to (4) and - the qualified component may be strained with fatigue. Because of this, there is a need for a low force that can repeatedly produce good electrical contact between a test probe and its target. Most of the well-known test probe tips are generally conical or narrowed to other shapes. This point, which is in-line with the longitudinal axis of the probe, permits the concentration of forces that are in-line with the axis, thus limiting probe wear. The conventional probe point is aimed at fluxing, the deepest part of the pond, relative to the through-hole filled with solder containing the concave surface of the concave liquid which is filled by the beach-like flux residue. Attempts to contact the solder may be frustrated, and although the node may actually function properly, the test may fail. 5 There are also probe tips with two or more tips to align with the pile-shaped solder elements • the upper cup, crown and radial star. However, as the number of contact points increases, the surface area of the contact increases. More specifically, as the number of contact points increases, the concentration of the force applied to each point decreases. This effect can be shown by way of example of a person sitting on a shoe. Because the 2〇 snowshoes distribute their weight across a large surface area on the snow, the person can walk through the soft ground. - In a more precise example, the force value applied to a beer (a heart) from a single point will transfer the force value of 12. The same force applied by the three points shows that only 4 forces are applied at each point, which is one-third of the total force (2 3 4). In the case of Easy 5, the contact force applied by the column base is divided by the number of joints, and the conductivity is 200841016. The material limits how small the contact surface area of each tip can be made. Therefore, a ^w three-tip probe ringing 2=^ rim will have a scale contact table _). _ force more times (assuming all tips 5

10 Therefore, 'a proper electrical contact between the contact portion of the starting tip, the crown tip or the like and the solder is determined by the second two pieces = the tip system is also provided by the presence of the (four) agent. The system (4) causes a lower connection. In addition, the cup-shaped tip and the multi-point tip may be easily soiled by the solvent-promoting material. As the tip of the probe attempts to reach the solder underneath the material (4), the assisted rider is compacted to _ and/or along the multiple weeks. This material can be concentrated to the point where the probe tip is simply unable to make electrical contact, or even a clean test location.

Since the single-section portion tends to align with the center of the hole at the thickest point of the fluxing, the single-point tip is less suitable for detecting through-holes that are blocked or covered by the flux material. The tab tip and the tip having three or more tips result in a force distribution over the increased surface area. It may be avoided that the multi-point tip of the co-solvent material has a smaller 20 force that penetrates the solvent residue and is easily soiled by the flux that collects at the tip of the probe, and thus cannot be reproducible and Reliable electrical contact. Therefore, the inert contact between the probe and the solder is not achieved in all cases and the test system may erroneously evaluate a healthy board and/or component as defective due to contact failure. Also, bad contact may cause 200841016 to cause bad boards to be corrected (4). Due to the expensive phase, the elimination of good products, the rejection of good products, or the support of customers during the warranty period, the bad products of the division will be expensive. This kind of incorrect evaluation will cost

"Thus, there is a need for a device that overcomes more than one of the above-mentioned drawbacks. [Inventive Summary] The present invention provides a contact probe for detecting a node on a Thai package road. By way of example only, according to the embodiment, there is provided a tip-and-tip probe tip for use on a wipe-on-circuit, comprising: a = line; a shaft made of an electrically conductive material, Axis and probe ^ = heart; two-pronged tip 'which is lightly coupled to the axis and parallel to the probe axis, = tip provides one end contact point; and - self-cleaning space, which is disposed on the two-forked tip between. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side elevational view of a two-pointed probe according to an embodiment; FIG. 2 is a side elevational cross-sectional view of the pointed probe of FIG. 1; FIG. - Example - Partial Stereo 4 of the tined probe shows a side cross-sectional view of the face-: tines probe according to a point μ >, such as - (d) _ biased self-cleaning space /5 Figure 41 (4) Side-viewing cross-sectional view of the configuration of the 1st generation embodiment; aj 9 200841016 Partial perspective view of the alternative tip-type probe; Probe of the tip of the probe shown in the figure; side view of the tip probe; the two sides of the tip probe; the figure is a side view of a tines probe; / Figure is a side view of an alternative probe - a side view of an alternative embodiment;

$ Figure is a side view of an alternative embodiment of a large-sized probe; the sub-graph is a side view 10 of an alternative embodiment of a large fork probe; #固为第图的图A prong tip end view of a tined probe; Figure 15 is a side view of a headed embodiment of a tined probe; Figure 16 is a headless alternative embodiment of a tined probe Figure 17 is a plan view of an alternative embodiment of a pick-up probe; and Figure 18 is a portion of a tines-type needle including a plunger according to an alternative embodiment. Figure 19 shows a two-way method for a tines probe according to one embodiment; and a second figure shows a top view of a node hole for testing with a tines probe; The figure shows a high-level flow chart of the method of use. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT(S) DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT The description is to be construed as illustrative and not restrictive. The concept here is not limited to the use or application of a specific two-pointed and 5 type probe. Accordingly, while the tools described herein are illustrative, exemplary, and illustrated for convenience, the principles herein are equally applicable to other types of tines probes. • Referring now to the drawings, and more particularly to Figures 1 through 4, wherein the tip/tip probe tip is shown to detect a node on a circuit, specifically, in at least one embodiment One hole node. In at least one embodiment, the pointed probe 100 has a longitudinal probe axis 102, a shaft 104 concentric with the probe axis 1〇2, and two prongs 106, 108 each providing an end contact point 11〇, 112, prongs 106, 108 and contact points 110, 112 〇 15 for providing a probe tip 114 are coupled to the shaft 1〇4 and along the probe axis 102. Position and provide the apex of the tip 114. Each of the prongs 106, 108 is parallel to the probe axis 102. In at least one embodiment, the prongs 1〇6, (10) are lightly coupled to the axis just on the opposite side of the probe axis 102. Also, at least in the embodiment, the pointed ends 106, 108 are located in the same plane 308 (see Figure 3), which is parallel to 20 and includes the probe axis 1〇2. This configuration provides a tip-finger probe tip along the probe axis: In at least one alternative embodiment, the prongs 106 108 are not located in the same plane as the acantral axis 1 〇 4, and thus, the |, , , , , , , , , , contact_. The second is in a plane transverse to the probe axis 104. 11 200841016 The structure of the tines probe tip 100 can be further understood from the partial perspective provided in Fig. 3. Also, in at least one embodiment, the tip portion 114 is defined along the needle axis 102 by two opposing faces 30, 3, 2. The faces 3〇〇, 3〇2 converge toward each other along a first axis (shown as a z-axis) substantially parallel to the probe axis 102. The faces 3, 302 are separated along a second axis (shown as the X axis) that is transverse to the probe axis 1〇2 and pushed to the contact points 11〇, 112. And the pushing and separating of the faces 300, 302 places the prongs 1 〇 6, 1 〇 8 on opposite sides of the stylus axis 102. Each of the prongs 1 〇 6, 1 〇 8 turns to provide contacts 110, 112, respectively. The prongs 106, 1 〇 8 further define an area or space 116 between the contact points 110, 112. This space 116 is distinguished from the apex of the tip 114 provided by the prong tip 1 , 6 , 108 and applied to the probe axis 102 . As discussed further below, space 116 is a self-cleaning space. Please understand and understand that the prongs 1Q6, 108 provide pin point contacts 11〇, 15 112. In other words, the contact points 110, 112 are sharp tips that provide substantially singular contact points as distinguished from multi-point geometric contact surfaces or regions in a common plane. Figure 2 provides a cross-sectional view of the tines probe 100 shown in Figure 1 along the probe axis 1〇2, which shows half of the self-cleaning space 116. As shown in FIG. 20, the display of the self-cleaning space 116 is formed by a first surface 150 extending from the tip contact point 110 to the side 204 and a second surface 2〇〇 extending from the contact point 110 to the side 206. section. Referring to Figures 1 through 3, the self-cleaning space 116 has a central region pole 152 disposed along the probe axis 1〇2 in a first plane 3〇8 (χζ plane, see 12 200841016, Figure 3). The fork tip is between l〇6 and l〇8. The self-cleaning space 116 further has exiting pole regions 154 and 154 above the central region 152. The exit regions 154 and 154' are located along a second axis (shown as the Y axis) in a second plane 310 (YZ plane, see Figure 3). Referring to Fig. 3, it can be seen that the 5 exiting region 154 is located above the central region pole 152 with respect to the Z axis and the Y axis. Specifically, there is a slope angle from the central region pole 152 to the exit region 154 and additionally to the exit region 154'. g As shown in Fig. 3, the first surface 150 is defined by the boundary between the contact points no, the central region pole 152, and the exit region pole 154 as shown. The tenth surface 150' is defined by the boundary between the contact points 112, the central region pole 152, and the exit region pole 154 as shown. The second surface 2 is defined by the edge between the contact points - 110, the central region pole 152, and the exit region pole 154 (see Figure 2). A second surface 200, (not shown in Fig. 3; see Fig. 14) is defined by the edge between the contact points 112, the central region pole 152, and the exit 15 from the region pole 154 (see Figure 2). . # In common, the first and second surfaces 150, 150, 20〇, 2〇0 provide a self-cleaning aspect for the self-cleaning space 116. Since the pointed probe is brought into contact with a node for testing, debris such as solder residue, flux, dust or other material may enter the self-cleaning space 116. The bevel angles of the second and second surfaces 150, 150, 200, 200 may advantageously ensure that such debris will be deflected away from the probe axis and will not get stuck in the self-cleaning void 116. More specifically, the first surface 15 and the second surface 200 share a common edge 304 between the contact point 110 and the central region pole 152. Similarly, the first table 13 200841016 face 150' and the second surface 2〇〇 share a common edge 306 between the contact point 112 and the central region pole i52. As shown in FIG. 4, any material 400 that approaches from the apex of the tip 110 and strikes the first surface 150 or the second surface 2〇〇 is biased away from the probe axis 102 and thus away from the tines probe 1〇〇. . 