TW200717536A - Memory with robust data sensing and method for sensing data - Google Patents
Memory with robust data sensing and method for sensing dataInfo
- Publication number
- TW200717536A TW200717536A TW095131664A TW95131664A TW200717536A TW 200717536 A TW200717536 A TW 200717536A TW 095131664 A TW095131664 A TW 095131664A TW 95131664 A TW95131664 A TW 95131664A TW 200717536 A TW200717536 A TW 200717536A
- Authority
- TW
- Taiwan
- Prior art keywords
- data line
- sensing
- output terminal
- data
- coupled
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/065—Differential amplifiers of latching type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/08—Control thereof
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1048—Data bus control circuits, e.g. precharging, presetting, equalising
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/18—Bit line organisation; Bit line lay-out
Landscapes
- Read Only Memory (AREA)
- Static Random-Access Memory (AREA)
- Dram (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/218,135 US7158432B1 (en) | 2005-09-01 | 2005-09-01 | Memory with robust data sensing and method for sensing data |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200717536A true TW200717536A (en) | 2007-05-01 |
| TWI416534B TWI416534B (zh) | 2013-11-21 |
Family
ID=37592334
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095131664A TWI416534B (zh) | 2005-09-01 | 2006-08-29 | 具強健式資料感測之記憶體及感測資料之方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7158432B1 (zh) |
| JP (1) | JP2009506478A (zh) |
| KR (1) | KR20080046639A (zh) |
| CN (1) | CN101253570B (zh) |
| TW (1) | TWI416534B (zh) |
| WO (1) | WO2007027577A2 (zh) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI476781B (zh) * | 2007-05-09 | 2015-03-11 | Freescale Semiconductor Inc | 關於在記憶體陣列中低電壓資料路徑之電路以及其操作方法 |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8077533B2 (en) | 2006-01-23 | 2011-12-13 | Freescale Semiconductor, Inc. | Memory and method for sensing data in a memory using complementary sensing scheme |
| US7793172B2 (en) * | 2006-09-28 | 2010-09-07 | Freescale Semiconductor, Inc. | Controlled reliability in an integrated circuit |
| US7656731B2 (en) | 2007-03-30 | 2010-02-02 | Qualcomm, Incorporated | Semi-shared sense amplifier and global read line architecture |
| US7817491B2 (en) * | 2007-09-28 | 2010-10-19 | Hynix Semiconductor Inc. | Bank control device and semiconductor device including the same |
| US7688656B2 (en) * | 2007-10-22 | 2010-03-30 | Freescale Semiconductor, Inc. | Integrated circuit memory having dynamically adjustable read margin and method therefor |
| US8120975B2 (en) * | 2009-01-29 | 2012-02-21 | Freescale Semiconductor, Inc. | Memory having negative voltage write assist circuit and method therefor |
| US20100208538A1 (en) * | 2009-02-17 | 2010-08-19 | Freescale Semiconductor, Inc. | Sensing circuit for semiconductor memory |
| KR20140100005A (ko) | 2013-02-04 | 2014-08-14 | 삼성전자주식회사 | 등화기 및 이를 구비한 반도체 메모리 장치 |
| US9336890B1 (en) * | 2014-10-17 | 2016-05-10 | Cypress Semiconductor Corporation | Simultaneous programming of many bits in flash memory |
| JP6620472B2 (ja) * | 2015-09-08 | 2019-12-18 | 凸版印刷株式会社 | 半導体記憶装置 |
| KR102557324B1 (ko) * | 2016-02-15 | 2023-07-20 | 에스케이하이닉스 주식회사 | 메모리 장치 |
| CN107305778B (zh) * | 2016-04-18 | 2020-05-01 | 华邦电子股份有限公司 | 储存器电路以及储存器电路的预充电方法 |
| US10811081B2 (en) * | 2018-12-12 | 2020-10-20 | Micron Technology, Inc. | Apparatuses for decreasing write pull-up time and methods of use |
| US11043276B1 (en) | 2020-02-20 | 2021-06-22 | Sandisk Technologies Llc | Sense amplifier architecture providing improved memory performance |
| US11450364B2 (en) * | 2020-08-27 | 2022-09-20 | Taiwan Semiconductor Manufacturing Company Ltd. | Computing-in-memory architecture |
| DE102021110222B4 (de) | 2021-02-26 | 2022-11-03 | Taiwan Semiconductor Manufacturing Co., Ltd. | Speicherschaltung und Betriebsverfahren dafür |
| CN114708896B (zh) | 2021-02-26 | 2025-08-12 | 台湾积体电路制造股份有限公司 | 存储器电路及其操作方法 |
| US12283338B2 (en) * | 2022-04-29 | 2025-04-22 | Samsung Electronics Co., Ltd. | Global data line of multi-array synchronous random access memory (SRAM) |
| CN116978425A (zh) * | 2022-04-29 | 2023-10-31 | 三星电子株式会社 | 多阵列同步随机访问存储器(sram)的全局数据线 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4964083A (en) | 1989-04-27 | 1990-10-16 | Motorola, Inc. | Non-address transition detection memory with improved access time |
| US5657292A (en) * | 1996-01-19 | 1997-08-12 | Sgs-Thomson Microelectronics, Inc. | Write pass through circuit |
| JPH10283776A (ja) * | 1997-04-04 | 1998-10-23 | Mitsubishi Electric Corp | 半導体記憶装置 |
| AU7706198A (en) * | 1997-05-30 | 1998-12-30 | Micron Technology, Inc. | 256 meg dynamic random access memory |
| JPH11328965A (ja) | 1998-05-20 | 1999-11-30 | Nec Corp | 半導体記憶装置 |
| US6198682B1 (en) | 1999-02-13 | 2001-03-06 | Integrated Device Technology, Inc. | Hierarchical dynamic memory array architecture using read amplifiers separate from bit line sense amplifiers |
| US6111796A (en) * | 1999-03-01 | 2000-08-29 | Motorola, Inc. | Programmable delay control for sense amplifiers in a memory |
| US6137746A (en) | 1999-07-28 | 2000-10-24 | Alliance Semiconductor Corporation | High performance random access memory with multiple local I/O lines |
| US6292402B1 (en) * | 1999-12-08 | 2001-09-18 | International Business Machines Corporation | Prefetch write driver for a random access memory |
| JP2001291389A (ja) * | 2000-03-31 | 2001-10-19 | Hitachi Ltd | 半導体集積回路 |
| US6445216B1 (en) * | 2001-05-14 | 2002-09-03 | Intel Corporation | Sense amplifier having reduced Vt mismatch in input matched differential pair |
| JP2003151267A (ja) * | 2001-11-09 | 2003-05-23 | Fujitsu Ltd | 半導体記憶装置 |
| US6885600B2 (en) * | 2002-09-10 | 2005-04-26 | Silicon Storage Technology, Inc. | Differential sense amplifier for multilevel non-volatile memory |
| JP2004213829A (ja) * | 2003-01-08 | 2004-07-29 | Renesas Technology Corp | 半導体記憶装置 |
| US7242624B2 (en) * | 2005-06-14 | 2007-07-10 | Qualcomm Incorporated | Methods and apparatus for reading a full-swing memory array |
-
2005
- 2005-09-01 US US11/218,135 patent/US7158432B1/en not_active Expired - Lifetime
-
2006
- 2006-08-29 WO PCT/US2006/033480 patent/WO2007027577A2/en not_active Ceased
- 2006-08-29 KR KR1020087004291A patent/KR20080046639A/ko not_active Withdrawn
- 2006-08-29 CN CN2006800317941A patent/CN101253570B/zh active Active
- 2006-08-29 TW TW095131664A patent/TWI416534B/zh active
- 2006-08-29 JP JP2008529153A patent/JP2009506478A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI476781B (zh) * | 2007-05-09 | 2015-03-11 | Freescale Semiconductor Inc | 關於在記憶體陣列中低電壓資料路徑之電路以及其操作方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US7158432B1 (en) | 2007-01-02 |
| CN101253570A (zh) | 2008-08-27 |
| JP2009506478A (ja) | 2009-02-12 |
| CN101253570B (zh) | 2010-09-01 |
| WO2007027577A2 (en) | 2007-03-08 |
| TWI416534B (zh) | 2013-11-21 |
| KR20080046639A (ko) | 2008-05-27 |
| WO2007027577A3 (en) | 2007-07-05 |
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