TW200627469A - Memory transaction burst operation and memory components supporting temporally multiplexed error correction coding - Google Patents

Memory transaction burst operation and memory components supporting temporally multiplexed error correction coding

Info

Publication number
TW200627469A
TW200627469A TW094140809A TW94140809A TW200627469A TW 200627469 A TW200627469 A TW 200627469A TW 094140809 A TW094140809 A TW 094140809A TW 94140809 A TW94140809 A TW 94140809A TW 200627469 A TW200627469 A TW 200627469A
Authority
TW
Taiwan
Prior art keywords
ecc
data
memory
temporally multiplexed
addressable
Prior art date
Application number
TW094140809A
Other languages
English (en)
Other versions
TWI304591B (en
Inventor
Pete Vogt
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of TW200627469A publication Critical patent/TW200627469A/zh
Application granted granted Critical
Publication of TWI304591B publication Critical patent/TWI304591B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02—Addressing or allocation; Relocation
    • G06F12/08—Addressing or allocation; Relocation in hierarchically structured memory systems, e.g. virtual memory systems
    • G06F12/0802—Addressing of a memory level in which the access to the desired data or data block requires associative addressing means, e.g. caches
    • G06F12/0877—Cache access modes
    • G06F12/0879—Burst mode
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/14—Handling requests for interconnection or transfer
    • G06F13/20—Handling requests for interconnection or transfer for access to input/output bus
    • G06F13/28—Handling requests for interconnection or transfer for access to input/output bus using burst mode transfer, e.g. direct memory access DMA, cycle steal
    • G06F13/287—Multiplexed DMA
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
    • G11C7/1018—Serial bit line access mode, e.g. using bit line address shift registers, bit line address counters, bit line burst counters
    • G11C7/1027—Static column decode serial bit line access mode, i.e. using an enabled row address stroke pulse with its associated word line address and a sequence of enabled bit line addresses
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Dram (AREA)
  • Detection And Correction Of Errors (AREA)
  • Memory System (AREA)
TW094140809A 2004-11-22 2005-11-21 Memory transaction burst operation and memory components supporting temporally multiplexed error correction coding TWI304591B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/995,850 US7464241B2 (en) 2004-11-22 2004-11-22 Memory transaction burst operation and memory components supporting temporally multiplexed error correction coding

Publications (2)

Publication Number Publication Date
TW200627469A true TW200627469A (en) 2006-08-01
TWI304591B TWI304591B (en) 2008-12-21

Family

ID=36203765

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094140809A TWI304591B (en) 2004-11-22 2005-11-21 Memory transaction burst operation and memory components supporting temporally multiplexed error correction coding

Country Status (8)

Country Link
US (1) US7464241B2 (zh)
JP (2) JP4777358B2 (zh)
KR (1) KR100884096B1 (zh)
CN (1) CN101036131B (zh)
DE (1) DE112005002390T5 (zh)
GB (1) GB2433624B (zh)
TW (1) TWI304591B (zh)
WO (1) WO2006057963A2 (zh)