5 Since the cavity, aperture or other semi-enclosed structure is not provided within the self-cleaning space 116, the self-cleaning space 116 does not trap and collect the debris material. In the event that any of the swarf material collects on the first or second surface 150, 150, 200, 2, the new swarf material entering the self-cleaning space 116 in the post-test cycle is the first and second surfaces. 15〇, 15〇', 2〇〇, 2〇〇, push the gathered material away from the probe axis 102, and thus prevent the tip ι4 from being discerned. Figure 5 provides a cross-sectional side elevational cross-sectional view of the tines probe shown in Figure 1 along the probe axis 1〇2. Although in FIG. 2, the self-cleaning work 116 is not shown as having a flat first and second surface ι5 〇, 2 〇 0, the first and second surfaces 500, 502 are shown as Curved. 15 such a linear surface may be advantageous in at least one embodiment to further enhance the self-cleaning aspect of the self/monthly space 116 and as an alternative to convenient manufacturing. Referring to Figures 1 through 3, it is apparent that in at least one embodiment, the tip portion 114 is formed from the shaft 1041. More specifically, since the shaft 1() 4 has a substantially-cross section, 20 can understand that the cross-tips 1 (10), (10) of the respective contact points ii 〇, m have a substantially rectangular shape and have a convex shape. Side 312 and two flat sides 314, 316. 6 to 8 provide an alternative embodiment of the tines probe tip 1G0. A partial perspective view of the & reverberative probe (10) is provided. The top of the large probe is shown in Fig. 8, and Fig. 8 provides the tip probe tip 1 shown in Fig. 6 along the axis of the probe 14 200841016. Side view of the cross section. As shown in Figures 1 through 5, the tines probe tip 1() shown in Figures 6 through 8 has a longitudinal probe axis 102 which is concentric with one axis 5 104 ' for the probe axis 1 〇 2 And two split prongs 106, 108 for providing a probe tip 114. The two prongs 106, 108 provide contact points ι1 〇, 112, respectively. Unlike the embodiment shown in Figs. 1 to 5, Figs. 6 to 8 show an embodiment in which the self-cleaning space 6 (10) is provided by two intersection portions of at least two curved structures. More specifically, the self-cleaning spaces 6 〇 q 10 shown in Figures 6 through 8 are formed by two curved surfaces 602, 604, each of which may be part of a cylinder, sphere, egg or other three-dimensional curved surface. As shown, the curved surfaces 602, 604 intersect in the first plane 3〇8 (χζ plane) and are pushed from the central pole region 152 to the contact points 11〇 and 112. Bebey ground, as described above in Figure 4, the debris material entering the self-cleaning space 600 along a path approaching the probe axis 15 1〇2 will encounter the curved surface 602 or 604 (shown in Figure 4) For the surface 15〇, 200). As the curved slope of the curved surfaces 602, 604 is directed away from the probe axis 1〇2, the blow debris is deflected away from the probe tip 110. Since there are no cavities, apertures or other open structures in the self-cleaning space, the self-cleaning space 600 does not trap and collect the flux residue or other substances. For self-cleaning spaces 116 and 600, both are shown to be symmetrical about probe axis 102. This symmetry is a design preference and may be advantageous for a particular embodiment. In an alternative embodiment, the self-cleaning space 116 or 6〇〇 may be skewed toward the center axis 102 and/or the center of the tip 114. In addition, 15 200841016 self-cleaning spaces 116 and 600 are shown as simple ramp-like structures. In at least one alternative embodiment, the surface defining the self-cleaning space (eg, 150, 150, 200, 200', 500, 502, 602, 604) may have a decoupling tapered path or other bias to define The outline of the channel (not shown). 5 Referring to Figures 6 through 8, it is apparent that in at least one embodiment, the tip portion 114 is formed from the shaft 1〇4. More specifically, since the shaft 104 has a substantially circular cross-section, it can be appreciated that the cross-sections of the prongs 1 , 6 , 108 of the respective contact points 110 , 112 may be generally triangular in shape with a convex side 606 . And two concave sides 608, 610. Referring to Figures 3 and 6 and the side cutaway views of Figures 2, 5 and 8, it can be seen that the 10 contacts 11〇, 112 are disposed at the apex of the prongs 106, 108 of the tip 114 by a coupling to the shaft. The push structure of 104 is opposite to the probe shaft 1〇4. In at least one embodiment, the tip portion 114 is an integral component of the shaft 104 such that the tines probe tip 100 is referred to as a headless type, such as shown in Figures 3, 6 and 16. In at least one alternative embodiment, a clearly identifiable structure (i.e., a head) provides a tip portion 114 15 that is said to have a head or head type, such as the 15th and Figure 17 shows. To provide this larger or smaller head profile of the tip 114, the shaft 104 may be stepped up as shown, or gradually pushed down to become smaller or larger to provide a larger or larger tip 114. Small head profile. The starting position of the head on the axis 1〇4 is shown by the dotted line us of the second to the second figure.

