TW200612481A - Development processing method - Google Patents
Development processing methodInfo
- Publication number
- TW200612481A TW200612481A TW094126234A TW94126234A TW200612481A TW 200612481 A TW200612481 A TW 200612481A TW 094126234 A TW094126234 A TW 094126234A TW 94126234 A TW94126234 A TW 94126234A TW 200612481 A TW200612481 A TW 200612481A
- Authority
- TW
- Taiwan
- Prior art keywords
- prescribed
- wafer
- liquid
- inert liquid
- resist film
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004238488A JP2006059918A (ja) | 2004-08-18 | 2004-08-18 | 現像処理方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200612481A true TW200612481A (en) | 2006-04-16 |
Family
ID=35907350
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094126234A TW200612481A (en) | 2004-08-18 | 2005-08-02 | Development processing method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2006059918A (zh) |
TW (1) | TW200612481A (zh) |
WO (1) | WO2006018960A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI637434B (zh) * | 2016-03-31 | 2018-10-01 | 斯庫林集團股份有限公司 | 基板處理方法及基板處理裝置 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4859245B2 (ja) * | 2007-10-29 | 2012-01-25 | 東京エレクトロン株式会社 | 基板処理装置 |
US20130040246A1 (en) * | 2011-08-09 | 2013-02-14 | Tokyo Electron Limited | Multiple chemical treatment process for reducing pattern defect |
JP6610285B2 (ja) * | 2016-01-22 | 2019-11-27 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理システム並びに基板処理方法 |
KR102608177B1 (ko) * | 2016-12-19 | 2023-11-30 | 도쿄엘렉트론가부시키가이샤 | 현상 처리 방법, 컴퓨터 기억 매체 및 현상 처리 장치 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63229715A (ja) * | 1987-03-19 | 1988-09-26 | Fujitsu Ltd | レジストハ−ドニング方法 |
JPH05326392A (ja) * | 1992-05-14 | 1993-12-10 | Fujitsu Ltd | 半導体装置の製造方法 |
JP2745443B2 (ja) * | 1993-01-22 | 1998-04-28 | 株式会社ソルテック | レジストパターン形成方法 |
JPH0945651A (ja) * | 1995-07-26 | 1997-02-14 | Toshiba Corp | レジストの洗浄装置及び現像装置 |
JPH11154634A (ja) * | 1997-11-20 | 1999-06-08 | Sony Corp | 半導体装置の製造方法及び製造装置 |
JP2000089477A (ja) * | 1998-09-11 | 2000-03-31 | Nec Corp | レジストパターンの形成方法 |
TW558736B (en) * | 2000-02-26 | 2003-10-21 | Shipley Co Llc | Method of reducing defects |
JP2003178946A (ja) * | 2001-12-10 | 2003-06-27 | Tokyo Electron Ltd | 現像処理方法及び現像処理装置 |
-
2004
- 2004-08-18 JP JP2004238488A patent/JP2006059918A/ja active Pending
-
2005
- 2005-07-29 WO PCT/JP2005/013931 patent/WO2006018960A1/ja active Application Filing
- 2005-08-02 TW TW094126234A patent/TW200612481A/zh unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI637434B (zh) * | 2016-03-31 | 2018-10-01 | 斯庫林集團股份有限公司 | 基板處理方法及基板處理裝置 |
Also Published As
Publication number | Publication date |
---|---|
JP2006059918A (ja) | 2006-03-02 |
WO2006018960A1 (ja) | 2006-02-23 |
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