TW200723682A - Circuit for adjusting cutoff frequency of filter - Google Patents

Circuit for adjusting cutoff frequency of filter

Info

Publication number
TW200723682A
TW200723682A TW095128711A TW95128711A TW200723682A TW 200723682 A TW200723682 A TW 200723682A TW 095128711 A TW095128711 A TW 095128711A TW 95128711 A TW95128711 A TW 95128711A TW 200723682 A TW200723682 A TW 200723682A
Authority
TW
Taiwan
Prior art keywords
filter circuit
cutoff frequency
circuit
filter
switch
Prior art date
Application number
TW095128711A
Other languages
English (en)
Inventor
Takeshi Ikeda
Hiroshi Miyagi
Original Assignee
Neuro Solution Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Neuro Solution Corp filed Critical Neuro Solution Corp
Publication of TW200723682A publication Critical patent/TW200723682A/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H11/00—Networks using active elements
    • H03H11/02—Multiple-port networks
    • H03H11/04—Frequency selective two-port networks
    • H03H11/12—Frequency selective two-port networks using amplifiers with feedback
    • H03H11/1291—Current or voltage controlled filters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H2210/00—Indexing scheme relating to details of tunable filters
    • H03H2210/02—Variable filter component
    • H03H2210/021—Amplifier, e.g. transconductance amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H2210/00—Indexing scheme relating to details of tunable filters
    • H03H2210/04—Filter calibration method
    • H03H2210/043—Filter calibration method by measuring time constant

Landscapes

  • Networks Using Active Elements (AREA)
TW095128711A 2005-12-15 2006-08-04 Circuit for adjusting cutoff frequency of filter TW200723682A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005362252 2005-12-15

Publications (1)

Publication Number Publication Date
TW200723682A true TW200723682A (en) 2007-06-16

Family

ID=38162678

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095128711A TW200723682A (en) 2005-12-15 2006-08-04 Circuit for adjusting cutoff frequency of filter

Country Status (5)

Country Link
US (1) US20090315619A1 (zh)
JP (1) JPWO2007069360A1 (zh)
CN (1) CN101326714A (zh)
TW (1) TW200723682A (zh)
WO (1) WO2007069360A1 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007325083A (ja) * 2006-06-02 2007-12-13 Neuro Solution Corp アンテナ入力同調回路
US7937058B2 (en) * 2006-10-18 2011-05-03 Freescale Semiconductor, Inc. Controlling the bandwidth of an analog filter
CN101587141B (zh) * 2008-05-21 2011-12-07 承永资讯科技股份有限公司 具有自动切换低通滤波器功能的测量装置
CN105814819B (zh) * 2013-12-04 2019-06-28 马维尔国际贸易有限公司 用于校准模拟滤波器的方法和系统
US11025204B2 (en) * 2017-11-02 2021-06-01 Mediatek Inc. Circuit having high-pass filter with variable corner frequency
US11025228B1 (en) * 2020-05-12 2021-06-01 Honeywell International Inc. Dynamic noise shaping filters and corresponding methods

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08191231A (ja) * 1995-01-06 1996-07-23 Sony Corp フィルタ回路
JP2000059162A (ja) * 1998-08-06 2000-02-25 Fujitsu Ltd フィルタ特性調整方法及び装置
JP2002076267A (ja) * 2000-08-22 2002-03-15 Hitachi Ltd 無線送受信装置
JP2002118443A (ja) * 2000-10-06 2002-04-19 Niigata Seimitsu Kk フィルタ回路
JP2002232251A (ja) * 2001-02-01 2002-08-16 Asahi Kasei Microsystems Kk フィルタ中心周波数調整装置および方法
JP2003060485A (ja) * 2001-08-14 2003-02-28 Sony Corp 能動フィルタ回路
JP2003347901A (ja) * 2002-05-28 2003-12-05 Hitachi Ltd 周波数特性の自動調整機能を有するフィルタ回路
KR100464446B1 (ko) * 2003-02-28 2005-01-03 삼성전자주식회사 임피던스 스케일링에 의한 주파수 응답 제어 장치
JP4443424B2 (ja) * 2005-01-06 2010-03-31 富士通マイクロエレクトロニクス株式会社 アナログフィルタ回路

Also Published As

Publication number Publication date
US20090315619A1 (en) 2009-12-24
WO2007069360A1 (ja) 2007-06-21
JPWO2007069360A1 (ja) 2009-05-21
CN101326714A (zh) 2008-12-17

Similar Documents

Publication Publication Date Title
KR100922846B1 (ko) Ｐｗｍ신호생성회로 및 그것을 구비한 전원장치
TW200723682A (en) Circuit for adjusting cutoff frequency of filter
WO2005039049A3 (en) Ring oscillator with peaking stages
ATE228709T1 (de) Vefahren und vorrichtung zum einstellen von taktsignalen über fein- und grobbereiche
WO2007009465A3 (en) Programmable microphone
ATE396544T1 (de) Signalskalierungsschaltung mit geschalteten kapazitäten
WO2010042361A3 (en) Programmable integrated circuit device to support inductive sensing
WO2009034750A1 (ja) シフトレジスタ
ATE538535T1 (de) Digitale frequenzgeregelte verzögerungsleitung
WO2008033712A3 (en) Detecting voltage glitches
WO2008153777A3 (en) Low cost and low variation oscillator
WO2006083530A3 (en) Capacitive tuning network for low gain digitally controlled oscillator
JP2009017265A5 (zh)
JP2010197390A (ja) キャパシタンス測定回路
RU2008122881A (ru) Пассивные компоненты с переменными характеристиками с высоким разрешением, выбор значения и управление
ATE510353T1 (de) Digital gesteuerter oszillator
WO2010086348A3 (en) Method and system for measuring a time constant of an integrated circuit, and integrated circuit provided with such a system
TW200506906A (en) Detecting device for tracing error
TW200613995A (en) Main board with a slot-sharing circuit for PCI express x16 and x1 slot to be connected to
DE502004002572D1 (de) Schaltung und verfahren zum verarbeiten einer speisespannung mit spannungsspitzen
JP2011188250A (ja) 時定数調整回路
TW200629674A (en) Controller arrangement
TW200513036A (en) Delay stage insensitive to operating voltage and delay circuit including the same
DK1361660T3 (da) Elektronisk strömkreds med mindst en indgang til udvælgelse af en tilstand af den elektroniske strömkreds
WO2008117622A1 (ja) 試験装置および電子デバイス