20 Figure 9 shows two alternative embodiments of the head structure 900 (shown as 9A and 900B) which provide respective contact points 11〇, 112 and self-care for the prongs 1〇6, 1〇8 Space 116,000. As shown, each head structure has a width that is substantially the same as the diameter of the shaft 104, and each head is generally rectangular at a point coupled to the axis 1〇4. Also, in at least one embodiment, the head 900 has a geometry that is generally the same as the axis 4 at the point of association with the axis 1〇4 16 200841016. In at least one alternative embodiment, the head 9 has a geometry that is substantially different from the axis 104 at the point of association with the axis 1〇4. Figures 10 through 13 show four side views of an alternative embodiment of the probe tip 114 of the tined probe tip 100. To be more precise, the tip ^ is pushed out in the 'straight line' as shown in the 10th. It may also have a scalloped side as shown in the figure. In another alternative embodiment, the pointed tips 1〇6, %1〇8 are quite significant, as shown in Fig. 12. The prongs 106, 108 can also be quickly pushed out as shown in Fig. 13. Fig. 14 is a bottom view summarizing the embodiments corresponding to Figs. 1 to 3 and Fig. 9. In this figure, it can be further understood that the singularity of the contact points 11 〇, 112 is for the valley to identify 'display each contact point 11 〇, 112 as an exaggerated point, rather than a straight line or surrounded geometric area. As shown in Figures 11 through 13, there is an additional push for one of the ends of the tip 114 to ensure that the appropriate approach angle is provided to achieve the contact points 11, 112. • More specifically, it is predetermined that the contact points 110, 112 are sufficiently sharp to penetrate the surface of the predetermined circuit node to establish proper electrical contact for testing purposes. Self-cleaning spaces 116 and 600 help to ensure that the contact points ho, Η2 are unobstructed and cannot touch a test node. 2) The face angle used to establish the contact points 11〇, 112 will be application specific and will include, but is not limited to, the diameter of the probe axis 1〇4, the force applied during the test, the tested node The type, the material forming the tines probe tip 100, and the material that forms and/or covers the material being tested (such as lead-free solder) are specific factors. In general, the face angle will be in a range of about ten degrees (1 〇.) 17 200841016 to about thirty-five degrees (35.). The distance between the contact points no, 112 is set such that each contact point 110, 112 just hits the inner side of the pad flange of the test target' so that the bulk of the central beach pond that avoids flux residue resides in the through hole. Alternatively, the distance between the contact points 110, 112 can be set such that the contact point G 112 hits the 塾 flange of the tamper-evident ’ so that the central pool of the co-solvent residue is also retained in the through-hole. The contours of the prongs 106, 108 and the face angles used to provide the contact points 110, 112 can be formed using processes well known in the art of electrical test probes, including but not limited to casting, milling, Machining, grinding, sharpening, polishing, stamping and combinations thereof. 10, to permit electrical testing of a node on a circuit, the shafting is adapted to be coupled to the test equipment and the probe tip 114 is adapted to be electrically coupled to a node on a circuit. More specifically, the shaft 1〇4 is formed from an electrically conductive material such as, but not limited to, yellow copper, nickel, steel, tantalum, steel, stainless steel, aluminum, titanium, and combinations thereof. In at least one embodiment, the shaft is formed from steel. In addition, contact points 11 〇 I , 112 , head 114 , and shaft 104 may be plated with a conductive material such as gold, silver, or the like to further enhance probe life, electrical conductivity of the probe, and/or prevent oxidation. . '20 nickel as for the shaft, the prongs 1〇6, 1〇8 are made of an electrically conductive material S such as, but not limited to, brass, copper, tantalum, steel, stainless steel, aluminum, titanium, and combinations thereof, in at least one embodiment The prongs, (10) are formed by the 110 providing the shaft 104. In addition, the tip 1G6, and more precisely the contact m, can be coated with a material such as gold, silver or a combination thereof to achieve a strong magnetic property and/or prevention of the probe. Oxidation.

Just as the same tip probe axis 1〇〇 can incorporate a 900A 18 200841016 900B (see Figure 9) to provide the tip ι14, which may or may not have the same geometry as the shaft 104, the tip The cross-sectional width of 114 may be larger or smaller than the axis 104, as shown in Figures 15 through π. For example, Fig. 15 shows the cross-sectional width of the tip portion 114 of the cross-section of the shaft 104, and Figure 17 shows a tip portion 114 having a larger cross-sectional width than the axis 1〇4. The cross-sectional width of the tip portion 114 can also be substantially the same as that of the probe shaft 1 () 4, as shown in Fig. 16. Moreover, different embodiments may incorporate different head elements for one of the tips 114, as shown in Figures 15 and 17, or for an integrated head element of the tip 114, as shown in Figure 16. Still further, the heads 900A and 900B and the cross-section of the shaft 104 may be circular or rectangular in shape from each other. Moreover, in at least one embodiment, the shaft 1〇4 includes a plunger. Specifically, a portion of the shaft 104 opposite the prongs 106, 108 is a plunger 18 (10) as shown in FIG. The plunger is structured and configured to fit and be retained within a barrel 1802. The barrel 1802 provides a structure, such as a fold 18〇4, which prevents the 15 column base 1800 from leaving the barrel 1802 entirely while allowing the plunger 1800 to move or move within the barrel 1802 along the probe axis 102 to a range set by design. Inside, as shown in Figure 18. Inside the barrel 1802, therefore, the unillustrated one is a partially compressed spring that abuts the end of the plunger 1800 and the end of the barrel 1802. When compressed to a set depth of 2 〇 and generally as part of a complete transition, the spring provides a measured force for the dam 1800 and thus the shaft 1 〇 4 when the shaft is brought into contact with a node. In at least one embodiment, the plunger 18 can be allowed to move freely within the barrel 18A, so the probe tip 114 thus rotates along the central axis 1〇2. In at least one alternative embodiment, the plunger 18〇〇 and the barrel 18〇2 may also be provided with a structure that prevents the tip end probe tip (8) from rotating. In at least one embodiment, such a rotation preventing structure, such as a tongue and pile configuration, is located inside the barrel 802. Rabbit γ # , ..., for dry use, showing an embodiment in which one of the structures is placed on a ridge 18〇6 of the shaft 104 (and the plunger (8) portion of the shaft 1〇4) and the cylinder 5 1 mesh 8〇2 The pile (10) 8 ° rotation prevents the choice of structure for the design preference project. The tampon 1800 can permit the tines probe tip 1 to follow the action of the probe = line 1 〇 2 while preventing its rotation. Also, as shown in Fig. 18, the tip portion 114 of the tines probe tip 100 can be translated along the Ζ axis, but its suppression does not rotate along the Ζ#4 line. This - fixed orientation is advantageous in many embodiments. In at least one embodiment, the barrel of the tined probe tip 100 is structured and configured to be received by a conductive receptacle or socket (not shown), such as by a (four) or only by A feature such as friction is retained on the ridge 1802 of the tines probe tip 1 100. In at least one embodiment, the receptacle or receptacle is not allowed to rotate after the cartridge has been inserted into the receptacle or receptacle 15 . The receptacle or socket is usually made up of «the part of the test attachment and is usually embedded in the non-conducting material and is placed in a matrix of the position of the read node. Still, the receptacle or socket is used to connect the test accessory from a test system and actually connect the node to the electronic test equipment of the test system via the probe. 