WO2008127241A1 - Embout de sonde-fourche à facettes - Google Patents

Embout de sonde-fourche à facettes Download PDF

Info

Publication number
WO2008127241A1
WO2008127241A1 PCT/US2007/009156 US2007009156W WO2008127241A1 WO 2008127241 A1 WO2008127241 A1 WO 2008127241A1 US 2007009156 W US2007009156 W US 2007009156W WO 2008127241 A1 WO2008127241 A1 WO 2008127241A1
Authority
WO
WIPO (PCT)
Prior art keywords
probe
fork
shaft
axis
probe tip
Prior art date
Application number
PCT/US2007/009156
Other languages
English (en)
Inventor
Alex Leon
Original Assignee
Hewelett-Packard Development Company
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewelett-Packard Development Company filed Critical Hewelett-Packard Development Company
Priority to PCT/US2007/009156 priority Critical patent/WO2008127241A1/fr
Priority to TW096121506A priority patent/TW200841016A/zh
Publication of WO2008127241A1 publication Critical patent/WO2008127241A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion

Abstract

Embout de sonde-fourche à facettes (100) destiné à tester un noeud tel qu'un noeud traversant (1900) sur un circuit. L'embout de sonde (100) présente une tige (104) constituée d'une matière conductrice d'électricité et concentrique par rapport à un axe de sonde longitudinal (102), ainsi que deux facettes en fourche (106, 108) liées à la tige (104) et positionnées en parallèle à l'axe de la sonde (102). Les deux facettes en fourche (106, 108) créent deux points de contact géométriquement singuliers (110, 112) qui concentrent une force appliquée depuis la tige (104) sur le trou du noeud (1900) et, plus particulièrement sur la soudure (1904) dans le trou du noeud au niveau de deux points. Un espace d'auto-nettoyage (116, 600) entre les facettes en fourche (106, 108) permet de prévenir l'engorgement de la sonde (100) par des flux de matières (1906) et/ou des débris. La tige (104) peut aussi comprendre un plongeur (1800) et/ou une structure de manière à fournir une orientation fixée préférée par prévention de la rotation de la sonde (100) autour de son propre axe (102).
PCT/US2007/009156 2007-04-13 2007-04-13 Embout de sonde-fourche à facettes WO2008127241A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/US2007/009156 WO2008127241A1 (fr) 2007-04-13 2007-04-13 Embout de sonde-fourche à facettes
TW096121506A TW200841016A (en) 2007-04-13 2007-06-14 Pronged fork probe tip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2007/009156 WO2008127241A1 (fr) 2007-04-13 2007-04-13 Embout de sonde-fourche à facettes

Publications (1)

Publication Number Publication Date
WO2008127241A1 true WO2008127241A1 (fr) 2008-10-23

Family

ID=38809811

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/009156 WO2008127241A1 (fr) 2007-04-13 2007-04-13 Embout de sonde-fourche à facettes

Country Status (2)

Country Link
TW (1) TW200841016A (fr)
WO (1) WO2008127241A1 (fr)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0835986A (ja) * 1994-07-21 1996-02-06 Aiwa Co Ltd 基板検査用コンタクトプローブ
JP2001311745A (ja) * 2000-04-28 2001-11-09 Hioki Ee Corp コンタクトプローブの製造方法
US20050052193A1 (en) * 2000-07-31 2005-03-10 Lecroy Corporation Notched electrical test probe tip
JP2005308619A (ja) * 2004-04-23 2005-11-04 Hioki Ee Corp プランジャー

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0835986A (ja) * 1994-07-21 1996-02-06 Aiwa Co Ltd 基板検査用コンタクトプローブ
JP2001311745A (ja) * 2000-04-28 2001-11-09 Hioki Ee Corp コンタクトプローブの製造方法
US20050052193A1 (en) * 2000-07-31 2005-03-10 Lecroy Corporation Notched electrical test probe tip
JP2005308619A (ja) * 2004-04-23 2005-11-04 Hioki Ee Corp プランジャー

Also Published As

Publication number Publication date
TW200841016A (en) 2008-10-16

Similar Documents

Publication Publication Date Title
US7279912B2 (en) Dual arcuate blade probe tip
US6441315B1 (en) Contact structures with blades having a wiping motion
US8102184B2 (en) Test contact system for testing integrated circuits with packages having an array of signal and power contacts
US6613662B2 (en) Method for making projected contact structures for engaging bumped semiconductor devices
US6538424B1 (en) Notched electrical test probe tip
KR100664393B1 (ko) 통전 시험용 프로브
US20050037649A1 (en) Electronic probe extender
US7602200B2 (en) Probe for electrical test comprising a positioning mark and probe assembly
US20090261851A1 (en) Spring probe
US7259581B2 (en) Method for testing semiconductor components
US6518780B1 (en) Electrical test probe wedge tip
US20070084903A1 (en) Pronged fork probe tip
WO2008127242A1 (fr) Embout de sonde à lame arquée duale
TW201544815A (zh) 微機電探針及其製造方法與探針頭
TWI529394B (zh) Check the contact probe
WO2008127241A1 (fr) Embout de sonde-fourche à facettes
US7316065B2 (en) Method for fabricating a plurality of elastic probes in a row
JPWO2011071082A1 (ja) コンタクトプローブ
US7452214B2 (en) Interconnect assemblies, and methods of forming interconnects, between conductive contact bumps and conductive contact pads
KR20010039971A (ko) 납땜 볼용 접촉기
US20130271172A1 (en) Probe apparatus and method
KR100823873B1 (ko) 테스트 소켓
US7977960B2 (en) Cantilever type probe head having introducing portion with end face having a tapered portion and an extended rectangular portion
JP2001124799A (ja) プローブシート及びその製造方法並びにプローブカード
JP2002286757A (ja) コンタクトプローブ

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 07755429

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 07755429

Country of ref document: EP

Kind code of ref document: A1