Families Citing this family (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI254848B (en) * 2004-11-16 2006-05-11 Via Tech Inc Method and related apparatus for performing error checking-correcting
JP4740766B2 (ja) * 2006-02-27 2011-08-03 富士通株式会社 データ受信装置、データ送受信システム、データ送受信システムの制御方法及びデータ受信装置の制御プログラム
US7620875B1 (en) * 2006-03-07 2009-11-17 Xilinx, Inc. Error correction code memory system with a small footprint and byte write operation
US7533191B2 (en) * 2006-06-30 2009-05-12 Intel Corporation Methods and arrangements for devices to share a common address on a bus
US7844888B2 (en) * 2006-09-29 2010-11-30 Qimonda Ag Electronic device, method for operating an electronic device, memory circuit and method of operating a memory circuit
KR100845529B1 (ko) * 2007-01-03 2008-07-10 삼성전자주식회사 플래시 메모리 장치의 이씨씨 제어기 및 그것을 포함한메모리 시스템
US7568137B1 (en) * 2007-03-27 2009-07-28 Xilinx, Inc. Method and apparatus for a clock and data recovery circuit
US20110016278A1 (en) * 2008-03-31 2011-01-20 Frederick Ware Independent Threading of Memory Devices Disposed on Memory Modules
US20090276587A1 (en) * 2008-04-30 2009-11-05 Moyer William C Selectively performing a single cycle write operation with ecc in a data processing system
US7814300B2 (en) 2008-04-30 2010-10-12 Freescale Semiconductor, Inc. Configurable pipeline to process an operation at alternate pipeline stages depending on ECC/parity protection mode of memory access
US8521979B2 (en) 2008-05-29 2013-08-27 Micron Technology, Inc. Memory systems and methods for controlling the timing of receiving read data
US7979757B2 (en) 2008-06-03 2011-07-12 Micron Technology, Inc. Method and apparatus for testing high capacity/high bandwidth memory devices
US8756486B2 (en) 2008-07-02 2014-06-17 Micron Technology, Inc. Method and apparatus for repairing high capacity/high bandwidth memory devices
US8289760B2 (en) 2008-07-02 2012-10-16 Micron Technology, Inc. Multi-mode memory device and method having stacked memory dice, a logic die and a command processing circuit and operating in direct and indirect modes
US7855931B2 (en) 2008-07-21 2010-12-21 Micron Technology, Inc. Memory system and method using stacked memory device dice, and system using the memory system
US8127204B2 (en) 2008-08-15 2012-02-28 Micron Technology, Inc. Memory system and method using a memory device die stacked with a logic die using data encoding, and system using the memory system
WO2011031260A1 (en) * 2009-09-10 2011-03-17 Hewlett-Packard Development Company, L.P. Memory subsystem having a first portion to store data with error correction code information and a second portion to store data without error correction code information
WO2012073287A1 (en) 2010-12-01 2012-06-07 Hitachi, Ltd. Storage control apparatus and storage control method
US8738993B2 (en) * 2010-12-06 2014-05-27 Intel Corporation Memory device on the fly CRC mode
US8400808B2 (en) 2010-12-16 2013-03-19 Micron Technology, Inc. Phase interpolators and push-pull buffers
CN102521180B (zh) * 2011-12-02 2014-10-22 百利通科技（扬州）有限公司 一种多通道实时直读存储器结构
US9612901B2 (en) * 2012-03-30 2017-04-04 Intel Corporation Memories utilizing hybrid error correcting code techniques
US9323608B2 (en) 2012-06-07 2016-04-26 Micron Technology, Inc. Integrity of a data bus
US9009570B2 (en) * 2012-06-07 2015-04-14 Micron Technology, Inc. Integrity of an address bus
US8996960B1 (en) * 2012-06-26 2015-03-31 Inphi Corporation Vertical error correction code for DRAM memory
KR102002925B1 (ko) * 2012-11-01 2019-07-23 삼성전자주식회사 메모리 모듈, 그것을 포함하는 메모리 시스템, 그것의 구동 방법
US9064606B2 (en) * 2012-12-20 2015-06-23 Advanced Micro Devices, Inc. Memory interface supporting both ECC and per-byte data masking
US9569352B2 (en) 2013-03-14 2017-02-14 Sandisk Technologies Llc Storage module and method for regulating garbage collection operations based on write activity of a host
EP2979272A1 (en) * 2013-07-31 2016-02-03 Hewlett-Packard Development Company, L.P. Off-memory-module ecc-supplemental memory system
US9171597B2 (en) 2013-08-30 2015-10-27 Micron Technology, Inc. Apparatuses and methods for providing strobe signals to memories
WO2015047402A1 (en) * 2013-09-30 2015-04-02 Hewlett-Packard Development Company, L.P. Programming memory controllers to allow performance of active memory operations