2, as described above, the tines probe barrel 1802 is typically forced into a pocket to utilize this forced fit to provide a tines probe tip 1 when it is incorporated into a rotation preventing structure The fixed type is preferably oriented, that is, a non-directional needle or a fixed orientation probe is provided. It is not uncommon for a node to be slightly out of alignment during the test process. When a test probe is free to rotate 20 200841016 along its axis, this misalignment may cause the probe to rotate to a position where the tip 1 〇6, 1 〇 8 missing section of the contact surface of the dip 1902 is as in the 19th As shown in the figure, this misalignment may reduce the quality or prevent reversible electrical contact and cause false false readings and node failure. If you do not take test attachment repair that may be expensive, time consuming, and cause line downtime, 19_Depending on the target surface, a non-rotating tines probe tip 100 that is considered to be the most suitable and will be misaligned to ensure that the fork tip head, 1G8 will not miss the intended contact surface swelling or 1906. In other words, a non-rotating tip-type probe tip 1 〇〇 can be physically set in the metric attachment towel to be aligned to effectively strike the misaligned node. Since the tines probe tip 100 is not Rotating will maintain the alignment of this setting. You can also use a solid-state directional ride to avoid turning too close to the conductive traces of the nodes or to prevent damage or contact with adjacent components. Μ Please understand that there is a need to test a variety of circuits The same type of node is known to be a through hole. The f hole and/or the through hole are installed when the reflowed solder flows from the h portion or the entire region of the hole, and the piece and/or the plate is supplied. The mating room will help it flow to the surface and solidify on top of the solder. This flux material may be located under the top of the hole, flattened on top of the solder on the node or overflowed. Tip fork tip 1()() can advantageously overcome the problem of the other test probes being affected by the hole detector or the thickest part by avoiding the bulk of the beach recording agent or its thickest part. After the physical structure of the ministry, the additional advantages of the structure are also clearly understood through the discussion of at least the method of using the method. 200841016 This figure is provided in the figure of Figure 19. Please understand that the order of the α4 field capture method is not sufficient. Rather, this description is only for demonstration and the method of picking up the needle tip 100. Point-to-point and probing 5 10 15 20 As shown in the upper left of Figure 19, as described above, the 丨, 次, and The part 1 is placed above a node hole 1900 for testing. The diagram of Figure 19 depicts a cross-section of the node aperture 1900 that shows the pad η ΛΑ 2 and the solder 1904 on the pad and the node hole 1900. The flux 1906 has been placed on the curved surface of the concave cavity of the 萨 趴 趴The hole 1900 is formed on the top of the solder 1904. The Jr straight flat probe, an arrow probe or a ride in the early morning of the knot, the help, (4) just 6 as shown for the test of the node hole test constitute a significant obstacle. Flat sheet probes deplete their strength over a large contact surface area, making it more difficult to penetrate residual flux 1906. It can also be used with a flat-panel probe or an arrow probe to attempt to ensure penetration of the _ or U material. However, such higher spring forces may increase the chance of damage to the board. In the particular application illustrated, it is understood that the size of the tines probe tip 100 has a dimension 1908 that is less than the inner diameter 1910 of the node hole 1_ between the contact points 11G, U2. Therefore, it is understood that the tines probe tip 1 is intended to establish contact at the shallow end of the solder 1904 liquid bend surface in the node hole 1900, rather than the adjacent pad 1902 of the perimeter, the pellet node hole 19〇〇 or The center of the node hole 1900 has the thickest flux 1906 accumulated. Since the pointed probe tip 100 is forced into contact with the node aperture 1900, each contact 110, 112 contacts the edge portion of the solder 1904 within the node aperture 1900. The pointed probe tip 100 advantageously avoids attempts to reach the solder 19〇4 through the flux 1906. In the event that a flux or other debris covers the 22 200841016 node hole 1900, the self-cleaning space 600 may permit the contact points 1〇6, 1〇8 to contact the solder 1904 without succumbing to obstacles or residues on the probe tip 丨14. accumulation.

Moreover, since the surface tension of the solder 1904 is lower than the capillary force formed between the solder 1904 and the hole wall, a concave liquid 5 curved surface is formed on the surface of the solder 19〇4, with respect to the center of the largest hole 1900. The depth, the depth of the solder 1904 along the edge portion of the aperture 19 is typically very small. Therefore, the accumulation of debris such as flux 19〇6 at the general center adjacent to the node hole 1900 is also generally much thicker. Also, as shown, the stack of flux 19〇6 and other debris may extend at least partially into the self-cleaning space 6〇〇, as shown, 1〇 each prongs 106, 108 have A substantially thinner region of flux 1906 is passed through and penetrates significantly into solder 19〇4. Since each of the prongs 106, 1 〇 8 produces an initial contact at a single point, the force applied from the shaft 104 to the node hole 1900 is only halved. More precisely, if a tenth: unit (arbitrary unit) pressure is added to a single point, at this point 15 full force of twelve units is achieved. Assuming the same contact surface at each point, as the number of contacts increases (i.e., the contact area increases), the contact force and pressure achieved by each contact point decreases. With two contact points, twelve units of force are achieved as six units of force by each contact point. With three contact points, the pressure force of twelve units is only achieved as four units of force by each contact point. 2〇 and 'Because the fork probe tip 100 makes contact with the node hole 19〇〇 only at two points, the force from the shaft 104 to the node hole 19〇〇 is only halved. If the force of the ten-quote (single unit) is applied to a single point, at this point, the force of twelve units is full. As the number of contact points increases (i.e., the contact area is increased), the contact force achieved at each contact point is reduced. With two points of contact: 23 200841016 A force of twelve units results in six units of force at each point of contact. With two contact points, twelve units of force are only achieved as four units of force by each contact point. Overcoming the solvent residue with a rut-powered probe can potentially jeopardize - 5 damage to the plate, welded joints or components, especially when used in large quantities to detect • MDF. Moreover, the contact points 11〇, 112 of the pointed ends 106, 108 achieve a greater force of the locomotive low probe force, which increases the contact point, Η: electrically contacts the surface of the node hole 19 without Destructive damage to the board, solder or the probability of a hole. 1〇 With the pointed probe tip 100 being extracted from the node hole 1900, the extraction system, the two solder recesses in the shell hole 19〇〇, 19ι4 (also known as the target mark • =). 1912, 19丨4 may advantageously be shown for the tines probe tip 1 as shown and described above with reference to Figures 3 and 6, the cross-section of each of the prongs 1 〇 6, 108 In at least one embodiment, each puncture has a convex edge and two straight edges. At least one alternative embodiment φ has a convex edge and two concave edges, as shown in the second drawing. A top view of the node hole 19A after the pointed probe tip 1〇〇 is not removed. None of the embodiments include all, since an alternative embodiment (not shown), the dry pit 1912 may be When a diamond, rhombic, conical or other 'seeing rabbit' test hole node 1900 is tested, an observer may easily determine whether a tines probe tip 100 is used in the test process or The alignment accuracy on the attachment of the node. ^ This method is summarized in the flowchart of Fig. 21. The method first provides a tines probe tip 1 〇〇, 24 200841016, block 2100, as described in the figures 、, ?, 弟 1-18. The tines probe tip 100 is urged to contact the node, block 2102. More specifically, the contact points provided by the prongs 106, 108 are disposed in the edges of the solder surface within the nodes, respectively (see Figure 18). When a contact is established between the tines probe tip 100 and the node, the node is electrically evaluated, and decision 2104 is made. If the node evaluates to be good, it can be reported or recorded, block 2106, and if the node evaluates to be bad, it is reported as bad, block 2108. In at least one embodiment, circuitry with bad nodes will be discarded to save further processing costs. After evaluation, the tines probe tip 100 is extracted from the node, block 10 2110. As indicated above, the extraction process leaves two curved depressions or sight marks on the nodes, block 2112, which can be used to confirm the use of the tines probe tip 100 in the testing process or to verify its alignment with respect to the nodes. Changes may be made in the methods, systems, processes and structures described above without departing from the scope of the invention. It is therefore to be understood that the subject matter shown in the foregoing description and/ The following claims are intended to cover all such general and specific features and the scope of BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side elevational view of a two-forked probe according to an embodiment; FIG. 2 is a side elevational cross-sectional view of the tines probe of FIG. 1; A partial perspective view of a tines probe according to an embodiment; FIG. 4 shows a side cross-sectional view of a tines probe according to an embodiment. 200841016 View 'its display - used to make _ biased self Clean up the space. Figure 5 shows a side cross-sectional view of an alternative embodiment of the tip shown in Figure 1, Afc and Formula 1 wood needle; κ Figure 6 shows the part of an alternative tip probe. Figure 7 is a side view of the pointed probe shown in Figure 6; Figure 8 is a side cross-sectional view of the tines probe shown in Figure 7;

Figure 9 shows two alternative head and shaft configurations for a tined probe in accordance with an alternative embodiment; Figure 10 is a side view of a tip-and-tip probe; =11 is a tip-and-tip probe Side view of an alternative embodiment; = 12 is a side view of an alternative embodiment of a pointed probe; the figure is a side view of an alternative embodiment of the *reclosed probe, The figure shows the prong tip end of the tines probe shown in Fig. 9. Fig. 5 is a front view of one of the large-type probes. The figure shows one of the large-type probes without head. Figure 17 is a plan view of an alternative embodiment; a face 20 of an alternative embodiment of a push-and-tap probe. Figure 18 is a cross-section of a plunger according to one embodiment. Partial perspective view of the probe; Figure 19 shows the method used for a tines probe according to one of the examples of Xu Ma, and the figure 20 shows a node hole for testing with a pointed probe. Looking down at 26 200841016; Figure 21 is a high-level flow chart of the method of use.

[Main component symbol description] 100... tines probe tip 102... longitudinal probe axis 104... sleeve 106, 108... fork tip 110, 112... contact point 114... probe tip 116··· self-cleaning space 118························································································ Face 304, 306... Common Edge 308... Plane 308... First Plane 600... Self-cleaning Space 602, 604... Curved Surface 606... Convex Side 608, 610... Concave Side 900, 900A, 900B··^ 1800... Plunger 1802... Cartridge 1804 ... folding 1806...ridge 1808...pile 1900···node,node hole 1902...node,pad 1904...solder 1906...cosolvent 1908...dimension 1910...node hole 1900 inner diameter 1912,1914...solder recess, sight mark, The puncture portion 2100...provides a tines probe 2102...to drive the tines probe to contact the node 27 200841016 • expose two depressions on the node, each of which is a triangle 2104...evaluation node 2112·· 2106...reported success 2108...report ^$文2110...from Point extraction prongs probe

28

Claims (1)

200841016 X. Patent application scope: 1 · A tines probe tip for detecting a node on a circuit, comprising: a longitudinal probe axis; 5 a shaft made of an electrically conductive material, the axis The probe axis is concentric; a two-pronged tip coupled to the axis and parallel to the probe axis, each of the prongs providing an end contact point; and a self-cleaning space disposed on the two prongs between. The tipping probe tip of claim 1, wherein the self-cleaning space has a central region disposed between the two prongs along a first axis, the self-cleaning space There is an exit region located above the central region along a second axis that intersects the first axis. 15 3. The tines probe tip of claim 1, wherein the self-cleaning space is provided by two intersection portions of at least two curved surfaces. 4. The tines probe tip of claim 1, wherein the end contact points are disposed in a plane transverse to the axis of the probe. 5. The tines probe tip of claim 1, wherein each of the prongs 20 has a generally triangular cross section consisting of a convex side and two straight sides. 6. The tines probe tip of claim 1, wherein each of the prongs has a generally triangular cross section consisting of a convex side and two concave sides. 29 200841016 7. The tip of the probe tip of claim 1, wherein the shaft includes a plunger that permits movement of the shaft and the prongs along the axis of the probe. 8. The pointed probe tip of claim 1, wherein the shaft package 5 includes a plunger that permits movement of the shaft and the prongs along the axis of the probe in a fixed orientation . 9. The tines probe tip of claim 1, wherein the probe tip is operable to create a contact between the edge edge surface and each contact point in the through hole node, such The contact point scale is concentrated from the axis of the shaft to the node. 10 = the tip of the probe tip of the scope of claim i, the step comprising: engaging the head of the shaft, the two pointed ends being joined to the head opposite the shaft - the self-cleaning space at least Partially disposed in the head. The tines probe tip of the first aspect of the patent application, wherein the two 15 = pointed ends are defined by the opposite faces along the axis of the probe, the faces along the axis of the needle along the -th_ The axes converge toward each other, which are separated and pushed into a point along the second axis of the transverse axis of the needle axis. • As in the tip of the tines probe tip of claim 1, the tip and the needle tip are operable to create two unique 20 representative triangular depressions in the edge of the node hole. A method for detecting a point on a road using a tip-and-tip probe tip, comprising: a probe-providing probe having: a longitudinal probe axis; 30 200841016 being a shaft made of electrically conductive material, The shaft and the probe shaft are green-both and pointed, and are lightly coupled to the shaft and parallel to the probe axis, each prong provides one end contact point; a self-cleaning space is disposed at the two fork ends Interacting the probe to contact the edge of the fresh well surface in the through hole, each contact point is disposed in the solder, electrically evaluating the node; and extracting the probe from the node, The extraction system reveals two unique triangular recesses in the edge of the dry well in the through hole. 14. The method of claim 13 wherein the method applies a force from the shaft to the region of the solder well having the smallest solvent material via the 2 contact points. Η 15.M. The method of claim 13 of the patent scope, wherein each (4) has a triangular cross-section consisting of a convex side and two straight lines, the exposed depressions having one and the same pointed _ The resulting geometry. The method of claim 13, wherein each of the pointed ends has a substantially triangular cross section consisting of a convex side and two concave sides, the exposed recesses having - and the pointed ends - The resulting geometry. 31