TW200716767A - Sputtering target for the formation of phase-change films and process for the production of the target - Google Patents

Sputtering target for the formation of phase-change films and process for the production of the target

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Publication number
TW200716767A
TW200716767A TW095125116A TW95125116A TW200716767A TW 200716767 A TW200716767 A TW 200716767A TW 095125116 A TW095125116 A TW 095125116A TW 95125116 A TW95125116 A TW 95125116A TW 200716767 A TW200716767 A TW 200716767A
Authority
TW
Taiwan
Prior art keywords
target
phase
formation
production
ingot
Prior art date
Application number
TW095125116A
Other languages
English (en)
Inventor
Sohei Nonaka
Kei Kinoshita
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Publication of TW200716767A publication Critical patent/TW200716767A/zh

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    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
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    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B19/00Selenium; Tellurium; Compounds thereof
    • C01B19/002Compounds containing, besides selenium or tellurium, more than one other element, with -O- and -OH not being considered as anions
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    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/515Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics
    • C04B35/547Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on sulfides or selenides or tellurides
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    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/622Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/626Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B
    • C04B35/62605Treating the starting powders individually or as mixtures
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    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/622Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/626Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B
    • C04B35/62605Treating the starting powders individually or as mixtures
    • C04B35/62645Thermal treatment of powders or mixtures thereof other than sintering
    • C04B35/62675Thermal treatment of powders or mixtures thereof other than sintering characterised by the treatment temperature
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    • C04B35/6455Hot isostatic pressing
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    • C04B35/653Processes involving a melting step
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    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C1/00Making non-ferrous alloys
    • C22C1/04Making non-ferrous alloys by powder metallurgy
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    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C28/00Alloys based on a metal not provided for in groups C22C5/00 - C22C27/00
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    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/541Heating or cooling of the substrates
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F2998/00Supplementary information concerning processes or compositions relating to powder metallurgy
    • B22F2998/10Processes characterised by the sequence of their steps
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    • C01INORGANIC CHEMISTRY
    • C01PINDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
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    • C01P2002/70Crystal-structural characteristics defined by measured X-ray, neutron or electron diffraction data
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    • C01P2004/60Particles characterised by their size
    • C01P2004/61Micrometer sized, i.e. from 1-100 micrometer
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    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
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    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/44Metal salt constituents or additives chosen for the nature of the anions, e.g. hydrides or acetylacetonate
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    • C04B2235/50Constituents or additives of the starting mixture chosen for their shape or used because of their shape or their physical appearance
    • C04B2235/54Particle size related information
    • C04B2235/5418Particle size related information expressed by the size of the particles or aggregates thereof
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    • C04B2235/74Physical characteristics
    • C04B2235/76Crystal structural characteristics, e.g. symmetry
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    • C04B2235/80Phases present in the sintered or melt-cast ceramic products other than the main phase

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  • Inorganic Chemistry (AREA)
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  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Physical Vapour Deposition (AREA)
  • Powder Metallurgy (AREA)
TW095125116A 2005-07-11 2006-07-10 Sputtering target for the formation of phase-change films and process for the production of the target TW200716767A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005201246 2005-07-11
JP2006179153A JP4061557B2 (ja) 2005-07-11 2006-06-29 相変化膜形成用スパッタリングターゲットおよびその製造方法。

Publications (1)

Publication Number Publication Date
TW200716767A true TW200716767A (en) 2007-05-01

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ID=37637093

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095125116A TW200716767A (en) 2005-07-11 2006-07-10 Sputtering target for the formation of phase-change films and process for the production of the target

Country Status (6)

Country Link
US (1) US20100108499A1 (zh)
EP (1) EP1903122A4 (zh)
JP (1) JP4061557B2 (zh)
KR (1) KR20080019067A (zh)
TW (1) TW200716767A (zh)
WO (1) WO2007007704A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI453741B (zh) * 2007-12-20 2014-09-21 Thomson Licensing 記錄式光學儲存媒體及其製法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007131941A (ja) * 2006-05-26 2007-05-31 Mitsubishi Materials Corp パーティクル発生の少ない相変化膜形成用スパッタリングターゲットの製造方法。
KR101249153B1 (ko) * 2008-03-17 2013-03-29 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 소결체 타겟 및 소결체의 제조 방법
PL3039153T3 (pl) 2013-08-30 2019-02-28 Evonik Degussa Gmbh Mikroorganizm do wytwarzania metioniny o ulepszonej aktywności syntazy metioniny i wypływie metioniny
KR20160051952A (ko) * 2014-10-30 2016-05-12 한국생산기술연구원 비정질막 및 질소를 포함하는 나노구조막의 제조방법
JP6536239B2 (ja) * 2015-07-15 2019-07-03 三菱マテリアル株式会社 Te−Ge系スパッタリングターゲット、及び、Te−Ge系スパッタリングターゲットの製造方法
CN108026516A (zh) 2015-08-07 2018-05-11 赢创德固赛有限公司 通过发酵的蛋白硫代羧化物依赖性l-甲硫氨酸生产
CN106191773B (zh) * 2016-08-26 2018-05-25 北京工业大学 一种基于解析法制备定原子比的掺杂Ge2Sb2Te5相变薄膜的方法
WO2020170492A1 (ja) * 2019-02-20 2020-08-27 三菱マテリアル株式会社 スパッタリングターゲット
JP2020132996A (ja) * 2019-02-20 2020-08-31 三菱マテリアル株式会社 スパッタリングターゲット
JP7261694B2 (ja) * 2019-08-09 2023-04-20 Jx金属株式会社 スパッタリングターゲット及び、スパッタリングターゲットの製造方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3336034B2 (ja) 1992-05-12 2002-10-21 同和鉱業株式会社 スパッタリング・ターゲットの製造方法
DE10017414A1 (de) * 2000-04-07 2001-10-11 Unaxis Materials Deutschland G Sputtertarget auf der Basis eines Metalls oder einer Metalllegierung und Verfahren zu dessen Herstellung
TW487682B (en) * 2000-08-10 2002-05-21 Nat Science Council Rewritable phase-change type optical information recording composition and optical disk containing the same
JP4766441B2 (ja) * 2003-09-17 2011-09-07 三菱マテリアル株式会社 半導体不揮発メモリー用相変化膜およびこの相変化膜を形成するためのスパッタリングターゲット
TWI260015B (en) * 2003-12-19 2006-08-11 Tsung-Shune Chin Ultra-high density phase-change recording media based on the Ga-Sb-Te system
JP4708361B2 (ja) * 2004-11-30 2011-06-22 Jx日鉱日石金属株式会社 Sb−Te系合金焼結体スパッタリングターゲット

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI453741B (zh) * 2007-12-20 2014-09-21 Thomson Licensing 記錄式光學儲存媒體及其製法

Also Published As

Publication number Publication date
EP1903122A4 (en) 2011-06-22
EP1903122A1 (en) 2008-03-26
JP4061557B2 (ja) 2008-03-19
US20100108499A1 (en) 2010-05-06
KR20080019067A (ko) 2008-02-29
JP2007045697A (ja) 2007-02-22
WO2007007704A1 (ja) 2007-01-18

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