KR20150090414A (ko) * 2014-01-29 2015-08-06 에스케이하이닉스 주식회사 에러 정정 동작을 수행하는 반도체 장치
JP6385077B2 (ja) 2014-03-05 2018-09-05 ルネサスエレクトロニクス株式会社 半導体装置
US9471254B2 (en) * 2014-04-16 2016-10-18 Sandisk Technologies Llc Storage module and method for adaptive burst mode
US9928169B2 (en) 2014-05-07 2018-03-27 Sandisk Technologies Llc Method and system for improving swap performance
US9710198B2 (en) 2014-05-07 2017-07-18 Sandisk Technologies Llc Method and computing device for controlling bandwidth of swap operations
US9633233B2 (en) 2014-05-07 2017-04-25 Sandisk Technologies Llc Method and computing device for encrypting data stored in swap memory
US9665296B2 (en) 2014-05-07 2017-05-30 Sandisk Technologies Llc Method and computing device for using both volatile memory and non-volatile swap memory to pre-load a plurality of applications
JP6381673B2 (ja) * 2014-12-19 2018-08-29 三菱電機株式会社 情報処理装置およびｆｐｇａコンフィギュレーション方法
US9450609B1 (en) * 2015-03-31 2016-09-20 Altera Corporation Methods and apparatus for embedding an error correction code in memory cells
US10061645B2 (en) * 2015-06-30 2018-08-28 Qualcomm Incorporated Memory array and link error correction in a low power memory sub-system
US9965352B2 (en) * 2015-11-20 2018-05-08 Qualcomm Incorporated Separate link and array error correction in a memory system
DE102016123247B4 (de) * 2015-12-01 2024-03-21 Nvidia Corporation Systeme und verfahren zur speicherverwaltung
US9891986B2 (en) * 2016-01-26 2018-02-13 Nxp Usa, Inc. System and method for performing bus transactions
US9990158B2 (en) 2016-06-22 2018-06-05 Sandisk Technologies Llc Storage system and method for burst mode management using transfer RAM
US9818457B1 (en) 2016-09-30 2017-11-14 Intel Corporation Extended platform with additional memory module slots per CPU socket
US10216657B2 (en) 2016-09-30 2019-02-26 Intel Corporation Extended platform with additional memory module slots per CPU socket and configured for increased performance
CN108255633B (zh) * 2016-12-28 2021-07-30 旺宏电子股份有限公司 存储控制方法、存储装置
CN108511030B (zh) * 2017-02-24 2020-12-18 瑞昱半导体股份有限公司 记忆体测试方法
KR102362229B1 (ko) 2017-08-10 2022-02-11 삼성전자주식회사 메모리 컨트롤러, 메모리 시스템 및 메모리 컨트롤러를 포함하는 어플리케이션 프로세서
KR102433098B1 (ko) 2018-02-26 2022-08-18 에스케이하이닉스 주식회사 어드레스 생성회로, 어드레스 및 커맨드 생성회로 및 반도체 시스템
US10636476B2 (en) * 2018-11-01 2020-04-28 Intel Corporation Row hammer mitigation with randomization of target row selection
US11403172B2 (en) * 2019-08-05 2022-08-02 Cypress Semiconductor Corporation Methods for error detection and correction and corresponding systems and devices for the same
US11416333B2 (en) * 2019-08-22 2022-08-16 Micron Technology, Inc. Semiconductor device with power-saving mode and associated methods and systems
WO2021035811A1 (zh) * 2019-08-27 2021-03-04 江苏华存电子科技有限公司 一种可变动码率与更正能力内存控制方法
CN111128262B (zh) * 2019-12-17 2021-02-23 海光信息技术股份有限公司 存储器电路、电路控制方法、集成电路器件及处理器
CN115016981B (zh) * 2022-06-16 2023-05-09 海光信息技术股份有限公司 存储区域的设置方法、数据读取、写入方法及相关装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5987627A (en) 1992-05-13 1999-11-16 Rawlings, Iii; Joseph H. Methods and apparatus for high-speed mass storage access in a computer system
JPH1173737A (ja) * 1997-08-29 1999-03-16 Sony Corp 記録装置及び方法、再生装置及び方法並びに記録媒体
JP3307579B2 (ja) 1998-01-28 2002-07-24 インターナショナル・ビジネス・マシーンズ・コーポレーション データ記憶システム
JP3230485B2 (ja) * 1998-04-09 2001-11-19 日本電気株式会社 １チップマイクロコンピュータ
US20020029365A1 (en) 1998-12-17 2002-03-07 Yoshimichi Sato Information processing apparatus
US6212631B1 (en) * 1999-01-15 2001-04-03 Dell Usa, L.P. Method and apparatus for automatic L2 cache ECC configuration in a computer system
US6941505B2 (en) 2000-09-12 2005-09-06 Hitachi, Ltd. Data processing system and data processing method
US6687767B2 (en) 2001-10-25 2004-02-03 Sun Microsystems, Inc. Efficient direct memory access transfer of data and check information to and from a data storage device
US7117421B1 (en) * 2002-05-31 2006-10-03 Nvidia Corporation Transparent error correction code memory system and method
US7447950B2 (en) * 2003-05-20 2008-11-04 Nec Electronics Corporation Memory device and memory error correction method
US7272774B2 (en) * 2004-04-16 2007-09-18 Kingston Technology Corp. Extender card for testing error-correction-code (ECC) storage area on memory modules
US7322002B2 (en) * 2004-05-26 2008-01-22 Micron Technology, Inc. Erasure pointer error correction

