TW200623276A - Method for forming self-aligned dual fully silicided gates in cmos devices - Google Patents

Method for forming self-aligned dual fully silicided gates in cmos devices

Info

Publication number
TW200623276A
TW200623276A TW094141589A TW94141589A TW200623276A TW 200623276 A TW200623276 A TW 200623276A TW 094141589 A TW094141589 A TW 094141589A TW 94141589 A TW94141589 A TW 94141589A TW 200623276 A TW200623276 A TW 200623276A
Authority
TW
Taiwan
Prior art keywords
gate
type
fully silicided
source
well region
Prior art date
Application number
TW094141589A
Other languages
English (en)
Inventor
Sun-Fei Fang
Cyril Cabral Jr
Chester T Dziobkowski
Christian Lavoie
Clement H Wann
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of TW200623276A publication Critical patent/TW200623276A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8232—Field-effect technology
    • H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
    • H01L21/8238—Complementary field-effect transistors, e.g. CMOS
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8232—Field-effect technology
    • H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
    • H01L21/8238—Complementary field-effect transistors, e.g. CMOS
    • H01L21/823828—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the gate conductors, e.g. particular materials, shapes
    • H01L21/823835—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the gate conductors, e.g. particular materials, shapes silicided or salicided gate conductors
TW094141589A 2004-12-02 2005-11-25 Method for forming self-aligned dual fully silicided gates in cmos devices TW200623276A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/904,885 US7122472B2 (en) 2004-12-02 2004-12-02 Method for forming self-aligned dual fully silicided gates in CMOS devices

Publications (1)

Publication Number Publication Date
TW200623276A true TW200623276A (en) 2006-07-01

Family

ID=36565726

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094141589A TW200623276A (en) 2004-12-02 2005-11-25 Method for forming self-aligned dual fully silicided gates in cmos devices

Country Status (7)

Country Link
US (1) US7122472B2 (zh)
EP (1) EP1831925A4 (zh)
JP (1) JP2008522443A (zh)
KR (1) KR20070085699A (zh)
CN (1) CN101069282B (zh)
TW (1) TW200623276A (zh)
WO (1) WO2006060574A2 (zh)

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JP4791722B2 (ja) * 2004-09-21 2011-10-12 株式会社東芝 半導体装置の製造方法
KR100719340B1 (ko) * 2005-01-14 2007-05-17 삼성전자주식회사 듀얼 게이트 전극을 갖는 반도체 소자 및 그 형성 방법
FR2881575B1 (fr) * 2005-01-28 2007-06-01 St Microelectronics Crolles 2 Transistor mos a grille totalement siliciuree
US7148097B2 (en) * 2005-03-07 2006-12-12 Texas Instruments Incorporated Integrated circuit containing polysilicon gate transistors and fully silicidized metal gate transistors
JP2006294800A (ja) * 2005-04-08 2006-10-26 Toshiba Corp 半導体装置の製造方法
US7151023B1 (en) * 2005-08-01 2006-12-19 International Business Machines Corporation Metal gate MOSFET by full semiconductor metal alloy conversion
KR100685904B1 (ko) * 2005-10-04 2007-02-26 동부일렉트로닉스 주식회사 풀리 실리사이드 게이트 및 그것을 가진 반도체 소자의제조 방법
JP4287421B2 (ja) * 2005-10-13 2009-07-01 株式会社ルネサステクノロジ 半導体装置の製造方法
US20070123042A1 (en) * 2005-11-28 2007-05-31 International Business Machines Corporation Methods to form heterogeneous silicides/germanides in cmos technology
US7410854B2 (en) * 2006-10-05 2008-08-12 Taiwan Semiconductor Manufacturing Company, Ltd. Method of making FUSI gate and resulting structure
US20080093682A1 (en) * 2006-10-18 2008-04-24 Liang-Gi Yao Polysilicon levels for silicided structures including MOSFET gate electrodes and 3D devices
US20080146012A1 (en) * 2006-12-15 2008-06-19 Taiwan Semiconductor Manufacturing Company, Ltd. Novel method to adjust work function by plasma assisted metal incorporated dielectric
KR100836763B1 (ko) * 2006-12-28 2008-06-10 삼성전자주식회사 반도체 소자 및 그 형성 방법
US20080206973A1 (en) * 2007-02-26 2008-08-28 Texas Instrument Inc. Process method to optimize fully silicided gate (FUSI) thru PAI implant
US7737015B2 (en) * 2007-02-27 2010-06-15 Texas Instruments Incorporated Formation of fully silicided gate with oxide barrier on the source/drain silicide regions
KR100860471B1 (ko) * 2007-04-02 2008-09-25 동부일렉트로닉스 주식회사 반도체 소자 및 그의 제조방법
US20090053883A1 (en) * 2007-08-24 2009-02-26 Texas Instruments Incorporated Method of setting a work function of a fully silicided semiconductor device, and related device
US7749847B2 (en) * 2008-02-14 2010-07-06 International Business Machines Corporation CMOS integration scheme employing a silicide electrode and a silicide-germanide alloy electrode
US7749898B2 (en) * 2008-06-24 2010-07-06 Globalfoundries Inc. Silicide interconnect structure
US20100019327A1 (en) * 2008-07-22 2010-01-28 Eun Jong Shin Semiconductor Device and Method of Fabricating the Same
US9401431B2 (en) * 2009-04-21 2016-07-26 Cbrite Inc. Double self-aligned metal oxide TFT
US8378428B2 (en) * 2010-09-29 2013-02-19 Taiwan Semiconductor Manufacturing Company, Ltd. Metal gate structure of a semiconductor device
US8779551B2 (en) * 2012-06-06 2014-07-15 International Business Machines Corporation Gated diode structure for eliminating RIE damage from cap removal
CN106486424B (zh) * 2015-08-26 2019-11-12 中芯国际集成电路制造(上海)有限公司 半导体器件的形成方法

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JP2980057B2 (ja) * 1997-04-30 1999-11-22 日本電気株式会社 半導体装置の製造方法
US6090653A (en) * 1998-03-30 2000-07-18 Texas Instruments Method of manufacturing CMOS transistors
US6100173A (en) * 1998-07-15 2000-08-08 Advanced Micro Devices, Inc. Forming a self-aligned silicide gate conductor to a greater thickness than junction silicide structures using a dual-salicidation process
US6153485A (en) * 1998-11-09 2000-11-28 Chartered Semiconductor Manufacturing Ltd. Salicide formation on narrow poly lines by pulling back of spacer
US6277683B1 (en) * 2000-02-28 2001-08-21 Chartered Semiconductor Manufacturing Ltd. Method of forming a sidewall spacer and a salicide blocking shape, using only one silicon nitride layer
US6562718B1 (en) * 2000-12-06 2003-05-13 Advanced Micro Devices, Inc. Process for forming fully silicided gates
US6528402B2 (en) * 2001-02-23 2003-03-04 Vanguard International Semiconductor Corporation Dual salicidation process
US6524939B2 (en) * 2001-02-23 2003-02-25 Vanguard International Semiconductor Corporation Dual salicidation process
US6534405B1 (en) * 2001-10-01 2003-03-18 Taiwan Semiconductor Manufacturing Company Method of forming a MOSFET device featuring a dual salicide process
JP2005519468A (ja) * 2002-02-28 2005-06-30 アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド 半導体デバイス中の異なるシリコン含有領域上に、異なるシリサイド部分を形成する方法
US6689676B1 (en) * 2002-07-26 2004-02-10 Motorola, Inc. Method for forming a semiconductor device structure in a semiconductor layer
US6589836B1 (en) * 2002-10-03 2003-07-08 Taiwan Semiconductor Manufacturing Company One step dual salicide formation for ultra shallow junction applications
JP4197607B2 (ja) * 2002-11-06 2008-12-17 株式会社東芝 絶縁ゲート型電界効果トランジスタを含む半導体装置の製造方法
US6846734B2 (en) * 2002-11-20 2005-01-25 International Business Machines Corporation Method and process to make multiple-threshold metal gates CMOS technology
JP4209206B2 (ja) * 2003-01-14 2009-01-14 富士通マイクロエレクトロニクス株式会社 半導体装置の製造方法
US6905922B2 (en) * 2003-10-03 2005-06-14 Taiwan Semiconductor Manufacturing Company, Ltd. Dual fully-silicided gate MOSFETs
US7396767B2 (en) * 2004-07-16 2008-07-08 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor structure including silicide regions and method of making same

Also Published As

Publication number Publication date
CN101069282A (zh) 2007-11-07
EP1831925A2 (en) 2007-09-12
JP2008522443A (ja) 2008-06-26
US20060121663A1 (en) 2006-06-08
CN101069282B (zh) 2012-05-30
WO2006060574A2 (en) 2006-06-08
US7122472B2 (en) 2006-10-17
KR20070085699A (ko) 2007-08-27
WO2006060574A3 (en) 2006-07-20
EP1831925A4 (en) 2009-06-24

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