TW200633045A - Method of polishing GaN substrate - Google Patents

Method of polishing GaN substrate

Info

Publication number
TW200633045A
TW200633045A TW095100221A TW95100221A TW200633045A TW 200633045 A TW200633045 A TW 200633045A TW 095100221 A TW095100221 A TW 095100221A TW 95100221 A TW95100221 A TW 95100221A TW 200633045 A TW200633045 A TW 200633045A
Authority
TW
Taiwan
Prior art keywords
gan substrate
polishing
surface plate
polishing gan
abrasive material
Prior art date
Application number
TW095100221A
Other languages
English (en)
Inventor
Naoki Matsumoto
Original Assignee
Sumitomo Electric Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries filed Critical Sumitomo Electric Industries
Publication of TW200633045A publication Critical patent/TW200633045A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002—Preparing wafers
    • H01L21/02005—Preparing bulk and homogeneous wafers
    • H01L21/02008—Multistep processes
    • H01L21/0201—Specific process step
    • H01L21/02024—Mirror polishing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10—Inorganic compounds or compositions
    • C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403—AIII-nitrides
    • C30B29/406—Gallium nitride
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Inorganic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
TW095100221A 2005-01-12 2006-01-03 Method of polishing GaN substrate TW200633045A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005005497A JP5065574B2 (ja) 2005-01-12 2005-01-12 ＧａＮ基板の研磨方法

Publications (1)

Publication Number Publication Date
TW200633045A true TW200633045A (en) 2006-09-16

Family

ID=36677555

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095100221A TW200633045A (en) 2005-01-12 2006-01-03 Method of polishing GaN substrate

Country Status (8)

Country Link
US (2) US7452814B2 (zh)
EP (1) EP1814149B1 (zh)
JP (1) JP5065574B2 (zh)
KR (1) KR100858948B1 (zh)
CN (3) CN100421224C (zh)
HK (1) HK1100101A1 (zh)
TW (1) TW200633045A (zh)
WO (1) WO2006075527A1 (zh)

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Publication number Priority date Publication date Assignee Title
JP5433414B2 (ja) * 2006-07-26 2014-03-05 フライベルガー・コンパウンド・マテリアルズ・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング Ｉｉｉ−ｎ基板の平滑化方法
TWI452617B (zh) * 2006-07-26 2014-09-11 Freiberger Compound Mat Gmbh 平滑化第三族氮化物基材之方法
US7585772B2 (en) 2006-07-26 2009-09-08 Freiberger Compound Materials Gmbh Process for smoothening III-N substrates
JP2008066355A (ja) * 2006-09-05 2008-03-21 Sumitomo Electric Ind Ltd ３族窒化物基板の製造方法、３族窒化物基板、エピタキシャル層付き３族窒化物基板、３族窒化物デバイス、エピタキシャル層付き３族窒化物基板の製造方法、および３族窒化物デバイスの製造方法。
US8916124B2 (en) * 2007-12-05 2014-12-23 Ricoh Company, Ltd. Group III nitride crystal, method for growing the group III nitride crystal, and apparatus for growing the same
JP4333820B1 (ja) * 2009-01-19 2009-09-16 住友電気工業株式会社 化合物半導体基板
DE102009025243B4 (de) 2009-06-17 2011-11-17 Siltronic Ag Verfahren zur Herstellung und Verfahren zur Bearbeitung einer Halbleiterscheibe aus Silicium
CN103506928B (zh) * 2012-06-19 2016-02-10 上海硅酸盐研究所中试基地 超硬半导体材料抛光方法
US20160013085A1 (en) * 2014-07-10 2016-01-14 Applied Materials, Inc. In-Situ Acoustic Monitoring of Chemical Mechanical Polishing
CN107263301B (zh) * 2017-06-26 2019-05-14 镓特半导体科技（上海）有限公司 一种研磨-化学机械抛光氮化镓晶圆片的方法
US11078380B2 (en) * 2017-07-10 2021-08-03 Entegris, Inc. Hard abrasive particle-free polishing of hard materials
CN107953154B (zh) * 2017-12-27 2020-03-10 武汉华星光电半导体显示技术有限公司 玻璃基板的研磨方法及研磨装置

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JPS62102970A (ja) * 1985-10-31 1987-05-13 Hitachi Metals Ltd 硬質Ｓｎラツピング定盤
JPH09254024A (ja) * 1996-03-18 1997-09-30 Nittetsu Semiconductor Kk 半導体ウェハの化学機械的研磨装置および化学機械的研磨方法
US5743788A (en) * 1996-12-02 1998-04-28 Motorola, Inc. Platen coating structure for chemical mechanical polishing and method
JP2001205556A (ja) * 2000-01-28 2001-07-31 Tdk Corp 磁気ヘッドスライダの研磨方法
JP2001322899A (ja) * 2000-05-11 2001-11-20 Matsushita Electric Ind Co Ltd 窒化ガリウム系化合物半導体基板及びその製造方法
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JP4518746B2 (ja) * 2003-05-06 2010-08-04 住友電気工業株式会社 ＧａＮ基板
KR100550491B1 (ko) * 2003-05-06 2006-02-09 스미토모덴키고교가부시키가이샤 질화물 반도체 기판 및 질화물 반도체 기판의 가공 방법
JP2004335646A (ja) 2003-05-06 2004-11-25 Sumitomo Electric Ind Ltd ＧａＮ基板
JP4155872B2 (ja) * 2003-05-26 2008-09-24 一正 大西 ラップ盤の製造方法
TWI315886B (en) * 2005-04-08 2009-10-11 Ohara Kk A substrate and a method for polishing a substrate

Also Published As

Publication number Publication date
WO2006075527A1 (ja) 2006-07-20
JP5065574B2 (ja) 2012-11-07
EP1814149B1 (en) 2011-09-14
CN1906739A (zh) 2007-01-31
CN101274419A (zh) 2008-10-01
KR20060135672A (ko) 2006-12-29
CN101350302A (zh) 2009-01-21
JP2006196609A (ja) 2006-07-27
CN101350302B (zh) 2011-01-19
CN100421224C (zh) 2008-09-24
US7452814B2 (en) 2008-11-18
HK1100101A1 (en) 2007-09-07
EP1814149A1 (en) 2007-08-01
KR100858948B1 (ko) 2008-09-18
CN101274419B (zh) 2011-03-23
US20060283840A1 (en) 2006-12-21
EP1814149A4 (en) 2009-04-29
US20090045410A1 (en) 2009-02-19

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