TW200715404A - Microelectronic assembly and method for forming the same - Google Patents

Microelectronic assembly and method for forming the same

Info

Publication number
TW200715404A
TW200715404A TW095134084A TW95134084A TW200715404A TW 200715404 A TW200715404 A TW 200715404A TW 095134084 A TW095134084 A TW 095134084A TW 95134084 A TW95134084 A TW 95134084A TW 200715404 A TW200715404 A TW 200715404A
Authority
TW
Taiwan
Prior art keywords
forming
substrate
same
microelectronic assembly
hole
Prior art date
Application number
TW095134084A
Other languages
English (en)
Other versions
TWI417958B (zh
Inventor
Bishnu P Gogoi
Original Assignee
Freescale Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Publication of TW200715404A publication Critical patent/TW200715404A/zh
Application granted granted Critical
Publication of TWI417958B publication Critical patent/TWI417958B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
    • H01L21/764—Air gaps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
    • H01L21/46—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428
    • H01L21/461—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/465—Chemical or electrical treatment, e.g. electrolytic etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Manufacturing Cores, Coils, And Magnets (AREA)
  • Coils Or Transformers For Communication (AREA)
TW095134084A 2005-09-30 2006-09-14 微電子總成及形成其之方法 TWI417958B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/239,986 US7425485B2 (en) 2005-09-30 2005-09-30 Method for forming microelectronic assembly

Publications (2)

Publication Number Publication Date
TW200715404A true TW200715404A (en) 2007-04-16
TWI417958B TWI417958B (zh) 2013-12-01

Family

ID=37901096

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095134084A TWI417958B (zh) 2005-09-30 2006-09-14 微電子總成及形成其之方法

Country Status (7)

Country Link
US (2) US7425485B2 (zh)
EP (1) EP1935022B1 (zh)
JP (1) JP4722999B2 (zh)
KR (1) KR101303413B1 (zh)
CN (1) CN101501838B (zh)
TW (1) TWI417958B (zh)
WO (1) WO2007040992A2 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070173070A1 (en) * 2006-01-26 2007-07-26 Mei-Ling Chen Porous low-k dielectric film and fabrication method thereof
US8860544B2 (en) * 2007-06-26 2014-10-14 Mediatek Inc. Integrated inductor
US20100295150A1 (en) * 2009-05-22 2010-11-25 Chan Kuei-Ti Semiconductor device with oxide define dummy feature
CN102456612A (zh) * 2010-10-27 2012-05-16 上海华虹Nec电子有限公司 半导体集成电感的制作方法及结构
CN102616727B (zh) * 2011-01-31 2015-04-29 中芯国际集成电路制造(上海)有限公司 Mems器件及其制作方法
DE102011010248B3 (de) * 2011-02-03 2012-07-12 Infineon Technologies Ag Ein Verfahren zum Herstellen eines Halbleiterbausteins
US8354325B1 (en) * 2011-06-29 2013-01-15 Freescale Semiconductor, Inc. Method for forming a toroidal inductor in a semiconductor substrate
CN104752157A (zh) * 2013-12-30 2015-07-01 中芯国际集成电路制造(上海)有限公司 半导体衬底及其制作方法、集成无源器件及其制作方法

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JP3102885B2 (ja) * 1991-07-10 2000-10-23 ゼネラル・エレクトリック・カンパニィ チャンバを設けた高密度相互接続構造体
US5500552A (en) * 1993-07-26 1996-03-19 T.I.F. Co., Ltd. LC element, semiconductor device and LC element manufacturing method
TW275152B (zh) * 1993-11-01 1996-05-01 Ikeda Takeshi
US5828101A (en) * 1995-03-30 1998-10-27 Kabushiki Kaisha Toshiba Three-terminal semiconductor device and related semiconductor devices
US6492705B1 (en) * 1996-06-04 2002-12-10 Intersil Corporation Integrated circuit air bridge structures and methods of fabricating same
US5773870A (en) * 1996-09-10 1998-06-30 National Science Council Membrane type integrated inductor and the process thereof
JPH10321802A (ja) * 1997-05-22 1998-12-04 Toshiba Corp インダクタ素子
US5930637A (en) * 1997-10-31 1999-07-27 Taiwan Semiconductor Manufacturing Co., Ltd. Method of fabricating a microwave inductor
DE19810825A1 (de) * 1998-03-12 1999-09-16 Siemens Ag Integrierte elektronische Schaltungsanordnung und Verfahren zu ihrer Herstellung
US6025261A (en) * 1998-04-29 2000-02-15 Micron Technology, Inc. Method for making high-Q inductive elements
US6307247B1 (en) * 1999-07-12 2001-10-23 Robert Bruce Davies Monolithic low dielectric constant platform for passive components and method
JP4969715B2 (ja) * 2000-06-06 2012-07-04 ルネサスエレクトロニクス株式会社 半導体装置
DE10054484A1 (de) * 2000-11-03 2002-05-08 Bosch Gmbh Robert Mikromechanisches Bauelement und entsprechendes Herstellungsverfahren
SE519893C2 (sv) * 2000-11-09 2003-04-22 Ericsson Telefon Ab L M Induktorstruktur hos integrerad krets samt icke-förstörande mätning av etsningsdjup
TW523920B (en) * 2000-11-18 2003-03-11 Lenghways Technology Co Ltd Integrated multi-channel communication passive device manufactured by using micro-electromechanical technique
US6737727B2 (en) * 2001-01-12 2004-05-18 International Business Machines Corporation Electronic structures with reduced capacitance
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JP2003113940A (ja) * 2001-08-02 2003-04-18 Riken Corp スチール製ピストンリング
CN1131557C (zh) * 2001-08-24 2003-12-17 清华大学 硅基单面加工悬浮结构微机械电感的制作方法
JP2003179148A (ja) 2001-10-04 2003-06-27 Denso Corp 半導体基板およびその製造方法
DE10212630A1 (de) * 2002-03-21 2003-10-16 Infineon Technologies Ag Spule auf einem Halbleitersubstrat und Verfahren zu deren Herstellung
US7701022B2 (en) * 2002-05-01 2010-04-20 Rohm Co., Ltd. Semiconductor device and method of producing the same
JP4135564B2 (ja) * 2002-11-12 2008-08-20 株式会社デンソー 半導体基板およびその製造方法
TW570896B (en) * 2003-05-26 2004-01-11 Prime View Int Co Ltd A method for fabricating an interference display cell
JP4651920B2 (ja) 2003-07-15 2011-03-16 ルネサスエレクトロニクス株式会社 半導体装置
US6989578B2 (en) * 2003-07-31 2006-01-24 Taiwan Semiconductor Manufacturing Company Inductor Q value improvement
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JP2007505505A (ja) * 2004-01-10 2007-03-08 エイチブイブイアイ・セミコンダクターズ・インコーポレイテッド パワー半導体装置およびそのための方法
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US7704868B2 (en) * 2005-04-12 2010-04-27 University Of Florida Research Foundation, Inc. Fabrication of a micro-electromechanical system (MEMS) device from a complementary metal oxide semiconductor (CMOS)

Also Published As

Publication number Publication date
JP4722999B2 (ja) 2011-07-13
WO2007040992A2 (en) 2007-04-12
EP1935022A2 (en) 2008-06-25
CN101501838B (zh) 2011-04-20
JP2009510778A (ja) 2009-03-12
US20080290480A1 (en) 2008-11-27
US7723821B2 (en) 2010-05-25
KR20080054388A (ko) 2008-06-17
EP1935022A4 (en) 2011-09-28
CN101501838A (zh) 2009-08-05
US20070075394A1 (en) 2007-04-05
TWI417958B (zh) 2013-12-01
US7425485B2 (en) 2008-09-16
KR101303413B1 (ko) 2013-09-05
EP1935022B1 (en) 2013-04-10
WO2007040992A3 (en) 2009-04-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees