TW200824032A - Customer tray and electronic component testing apparatus - Google Patents

Customer tray and electronic component testing apparatus Download PDF

Info

Publication number
TW200824032A
TW200824032A TW096134819A TW96134819A TW200824032A TW 200824032 A TW200824032 A TW 200824032A TW 096134819 A TW096134819 A TW 096134819A TW 96134819 A TW96134819 A TW 96134819A TW 200824032 A TW200824032 A TW 200824032A
Authority
TW
Taiwan
Prior art keywords
tray
electronic component
tested
test
custom
Prior art date
Application number
TW096134819A
Other languages
English (en)
Chinese (zh)
Inventor
Akihiko Ito
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200824032A publication Critical patent/TW200824032A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW096134819A 2006-10-27 2007-09-19 Customer tray and electronic component testing apparatus TW200824032A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/321491 WO2008050443A1 (fr) 2006-10-27 2006-10-27 Plateau client et appareil de test de composant électronique

Publications (1)

Publication Number Publication Date
TW200824032A true TW200824032A (en) 2008-06-01

Family

ID=39324257

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096134819A TW200824032A (en) 2006-10-27 2007-09-19 Customer tray and electronic component testing apparatus

Country Status (2)

Country Link
TW (1) TW200824032A (ja)
WO (1) WO2008050443A1 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI414802B (ja) * 2010-07-30 2013-11-11
TWI418437B (zh) * 2011-02-08 2013-12-11 Cal Comp Optical Electronics Suzhou Co Ltd 拆裝設備
TWI470246B (zh) * 2012-03-16 2015-01-21 Tech Wing Co Ltd 測試分選機
TWI722680B (zh) * 2018-11-27 2021-03-21 日商日本發條股份有限公司 探針單元
TWI807327B (zh) * 2020-05-25 2023-07-01 南韓商泰克元有限公司 測試處理器及其控制方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013137286A (ja) * 2011-12-28 2013-07-11 Advantest Corp 電子部品試験装置
JP7487076B2 (ja) 2020-11-17 2024-05-20 株式会社Ｎｓテクノロジーズ デバイス搬送装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000111612A (ja) * 1998-10-01 2000-04-21 Advantest Corp トレイ収納用ホルダ
JP4222442B2 (ja) * 1999-07-16 2009-02-12 株式会社アドバンテスト 電子部品試験装置用インサート
JP2001124825A (ja) * 1999-10-28 2001-05-11 Ando Electric Co Ltd オートハンドラ用ハンド

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI414802B (ja) * 2010-07-30 2013-11-11
TWI418437B (zh) * 2011-02-08 2013-12-11 Cal Comp Optical Electronics Suzhou Co Ltd 拆裝設備
TWI470246B (zh) * 2012-03-16 2015-01-21 Tech Wing Co Ltd 測試分選機
TWI722680B (zh) * 2018-11-27 2021-03-21 日商日本發條股份有限公司 探針單元
TWI807327B (zh) * 2020-05-25 2023-07-01 南韓商泰克元有限公司 測試處理器及其控制方法

Also Published As

Publication number Publication date
WO2008050443A1 (fr) 2008-05-02

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