TW200618478A - Single gate oxide I/O buffer with improved under-drive feature - Google Patents

Single gate oxide I/O buffer with improved under-drive feature

Info

Publication number
TW200618478A
TW200618478A TW094140554A TW94140554A TW200618478A TW 200618478 A TW200618478 A TW 200618478A TW 094140554 A TW094140554 A TW 094140554A TW 94140554 A TW94140554 A TW 94140554A TW 200618478 A TW200618478 A TW 200618478A
Authority
TW
Taiwan
Prior art keywords
voltage
buffer
supply voltage
gate oxide
single gate
Prior art date
Application number
TW094140554A
Other languages
Chinese (zh)
Other versions
TWI306694B (en
Inventor
Kuo-Ji Chen
Ker-Min Chen
Original Assignee
Taiwan Semiconductor Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg Co Ltd filed Critical Taiwan Semiconductor Mfg Co Ltd
Publication of TW200618478A publication Critical patent/TW200618478A/en
Application granted granted Critical
Publication of TWI306694B publication Critical patent/TWI306694B/en

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003Modifications for increasing the reliability for protection
    • H03K19/00315Modifications for increasing the reliability for protection in field-effect transistor circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003Modifications for increasing the reliability for protection
    • H03K19/00369Modifications for compensating variations of temperature, supply voltage or other physical parameters
    • H03K19/00384Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dram (AREA)

Abstract

A high voltage buffer module used in an input/output buffer circuit coupled between a high voltage circuit and a low voltage circuit, operates between a first supply voltage and its complementary second supply voltage. A pull-up module, coupled between the first supply voltage and an output node, outputs the first supply voltage to the output node, in response to an input signal. A voltage detection circuit provides the pull-up module with at least one bias voltage selected from a predetermined set of voltage levels, wherein the voltage detection circuit selects the bias voltage upon detecting a reduction of the first supply voltage.
TW094140554A 2004-11-18 2005-11-18 Single gate oxide i/o buffer with improved under-drive feature TWI306694B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/993,054 US7193441B2 (en) 2004-11-18 2004-11-18 Single gate oxide I/O buffer with improved under-drive feature

Publications (2)

Publication Number Publication Date
TW200618478A true TW200618478A (en) 2006-06-01
TWI306694B TWI306694B (en) 2009-02-21

Family

ID=36385635

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094140554A TWI306694B (en) 2004-11-18 2005-11-18 Single gate oxide i/o buffer with improved under-drive feature

Country Status (3)

Country Link
US (1) US7193441B2 (en)
CN (1) CN1783719B (en)
TW (1) TWI306694B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8593203B2 (en) 2008-07-29 2013-11-26 Qualcomm Incorporated High signal level compliant input/output circuits
TWI465038B (en) * 2009-04-20 2014-12-11 Advanced Risc Mach Ltd Circuitry for processing signals from a higher voltage domain using devices designed to operate in a lower voltage domain

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060114008A (en) * 2004-02-11 2006-11-03 코닌클리즈케 필립스 일렉트로닉스 엔.브이. High voltage driver circuit with fast reading operation
US7834634B2 (en) * 2005-05-06 2010-11-16 Agere Systems Inc. Low-power switch state detection circuit and method and mobile telephone incorporating the same
JP2007227625A (en) * 2006-02-23 2007-09-06 Toshiba Microelectronics Corp Semiconductor integrated circuit and its layout designing method
US7479813B2 (en) 2006-06-14 2009-01-20 Freescale Semiconductor, Inc. Low voltage circuit with variable substrate bias
US7605611B2 (en) * 2007-10-24 2009-10-20 Micron Technology, Inc. Methods, devices, and systems for a high voltage tolerant buffer
US8138814B2 (en) * 2008-07-29 2012-03-20 Qualcomm Incorporated High signal level compliant input/output circuits
US7986171B2 (en) * 2008-10-21 2011-07-26 Himax Technologies Limited Mixed-voltage I/O buffer
US20100102872A1 (en) * 2008-10-29 2010-04-29 Taiwan Semiconductor Manufacturing Co., Ltd. Dynamic Substrate Bias for PMOS Transistors to Alleviate NBTI Degradation
US7839174B2 (en) * 2008-12-09 2010-11-23 Himax Technologies Limited Mixed-voltage tolerant I/O buffer and output buffer circuit thereof
US8085080B2 (en) * 2009-02-27 2011-12-27 St-Ericsson Sa Generation of a low jitter clock signal
EP2278712A1 (en) * 2009-07-01 2011-01-26 STMicroelectronics (Rousset) SAS Integrated circuit including a broadband high-voltage buffer circuit
US8446182B2 (en) * 2009-12-04 2013-05-21 Macronix International Co., Ltd. TX output combining method between different bands
KR101993192B1 (en) * 2012-10-04 2019-06-27 삼성전자주식회사 Multi-voltage supplied input buffer
US9018986B2 (en) * 2013-01-21 2015-04-28 Via Technologies, Inc. Output buffers
CN105306043B (en) * 2014-06-04 2018-11-06 晶豪科技股份有限公司 Input buffer
US9762231B2 (en) 2015-03-10 2017-09-12 Qualcomm Incorporated Transistors configured for gate overbiasing and circuits therefrom
US9917589B2 (en) 2016-02-02 2018-03-13 Samsung Electronics Co., Ltd. Transmitter circuit and receiver circuit for operating under low voltage
WO2019033340A1 (en) 2017-08-17 2019-02-21 深圳市汇顶科技股份有限公司 Level translator capable of outputting positive and negative voltages
US10205441B1 (en) * 2017-12-14 2019-02-12 Nxp Usa, Inc. Level shifter having constant duty cycle across process, voltage, and temperature variations
TWI666873B (en) * 2018-01-12 2019-07-21 立積電子股份有限公司 Integrated circuit and transmission circuit thereof
US11223358B2 (en) * 2020-01-17 2022-01-11 Nxp Usa, Inc. IO analog rail control circuit for power ramps

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6081132A (en) * 1998-03-09 2000-06-27 Intel Corporation High voltage drive output buffer for low Voltage integrated circuits
US6018257A (en) * 1998-03-23 2000-01-25 Lsi Logic Corporation Output drive circuit tolerant of higher voltage signals
KR100292408B1 (en) * 1999-03-04 2001-06-01 윤종용 High voltage tolerant interface circuit
US6388499B1 (en) * 2001-01-19 2002-05-14 Integrated Device Technology, Inc. Level-shifting signal buffers that support higher voltage power supplies using lower voltage MOS technology

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8593203B2 (en) 2008-07-29 2013-11-26 Qualcomm Incorporated High signal level compliant input/output circuits
TWI465038B (en) * 2009-04-20 2014-12-11 Advanced Risc Mach Ltd Circuitry for processing signals from a higher voltage domain using devices designed to operate in a lower voltage domain

Also Published As

Publication number Publication date
CN1783719B (en) 2010-05-05
US7193441B2 (en) 2007-03-20
US20060103435A1 (en) 2006-05-18
TWI306694B (en) 2009-02-21
CN1783719A (en) 2006-06-07

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