Also Published As

Publication number Publication date
US20060123320A1 (en) 2006-06-08
JP2011243206A (ja) 2011-12-01
JP4777358B2 (ja) 2011-09-21
KR20070051930A (ko) 2007-05-18
CN101036131A (zh) 2007-09-12
US7464241B2 (en) 2008-12-09
GB2433624A (en) 2007-06-27
WO2006057963A2 (en) 2006-06-01
KR100884096B1 (ko) 2009-02-19
WO2006057963A3 (en) 2006-07-20
JP5399442B2 (ja) 2014-01-29
TWI304591B (en) 2008-12-21
JP2008521160A (ja) 2008-06-19
DE112005002390T5 (de) 2007-10-11
GB2433624B (en) 2008-10-15
GB0706172D0 (en) 2007-05-09
CN101036131B (zh) 2011-01-26

Similar Documents

Publication Publication Date Title
GB2433624A (en) Memory transaction burst operation and memory components supporting temporally multiplexed error correction coding
US8086783B2 (en) High availability memory system
US8510631B2 (en) Multi-channel memory apparatus and method thereof
US8327105B2 (en) Providing frame start indication in a memory system having indeterminate read data latency
KR101093857B1 (ko) 공통 프레임에서 공유 에러 비트 코드와 함께 데이터 및 데이터 마스크 비트들을 전송하기 위한 시스템, 방법 및 장치
JP5142138B2 (ja) メモリ・システム内の障害メモリ要素を識別する方法及びメモリ・システム
US9350386B2 (en) Memory device, memory system, and method of operating the same
CN102084341B (zh) 用于在高速串行链路中使用的循环冗余码
GB2461428A (en) Ecc implementation in non-ecc components
US6493843B1 (en) Chipkill for a low end server or workstation
TW200710653A (en) Memory device
TW200501167A (en) Systems and methods for providing error correction code testing functionality
KR101251100B1 (ko) 별도의 순환 중복 코드 프레임들을 이용하는 효율적인 대역내 신뢰도
US20070089035A1 (en) Silent data corruption mitigation using error correction code with embedded signaling fault detection
US9436401B1 (en) Computer memory data security
TW200708966A (en) Data memory system and method for transferring data into a data memory
TW200629086A (en) Storage system and method for handling bad storage device data therefor
US7844888B2 (en) Electronic device, method for operating an electronic device, memory circuit and method of operating a memory circuit
US20050114750A1 (en) High reliability memory subsystem using data error correcting code symbol sliced command repowering
US11657890B2 (en) Memory system, integrated circuit system, and operation method of memory system
TW200641901A (en) On-the-fly error checking and correction codec system and method for supporting non-volatile memory
TW200727308A (en) Memory module having address transforming function and method for controlling memory
JP4819843B2 (ja) メモリ装置のためのｅｃｃコード生成方法
TW200630789A (en) Apparatus, system, and method for error checking and recovery of transmitted data in a SCSI environment
TW342498B (en) System including a ferroelectric memory

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees